Semi-supervised deep learning by metric embedding
  Deep networks are successfully used as classification models yielding
state-of-the-art results when trained on a large number of labeled samples.
These models, however, are usually much less suited for semi-supervised
problems because of their tendency to overfit easily when trained on small
amounts of data. In this work we will explore a new training objective that is
targeting a semi-supervised regime with only a small subset of labeled data.
This criterion is based on a deep metric embedding over distance relations
within the set of labeled samples, together with constraints over the
embeddings of the unlabeled set. The final learned representations are
discriminative in euclidean space, and hence can be used with subsequent
nearest-neighbor classification using the labeled samples.
