Testability-Aware Low Power Controller Design with Evolutionary Learning
  XORNet-based low power controller is a popular technique to reduce circuit
transitions in scan-based testing. However, existing solutions construct the
XORNet evenly for scan chain control, and it may result in sub-optimal
solutions without any design guidance. In this paper, we propose a novel
testability-aware low power controller with evolutionary learning. The XORNet
generated from the proposed genetic algorithm (GA) enables adaptive control for
scan chains according to their usages, thereby significantly improving XORNet
encoding capacity, reducing the number of failure cases with ATPG and
decreasing test data volume. Experimental results indicate that under the same
control bits, our GA-guided XORNet design can improve the fault coverage by up
to 2.11%. The proposed GA-guided XORNets also allows reducing the number of
control bits, and the total testing time decreases by 20.78% on average and up
to 47.09% compared to the existing design without sacrificing test coverage.
