CNN-Cap: Effective Convolutional Neural Network Based Capacitance Models
  for Full-Chip Parasitic Extraction
  Accurate capacitance extraction is becoming more important for designing
integrated circuits under advanced process technology. The pattern matching
based full-chip extraction methodology delivers fast computational speed, but
suffers from large error, and tedious efforts on building capacitance models of
the increasing structure patterns. In this work, we propose an effective method
for building convolutional neural network (CNN) based capacitance models
(called CNN-Cap) for two-dimensional (2-D) structures in full-chip capacitance
extraction. With a novel grid-based data representation, the proposed method is
able to model the pattern with a variable number of conductors, so that largely
reduce the number of patterns. Based on the ability of ResNet architecture on
capturing spatial information and the proposed training skills, the obtained
CNN-Cap exhibits much better performance over the multilayer perception neural
network based capacitance model while being more versatile. Extensive
experiments on a 55nm and a 15nm process technologies have demonstrated that
the error of total capacitance produced with CNN-Cap is always within 1.3% and
the error of produced coupling capacitance is less than 10% in over 99.5%
probability. CNN-Cap runs more than 4000X faster than 2-D field solver on a GPU
server, while it consumes negligible memory compared to the look-up table based
capacitance model.
