TinyDefectNet: Highly Compact Deep Neural Network Architecture for
  High-Throughput Manufacturing Visual Quality Inspection
  A critical aspect in the manufacturing process is the visual quality
inspection of manufactured components for defects and flaws. Human-only visual
inspection can be very time-consuming and laborious, and is a significant
bottleneck especially for high-throughput manufacturing scenarios. Given
significant advances in the field of deep learning, automated visual quality
inspection can lead to highly efficient and reliable detection of defects and
flaws during the manufacturing process. However, deep learning-driven visual
inspection methods often necessitate significant computational resources, thus
limiting throughput and act as a bottleneck to widespread adoption for enabling
smart factories. In this study, we investigated the utilization of a
machine-driven design exploration approach to create TinyDefectNet, a highly
compact deep convolutional network architecture tailored for high-throughput
manufacturing visual quality inspection. TinyDefectNet comprises of just ~427K
parameters and has a computational complexity of ~97M FLOPs, yet achieving a
detection accuracy of a state-of-the-art architecture for the task of surface
defect detection on the NEU defect benchmark dataset. As such, TinyDefectNet
can achieve the same level of detection performance at 52$\times$ lower
architectural complexity and 11x lower computational complexity. Furthermore,
TinyDefectNet was deployed on an AMD EPYC 7R32, and achieved 7.6x faster
throughput using the native Tensorflow environment and 9x faster throughput
using AMD ZenDNN accelerator library. Finally, explainability-driven
performance validation strategy was conducted to ensure correct decision-making
behaviour was exhibited by TinyDefectNet to improve trust in its usage by
operators and inspectors.
