Blind Deconvolution Microscopy Using Cycle Consistent CNN with Explicit
  PSF Layer
  Deconvolution microscopy has been extensively used to improve the resolution
of the widefield fluorescent microscopy. Conventional approaches, which usually
require the point spread function (PSF) measurement or blind estimation, are
however computationally expensive. Recently, CNN based approaches have been
explored as a fast and high performance alternative. In this paper, we present
a novel unsupervised deep neural network for blind deconvolution based on cycle
consistency and PSF modeling layers. In contrast to the recent CNN approaches
for similar problem, the explicit PSF modeling layers improve the robustness of
the algorithm. Experimental results confirm the efficacy of the algorithm.
