Deep Haar Scattering Networks in Pattern Recognition: A promising
  approach
  The aim of this paper is to discuss the use of Haar scattering networks,
which is a very simple architecture that naturally supports a large number of
stacked layers, yet with very few parameters, in a relatively broad set of
pattern recognition problems, including regression and classification tasks.
This architecture, basically, consists of stacking convolutional filters, that
can be thought as a generalization of Haar wavelets, followed by non-linear
operators which aim to extract symmetries and invariances that are later fed in
a classification/regression algorithm. We show that good results can be
obtained with the proposed method for both kind of tasks. We have outperformed
the best available algorithms in 4 out of 18 important data classification
problems, and have obtained a more robust performance than ARIMA and ETS time
series methods in regression problems for data with strong periodicities.
