Ray-based framework for state identification in quantum dot devices
  Quantum dots (QDs) defined with electrostatic gates are a leading platform
for a scalable quantum computing implementation. However, with increasing
numbers of qubits, the complexity of the control parameter space also grows.
Traditional measurement techniques, relying on complete or near-complete
exploration via two-parameter scans (images) of the device response, quickly
become impractical with increasing numbers of gates. Here we propose to
circumvent this challenge by introducing a measurement technique relying on
one-dimensional projections of the device response in the multidimensional
parameter space. Dubbed the ``ray-based classification (RBC) framework,'' we
use this machine learning approach to implement a classifier for QD states,
enabling automated recognition of qubit-relevant parameter regimes. We show
that RBC surpasses the 82 % accuracy benchmark from the experimental
implementation of image-based classification techniques from prior work while
reducing the number of measurement points needed by up to 70 %. The reduction
in measurement cost is a significant gain for time-intensive QD measurements
and is a step forward toward the scalability of these devices. We also discuss
how the RBC-based optimizer, which tunes the device to a multiqubit regime,
performs when tuning in the two-dimensional and three-dimensional parameter
spaces defined by plunger and barrier gates that control the QDs.This work
provides experimental validation of both efficient state identification and
optimization with machine learning techniques for non-traditional measurements
in quantum systems with high-dimensional parameter spaces and time-intensive
measurements.
