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The Jenny Brook Stage in its New Location
The Jenny Brook Bluegrass Festival will begin its tenth season on Wednesday, June 16th with a covered dish supper and barn dance at 6:00 PM. The formal festival will begin Thursday afternoon at 5:30 PM and run through Sunday the 20th with a full lineup of national, regional, and local bands, including a "surprise" band to close on Sunday afternoon. Last year the Jenny Brook stage was moved from its previous location in Weston, VT to the more spacious and versatile World's Fair Grounds in Tunbridge, VT. The larger and more flexible fair grounds are located in a lovely rural valley in central Vermont made easily accessible by its proximity to both I-89 and I-91. This medium sized event now has room to grow, and has already shown that it can offer the full range of activities expected at a festival along with a few extra bells and whistles. The setting is one of the most beautiful in New England. Promoters Candi and Seth Sawyer have worked hard to develop this event and their effort shows in every element of the festival.
Candi and Seth Sawyer
The Lineup
Seldom Scene
Founded in 1971, Seldom Scene established itself as a cutting edge band that used bluegrass instruments and sounds to bring the contemporary sounds of folk and rock music into the genre. While banjo player Ben Eldridge is the only remaining original player, the addition of Dudley Connell, brings his commitment to traditional music as shown in The Johnson Mountain Boys along with energy and infectious enthusiasm to the band. Lou Reid, of Lou Reid and Carolina as well as a member of several earlier ground breaking bands, on mandolin and singing tenor is always strong. Ronnie Simpkins on bass and Fred Travers on Dobro bring forward an exceptional ensemble.
Dudley Connell
Ben Eldridge
In addition to his performance with Seldom Scene, Dudley Connell will pair with traditional singer/mandolinist Don Rigsby for a single set on Friday evening. Rigsby has recently returned to full time touring after spending several years as director of the traditional music program at Morehead State University in Kentucky. Rigsby has been a member of The Bluegrass Cardinals, J.D. Crowe and the New South, The Lonesome River Band, and superband Longview and has been nominated for and won numerous awards including Grammys, SPBGMA, and IBMA recognition. In combination, this duet is powerful and entertaining. Connell and Rigsby have recorded two projects together.
Don Rigsby
The Gibson Brothers
The Gibson Brothers are a perennial favorite at Jenny Brook who will be back on Saturday for two sets, including their closing one, which can last until they are forced to quit. With their new CD "Ring the Bell" and its title song both of topping the Bluegrass Unlimited charts for months this year, the Gibson's will bring not only their fine singing and song writing, but the hopes of many that they will be rewarded for their excellence at IBMA this year. With Clayton Campbell on fiddle, Mike Barber on bass, and Joe Walsh (whose second solo CD is due out soon) on mandolin, this band is strong at every instrument, providing more than support for the famed brother harmonies of Eric and Leigh. This band is at the very top of its game and will surely please even the most discriminating bluegrass fans with their performance and delightful personalities.
Eric and Leigh Gibson
Grasstowne was formed three years ago as three storied musicians (Alan Bibey, Steve Gulley, and Phil Leadbetter) formed a new band. Phil has since moved on, but the addition of Adam Haynes on fiddle (James King Band, Larry Stephenson, Doyle Lawson & Quicksilver) and Justin Jenkins (Blue Moon Rising) on banjo have more than filled in the holes. Each is an experienced player and Haynes adds vocal versatility to the band. Alan Bibey is recognized as one of the world's premier mandolin players. Steve Gulley, formerly of Mountain Heart, has a soulful, powerful singing voice that provides strong leads and tenor harmonies. Grasstowne has not had broad exposure in the northeast, but attendees at Jenny Brook should expect a first class performance.
Alan Bibey
Steve Gulley
Adam Haynes
The Tennessee Mafia Jug BandLeRoy Troy and the Tennessee Mafia Jug Band have become favorites at Jenny Brook and will be performing during the first three days. Troy is an inventive and hilarious performer bringing his admiration for the old time music and routines of Uncle Dave Macon along with a first rate band playing old time, classic country, and bluegrass. Viewers are captivated by his gyrations with the open back banjo, twirling and swinging it like a pendulum as he plays, as well as the polished quality of the entire band's performance. In addition to seeing this band on stage, they can frequently be found around the campground in jamming groups. They can also be seen regularly on cable and satellite channel RFD-TV.
LeRoy Troy
Audie Blaylock & Redline
Audie Blaylock will be returning for his second year at Jenny Brook. Last year he appeared on Sunday afternoon, so many people who might have enjoyed his energetic set weren't there. This year he'll be in strong spots in Saturday's lineup and should provide a pleasing show.
Summertown Road
A new band from Kentucky, Summertown Road has recently released their first CD on Rounder Records. A year ago a review gave them a mixed notice, especially touting their instrumental quality, but they were fresh out of the box. A year later, a video on their web site suggests they have a good deal to offer in their mixed show of classic bluegrass covers and original material.
Zach Rambo, Randy Thomas, Jack Hicks, Bo Isaac
Photo from Summertown Road MySpace Page
Smokey Greene retired several years ago and then kept right on touring. He'll be at Jenny Brook all four days with his combination of witty novelty songs and classic country often featuring Ernest Tubb songs. His solo act with his battered old guitar "Ben A. Martin" is a favorite of many people. Acoustic Blue is a first rate regional band featuring good singing and a variety of newer covers along with material written within the band. They're entertaining and musically interesting. I haven't heard The Hemingway Brothers yet, but they advertise themselves as a hard driving traditional cover band playing bluegrass classics. All told, Jenny Brook this year has a strong lineup. It'll be worth staying through Sunday to see what Candi has in mind for her closing surprise.
Smokey Greene
Acoustic Blue
The Gazebo Stage and Kids AcademyFrom the Jenny Brook store to several comprehensive vendors through to the Sugar Shack, staffed by the local maple producers and serving wonderful breakfasts as well as a range of maple products, the Jenny Brook vendors offer good fair food and more wholesome meals at generally reasonable prices.
Regular attendees at Jenny Brook have watched young banjo picker Michelle Canning grow up as a member of the Kids Academy. Last year she distinguished herself with a solo performance at the newly incorporated Gazebo Stage, located near the rear of the fair grounds. This year Michelle will host band and individual showcases at the Grass Seeds Gazebo Stage. While it's not necessary, it would be helpful if those wishing to perform there would notify Michelle at the the link above.
Once again, guitarist and teacher Tony Watt, with the assistance of Sam Stambler will be directing the Jenny Brook kids academy. This free program will include two days of teaching and rehearsals along with a performance from the Jenny Brook stage on Sunday around noon. While pre-registration is not require, it would help Tony prepare to know what kids will be attending. Get in touch with him here.
Tony Watt at Kids Academy Rehearsal
Kids Academy Performance
EA variety of interesting workshops will be held on both Friday and Saturday. Located in an animal show area toward the back of the fairgrounds, the workshop "stage" is a cozy and comfortable place for interested people to interact with and learn from skilled professionals who have much to teach. Please try to remember that workshops are designed to help you learn from a professional rather than for you to try to impress them with your skills.
The Gibson Brothers Present Song Writing Workshop
|Running the Sound Board with Harry Grant
|Old Time Dobro with Jim Warren
|Clawhammer or Frailing Banjo with Leroy Troy
|Jug History and Stories with Lester & Mike Armistead
|Banjo with Jack Hicks
|Mandolin with Alan Bibey
|Songwriting with Steve Gulley
|Guitar with Audie Blaylock
How to Get to Jenny Brook
View Larger Map
2010 is the tenth anniversary of the Jenny Brook Bluegrass Festival. Candi and Seth Sawyer have persevered in presenting and building this festival despite family challenges that would have crippled most people. Attendees this year can expect some surprises along with the usual mixture of fine music, a welcoming environment, friendly people, and great jamming. See you there!
Seth Sawyer
Candi Sawyer


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If you always look out for some beautiful jewellery that's unique and in-style, if the regular jewellers shop gives you chill. And you are constantly look out for jewellery designers that amaze you by their extra ordinary collection, then this article is for you as we tell you top 3 Instagram Jewellery brands that will take away your heart. They are new, in-fashion and will definitely take our jewellery game to next level. Scroll down and start buying.
#1 shopnimai
Nimai is a first of its kind jewellery brand which features artist from different parts of the country. Their collection is unique and beautiful. If you are looking for something chic, they will give you a wide range of statement pieces.
#2 Zariinjewelry
Just have look at their collection once you will have a major crush on it. We are totally in love with their pearl kissed redux collection. This brand is perfect for the fashion forward women. It's a renowned brand famous for it's unique craftsmanship.
#3 Ikroop
This brand is famous for its contemporary jewellery and artwork using glass. It has a nice contemporary collection, worth buying.

