Deep Reinforcement Learning for Efficient Measurement of Quantum Devices
  Deep reinforcement learning is an emerging machine learning approach which
can teach a computer to learn from their actions and rewards similar to the way
humans learn from experience. It offers many advantages in automating decision
processes to navigate large parameter spaces. This paper proposes a novel
approach to the efficient measurement of quantum devices based on deep
reinforcement learning. We focus on double quantum dot devices, demonstrating
the fully automatic identification of specific transport features called bias
triangles. Measurements targeting these features are difficult to automate,
since bias triangles are found in otherwise featureless regions of the
parameter space. Our algorithm identifies bias triangles in a mean time of less
than 30 minutes, and sometimes as little as 1 minute. This approach, based on
dueling deep Q-networks, can be adapted to a broad range of devices and target
transport features. This is a crucial demonstration of the utility of deep
reinforcement learning for decision making in the measurement and operation of
quantum devices.
