Direct detection of plasticity onset through total-strain profile
  evolution
  Plastic yielding in solids strongly depends on various conditions, such as
temperature and loading rate and indeed, sample-dependent knowledge of yield
points in structural materials promotes reliability in mechanical behavior.
Commonly, yielding is measured through controlled mechanical testing at small
or large scales, in ways that either distinguish elastic (stress) from total
deformation measurements, or by identifying plastic slip contributions. In this
paper we argue that instead of separate elastic/plastic measurements, yielding
can be unraveled through statistical analysis of total strain fluctuations
during the evolution sequence of profiles measured in-situ, through digital
image correlation. We demonstrate two distinct ways of precisely quantifying
yield locations in widely applicable crystal plasticity models, that apply in
polycrystalline solids, either by using principal component analysis or
discrete wavelet transforms. We test and compare these approaches in synthetic
data of polycrystal simulations and a variety of yielding responses, through
changes of the applied loading rates and the strain-rate sensitivity exponents.
