Test-Time Adaptation to Distribution Shift by Confidence Maximization
  and Input Transformation
  Deep neural networks often exhibit poor performance on data that is unlikely
under the train-time data distribution, for instance data affected by
corruptions. Previous works demonstrate that test-time adaptation to data
shift, for instance using entropy minimization, effectively improves
performance on such shifted distributions. This paper focuses on the fully
test-time adaptation setting, where only unlabeled data from the target
distribution is required. This allows adapting arbitrary pretrained networks.
Specifically, we propose a novel loss that improves test-time adaptation by
addressing both premature convergence and instability of entropy minimization.
This is achieved by replacing the entropy by a non-saturating surrogate and
adding a diversity regularizer based on batch-wise entropy maximization that
prevents convergence to trivial collapsed solutions. Moreover, we propose to
prepend an input transformation module to the network that can partially undo
test-time distribution shifts. Surprisingly, this preprocessing can be learned
solely using the fully test-time adaptation loss in an end-to-end fashion
without any target domain labels or source domain data. We show that our
approach outperforms previous work in improving the robustness of publicly
available pretrained image classifiers to common corruptions on such
challenging benchmarks as ImageNet-C.
