BraggNN: Fast X-ray Bragg Peak Analysis Using Deep Learning
  X-ray diffraction based microscopy techniques such as High Energy Diffraction
Microscopy rely on knowledge of the position of diffraction peaks with high
precision. These positions are typically computed by fitting the observed
intensities in area detector data to a theoretical peak shape such as
pseudo-Voigt. As experiments become more complex and detector technologies
evolve, the computational cost of such peak detection and shape fitting becomes
the biggest hurdle to the rapid analysis required for real-time feedback during
in-situ experiments. To this end, we propose BraggNN, a deep learning-based
method that can determine peak positions much more rapidly than conventional
pseudo-Voigt peak fitting. When applied to a test dataset, BraggNN gives errors
of less than 0.29 and 0.57 pixels, relative to the conventional method, for 75%
and 95% of the peaks, respectively. When applied to a real experimental
dataset, a 3D reconstruction that used peak positions computed by BraggNN
yields 15% better results on average as compared to a reconstruction obtained
using peak positions determined using conventional 2D pseudo-Voigt fitting.
Recent advances in deep learning method implementations and special-purpose
model inference accelerators allow BraggNN to deliver enormous performance
improvements relative to the conventional method, running, for example, more
than 200 times faster than a conventional method on a consumer-class GPU card
with out-of-the-box software.
