Deep Metric Learning-Based Semi-Supervised Regression With Alternate
  Learning
  This paper introduces a novel deep metric learning-based semi-supervised
regression (DML-S2R) method for parameter estimation problems. The proposed
DML-S2R method aims to mitigate the problems of insufficient amount of labeled
samples without collecting any additional samples with target values. To this
end, the proposed DML-S2R method is made up of two main steps: i) pairwise
similarity modeling with scarce labeled data; and ii) triplet-based metric
learning with abundant unlabeled data. The first step aims to model pairwise
sample similarities by using a small number of labeled samples. This is
achieved by estimating the target value differences of labeled samples with a
Siamese neural network (SNN). The second step aims to learn a triplet-based
metric space (in which similar samples are close to each other and dissimilar
samples are far apart from each other) when the number of labeled samples is
insufficient. This is achieved by employing the SNN of the first step for
triplet-based deep metric learning that exploits not only labeled samples but
also unlabeled samples. For the end-to-end training of DML-S2R, we investigate
an alternate learning strategy for the two steps. Due to this strategy, the
encoded information in each step becomes a guidance for learning the other
step. The experimental results confirm the success of DML-S2R compared to the
state-of-the-art semi-supervised regression methods. The code of the proposed
method is publicly available at https://git.tu-berlin.de/rsim/DML-S2R.
