Deep Metric Learning for Few-Shot Image Classification: A Selective
  Review
  Few-shot image classification is a challenging problem which aims to achieve
the human level of recognition based only on a small number of images. Deep
learning algorithms such as meta-learning, transfer learning, and metric
learning have been employed recently and achieved the state-of-the-art
performance. In this survey, we review representative deep metric learning
methods for few-shot classification, and categorize them into three groups
according to the major problems and novelties they focus on. We conclude this
review with a discussion on current challenges and future trends in few-shot
image classification.
