Configuration and Collection Factors for Side-Channel Disassembly
  Myriad uses, methodologies, and channels have been explored for side-channel
analysis. However, specific implementation considerations are often
unpublished. This paper explores select test configuration and collection
parameters, such as input voltage, shunt resistance, sample rate, and
microcontroller clock frequency, along with their impact on side-channel
analysis performance. The analysis use case considered is instruction
disassembly and classification using the microcontroller power side-channel. An
ATmega328P microcontroller and a subset of the AVR instruction set are used in
the experiments as the Device Under Test (DUT). A time-series convolutional
neural network (CNN) is used to evaluate classification performance at
clock-cycle fidelity. We conclude that configuration and collection parameters
have a meaningful impact on performance, especially where the
instruction-trace's signal to noise ratio (SNR) is impacted. Additionally, data
collection and analysis well above the Nyquist rate is required for
side-channel disassembly. We also found that 7V input voltage with 1 kiloohm
shunt and a sample rate of 250-500 MSa/s provided optimal performance in our
application, with diminishing returns or in some cases degradation at higher
levels.