subset: commoncrawl


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Monday, May 10, 2010
My second attempt with fondant. Since they messed up on the schedualing of the Wilton 3 class at my local craft store I decided to just do some experimenting on my own. My Wilton fondant was all dried up and crumbly so I found a local bakery supply store in Murray. I was so excited to know we had one not too far away. So before I ran out of steam I went over and picked up some new professional fondant, Choco-Pan. Its white chocolate flavored so it is really pretty good. I still had some trouble working with it because the sides of it were all dried up and not pliable. Luckily my order of Satin Ice fondant just arrived, and I've heard it is the best. So far it looks pretty soft so I'm excited to try working with it. Overall I think this cake turned out alright, I had a lot of problems with the fondant sticking to the table and tearing. Also the laying of the fondant was a little lumpy, probably because I did not use enough icing underneath and it was dry. I like the strawberries on the cake though.
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Sunday, 15 January 2012
Barefoot & Liberty
I was honoured to be approached a while back by a very talented quilt maker (and cake maker!) to design her a logo for her company "Barefoot & Liberty". Her inspiration is drawn from the beauty around her and of the 1940s-1950s era. Her quilts are stunning, with so much love and time put into them, she even makes personal commissioned ones on request.
If you are ever looking for a lovely gift for yourself or perhaps someones first home, visit Agnes and see if she can add your own magic into a piece.
Her Etsy site is now up and running, but she is the nicest person out there so if you have any questions about commissions you will love talking to her as much as you will love her products!
Check out her goodies here.
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Recently, Dave, managed to dig up an old advertisement poster where the Canadian Government tried to encourage women to go west and get married with statements like "anything in skirts stands a chance". It of course reminded me of how different things are today. Women, for one would not stand for this kind of malarkey. We have all grown more mature as a global culture and are better educated on issues like etiquette, equality, respect and commitment. Yeah, right (sarcasm).
In today's mad rush of living, is there time for love, romance and family? Many people are finding it hard to cope. Some caring governments are once again entering the fray to help out and surely the award for the most "caring" government goes to Singapore.
Singaporean professionals are too busy spending more hours than there are in a day, just to achieve the minimum 5 C's required to enter the dating game. How are the poor dears ever going to find a match and get married? The super-caring Singapore Government has been in a huff and a puff over the fact that fewer citizens were getting married and many of them later in life. Even when married, the couples were not productive. According to statistics for 2002, Singaporean women give birth to 1.37 babies in a lifetime, down from 1.87 in 1990. Since a replacement level of 2.1 is required to keep a country's natural population stable, Prime Minister Goh Chok Tong elevated baby-making to a national priority. The concern was that the declining fertility rate would lead to economic crisis, increased security risk and political instability.
With admirable determination, the Singaporeans took action on bachelors and bachelorettes. In 1984, the Working Committee on Marriage and Procreation was formed with the task of increasing the birth-rate. Figuring that Singaporeans respond well to financial incentives, they introduced the "baby bonus' incentives. I do not have figures to show how successful this program was.
This did not solve the issue of fewer and later marriages. Thus the Social Development Unit or SDU was formed which came out with 70 recommendations for increasing baby production. SDU was to succeed where earlier efforts failed because they would tackle issues like dating and matchmaking because as was said earlier, hardworking Singaporeans do not have time for such distractions. SDU's efforts have earned them the nickname of Single, Desperate and Ugly.
Not swayed by such popular opinion, SDU went on to implement their plan which included compulsory dating courses in the first year of Universit, the "Love Boat Cruises" and the "Love Plane Flights" which include on-board lectures on seduction. The latter two, were subsidized holidays for singles and I believe, if any couple ended up getting married, the fare for the holiday was reimbursed.
Nowadays, Single, Desperate and Ugly hides behind their campaign brand of "Romancing Singapore" which organizes state-sponsored matchmaking events like speed dating (e.g. meet 6 guys/gals in 60 minutes), rock climbing for couples (an opportunity to get sweaty), love boat river race and midnight walks, just to name a few.
Singapore even has its own celebrity love guru, Dr. Wei, who also is known as Dr. Love. Dr. Love runs love cruises, Baby Planing Camps and was planning in 2004 to do an "edutainment" reality TV show called "Dr. Love's Super Baby-Making Show". This never materialized, perhaps because it went too far for "prudish" officials, despite Dr. Love's assurance that it would be done very clinically. Hmmm, very romantic indeed.
And has all this government plotting worked? In 2003, Durex did a sexual habits survey amongst 34 nations and Singapore ranked last for the second consecutive time. With Singaporeans reported having sex less than 8 times per month on average or 96 times per year. For the curious, it was the Hungarians, fortified with spicy paprika that took first place with 152 rolls in the hay per year.
Alas, so sad to see the fine efforts of Single Desperate and Ugly produce such poor results. Perhaps the expert readers in the blogosphere can give some advice on how we can avoid a movie entitled, "The Last of the Singaporeans".
"I am a Satire, yes?"


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Please read description carefully.
Do not base your order on the picture presented.
Description of the Good-Lite Texas Tumbling E Wide-spaced Distance Chart 10\'
Tumbling E distance chart with wide-spaced lines; line sizes range from 20/100 to 20/16 equivalent. Lines are labeled with 10' and 20' notations only. This chart can be used in Good-Lite's illuminated ESV1200, ESV1500, Model A+, Model A cabinet or hung on the wall. Chart size is 9" x 14" (22.9 cm x 35.6 cm).
This chart is recommended by the Texas Department of Public Health for vision testing and screening.
10 feet, 3 meters testing distance.
Medex SKU: GL-600722


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Thursday March 31 marked the First Annual American Society of Agronomy (ASA), Crop Science Society of America (CSSA), and Soil Science Society of America (SSSA) Graduate Students Congressional Visits Day on Capitol Hill. Eight graduate students traveled from around the country to meet with their Congressional delegations to talk about agronomic, crop, and soil science research and the importance of fellowships.
Kimberly Cline (University of Florida), Travis Conley (Texas Tech University), Janelle Donahue (University of Missouri), Darlene Florence (The Ohio State University), Ashley Harms (Kansas State University), Keith Merrill (Brigham Young University), Aaron Sindelar (University of Minnesota), and Bryan Stobaugh (University of Arkansas) had a full afternoon of meetings with members of Congress and their staff (please see pictures above). The event, sponsored by the ASA, CSSA, SSSA Science Policy Office and Member Services, was developed to provide an opportunity for ASA, CSSA, SSSA graduate students to participate in constituent advocacy for the sciences, as well as to learn about the United States' political process and system. Video footage from the Visits, including interviews with each student throughout the day, will be posted soon.
The delegation of ASA, CSSA, and SSSA Graduate Students who attended the 1st Annual Congressional Visits Day in Washington D.C., March 31, 2011
Ashley Harms, Bryan Stobaugh, and Janelle Donahue with Congressman Blaine Luetkemeyer (R-MO 9th).
Soil Scientist Darlene Florence with Senator Sherrod Brown (D-OH)
PhD Student, Aaron Sindelar with Senator Amy Klobuchar (D - MN)
Graduate students, Travis Conley and Kimberly Cline, Senator Mike Lee (R-UT), and UT Graduate Student, Keith Merrill


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by Chris MaGee
It was nearly a year ago that we reported on a pair of new films being produced for the Studio Ghibli Museum. Wed dropped the ball on the follow up on this story, we're sad to admit, as the first of these two, titled "Mr. Dough and the Egg Princess" got its premiere at the Museum, located in Mitaka, in November. "Mr. Dough and the Egg Princess" will soon end its run though and on June 4th the second film we reported on last year, "Treasure Hunting" will begin screening for visitors.
Anime News Network has got the details on this new 9-minute short which was overseen by Hayao Miyazaki himself. "Treasure Hunting" turns out to be an adaptation of a picture book by Rieko Nakagawa and Yuriko Yamawaki which tells the story of a boy named Yuji and a bunny named Gikku who compete against each other to see who can keep a stick they found. Like all Studio Ghibli shorts there are no clips of "Treasure Hunting" floating around to share with you, but there is the above promotional still that has come to us courtesy of the Ghibli Museum website. Guess you'll just have to get yourself to Mitaka to get a look at the short film this summer.
Saturday, April 23, 2011
New Ghibli Museum short film tells of competition between boy and bunny
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Graves County HS Alumni List
Last names starting with "A"
Select letter of last name to filter the alumni list
- Bell Adam
- Class of 2000 Brian Adams
- Class of 2009 Chet Adams
- Class of 1945 Patricia Adams
- Class of 2002 Stefanie Adams
- Class of 1972 Kimberly Adcock
- Corey Alderdice
- Class of 2004 Reed Alex
- Class of 2006 Sarah Alexander
- Class of 1986 Troy Alexander
- Class of 2011 Jerelle Allen
- Aaron Anderson
- Ryan Anderson
- Class of 2000 John Armstrong
- Creason Ashley
- Brandon Awberry
Looking for Graves County High School alumni not listed? If so, check out Classmates.com® - hundreds of more GCHS alumni have posted their profiles.
About the Graves County High School Alumni Directory
Check out all of the names of the Graves County High School alumni that attended high school in Mayfield that are listed above. Registering will allow you to join the directory. You can also find out what other graduates are doing now, share memories with other alumn, upload pictures from Graves County and find other alumni.


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Lynette Daniel is a widow and has two beautiful children. She owns Scrap That Moment, Central Illinois' largest scrapbooking store. She is a talented photographer, graphic designer and has been a nationally published scrapper since 2003. Lynette has had the privilege of working with over 20 scrapbooking manufacturers and is thrilled to design for Scrappin' Sports & More. In Lynette's spare time she coaches in city programs for kids, sponsors local sports teams, and photographs and writes editorials for different IL newspapers.
And now a little sample of her work :)
The first one is a gift tag on a bottle that says, "you been served."
Her nickname is "Net" and the tennis paper was her inspiration.
Below is a little Easter (basket) flower pot Lynette painted and put little football Easter chocolates & green skittles in the cardboard grass.


