Improving Unsupervised Defect Segmentation by Applying Structural
  Similarity to Autoencoders
  Convolutional autoencoders have emerged as popular methods for unsupervised
defect segmentation on image data. Most commonly, this task is performed by
thresholding a pixel-wise reconstruction error based on an $\ell^p$ distance.
This procedure, however, leads to large residuals whenever the reconstruction
encompasses slight localization inaccuracies around edges. It also fails to
reveal defective regions that have been visually altered when intensity values
stay roughly consistent. We show that these problems prevent these approaches
from being applied to complex real-world scenarios and that it cannot be easily
avoided by employing more elaborate architectures such as variational or
feature matching autoencoders. We propose to use a perceptual loss function
based on structural similarity which examines inter-dependencies between local
image regions, taking into account luminance, contrast and structural
information, instead of simply comparing single pixel values. It achieves
significant performance gains on a challenging real-world dataset of
nanofibrous materials and a novel dataset of two woven fabrics over the state
of the art approaches for unsupervised defect segmentation that use pixel-wise
reconstruction error metrics.
