Automated Circuit Approximation Method Driven by Data Distribution
  We propose an application-tailored data-driven fully automated method for
functional approximation of combinational circuits. We demonstrate how an
application-level error metric such as the classification accuracy can be
translated to a component-level error metric needed for an efficient and fast
search in the space of approximate low-level components that are used in the
application. This is possible by employing a weighted mean error distance
(WMED) metric for steering the circuit approximation process which is conducted
by means of genetic programming. WMED introduces a set of weights (calculated
from the data distribution measured on a selected signal in a given
application) determining the importance of each input vector for the
approximation process. The method is evaluated using synthetic benchmarks and
application-specific approximate MAC (multiply-and-accumulate) units that are
designed to provide the best trade-offs between the classification accuracy and
power consumption of two image classifiers based on neural networks.