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So here goes round two of my smoky eye practice sessions. I am trying to minimize the time it takes to do the eye look for a video tutorial....but alas smoky looks take a while to create because they HAVE to be BLENDED out seamlessly....and let's be real ladies...BLACK does not blend easily... : )
Fingers crossed I'll get the video up tomorrow. (Yes I am getting very pale as well)
I started off with Too Faced Shadow Insurance Eyeshadow Primer all over my lid up to the brow bone. I applied NYX Jumbo Eye Pencil in Black all over my lid as my primary base. Sonia Kashuk Large Crease Brush
On the lid and crease I applied Rock & Republic Fatalistic Eye Color (matte black). Sigma Medium Angled Shading E70 Brush & Sonia Kashuk Large Crease Brush
Next on the inner lid and crease I applied Rock & Republic Electric Eye Color (shimmery blue). MAC 242 Shader Brush
On the inner tearduct area I applied MAC Grain Eyeshadow (frosty nude). MAC 239 Eye Shader Brush
On the browbone area and for blending I used MAC Wild By Nature Eyeshadow (matte camel). MAC Large 252 Shader Brush
For highlight I used MAC Ricepaper Eyeshadow (shimmery champagne). MAC Large 252 Shader Brush
For my lower lashline I used Rock & Republic Electric Eye Color (shimmery blue). MAC 242 Shader Brush
I lined my upper lashline with MUFE Aqua Black Waterproof Cream Eye Shadow (black). Sigma Eye Liner E05 Brush
I lined my lower waterline with L'Oreal HIP Cream Eyeliner in Black. Sigma Eye Liner E05 Brush
I used Too Faced Lash Injection Mascara for my lashes and added Beautee Senses Smashing False Eyelashes for effect.
My brows are filled in with MAC Eyebrow Pencil in Stud and NARS Coconut Grove Eyeshadow (matte blackened brown). Paula Dorf Eye Definer Flat Top Brush
For my lips I used MUFE #31 Rouge Artist Intense Lipstick (creamy purple pink).
I primed my skin with Tarte ReCreate™ Silicone-Free Primer. I used NARS Sheer Glow Foundation in Tahoe - Sigma Flat Top Synthetic Kabuki Brush - for my face and set my t-zone with MAC Blot Powder in Dark. I used MAC Studio Finish Concealer in NC45 - Fingers : ) under my eyes set with Benefit Powderflage - Beauty Blender Sponge.
I used MAC Coygirl Blush (matte purple pink) for my cheeks - MAC 129 Powder/Blush Brush, MUFE #2 Sculpting Kit for contour - Sephora Professional #49 Blush Brush and MUFE #11 Shine On Powder (shimmery light pink) for highlight. Sigma Angled Top Synthetic Kabuki Brush


text: i have one question: Can i go split screen mode whit keybord and some gamepad (xbox360 controller for windows)????? because when i go singleplayer whit keybord or xbox360 controller everything working but when i want to play split screen mode i set PLAYER 1 control to keybord in the menu, second (controller) arent working when asked me for 2nd player (press start button). I pressing button but nothing I thing that one way how i can play splitscreen mode is = playing whit two controllers.....??? ( IS IT TRUE? ) I waste a lot of time sitting at computer to find something, so if anyone know what is the problem please told me it


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In the various social contexts in which I hang out, there's been a lot of yammering lately about gender and sexism. There was a minor uproar recently about gender testing in the olympics, which has, as these things do, sprawled into a vast battle about sexism and gender bias and heteronormative privilege and so on.
|South African runner Caster Semanya, one of the first women to be subjected to gender investigation.


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This section contains 874 words
(approx. 3 pages at 400 words per page)
Chapters 12 and 13 Summary
Chapter 12: Parsley
Brigitte chops up parsley and puts it on practically everything. In France, there is a special little hand grinder for chopping and sprinkling parsley on food. Her mother sent Brigitte one when she told her how much she missed having one. That evening Lucky breaks one of the spokes on the parsley grinder. Brigitte decides to take it to Dot who has a small pliers that can fix it. Brigitte asks Lucky to look for her car keys in her bedroom. Lucky is worried when she spots Brigitte's suitcase sitting out. Brigitte finds her keys and leaves.
After Brigitte leaves, Lucky opens the suitcase and sitting right there on top of a stock of papers is Brigitte's passport. Lucky is now convinced that Brigitte is leaving. She now realizes that people don't get to use their Higher Power in...
(read more from the Chapters 12 and 13 Summary)
This section contains 874 words
(approx. 3 pages at 400 words per page)


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High-quality large villa in Spain on the beach, real estate Torrevieja
Sale High-quality, spacious villa on the beach in Spain with panoramic views.
Villa 4-bedroom suite is situated in one of the best areas of Torrevieja Torre la Mata.
Detached villa on a hill with stunning sea views from all rooms.
On the site there is a large private swimming pool, green spaces, palm trees, lemons, sitting area, shower and gazebo.
The villa has spacious bedrooms 4, 3 bathrooms, living room with fireplace, separate kitchen, lounge, sunroom, several open sun terrace with sea views, large garage, sun deck with room.
The villa is sold fully furnished, with everything you need for a comfortable stay or rental.
Excellent infrastructure, a beautiful green park in walking distance, sandy beach meters 800, 200 sea in meters.
Villa in Spain on seashore
4 bedrooms, bathrooms 3
Living room, kitchen
The villa 250 m²
Large garage
Private pool
Distance from the sea: 200 meters
Ref №: 17911
Photos of the villa in Torrevieja on the beach
Area villas in Spain by the sea, the villa in Torrevieja
Our contacts
Email: email@example.com
Skype: espanalive
Phone realtor in Spain: (+ 34) 684 019 876 - Margarita.


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I haven't posted in so long! I moved back to NC and have been busy with life and jelly things. So I will give a big update on what's going on.
I had some huge success with breeding and raising Mangrove Box Jellyfish (Tripedalia cystophora). A few weeks ago I was able to get nearly 80 juvenile box jellies. I successfully reared many of those to about 1/2 ".
Some of them appear to be slowing down in growth. I feel this is because of their aquarium size, and the amount confined to that space. I'm in the process of designing several large holding tanks. Once the tanks are done, there will me much more room for these little guys to stretch their tentacles out. They will be available for sale through The Jellyfish Warehouse very soon!
On another note, I had a huge surprise recently. My Black Sea Nettle Polyps are producing some ephyra! These jellies are super slow growers and so it took nearly 7 weeks for the polyps to start this. I'm hoping my first batch will yield some healthy Black Nettles.
Cheers until next time!


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Former TV host and actor Gary Collins is dead at 74.
Television host and actor Gary Collins died early this morning in Biloxi, Mississippi, of natural causes at the age of 74, according to the local coroner's office. Collins was admitted to the Biloxi Regional Medical Center less than 24 hours before he was pronounced dead at 12:56 a.m.
He starred in the 1970s TV series "The Sixth Sense" and appeared in other series including "JAG," "Yes, Dear" and "The Young and the Restless," as well as on "The New Hollywood Squares" game show. Collins had been a host of the Miss America pageant.
He is survived by his wife, Mary Ann Mobley, a former Miss America from Brandon, Mississippi.
Related articles
- Actor Gary Collins dies at age 74 (lfpress.com)
- Legendary Actor Gary Collins Died of Natural Causes (aceshowbiz.com)
- Gary Collins Dead – Legendary Television Actor and Host Dies at 74 (oddonion.com)
- Actor, TV host Gary Collins dies at 74 in Miss. (tbo.com)
Posted on October 13, 2012, in Announcement, Arts, creativity, News, Obits, Television, Word from Bill and tagged Biloxi Mississippi, Collins, Gary Collins, Mary Ann Mobley, Miss America, Mississippi, Presenter, Television program. Bookmark the permalink. Comments Off on Former TV host and actor Gary Collins is dead at 74..


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Today's crafting entertainment consisted of batch making Christmas cards (looks like I will be doing the same tomorrow) Glitter from the glitter embossing powder has spread itself everywhere and some Polar White flower soft escaped as well. All in all a good productive day, I had a rest inbetween batches by using my Pro Makers to colour in some digi stamps which might end up on cards tomorrow.
Looking forward to tomorrow I have my fingers crossed my Cuttlebug and Ultimate Pro will arrive then I can do some more playing around and experimenting :0)
Edwina's Halloween Cards
8 months ago


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Congratulations Tommy, you certainly have a classic case of the Mondays!
Just one more thing that Auburn and Clemson have in common, firing a Bowden.
UPDATE: Joe Schad at ESPN is reporting that Cullen Harper said Bowden DESERVED this (Bowden pulled Harper as the starting QB of Friday). CJ Spiller was also quoted as saying that Bowden had lost the confidence of many of the players.
Read these for more (ht to GeorgiaSportsBlog):
The State


