Synthetic Defect Generation for Display Front-of-Screen Quality
  Inspection: A Survey
  Display front-of-screen (FOS) quality inspection is essential for the mass
production of displays in the manufacturing process. However, the severe
imbalanced data, especially the limited number of defect samples, has been a
long-standing problem that hinders the successful application of deep learning
algorithms. Synthetic defect data generation can help address this issue. This
paper reviews the state-of-the-art synthetic data generation methods and the
evaluation metrics that can potentially be applied to display FOS quality
inspection tasks.
