Machine Learning Clustering Techniques for Selective Mitigation of
  Critical Design Features
  Selective mitigation or selective hardening is an effective technique to
obtain a good trade-off between the improvements in the overall reliability of
a circuit and the hardware overhead induced by the hardening techniques.
Selective mitigation relies on preferentially protecting circuit instances
according to their susceptibility and criticality. However, ranking circuit
parts in terms of vulnerability usually requires computationally intensive
fault-injection simulation campaigns. This paper presents a new methodology
which uses machine learning clustering techniques to group flip-flops with
similar expected contributions to the overall functional failure rate, based on
the analysis of a compact set of features combining attributes from static
elements and dynamic elements. Fault simulation campaigns can then be executed
on a per-group basis, significantly reducing the time and cost of the
evaluation. The effectiveness of grouping similar sensitive flip-flops by
machine learning clustering algorithms is evaluated on a practical
example.Different clustering algorithms are applied and the results are
compared to an ideal selective mitigation obtained by exhaustive
fault-injection simulation.
