name: LEE
full_form: Laptop Embedded Equipment
context: Considering the methodology described in clause 5.1, Test Tolerance values for OTA ACLR were derived based on values captured in clause 11.3.7. For FR1: - For relative ACLR, the TT was agreed to be the same as the MU. - For absolute ACLR, the TT was agreed to be 0 dB. For FR2: The TT was agreed to be the same as the MU. Frequency range specific Test Tolerance values for the OTA ACLR test are defined in tables 11.3.8-1 to 11.3.8-4. Table 11.3.8-1: Test Tolerance values for the absolute OTA ACLR, Normal test conditions, FR1 Table 11.3.8-2: Test Tolerance values for the relative OTA ACLR, Normal test conditions, FR1 Table 11.3.8-3: Test Tolerance values for the absolute OTA ACLR, Normal test conditions, FR2 Table 11.3.8-4: Test Tolerance values for the relative OTA ACLR, Normal test conditions, FR2 An overview of the TT values for all the requirements is captured in clause 18.
description: Laptop Embedded Equipment (LEE) refers to a type of user equipment that is embedded within laptops, used for wireless communication. The context highlights the performance requirements for LEE devices in terms of Total Radiated Power (TRP) for various scenarios such as speech position and data transfer position.
explanation: The abbreviation 'LEE' is classified under UE (User Equipment) because it refers to a specific type of device that is used by end-users for wireless communication. The context mentions LEE devices in relation to performance requirements, which further supports its classification as a user equipment.
section_title: B.2		Total Radiated Power
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