Ultrametric Fitting by Gradient Descent
  We study the problem of fitting an ultrametric distance to a dissimilarity
graph in the context of hierarchical cluster analysis. Standard hierarchical
clustering methods are specified procedurally, rather than in terms of the cost
function to be optimized. We aim to overcome this limitation by presenting a
general optimization framework for ultrametric fitting. Our approach consists
of modeling the latter as a constrained optimization problem over the
continuous space of ultrametrics. So doing, we can leverage the simple, yet
effective, idea of replacing the ultrametric constraint with a min-max
operation injected directly into the cost function. The proposed reformulation
leads to an unconstrained optimization problem that can be efficiently solved
by gradient descent methods. The flexibility of our framework allows us to
investigate several cost functions, following the classic paradigm of combining
a data fidelity term with a regularization. While we provide no theoretical
guarantee to find the global optimum, the numerical results obtained over a
number of synthetic and real datasets demonstrate the good performance of our
approach with respect to state-of-the-art agglomerative algorithms. This makes
us believe that the proposed framework sheds new light on the way to design a
new generation of hierarchical clustering methods. Our code is made publicly
available at \url{https://github.com/PerretB/ultrametric-fitting}.
