Physical-Layer Supervised Learning Assisted by an Entangled Sensor
  Network
  Many existing quantum supervised learning (SL) schemes consider data given a
priori in a classical description. With only noisy intermediate-scale quantum
(NISQ) devices available in the near future, their quantum speedup awaits the
development of quantum random access memories (qRAMs) and fault-tolerant
quantum computing. There, however, also exist a multitude of SL tasks whose
data are acquired by sensors, e.g., pattern classification based on data
produced by imaging sensors. Solving such SL tasks naturally requires an
integrated approach harnessing tools from both quantum sensing and quantum
computing. We introduce supervised learning assisted by an entangled sensor
network (SLAEN) as a means to carry out SL tasks at the physical layer. The
entanglement shared by the sensors in SLAEN boosts the performance of
extracting global features of the object under investigation. We leverage SLAEN
to construct an entanglement-assisted support-vector machine for data
classification and entanglement-assisted principal component analyzer for data
compression. In both schemes, variational circuits are employed to seek the
optimum entangled probe states and measurement settings to maximize the
entanglement-enabled {enhancement}. We observe that SLAEN enjoys an appreciable
entanglement-enabled performance gain, even in the presence of loss, over
conventional strategies in which classical data are acquired by separable
sensors and subsequently processed by classical SL algorithms. SLAEN is
realizable with available technology, opening a viable route toward building
NISQ devices that offer unmatched performance beyond what the optimum classical
device is able to afford.
