Increasing Depth Leads to U-Shaped Test Risk in Over-parameterized
  Convolutional Networks
  Recent works have demonstrated that increasing model capacity through width
in over-parameterized neural networks leads to a decrease in test risk. For
neural networks, however, model capacity can also be increased through depth,
yet understanding the impact of increasing depth on test risk remains an open
question. In this work, we demonstrate that the test risk of over-parameterized
convolutional networks is a U-shaped curve (i.e. monotonically decreasing, then
increasing) with increasing depth. We first provide empirical evidence for this
phenomenon via image classification experiments using both ResNets and the
convolutional neural tangent kernel (CNTK). We then present a novel linear
regression framework for characterizing the impact of depth on test risk, and
show that increasing depth leads to a U-shaped test risk for the linear CNTK.
In particular, we prove that the linear CNTK corresponds to a depth-dependent
linear transformation on the original space and characterize properties of this
transformation. We then analyze over-parameterized linear regression under
arbitrary linear transformations and, in simplified settings, provably identify
the depths which minimize each of the bias and variance terms of the test risk.
