Process, Bias and Temperature Scalable CMOS Analog Computing Circuits
  for Machine Learning
  Analog computing is attractive compared to digital computing due to its
potential for achieving higher computational density and higher energy
efficiency. However, unlike digital circuits, conventional analog computing
circuits cannot be easily mapped across different process nodes due to
differences in transistor biasing regimes, temperature variations and limited
dynamic range. In this work, we generalize the previously reported
margin-propagation-based analog computing framework for designing novel
\textit{shape-based analog computing} (S-AC) circuits that can be easily
cross-mapped across different process nodes. Similar to digital designs S-AC
designs can also be scaled for precision, speed, and power. As a
proof-of-concept, we show several examples of S-AC circuits implementing
mathematical functions that are commonly used in machine learning (ML)
architectures. Using circuit simulations we demonstrate that the circuit
input/output characteristics remain robust when mapped from a planar CMOS 180nm
process to a FinFET 7nm process. Also, using benchmark datasets we demonstrate
that the classification accuracy of a S-AC based neural network remains robust
when mapped across the two processes and to changes in temperature.
