A Continual Learning Framework for Adaptive Defect Classification and
  Inspection
  Machine-vision-based defect classification techniques have been widely
adopted for automatic quality inspection in manufacturing processes. This
article describes a general framework for classifying defects from high volume
data batches with efficient inspection of unlabelled samples. The concept is to
construct a detector to identify new defect types, send them to the inspection
station for labelling, and dynamically update the classifier in an efficient
manner that reduces both storage and computational needs imposed by data
samples of previously observed batches. Both a simulation study on image
classification and a case study on surface defect detection via 3D point clouds
are performed to demonstrate the effectiveness of the proposed method.
