Noise-Resistant Deep Metric Learning with Probabilistic Instance
  Filtering
  Noisy labels are commonly found in real-world data, which cause performance
degradation of deep neural networks. Cleaning data manually is labour-intensive
and time-consuming. Previous research mostly focuses on enhancing
classification models against noisy labels, while the robustness of deep metric
learning (DML) against noisy labels remains less well-explored. In this paper,
we bridge this important gap by proposing Probabilistic Ranking-based Instance
Selection with Memory (PRISM) approach for DML. PRISM calculates the
probability of a label being clean, and filters out potentially noisy samples.
Specifically, we propose a novel method, namely the von Mises-Fisher
Distribution Similarity (vMF-Sim), to calculate this probability by estimating
a von Mises-Fisher (vMF) distribution for each data class. Compared with the
existing average similarity method (AvgSim), vMF-Sim considers the variance of
each class in addition to the average similarity. With such a design, the
proposed approach can deal with challenging DML situations in which the
majority of the samples are noisy. Extensive experiments on both synthetic and
real-world noisy dataset show that the proposed approach achieves up to 8.37%
higher Precision@1 compared with the best performing state-of-the-art baseline
approaches, within reasonable training time.
