Few-Shot One-Class Classification via Meta-Learning
  Although few-shot learning and one-class classification (OCC), i.e., learning
a binary classifier with data from only one class, have been separately well
studied, their intersection remains rather unexplored. Our work addresses the
few-shot OCC problem and presents a method to modify the episodic data sampling
strategy of the model-agnostic meta-learning (MAML) algorithm to learn a model
initialization particularly suited for learning few-shot OCC tasks. This is
done by explicitly optimizing for an initialization which only requires few
gradient steps with one-class minibatches to yield a performance increase on
class-balanced test data. We provide a theoretical analysis that explains why
our approach works in the few-shot OCC scenario, while other meta-learning
algorithms fail, including the unmodified MAML. Our experiments on eight
datasets from the image and time-series domains show that our method leads to
better results than classical OCC and few-shot classification approaches, and
demonstrate the ability to learn unseen tasks from only few normal class
samples. Moreover, we successfully train anomaly detectors for a real-world
application on sensor readings recorded during industrial manufacturing of
workpieces with a CNC milling machine, by using few normal examples. Finally,
we empirically demonstrate that the proposed data sampling technique increases
the performance of more recent meta-learning algorithms in few-shot OCC and
yields state-of-the-art results in this problem setting.