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What is atomic force microscopy (AFM)?
How does an AFM work?
What AFM modes do I really need?
How do I get started with AFM?
These are all legitimate questions that quickly come to mind when first buying or starting with AFM.
With this, we hope to set you on the right track with some general information on atomic force microscopy and atomic force microscopes. You may also find the microscope simulation mode and operating instructions included with our control software helfpful. It's free to install and try.
If you need more detailed or specific information, just contact us for further assistance.
Introduction to atomic force microscopy (AFM)
The field of scanning probe microscopy (SPM) began in the early 1980s with the invention of the scanning tunneling microscope (STM) by Gerd Binnig and Heinrich Rohrer, awarded with the Nobel Prize in Physics in 1986. In the same year, a major breakthrough was made with the invention of the atomic force microscope (AFM) by Gerd Binning, Calvin Quate and Christoph Gerber, which continues to revolutionize nanoscale characterization and measurements ever since. Today AFM is the most popular type of SPM, causing the terminology of AFM and SPM to be often used synonymously. In case of AFM, the probe is a cantilever, generally having a tip at its free end. The superfamily of SPM probes can also include simple metal wires (as used in STM) or glass fibers (as used for scanning nearfield optical microscopy/SNOM/NSOM).
Nowadays AFM includes a wide variety of methods in which the probe interacts with the sample in different ways in order to characterize various material properties. AFM can characterize a wide array of mechanical properties (e.g. adhesion, stiffness, friction, dissipation), electrical properties (e.g. capacitance, electrostatic forces, work function, electrical current), magnetic properties, and optical spectroscopic properties. In addition to imaging, the AFM probe can be used to manipulate, write, or even pull on substrates in lithography and molecular pulling experiments.
Due to its flexibility, the atomic force microscope has become a common tool for material characterization alongside optical and electron microscopy, achieving resolutions down to the nanometer scale and beyond. The AFM can operate in environments from ultra-high vacuum to fluids, and therefore cuts across all disciplines from physics and chemistry to biology and materials science.
This article describes the operating principle and most common measurement modes of atomic force microscopy, and some of the many properties that can be measured with AFM on the nanoscale.
Operating principle of AFM
The operating principle of atomic force microscopy is depicted in the following schematic:
The heart of the AFM lies with the cantilever/tip assembly that interacts with the sample; this assembly is also commonly referred to as the probe. The AFM probe interacts with the substrate through a raster scanning motion. The up/down and side to side motion of the tip as it scans along the surface is monitored through the "beam deflection method". The beam deflection method consists of a laser that is reflected off the back end of the cantilever and directed towards a position sensitive detector that tracks the vertical and lateral motion of the probe. The deflection sensitivity of these detectors has to be calibrated in terms of how many nanometers of motion correspond to a unit of voltage measured on the detector. Nanosurf instruments provide a straightforward procedure for the calibration of this sensitivity and this procedure is described below in the calibration section.
The probe can also be mounted into a holder with a shaker piezo. The shaker piezo provides the ability to oscillate the probe at a wide range of frequencies (typically 100 Hz to 2 MHz) enabling dynamic modes of operation in the AFM. The dynamic modes of operation can be performed either in resonant modes (where operation is at or near the resonance frequency of the cantilever) or off-resonance modes (where operation is at a frequency usually far below the cantilever's resonance frequency).
AFM hardware
XYZ motion
Electromagnetic scanners provide highly accurate and precise nanoscale motion in X, Y, and Z at low operation voltage in Nanosurf AFMs. These kinds of scanners provide significant advantages of highly linear motion and the absence of creep over other kinds of scanners such as piezoelectric scanners. The Nanosurf FlexAFM-based systems combine a piezoelectric scanner for Z motion with a flexure-based electromagnetic scanner in X and Y; this configuration provides fast motion in Z with maximum flatness in X and Y, which is optimal for the advanced capabilities offered by these systems.
Atomic force microscopes can be configured either to scan the tip over the sample (in which case the sample is stationary) or scan the sample under the tip (in which case the probe is stationary). All Nanosurf microscopes employ the tip scanning configuration. This configuration provides a significant advantage in terms of flexibility and size of the sample. Tip scanning instruments can accommodate large and unorthodox sample sizes; the only limitation on the sample is that it needs to fit into the instrument! Because the tip is moved and the sample remains stationary, the sample can be almost any size or weight and can still be scanned by the AFM. An example of sample flexibility is shown below with the NaniteAFM system (assembly in typical Nanosurf orange/black at the top) and a custom-built translation/rotation stage to perform roughness measurements on large concave and convex samples.
Cantilever/tip (probe) assembly
This assembly consists of a very sharp tip (typical radius of curvature at the end for commercial tips is 5-10 nm) that hangs off the bottom of a long and narrow cantilever. As mentioned previously, the cantilever/tip assembly is also referred to as the probe.
The two most common geometries for AFM cantilevers are rectangular ("diving-board") and triangular. An example of the diving board configuration of the levers is shown in the SEM image below; note the tip hanging off the end.
AFM cantilevers are typically madeof either silicon or silicon nitride, where silicon nitride is reserved for softer cantilevers with lower spring constants. The dimensions of the cantilever are very important as they dictate its spring constant or stiffness; this stiffness is fundamental to governing the interaction between the tip and the sample and can result in poor image quality if not chosen carefully. The relationship between the cantilever's dimensions and spring constant, k, is defined by the equation:
k = Ewt 3 / 4L3,
where w = cantilever width; t = cantilever thickness; L = cantilever length and E = Young's modulus of the cantilever material. Nominal spring constant values are typically provided by the vendor when buying the probes, but there can be significant variation in the actual values.
Nanosurf provides a straightforward manner of calibrating the spring constants of probes, which is described in the section below.
Deflection sensitivity calibration
This calibration is for the detector sensitivity in order to convert volts measured on the photodetector to nanometers of motion. The calibration is performed by measuring a force curve on an "infinitely stiff" surface such as sapphire. The "infinitely stiff" surface is chosen relative to the cantilever such that the cantilever does not indent into the sample during the force curve measurement. Once the force curve is collected of photodetector signal vs. piezo movement, as shown below, the slope of the repulsive portion of the wall is then calculated. This is the deflection sensitivity.
Note that on the Nanosurf Flex-ANA instrument and cantilever calibration options of other product lines this detector sensitivity calibration is automated, where multiple curves are collected and the average detector sensitivity value is calculated.
Spring constant calibration
Calibration of the spring constant of rectangular cantilevers is done via the Sader method on Nanosurf instrumentation and implemented for all current product lines. This method relies on inputting the length and width of the cantilever (these dimensions are provided by the vendor and read from a cantilever list in the AFM software). Generally, a thermal noise spectrum of the cantilever is recorded where the room temperature thermal motion is used to drive the cantilever. A sample thermal tuning spectrum is shown below. A single harmonic oscillator model is used to fit the peak in the thermal spectrum in order to extract the resonance frequency and quality factor. All these parameters are then input into the Sader model for hydrodynamic damping of the cantilever in a given environment, which then calculates the spring constant for the lever.
Alternatively, a frequency sweep can be used to calibrate the spring constant. Here the shaker piezo is used to drive the cantilever.
For spring constant calibration it is important that the cantilever is backed off the surface when these frequency sweeps (either by thermal method or piezo) occur. A lift of at least 100 µm off the surface is recommended.
The final concept that is important to understanding AFM operation is that of feedback. Feedback and feedback parameters are ubiquitous in our life. For example, temperature is the feedback parameter in a thermostat. The user will set the thermostat to the desired temperature, which is referred to as the "setpoint". As the temperature in the environment changes, there is feedback comparing it with the temperature setpoint so that the heater (or air conditioner) knows when to turn on and off in order to keep the temperature at the desired setpoint value.
Similarly in atomic force microscopes, depending on the different modes, there is a parameter that serves as the setpoint. For example, in static mode the feedback parameter is cantilever deflection, while in the most common form of dynamic mode, the cantilever oscillation amplitude is the feedback parameter. The instrument is trying to keep this feedback parameter constant at its setpoint value by adjusting the z piezo to move the cantilever probe up and down. The resulting z piezo movements provide the height information to create the surface topography.
Control of the feedback loop is done through the proportion-integral-derivative control, often referred to as the PID gains. These different gains refer to differences in how the feedback loop adjusts to deviations from the setpoint value, the error signal. For AFM operation, the integral gain is most important and can have a most dramatic effect on the image quality. The proportional gain might provide slight improvement after optimization of the integral gain. The derivative gain is mainly for samples with tall edges. If gains are set too low, the PID loop will not be able to keep the setpoint accurately. If the gains are chosen too high the result will be electrical noise in the image from interference from the feedback; the compensation for a deviation from the setpoint is larger than the error itself or noise gets amplified too strongly.
The other parameters that are important in feedback are the scan rate and the setpoint. If the scan rate is too fast, the PID loop will not have sufficient time to adjust the feedback parameter to its setpoint value and the height calculated from the z piezo movement will deviate from the true topography at slopes and near edges. Very slow scan rates are typically not an issue for the PID loop, but result in long acquisition times that can pose their own challenges such as thermal drift. Optimization of the PID gains and the scan rate are necessary in order to optimize feedback loops. The setpoint affects the interaction force or impuls between probe and sample. A setpoint close to the parameter value out of contact feedback is most gentle for the sample, but tends to slow down the feedback.
See below for an image that was collected with various PID gain settings at the same scan rate. In the red area the image is all electrical noise, because the gains are set too high. The area framed in orange also has some streaks of electrical noise illustrating the same problem. On the bottom, in the blue section, there is poor tracking due to gains being too low. A selected too high scan rate would have a similar appearance. The optimal image and parameter settings are in the green area.
AFM imaging modes
Static mode (contact mode)
Static mode, or contact mode, is the original and simplest mode to operate an AFM. In this mode, the probe is in continuous contact with the sample while the probe raster scans the surface. In other words, the probe "drags" across the sample. The most common configuration of static mode is to operate it in constant force or deflection feedback mode. In this mode, the cantilever deflection is the feedback parameter. The cantilever deflection is set by the user and is related to how hard the tip pushes against the surface so that the user controls how gentle or aggressive the interaction between the probe and the sample is.
Static mode can also be operated in constant height mode where the probe maintains a fixed height above the sample. There is no force feedback in this mode. Constant height mode is typically used in atomic resolution AFM, though it is uncommon for other AFM applications.
Finally there is a configuration known as error mode. This mode is operated in constant force mode). However, the topography image is then further enhanced by the addition of the deflection signal to the surface structure. In this mode the deflection signal is also referred to as the error signal because the deflection is the feedback parameter; any features or morphology that appear in this channel are due to the "error" in the feedback loop, or rather due to the feedback loop needing to kick in to keep the deflection setpoint constant.
In static mode with constant force, the output consists of two images: height (z topography) and deflection or error signal. Static mode can be a useful, simple imaging mode, especially for robust samples in air that can handle the high loads and torsional forces exerted by static mode, but also, surprisingly, for more delicate samples in liquid, as long as the force can be controlled below 100 pN.
Imaging of membrane proteins like bacteriorhodopsin (BR) is an example for the latter. The topography image below shows contact mode imaging on membrane patches containing BR adsorbed on mica, recorded with a FlexAFM and a soft, 0.1 N/m probe. The overview image shows two membrane patches facing the cantilever with different sides: left the extracellular side and right the cytoplasmic side. The difference in height is explained by different electrostatic interactions between membrane and mica and cantilever. In the right hand image there is a smaller scan area, in which individual trimers can be discerned in their native, crystalline matrix, with a distance of 6.2 nm between trimers.
Static mode is available on all Nanosurf AFM product lines.
Lateral force mode
Lateral force mode or frictional force mode is a form of static mode (contact mode). In lateral force mode, the imaging is exactly as it is in static mode except the cantilever scanning motion is generally performed perpendicular to the axis of the cantilever, as opposed to a freedom of scan rotation for conventional static mode. A schematic of the lateral force mode scan configuration is shown below.
This mode is particularly effective for measuring the friction of a surface as the side to side twisting of the cantilever by torque, measured as the probe raster scans along the surface. Lateral force measurements can be converted to frictional force through calibration of the torsional spring constant of the cantilever.
When operating in lateral force mode, it is important to be aware of topography that can convolute the lateral force signal. This is because changes in topography will incur a torsion onto the cantilever as well. In order to account for this topographic convolution, frequently lateral force images are collected both in the forward (retrace) and reverse (trace) scan direction and then subtracted from one another.
This concept is illustrated in the schematic below. The left image shows the effect of a feature in the surface (black semicircle) with friction contrast from the rest of the sample. The forward and reverse scan directions both show a change in friction over this feature; but the change is in opposite directions (blue trace and red trace). Subtracting the forward and reverse scans will enhance the difference in the frictional response. On the right hand side, the results of a topographic feature inducing a response in the lateral force (friction) response are shown. Now both forward and reverse traces show a signal in the lateral force channel in the same direction that is due to topography in this case, not actual frictional change. By taking the difference of the two images, the measured lateral force response is now reduced.
