Polylogarithmic width suffices for gradient descent to achieve
  arbitrarily small test error with shallow ReLU networks
  Recent theoretical work has guaranteed that overparameterized networks
trained by gradient descent achieve arbitrarily low training error, and
sometimes even low test error. The required width, however, is always
polynomial in at least one of the sample size $n$, the (inverse) target error
$1/\epsilon$, and the (inverse) failure probability $1/\delta$. This work shows
that $\widetilde{\Theta}(1/\epsilon)$ iterations of gradient descent with
$\widetilde{\Omega}(1/\epsilon^2)$ training examples on two-layer ReLU networks
of any width exceeding $\mathrm{polylog}(n,1/\epsilon,1/\delta)$ suffice to
achieve a test misclassification error of $\epsilon$. We also prove that
stochastic gradient descent can achieve $\epsilon$ test error with
polylogarithmic width and $\widetilde{\Theta}(1/\epsilon)$ samples. The
analysis relies upon the separation margin of the limiting kernel, which is
guaranteed positive, can distinguish between true labels and random labels, and
can give a tight sample-complexity analysis in the infinite-width setting
