Machine Learning to Tackle the Challenges of Transient and Soft Errors
  in Complex Circuits
  The Functional Failure Rate analysis of today's complex circuits is a
difficult task and requires a significant investment in terms of human efforts,
processing resources and tool licenses. Thereby, de-rating or vulnerability
factors are a major instrument of failure analysis efforts. Usually
computationally intensive fault-injection simulation campaigns are required to
obtain a fine-grained reliability metrics for the functional level. Therefore,
the use of machine learning algorithms to assist this procedure and thus,
optimising and enhancing fault injection efforts, is investigated in this
paper. Specifically, machine learning models are used to predict accurate
per-instance Functional De-Rating data for the full list of circuit instances,
an objective that is difficult to reach using classical methods. The described
methodology uses a set of per-instance features, extracted through an analysis
approach, combining static elements (cell properties, circuit structure,
synthesis attributes) and dynamic elements (signal activity). Reference data is
obtained through first-principles fault simulation approaches. One part of this
reference dataset is used to train the machine learning model and the remaining
is used to validate and benchmark the accuracy of the trained tool. The
presented methodology is applied on a practical example and various machine
learning models are evaluated and compared.
