Deep Learning based Intelligent Coin-tap Test for Defect Recognition
  The coin-tap test is a convenient and primary method for non-destructive
testing, while its manual on-site operation is tough and costly. With the help
of the latest intelligent signal processing method, convolutional neural
networks (CNN), we achieve an intelligent coin-tap test which exhibited
superior performance in recognizing the defects. However, this success of CNNs
relies on plenty of well-labeled data from the identical scenario, which could
be difficult to get for many real industrial practices. This paper further
develops transfer learning strategies for this issue, that is, to transfer the
model trained on data of one scenario to another. In experiments, the result
presents a notable improvement by using domain adaptation and pseudo label
learning strategies. Hence, it becomes possible to apply the model into
scenarios with none or little (less than 10\%) labeled data adopting the
transfer learning strategies proposed herein. In addition, we used a benchmark
dataset constructed ourselves throughout this study. This benchmark dataset for
the coin-tap test containing around 100,000 sound signals is published at
https://github.com/PPhub-hy/torch-tapnet.
