Using Machine Learning for Anomaly Detection on a System-on-Chip under
  Gamma Radiation
  The emergence of new nanoscale technologies has imposed significant
challenges to designing reliable electronic systems in radiation environments.
A few types of radiation like Total Ionizing Dose (TID) effects often cause
permanent damages on such nanoscale electronic devices, and current
state-of-the-art technologies to tackle TID make use of expensive
radiation-hardened devices. This paper focuses on a novel and different
approach: using machine learning algorithms on consumer electronic level Field
Programmable Gate Arrays (FPGAs) to tackle TID effects and monitor them to
replace before they stop working. This condition has a research challenge to
anticipate when the board results in a total failure due to TID effects. We
observed internal measurements of the FPGA boards under gamma radiation and
used three different anomaly detection machine learning (ML) algorithms to
detect anomalies in the sensor measurements in a gamma-radiated environment.
The statistical results show a highly significant relationship between the
gamma radiation exposure levels and the board measurements. Moreover, our
anomaly detection results have shown that a One-Class Support Vector Machine
with Radial Basis Function Kernel has an average Recall score of 0.95. Also,
all anomalies can be detected before the boards stop working.
