High Frequency EEG Artifact Detection with Uncertainty via Early Exit
  Paradigm
  Electroencephalography (EEG) is crucial for the monitoring and diagnosis of
brain disorders. However, EEG signals suffer from perturbations caused by
non-cerebral artifacts limiting their efficacy. Current artifact detection
pipelines are resource-hungry and rely heavily on hand-crafted features.
Moreover, these pipelines are deterministic in nature, making them unable to
capture predictive uncertainty. We propose E4G, a deep learning framework for
high frequency EEG artifact detection. Our framework exploits the early exit
paradigm, building an implicit ensemble of models capable of capturing
uncertainty. We evaluate our approach on the Temple University Hospital EEG
Artifact Corpus (v2.0) achieving state-of-the-art classification results. In
addition, E4G provides well-calibrated uncertainty metrics comparable to
sampling techniques like Monte Carlo dropout in just a single forward pass. E4G
opens the door to uncertainty-aware artifact detection supporting
clinicians-in-the-loop frameworks.
