Supervised Learning with Quantum Measurements
  This paper reports a novel method for supervised machine learning based on
the mathematical formalism that supports quantum mechanics. The method uses
projective quantum measurement as a way of building a prediction function.
Specifically, the relationship between input and output variables is
represented as the state of a bipartite quantum system. The state is estimated
from training samples through an averaging process that produces a density
matrix. Prediction of the label for a new sample is made by performing a
projective measurement on the bipartite system with an operator, prepared from
the new input sample, and applying a partial trace to obtain the state of the
subsystem representing the output. The method can be seen as a generalization
of Bayesian inference classification and as a type of kernel-based learning
method. One remarkable characteristic of the method is that it does not require
learning any parameters through optimization. We illustrate the method with
different 2-D classification benchmark problems and different quantum
information encodings.
