A Family of Maximum Margin Criterion for Adaptive Learning
  In recent years, pattern analysis plays an important role in data mining and
recognition, and many variants have been proposed to handle complicated
scenarios. In the literature, it has been quite familiar with high
dimensionality of data samples, but either such characteristics or large data
have become usual sense in real-world applications. In this work, an improved
maximum margin criterion (MMC) method is introduced firstly. With the new
definition of MMC, several variants of MMC, including random MMC, layered MMC,
2D^2 MMC, are designed to make adaptive learning applicable. Particularly, the
MMC network is developed to learn deep features of images in light of simple
deep networks. Experimental results on a diversity of data sets demonstrate the
discriminant ability of proposed MMC methods are compenent to be adopted in
complicated application scenarios.
