Few-shot Learning via Dependency Maximization and Instance Discriminant
  Analysis
  We study the few-shot learning (FSL) problem, where a model learns to
recognize new objects with extremely few labeled training data per category.
Most of previous FSL approaches resort to the meta-learning paradigm, where the
model accumulates inductive bias through learning many training tasks so as to
solve a new unseen few-shot task. In contrast, we propose a simple approach to
exploit unlabeled data accompanying the few-shot task for improving few-shot
performance. Firstly, we propose a Dependency Maximization method based on the
Hilbert-Schmidt norm of the cross-covariance operator, which maximizes the
statistical dependency between the embedded feature of those unlabeled data and
their label predictions, together with the supervised loss over the support
set. We then use the obtained model to infer the pseudo-labels for those
unlabeled data. Furthermore, we propose anInstance Discriminant Analysis to
evaluate the credibility of each pseudo-labeled example and select the most
faithful ones into an augmented support set to retrain the model as in the
first step. We iterate the above process until the pseudo-labels for the
unlabeled data becomes stable. Following the standard transductive and
semi-supervised FSL setting, our experiments show that the proposed method
out-performs previous state-of-the-art methods on four widely used benchmarks,
including mini-ImageNet, tiered-ImageNet, CUB, and CIFARFS.