Lateral force images can be very effective at picking up material differences in the sample. Below are AFM images of a polymer blend of polystyrene and polybutadiene. The left shows topography where the two components in the blend are hard to discern. In the middle and the right are the two lateral force images in the forward and reverse direction where differentiation between the two components is easily observed.
The friction is further illustrated in the profile line graph through the image (left graph below), in which the black profile belongs to the forward and the gray to the backward scan direction. Note to display data as "raw data" to correctly display the torsion working on the cantilever. Taking the difference, Δ/2, of the forward and backward movements results in the friction with less cross-talk from topography (black solid profile in right graph below). Taking the average, Σ/2, of the forward and backward lateral deflection gives a signal dominated by the height variations and almost without friction information (gray dotted line in right graph below).
The image below shows the friction calculated from the difference data overlayed on the 3D topography. The image is rotated by about 180° compared to the images above.
Lateral force mode is available on the CoreAFM and FlexAFM product lines. For more information there is an application note on lateral force microscopy of PS-PB.
Dynamic mode (amplitude modulation)
Dynamic mode refers to a collection of AFM modes in which the cantilever oscillates at a high frequency at or close to resonance. A specific kind of dynamic mode, referred to as amplitude modulation mode (AM-AFM) is the most common AFM imaging mode. In AM-AFM, the amplitude of oscillation is the feedback parameter; other dynamic modes have different parameters for feedback such as frequency (frequency modulation) or phase (phase modulation). AM-AFM is also referred to as tapping mode or intermittent contact mode by other vendors.
As an imaging mode, amplitude modulation mode offers several key advantages. Because the cantilever operates at resonance and interacts with the sample as the probe "taps" along the surface, it is a gentle interaction with the surface relative to static imaging modes that can preserve the sharpness of the tip. This kind of interaction also minimizes torsional forces between the probe and the sample, which are especially exacerbated in static imaging mode. These two advantages are particularly important for soft materials such as polymers or nanoparticles or fibrillar samples where dynamic modes are less destructive to the sample. Finally, by using the cantilever's oscillation amplitude as the feedback parameter, the user is able to fine-tune the interaction between probe and sample between different regimes such as attractive and repulsive regimes.
In dynamic mode, the cantilever is generally driven with a shaker piezo and starts vibrating at the excitation frequency. By sweeping the frequency across a suitable range, the peak in the frequency spectrum that corresponds to the resonance frequency of the cantilever can be found. The Nanosurf software has a table with cantilever properties, allowing it to set the suitable search range automatically. Note that due to the small size of these cantilevers, typical resonance frequencies are in the kilohertz and even Megahertz regime. A sample frequency tune is shown below.
The cantilever is then driven with a sinusoidal motion at a fixed excitation energy, and it behaves as a damped spring or a single harmonic oscillator. As the oscillating cantilever is brought closer to the surface, the cantilever cannot oscillate at its full amplitude anymore and the amplitude of oscillation is reduced, as shown in the schematic below:
This amplitude reduction is the source of the feedback; the user sets an amplitude based on the type of interaction that is desired. The changes in amplitude are caused by changes in the resonance frequency of the cantilever during interaction. A more elaborate explanation how repulsive and attractive tip-sample interactions affect the cantilever can be found in the force spectroscopy section.
Parameters to optimize
The user should tweak 3 parameters during operation of dynamic mode:
- Cantilever spring constant:
The stiffness of the lever must be appropriately suited to image the material. Often some empirical trial and error is required to find a suitable cantilever. If the cantilever is too stiff, the result may be destructive to the sample or cause tip wear. If the cantilever is too soft, it may not be able to interact with the sample to generate any contrast or it stays in contact with the surface.
- Free vibration amplitude:
This is the amplitude of the oscillation by the cantilever when the cantilever is vibrating in free space away from the sample. This parameter is set in units of voltage. Rougher samples need a larger free vibration amplitude.
- Setpoint:
This is the reduced target amplitude, which results after the tip is in intermittent contact with the sample (see schematic above). The setpoint is expressed as a percentage of the free vibration amplitude. Lower amplitude setpoints will favor a more aggressive tip-sample interaction or a more repulsive tip-sample interaction.
Dynamic mode is available for all Nanosurf AFM product lines. Note, however, that amplitude and phase are measured differently by the various product lines. On the NaioAFM and on systems with the Easyscan 2 controller, a single channel lock-in amplifier is used to measure the phase, while the amplitude is measured by an RMS-DC converted. On all other systems, both amplitude and phase are measured by a two-channel lock-in amplifier, enabling a more sensitive measurement of both amplitude and phase, and a true 360-degree phase shift even at low oscillation amplitudes.
Phase imaging
Phase imaging is one of the most common (if not the most common) AFM imaging methods to obtain contrast based on material properties. Phase imaging is a form of amplitude modulation mode imaging, and refers to the phase channel that is collected during this mode. An excited cantilever oscillation will exhibit a phase shift (φ) between the drive and the response, as defined by the equation:
d = A sin (2πft + φ),
where d = deflection; A = amplitude; f = frequency; t = time; and φ = phase shift.
At resonance, the phase shift is 90 degrees compared to the phase well below resonance, as reflected in the amplitude vs. frequency and phase vs. frequency plots below (note that in the Nanosurf control software, the phase is set to zero at the selected oscillation frequency):
When the interaction between an oscillating cantilever and a sample changes, the resonance frequency of the cantilever will shift: to lower frequencies for attractive forces, to higher frequencies for repulsive forces. Consequently, the phase at a fixed frequency shifts when the cantilever-sample interaction changes, for example when the material properties change; this is the reason that phase is a common imaging mode when contrast based on material properties is desired. However, the challenge with phase is that it will shift due to a convolution of multiple material properties, such as: adhesion, stiffness (modulus), dissipation, and viscoelasticity. Thus, while phase is a very useful imaging channel, it can be difficult to interpret the contrast with respect to individual material properties. For example, a sample might have 2 components in it where one is very soft (but not sticky) and the second is sticky (but hard). Even though these are fundamentally different material properties, they could induce similar or even identical phase shifts so that the two components look the same in the phase image.
Below is an experiment on a blend of poly(styrene-butadiene-styrene) (SBS) and polystyrene (PS), showing the power of phase imaging. On the left is a topography image where the two components show some height differences, though the absolute height cannot be correlated with a polymer. In the right phase image, the two components are easily differentiated. These images have a scan size of 10 µm × 10 µm and were measured with a CoreAFM. More data on SBS-PS can be found here. An example of another polymer blend (polystyrene and polybutadiene) measured with NaioAFM can be found here.
An additional challenge of phase imaging is a propensity towards imaging artifacts such as reversal of contrast or loss of contrast. These artifacts are primarily due to the problem of attractive-repulsive bistability where the tip-sample interaction toggles between net-repulsive and net-attractive regimes. This bistability can be controlled with a proper understanding of the cantilever physics and appropriate adjustment of operating parameters. An example of this challenge is illustrated in the polymer mixture image below. Two phase images were collected under different conditions. Note that in the image on the left there is little contrast between the two materials, whereas in the image on the right the contrast between the materials is distinct.
Phase imaging is available on all Nanosurf AFM product lines.
Advanced AFM imaging modes
Additional measurement modes often in combination with special cantilevers enable the measurement of sample properties beyond the topography. Examples are Magnetic Force Microscopy (MFM) and several electrical AFM modes. Some of the modes depend on the detection of magnetic or electrical fields. Key in such measurements is to separate the short-range van der Waals forces from the longer range electrical or magnetic forces. A lifting mechanism enables the probing of longer range electrical and magnetic forces, and deconvoluting them from the short-range van der Waals forces that are present during topographic imaging. The height that the tip is lifted over the sample is often a parameter that needs to be optimized by the user in order to have successful imaging of the magnetic or electrical properties and is typically in the few to hundreds of nanometer range.
The lifting can be done in so called single, interlaced and dual scan line modes. In a single-pass or constant height setup, the slope of the surface is measured from a completed topography image or line before the imaging of the long range interaction is started, and then the tip is scanned at a fixed height above the sample, compensating for the average slope.
Alternative to the single pass are the interlaced and dual pass imaging modes (left and right in schematic below, resp.), providing the topographical information of the surface along with the functional signal. In interlaced mode the forward pass records the topography of a scan line and then the tip is lifted above the sample during the backward pass. In dual pass topography is measured forward and backward in the first pass and the long range signal in the forward and backward movement of the second pass. Dual scan provides the more accurate correlation between topography and long range signal, wheras the interlaced mode is faster.
Since the long range interactions depend on the distance between tip and sample, additional phase contrast is generated when moving at constant slope over a sample with considerable height variation. Contour following, which is an option available for interlaced and dual scanning imaging mode on C3000 and CoreAFM product lines, scans the cantilever above the sample, keeping the separation constant, as depicted schematically below. For very flat samples like hard discs or polished steel contour following is not critical, whereas it may become essential if surface protrusions exceed some tens of nanometers, as shown for an Electrostatic Force Microscopy (EFM) example with 100nm high pedestals.
Magnetic force microscopy (MFM)
MFM is a phase imaging mode that uses atomic force microscope cantilevers with a thin magnetic coating in order to probe the magnetic field between a sample and a magnetized tip. This method is commonly used to image any materials with heterogeneous magnetic properties such as magnetic-based hard drives. It can be operated in single, interlaced and dual scan line modes. Any of these modes require optimization of the height above the sample at which the MFM image is collected.
The measurements below show 80 µm topographic (left) and MFM (center) images of steel plus a zoomed in image of the MFM signal (right). The topography shows minor topographical features, whereas the corresponding MFM image reveals 3 distinct areas: the areas showing meandering being the magnetic ferrite phase, in which contrast and frequency depend on the domain orientations.
Electrical measurement modes
AFM can probe a wide variety of electrical properties of materials and surfaces. These methods operate either in static mode or dynamic mode, depending on the information being sought. Probing properties such as current, conductance, surface potential, and capacitance are increasingly important in a number of applications including research on semiconductors, solar and battery cells, conductive polymers, and nanoelectronics. These applications have in common that the electrical properties of increasingly miniaturized devices and features need to be measured. Note that all these methods require specialized tips, usually in the form of a conventional silicon AFM cantilever coated with an electrically conductive coating. Probes made of conducting diamond are also suitable for some of these methods. All these modes provide simultaneous topography and electrical property data. A review of some of the main electrical modes and properties are given here.
These electrical modes also often take advantage of interlaced and dual pass scan methods, in which the probe measures topography on the forward or first pass and then the probe is lifted a prescribed distance away from the surface on the backward or second pass, optionally following the topography (contour) of the sample, as shown in the advanced imaging modes section.
Conductive AFM (C-AFM)
This is a static mode method where both the current distribution and topography of a surface are mapped simultaneously. It is similar to scanning tunneling microscopy as in both modes a bias voltage is applied between tip and sample, and the tunneling current is measured between the two. However, the advantage of C-AFM, which uses a conductive cantilever as opposed to a sharp metallic wire, is that it provides topography information and current information independently. Single point measurements that measure the current vs. voltage curves (commonly referred to as IV curves) can also be collected in this mode to probe the detailed electrical properties at a position.
Current measurements in air may prove challenging. The contact area between tip and sample is very small (diameter in the 10nm range). Therefore the current density (current per surface area unit) can become very high, rapidly hampering the conductive properties of the cantilever coating. Here a resistor inline with the sample reduces this risk of highly conductive samples.
Surface contamination and a water film between tip and sample commonly present at ambient conditions additionally reduce reliability and repeatability of C-AFM: Only a few nanometers of debris on the tip can block the flow of electrical current. Therefore higher forces are sometimes needed, which require harder tip materials or coatings like conductive diamond-like coatings or platinum silicide.
Such problems are reduced in vacuum systems, like in the example below, recorded in the vacuum of an SEM. The gradual effect of electron beam irradiation on topography and conductivity of a Pt(C) film was measured in situ with AFSEM™. The reduction of height shows the compacting of the film with irradiation dose. At the same time, an increase in local conductivity was observed at higher doses.
3D topography of Pt(C) film irradiated with different electron beam doses
Current through the film of the area inside the blue rectangle in the topography
C-AFM is available for all Nanosurf AFM product lines.
Piezoelectric force microscopy (PFM)
This static mode based method is geared towards the study of ferroelectric or piezoelectric materials, which are materials that respond mechanically to the application of an electric field. This mode measures topography simultaneously with mechanical response of the material when an electric voltage is applied with a conductive AFM tip. A sharp conductive AFM tip is brought into contact with the sample and an AC voltage is applied between the tip and sample. The sample will either expand or contract oscillatory due to this applied voltage. The sample motion is then tracked by the cantilever deflection, which is detected with a lock-in amplifier. The amplitude gives information on the piezoelectric tensor of the material and the phase provides information on the polarization direction.
