Ray-based classification framework for high-dimensional data
  While classification of arbitrary structures in high dimensions may require
complete quantitative information, for simple geometrical structures,
low-dimensional qualitative information about the boundaries defining the
structures can suffice. Rather than using dense, multi-dimensional data, we
propose a deep neural network (DNN) classification framework that utilizes a
minimal collection of one-dimensional representations, called \emph{rays}, to
construct the "fingerprint" of the structure(s) based on substantially reduced
information. We empirically study this framework using a synthetic dataset of
double and triple quantum dot devices and apply it to the classification
problem of identifying the device state. We show that the performance of the
ray-based classifier is already on par with traditional 2D images for low
dimensional systems, while significantly cutting down the data acquisition
cost.
