DeepTPI: Test Point Insertion with Deep Reinforcement Learning
  Test point insertion (TPI) is a widely used technique for testability
enhancement, especially for logic built-in self-test (LBIST) due to its
relatively low fault coverage. In this paper, we propose a novel TPI approach
based on deep reinforcement learning (DRL), named DeepTPI. Unlike previous
learning-based solutions that formulate the TPI task as a supervised-learning
problem, we train a novel DRL agent, instantiated as the combination of a graph
neural network (GNN) and a Deep Q-Learning network (DQN), to maximize the test
coverage improvement. Specifically, we model circuits as directed graphs and
design a graph-based value network to estimate the action values for inserting
different test points. The policy of the DRL agent is defined as selecting the
action with the maximum value. Moreover, we apply the general node embeddings
from a pre-trained model to enhance node features, and propose a dedicated
testability-aware attention mechanism for the value network. Experimental
results on circuits with various scales show that DeepTPI significantly
improves test coverage compared to the commercial DFT tool. The code of this
work is available at https://github.com/cure-lab/DeepTPI.