Shown below is a PFM image of a common piezoelectric material, lead zirconate titanate (PZT). The topograph is shown on the left and a 3D view on the right where the coloring represents the piezo response. The phase clearly reveals striped domains inside the grain that were not visible in the topography.
PFM is available for the CoreAFM and FlexAFM product lines.
Electrostatic force microscopy (EFM)
This mode is the electrical equivalent to MFM and operates in phase imaging mode, but now used for imaging variations in the electric field of the substrate. When scanning the tip lifted above the surface (typically only a few tens of nanometers), a voltage is applied between tip and sample to create a long-range electrostatic force.
EFM images reveal information about surface potential and charge distribution from the phase image: with increasing magnitude of the potential difference between tip and sample, the resonance frequency drops, causing reduction in phase. Thus, a lower phase indicates a larger (absolute) potential difference. This also means that the contrast can be varied with the applied voltage. The example below demonstrates that the phase contrast can be inverted by changing the potential. In this measurement aluminum pedestals on top of a gold substrate were imaged with 3V (top) and -3V (bottom) tip voltage in contour following EFM mode.
Kelvin probe force microscopy (KPFM)
This mode images the surface potential distribution of a sample without direct electrical tip-sample contact. It operates in dynamic mode with either a single or dual-pass setup. In the single-pass setup the tip is closer to the sample so there is higher sensitivity and resolution in the Kelvin force measurement, but the topography resolution may suffer somewhat. In the dual pass setup, the tip is further away from the sample, resulting in lower sensitivity and resolution, but the topography can be sharper.
In KPFM an AC plus DC voltage is applied to the cantilever causing an oscillating electrostatic force between tip and sample. The resulting deflection oscillation is detected with a lock-in amplifier and minimized by the DC voltage. The DC voltage used is the local contact potential difference (CPD) between tip and sample. Applications include imaging the Kelvin potential or work function of a surface and measuring applied voltage differences between conductors.
Below is an image illustrating the utility of KPFM. Graphene was deposited onto copper, which was subsequently oxidized. The topography image is shown in the inset revealing the two striated graphene domains and the copper domain in between. The Kelvin probe image shows new features in the surface such as crystal defects within the graphene (circled in white) and differences in coupling to the substrate (circled in grey).
In another example, local charges were placed on an insulating oxide surface layer in a Swiss cross pattern. Imaging the sample with topography (left) did not reveal the pattern, but imaging it in KPFM mode (right) that records the surface potential clearly showed the pattern.
The combination of electrical modes and MFM is also powerful, as illustrated for stainless steel that was imaged by KPFM and MFM. KPFM is available for the CoreAFM and FlexAFM product lines.
Force spectroscopy
Force spectroscopy refers to single point measurements in which the cantilever approaches and "pokes into" the sample, and then withdraws. During this measurement the cantilever deflection vs. piezo movement is measured, and this can ultimately be converted to a force vs. tip sample separation measurement that provides mechanical information about the sample. This conversion requires the calibration of the spring constant and deflection sensitivity. A model force curve of cantilever deflection vs. z piezo looks as follows:
The force curve can be divided in different segments where A-C (black line) refers to motion where the tip is approaching the surface and D-F (gray line) is when the tip is retracting from the surface. The gray line has been given an artifical offset for illustrative purposes:
- Cantilever is approaching the surface. If there are attractive or repulsive forces between the tip and the sample, those could be measured in this segment by the resp. down or up bending of the cantilever.
- "Snap-in": the cantilever snaps into contact with the sample. This snap-in is due to tip-surface interactions, like capillary forces.
- Repulsive portion: the tip and sample are in contact and bends up upon further movement of the z-piezo. This section is referred to as the net-repulsive portion.
- Repulsive portion on withdrawal: the tip is now unbending while being withdrawn from the surface.
- Pull-out: the tip gets "stuck" in an adhesive dip before it is able to emerge from the adhesion at the interface.
- The cantilever has returned to its unperturbed state while the z-piezo further increases the tip sample distance.
Modulus measurements
Force curves can be mined for various mechanical properties of the sample including adhesion, stiffness (modulus), and indentation depth (how much the tip penetrates into the sample at a given load).
Shown below are example force curves from different polymer samples collected on a Flex-ANA. Clearly the sample on the left is very soft and has high adhesion compared to sample on the right, which is stiffer (higher slope on repulsive wall) and less sticky.
Contact mechanics models that model the tip-sample interaction are needed in order to extract the pertinent mechanical information from the force curve. There are a variety of contact mechanics models such as Hertz, Sneddon, DMT, and JKR that can be used depending on the sample and the specifics of the tip-sample interaction. The force curve data are fit with the appropriate model in order to extract the mechanical property information.
Adhesion measurements
Measuring the stickiness or adhesion of a sample can be done by measuring the adhesive dip in a force curve collected through force spectroscopy. The adhesion was measured on the blend of polybutadiene and polystyrene revealing quantitatively different adhesive dips on the 2 materials, as shown in the force curves below on the two materials.
Adhesion measurements can also be extended to single cells and bacteria with Flex-FPM — which uses FluidFM™ technology with hollow cantilevers and a microfluidics control system. In such experiments cells are aspired to a hollow probe like a sock to a vacuum cleaner and subsequently pulled away from the surface, while measuring the cantilever deflection.
Unfolding and stretching measurements
Another application of force spectroscopy is the stretching of molecules tethered between the cantilever tip and a sample. In biological research it has gained a lot of popularity to study phenomena such as protein unfolding, which is challenging or impossible with other techniques. An intensively studied example is the sequential unfolding of bacteriorhodopsin (BR), a light-driven proton pump. The cantilever/tip is able to grab onto the bacteriorhodopsin and pull it out of the membrane. During this process discrete unfolding steps are captured in the force curve measurement as shown in the data below. The protein unfolding events can thus be quantified by yielding the force needed for the individual unfolding steps as well as the (increase of) length of the unfolded stretch of molecule tethered between tip and membrane from one unfolding event to the next.
Force mapping
Because force curves are single point measurements, often many measurements are needed in order to obtain accurate and meaningful data in what is termed force mapping. All Nanosurf product lines are capable of force mapping with grid automation, in addition to automated analysis to calculate slopes, snap-in, and adhesive forces. On the PS-PB polymer blend below, for example, a grid of force curves was collected and the adhesion measured. The 3D map where the adhesion is colored onto the 3D topography clearly shows the different adhesive properties of the two components, where the polystyrene (round domain in the right bottom) has higher adhesion than the surrounding polybutadiene. The data were subsequently compiled into a histogram for further quantification.
With histograms, parameters obtained from force curves, like the adhesion above, are easier to quantify, obtain the average values of the different peaks as well as their separation, and their distribution via the standard deviation or full width at half maximum for a peak.
The elastic modulus can be analyzed similarly. Using force curve mapping where force curves are collected over an area, the mechanical properties of medical tubing was investigated and shown in the data below. The three tube samples were uncoated, and then coated with different polymeric coatings. In a single run, the automated Flex-ANA was able to measure the elastic modulus on all 3 samples, which were equilibrated and immersed in PBS buffer, revealing that the coated tubing was much softer than the uncoated tubing. The softness in this case was a desirable feature, as it is comparable to that found in soft biological tissue, thus making it appropriate for medical applications.
Sophisticated force mapping that can accommodate a wide variety of sample configurations and automated collection and software analysis, with a choice of contact mechanics models, is offered in the Flex-ANA. With this instrument, a series of samples can be programmed for force mapping, followed by a streamlined quantitative analysis and integration of multiple data sets. Individual force curves are displayed during collection, and a histogram of the various properties builds up in real time, as shown in the software screenshot below.
This platform was used to analyze a blend of polymers as shown below. The force mapping showed a clear bimodal distribution in the analyzed modulus data, revealing two distinct moduli for the two different components in the sample.
Lithography and nanomanipulation
In addition to imaging and single point measurements, the AFM cantilever/probe can be used to actually write or manipulate features on the nanoscale. Typically operated in static mode, the cantilever/probe can carve out patterns or structures on surfaces through an aggressive interaction between the tip and sample configured with a high deflection setpoint. In this way a stiff cantilever was used to scratch an "X" into the sample below.
The probe can also write structures and patterns through local oxidation at the point between the probe and the sample. In the example below, a Nanosurf logo was etched using local oxidation of titanium by applying 3 V between the sample and a conductive diamond tip.
In terms of manipulation, the probe can be used to cut or move around structures. In the example below, the probe performed a "surgery" on a bacteria (the elongated white structure in both images below) and divided it into two parts. The cut through the bacteria is evident.
Before surgery
After surgery
More advanced setups such as the Flex-FPM — which uses FluidFM™ with hollow cantilevers connected to a microfluidics control system — can also be used in lithographic mode to write or deposit molecules from a liquid that can be delivered to the surface through the hollow cantilever. The volumes involved are tiny (femtoliters) and are combined with micrometer accuracy to write fluidic patterns such as the ones shown below. On the left is a grid written in biomolecules as a function of application time and pressure steps, resulting in well-controlled spots of different sizes. On the right is the Nanosurf logo written in air with a solution of 50% glycerol and a back pressure of 200mbar.
Automated spotting
Flex-FPM lithography
In this way DNA and RNA has been spotted on a surface for single cell content analysis. With its hollow probes, FluidFM is a more versatile technology than just a tool for spotting and nanolithography. A FluidFM probe exhibiting an opening next to apex of the tip can be used as a syringe for single cell injection or extraction.
Electrochemical AFM (EC-AFM)
Electrochemical AFM mode enables measurements while electrochemical reactions are taking place in electrolyte solutions on an electrode surface. Electrochemical reactions are processes in which electrons flow between solid electrodes and substances in solution, involving a reduction reaction (at the cathode) and an oxidation reaction (at the anode). These reactions are widely studied in applications such as corrosion and photovoltaics. EC-AFM measurements enable monitoring of the electrode structure during such reactions and establishing the relationship between the electrode structure/morphology and its electrochemical activity.
Because these studies typically occur in aggressive liquid environments, excellent environmental control and protection of AFM electronics is necessary for effective imaging. The Nanosurf Flex-Axiom series, combined with the electrochemistry stage ECS204, is ideally suited for these measurements, as all the AFM electronics are protected and positioned above the liquid, and the cantilever holders are made of a special corrosion-resistant material.
Shown below is a study of nucleation and growth of copper clusters under electrochemical control. Cyclic voltammograms were used to charactize the electrochemical reactions and establish suitable potentials to observe topographical changes under stable electrochemical conditions.
Nucleation was observed by AFM at E = -50mV in sulphoric acid vs a platinum quasi reference electrode. Increasing the potential E = -10mV reduced the growth rate and a single copper cluster could be followed by time-lapse AFM. This reaction is reversible and at positive potentials the cluster was dissolved again.
The height of the ECS204 electrochemical stage is constructed so that it can also accommodate standard, rod-like electrodes. In the example below, dissolution of deposited copper clusters on a polished rod-like platinum electrode at oxidizing conditions was observed by AFM.
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The International Federation for Systems Research has moved house to http://www.ifsr.org so please update your bookmarks and see you there!
Webmaster, Don Tai
The IFSR Conversations (historically, the Fuschl Conversations) have taken place every second year in Austria since 1982. This year the event will be held at the Sankt Madalena Seminar Hotel in Linz, Austria, from April 14-19, 2012.
Up to 30 participants take part in this conversation, divided into 4 or 5 teams, each devoted to a subtopic of the general theme of the Conversation. Participation in a Conversation is by invitation of the IFSR, based on the anticipated contributions by professionals to the topics for that year. Most costs for participants are covered by the IFSR, with the exception of travel and a 150 Euro registration fee.
The topics proposed for the 2102 Conversation can be found on the pages of this site. If you would like to suggest an additional topic for consideration, or to nominate a participant (including yourself) who could contribute to one of the teams, please contact Gary Metcalf, President, IFSR (email@example.com) or Gerhard Chroust, Secretary General, IFSR (firstname.lastname@example.com). We hope to have the topics and participants selected by the end of October, 2011, so that preparation between the team members can begin immediately afterwards.
Topics to-date (found on pages as numbered):
1. Revisiting the socio-ecological, social-technical and socio-psychological perspectives
2. Second order science: an example of emergence in social systems
3. Systemic Leverage Points for Emerging a Global Civilization
4. Towards a common language for systems praxis
About the Conversation:
A Conversation is a collectively guided disciplined inquiry and an exploration of issues of social/societal significance. It is engaged by scholarly practitioners in self organized teams who select the theme for their work. The conversation begins with a preparation phase that leads to an intensive interaction and learning phase, followed by findings and summary reports. [Adapted from Bela H. Banathy's Presentation to the ISI Conversation on Social Systems Design, Asilomar conference, Asilomar, California, November 1996]
Conversation events have also been sponsored for many years by the International Systems Institute at the Asilomar Conference Center in Pacific Grove, California, and have been held in numerous other locations around the world. Additional information, including the proceedings from past IFSR Conversations, can be found at: http://ifsr.org/node/33


