Anomaly Detection of Defect using Energy of Point Pattern Features
  within Random Finite Set Framework
  In this paper, we propose an efficient approach for industrial defect
detection that is modeled based on anomaly detection using point pattern data.
Most recent works use \textit{global features} for feature extraction to
summarize image content. However, global features are not robust against
lighting and viewpoint changes and do not describe the image's geometrical
information to be fully utilized in the manufacturing industry. To the best of
our knowledge, we are the first to propose using transfer learning of
local/point pattern features to overcome these limitations and capture
geometrical information of the image regions. We model these local/point
pattern features as a random finite set (RFS). In addition we propose RFS
energy, in contrast to RFS likelihood as anomaly score. The similarity
distribution of point pattern features of the normal sample has been modeled as
a multivariate Gaussian. Parameters learning of the proposed RFS energy does
not require any heavy computation. We evaluate the proposed approach on the
MVTec AD dataset, a multi-object defect detection dataset. Experimental results
show the outstanding performance of our proposed approach compared to the
state-of-the-art methods, and the proposed RFS energy outperforms the
state-of-the-art in the few shot learning settings.
