An Encoder-Decoder Based Approach for Anomaly Detection with Application
  in Additive Manufacturing
  We present a novel unsupervised deep learning approach that utilizes the
encoder-decoder architecture for detecting anomalies in sequential sensor data
collected during industrial manufacturing. Our approach is designed not only to
detect whether there exists an anomaly at a given time step, but also to
predict what will happen next in the (sequential) process. We demonstrate our
approach on a dataset collected from a real-world testbed. The dataset contains
images collected under both normal conditions and synthetic anomalies. We show
that the encoder-decoder model is able to identify the injected anomalies in a
modern manufacturing process in an unsupervised fashion. In addition, it also
gives hints about the temperature non-uniformity of the testbed during
manufacturing, which is what we are not aware of before doing the experiment.