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The weather is starting to turn a little cooler, which is the perfect time for some soup! That and I think the husband and I are both coming down with colds. So soup it will be for a few days!
I love potato and tomato soup the best; what are your favorites? My one friend makes a pretty good butternut squash soup, which sounds divine!
Lochlan Is One Month
4 hours ago


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Wednesday, May 18, 2011
Weighting in vain.
Well. I've done it. After sorting through 22 years' worth of free t-shirts and impulse buys, selling those that were in good enough condition and donating the rest, gradually swapping out my H&M basics for name-brand alternatives and peppering my curated collection of timeless staples with one-of-a-kind vintage finds and the odd designer gem, I've finally amassed the perfect wardrobe.
...For someone who weighs about seven pounds less than I do.
Let's talk about buying aspirationally. Everyone does it. No one likes to talk about it, because no one wants to admit that a) they've got a few pounds to lose and b) they've deluded themselves into believing that the best way to deal with said extra pounds is to invest in things they literally cannot use. Buying clothes in the wrong size is completely illogical: even if you manage to lose the weight, chances are that by the time you get there you'll want something else. But does that stop us? I guess I can't speak for any of you, but doesn't stop me.
Granted, my situation isn't exactly typical, in that two years ago I weighed nearly 65 pounds more than I do now. For a long time after I began my lifestyle change (people hate that phrase, but it is what it is), all I bought was "transitional clothing": things I liked, but wouldn't be devastated to say goodbye to once the next few inches came off. Now that I'm within 10 pounds of my original long-term goal weight, I have a reasonably good idea of what my body will look like when I finally get there. I've begun to invest in clothing again. The rub? I'm not there. Not yet, anyway. I've conditioned myself to try things on and, if they fit, buy the next size down, assuming I'll need it soon; I never buy anything I can't physically put on my body, but I definitely purchase with room to shrink. I'm a pathetic fashion cliche: a six with a wardrobe full of fours. But because I refuse to actually walk around in ill-fitting clothing, I end up only wearing about a third of my wardrobe, the unwearable part growing bigger as I grow neither bigger nor smaller.
Allow me to disclaim. I know I don't need to lose the weight. I'm healthy, attractive, physically fit, blah blah blah. Whatever. There's something about setting a goal and reaching it that's incredibly gratifying, and since my goal is reasonable and realistic, I refuse to deny myself that human satisfaction. It's not about the size itself; it's about reaching the hotness potential I know I'm capable of. Yes, I've come a long way, but isn't living your life comparatively just as dangerous as setting high expectations? Isn't it all too easy to be better without being your best?
After a mega-motivated April, I've been hovering at a plateau for a few weeks now, the dreaded swimsuit season looming ever closer. My dad is getting married on the beach over 4th of July weekend, and I'd really like to look like Brigitte Bardot in a bikini. You know, amateur stuff. Time to take the cupcake consumption down a notch, more for the sake of my own confidence than any obscure societal standard of beauty. But here's the more pressing question: do I throw in the tacky starfish-print beach towel and snap up the remainder of my summer wish list (blush-hued leather jacket, crisp white jeans and pink shorts à la Isabel Marant) in my current size, or do I wait a few weeks and see how things go? I'm itching for a seasonal wardrobe update, but I don't want to end up with things I can't wear, regardless of the outcome. Buy later to wear later, or buy now to possibly wear never? The answer should be obvious, shouldn't it? So why do we entertain the notion at the expense of our own pride and pocketbooks?
Have you ever fallen victim to vanity buying? Did it motivate you, or did it end up being a waste of money and a blow to your self-esteem? I'm really interested in the psychology of this, and I'd love to hear your thoughts or experiences. Let's just put it out there. Lady to lady (or gentleman. I don't discriminate). This doesn't have to be a lonely dressing room struggle.
3 comments:
- Liza Jane said...
I definitely buy aspirationally a little bit. I'm basically in between two sizes, with plans to settle in the lower, so I just buy the lower size. I also hang on to things that don't necessarily fit as well as they did a year ago (not the trendy stuff, but work suits and the like) so that I don't have to rebuy when I take it back off again.
- May 19, 2011 at 10:49 AM
- Emma Aubry Roberts said...
Ugh YES. And yet I have no trouble getting rid of my "fat clothes" once I feel I've grown out of them (into them? Under them?). Struggz.
Another thing is that sometimes when I do lose weight it's not always in the places/proportions I expect. So something that should theoretically fit now still doesn't look right and will end up being too big in some areas and still tight in others. It's just a dumb habit and a great way to end up perpetually chasing some fictional ideal. Yet so seductive in its way.
- May 19, 2011 at 12:42 PM
- fazila said...
i know how you feel girl. "i really wanna lose 3 pounds" hahahah. but seriously. im 3 pounds away from the goal weight i put for myself a year ago. crazy because i totes just a shit ton of pasta. whatever.
but yeah. as long as you know that you don't HAVE to lose the weight. then you know..well you know. just want you to be happy love.
looove you.
- May 20, 2011 at 10:24 AM


