Trimming Feature Extraction and Inference for MCU-based Edge NILM: a
  Systematic Approach
  Non-Intrusive Load Monitoring (NILM) enables the disaggregation of the global
power consumption of multiple loads, taken from a single smart electrical
meter, into appliance-level details. State-of-the-Art approaches are based on
Machine Learning methods and exploit the fusion of time- and frequency-domain
features from current and voltage sensors. Unfortunately, these methods are
compute-demanding and memory-intensive. Therefore, running low-latency NILM on
low-cost, resource-constrained MCU-based meters is currently an open challenge.
This paper addresses the optimization of the feature spaces as well as the
computational and storage cost reduction needed for executing State-of-the-Art
(SoA) NILM algorithms on memory- and compute-limited MCUs. We compare four
supervised learning techniques on different classification scenarios and
characterize the overall NILM pipeline's implementation on a MCU-based Smart
Measurement Node. Experimental results demonstrate that optimizing the feature
space enables edge MCU-based NILM with 95.15% accuracy, resulting in a small
drop compared to the most-accurate feature vector deployment (96.19%) while
achieving up to 5.45x speed-up and 80.56% storage reduction. Furthermore, we
show that low-latency NILM relying only on current measurements reaches almost
80% accuracy, allowing a major cost reduction by removing voltage sensors from
the hardware design.
