On the Resilience of RTL NN Accelerators: Fault Characterization and
  Mitigation
  Machine Learning (ML) is making a strong resurgence in tune with the massive
generation of unstructured data which in turn requires massive computational
resources. Due to the inherently compute- and power-intensive structure of
Neural Networks (NNs), hardware accelerators emerge as a promising solution.
However, with technology node scaling below 10nm, hardware accelerators become
more susceptible to faults, which in turn can impact the NN accuracy. In this
paper, we study the resilience aspects of Register-Transfer Level (RTL) model
of NN accelerators, in particular, fault characterization and mitigation. By
following a High-Level Synthesis (HLS) approach, first, we characterize the
vulnerability of various components of RTL NN. We observed that the severity of
faults depends on both i) application-level specifications, i.e., NN data
(inputs, weights, or intermediate), NN layers, and NN activation functions, and
ii) architectural-level specifications, i.e., data representation model and the
parallelism degree of the underlying accelerator. Second, motivated by
characterization results, we present a low-overhead fault mitigation technique
that can efficiently correct bit flips, by 47.3% better than state-of-the-art
methods.
