Deep Denoising For Scientific Discovery: A Case Study In Electron
  Microscopy
  Denoising is a fundamental challenge in scientific imaging. Deep
convolutional neural networks (CNNs) provide the current state of the art in
denoising natural images, where they produce impressive results. However, their
potential has barely been explored in the context of scientific imaging.
Denoising CNNs are typically trained on real natural images artificially
corrupted with simulated noise. In contrast, in scientific applications,
noiseless ground-truth images are usually not available. To address this issue,
we propose a simulation-based denoising (SBD) framework, in which CNNs are
trained on simulated images. We test the framework on data obtained from
transmission electron microscopy (TEM), an imaging technique with widespread
applications in material science, biology, and medicine. SBD outperforms
existing techniques by a wide margin on a simulated benchmark dataset, as well
as on real data. Apart from the denoised images, SBD generates likelihood maps
to visualize the agreement between the structure of the denoised image and the
observed data. Our results reveal shortcomings of state-of-the-art denoising
architectures, such as their small field-of-view: substantially increasing the
field-of-view of the CNNs allows them to exploit non-local periodic patterns in
the data, which is crucial at high noise levels. In addition, we analyze the
generalization capability of SBD, demonstrating that the trained networks are
robust to variations of imaging parameters and of the underlying signal
structure. Finally, we release the first publicly available benchmark dataset
of TEM images, containing 18,000 examples.