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Job seekers who doubt the risks of letting loose on social media—and recruiters who wonder if they should check candidates' online activities—might consider the story of a dating site, an outburst, a screen shot and a recruiter.
In late July, Boston-based Sam Oliver, an independent recruiter for tech startups, took notice of a friend's Facebook post: a screen shot of "graphic and threatening" comments that a man had sent to the friend via the dating app OkCupid.
The would-be suitor made the remarks after Oliver's friend had rejected him, according to the screen capture of their chat. (This link will take you to an article that Oliver wrote about the incident, which includes a link to the screen capture. Be advised that the language in the screen capture might be offensive to some readers.)
"In the screen shot of their exchange, I could see his profile photo and recognized him," Oliver told
SHRM Online. "I visited his OkCupid profile and looked at his other photos, trying to figure out why I recognized him."
After some online sleuthing using Google's reverse image search, Oliver discovered that the world is indeed small—too small for the man in question.
One of the photos on his dating-site profile also appeared "on both his LinkedIn and AngelList profiles, which is where I recognized him from," Oliver said. The man had applied to one of Oliver's clients through tech startup job site AngelList.
"Part of my job is to filter through the inbound candidates," she noted. "This man had submitted his LinkedIn profile, resume and a short bio to my client for consideration for a software developer position."
Oliver immediately withdrew the applicant from consideration for the job. "I sent him a message via AngelList letting him know my client was not interested in his candidacy and that he should be nicer to women on the Internet," she said.
"As a recruiter, I was concerned because this man verbally degraded and threatened another woman with sexual assault. This behavior strongly suggests he would contribute to a hostile work environment if hired," Oliver said.
Oliver said she didn't hear from the candidate again. After she wrote to him, he deactivated his AngelList and LinkedIn profiles. The man's OkCupid profile now contains no photos.
SHRM Online reached out to him for comment through the app but did not get a response.
Oliver wrote a blog post about the experience, and at least one Boston television station
reported on it.
"I sought legal advice on the matter because I received a number of threats [online]." My attorney informed me that I did nothing wrong and that my friend is able to press charges against this man under Massachusetts law, should she choose to. As far as I know, she has not yet chosen to press charges," Oliver said.
Rejection Is Legal
Florida-based employment attorney Donna Ballman, author of
Stand Up for Yourself Without Getting Fired: Resolve Workplace Crises Before You Quit, Get Axed or Sue the Bastards (2012, Career Press), agreed that Oliver was justified in screening the man out based on his dating-site exchange with her friend.
"Not only is it legal to refuse to hire a potential employee after seeing discriminatory and threatening remarks online, but I'd argue that it could subject the company to liability if they did hire him in spite of these online comments," Ballman told
SHRM Online via e-mail.
"Once the company is on notice that an employee or potential employee has the propensity to engage in sex discrimination, sexual harassment or violence against women, they would almost certainly be liable if they hire him and he engages in that kind of activity in the workplace.
"If they hired him, they would have to take extra precautions to prevent this type of behavior in the workplace. Plus, it could be a morale issue. If women find out about these comments and are afraid to be alone with him, the company could lose good employees," Ballman added.
She did share a word of warning, however. If the employer passed on this candidate but then hired another person who had made similar comments online that the company knew about, and if that person was a different sex, race, age, national origin or other protected category from the individual who was dropped from consideration, then the employer could be subject to a discrimination claim, she said.
Consider, for example, if a woman was making the comments, Ballman remarked. "Sometimes employers treat women and men differently in this type of situation. You can't have a double standard."
This wasn't the first time Oliver turned down a job candidate because of a social media post, and she's hardly alone in scanning applicants' online presences.
According to research from the Society for Human Resource Management this year,
more than one-third of companies disqualified a candidate in the past year over information that was found on public social media sites or that appeared in an online search.
"As a recruiter, a big portion of my job is sourcing talent. I find people's blogs, Twitter accounts, Facebook, etc., to evaluate their candidacy," Oliver said. "I have seen candidates on OkCupid before, though never in such a negative context."
"Social media is another tool that employers use to evaluate you—use it to your advantage," she added. "If you're not going to use it to showcase your interests [and] personality, then at least make sure there's nothing offensive or illegal on there. If you wouldn't say it out loud in real life, don't say it online."
Dinah Wisenberg Brin is a freelance reporter and writer based in Philadelphia. She writes about HR, entrepreneurship, medicine and personal finance, among other subjects.
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So I've been playing with my camera, now that I had a crash course from Franklin on how to use it better. It's such a fun time of year to take photos anyway, what with all the color and the light:
The kids on the block are out en masse. This was on the steps of the house where two girls live, which is next door to the house where four boys live:
Campus is beautiful too.
Speaking of campus, I bought a Venus Fly Trap today. I'll try taking pics of that and my knitting to post next.