An Automated Scanning Transmission Electron Microscope Guided by Sparse
  Data Analytics
  Artificial intelligence (AI) promises to reshape scientific inquiry and
enable breakthrough discoveries in areas such as energy storage, quantum
computing, and biomedicine. Scanning transmission electron microscopy (STEM), a
cornerstone of the study of chemical and materials systems, stands to benefit
greatly from AI-driven automation. However, present barriers to low-level
instrument control, as well as generalizable and interpretable feature
detection, make truly automated microscopy impractical. Here, we discuss the
design of a closed-loop instrument control platform guided by emerging sparse
data analytics. We demonstrate how a centralized controller, informed by
machine learning combining limited $a$ $priori$ knowledge and task-based
discrimination, can drive on-the-fly experimental decision-making. This
platform unlocks practical, automated analysis of a variety of material
features, enabling new high-throughput and statistical studies.
