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It has been another good year for the Ouachita Little Theatre (OLT). The theater has provided a lot of entertainment and enrichment to the community with a wide variety of plays, musical events, workshops, and outreach programs.
The year started with the second annual version of The OLT Goes Dancing directed by OLT Board member Jennifer Ogger, on the weekend of January 11. In preparation for the state championship competition, the play The Madwoman of Chaillot, directed by OLT president, Tim Hesse, was presented to local audiences on the weekend of January 25. It went on to win the state championship in a competition held at El Dorado, early in February.
Elvis Presley tribute artist Michael Cullipher brought his tribute show to the OLT stage in February, and late in the month the semiannual Benson Awards Show, the OLT's version of the Academy Awards, was held. March saw a very lively, and live, musical show headed by local blues guitarist David Lindy. April, as always is the month for the OLT musical, which, this year, was Annie Get Your Gun, directed by Jeffery Matthews. The quarterly Saturday Night at the Lyric (SNL) brought a diverse group of local musicians to the OLT stage, as always.
During the annual Mena Lum and Abner Festival the OLT performed a group of Lum and Abner radio shows from the '30s and '40s at the theater. The last two weekends of June the Junior OLT (JOLT) performed the summer play, Airline. On July 11 the nationally recognized a capella group Blend performed rock hits of the 50s and 60s at the OLT. There were two musical events in August, including the annual OLT Community Praise and Worship Concert, and a performance by Hot Springs-based folksinger Laura Lee Williard.
As the theater prepared for the fall play, in September, there were no shows. October started right out with a concert by the eclectic musician Brother Eudy, followed by the fall play, Dial M For Murder, directed by Jennifer Ogger. In November another SNL, featuring local musicians took place. In December the JOLT Christmas Variety Play, directed by Morgan Richmond and Emily Davis, featuring The Gift of the Magi, and A Hillbilly Christmas Carol was delayed by the ice storm but was finally performed over the weekend of December 13–15. Last two performances of the year were A Merry Mena Christmas, featuring three popular local bands, Sugar Creek, Straight Tequila, and Brothers and Sons, and Elvis At Christmas, featuring award-winning Elvis Presley tribute artist, Michael Cullipher, during the week before Christmas. The OLT is looking forward to another great year in 2014! For more information call the OLT Info Line at (479) 243-0186, or visit the OLT website, www.oltmena.com.


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July 8, 1999, Section G, Page 5Buy Reprints
VIRTUAL reality can offer users a chance to enter into a variety of fantasies. Most are appealing. But at a recent meeting of the American Psychiatric Association, psychiatrists, and others could spend three to five minutes experiencing an animated version of the auditory and visual hallucinations that plague many schizophrenics.
The impact of the experience is unsettling. Wearing a headset, you are immersed in a video in which it seems that you walk into a psychiatrist's office and sit in front of his desk.
Once there, you are immediately aware of classical music playing lightly in the background, but it is not clear if it is just Muzak or it is in your head. As the psychiatrist asks you about your weekend, voices denounce him, saying he doesn't really care. To the right, a mouse scurries across the carpet.
Looking back to the doctor, the digital clock on his desk has moved ahead an hour or so. The magazine on the opposite corner says ''Man of the Year,'' but a second later, the headline melts into, ''They're Trying to Poison You.''
A spider crawls through the air. As you desperately try to focus on the psychiatrist, he morphs into a three-eyed monster and sprouts horns. The voices are reaching a fever pitch, telling you that you aren't human, nothing matters, get out, run.
The idea behind the video is to give psychiatrists some sense of what their patients might be going through. It was developed by Janssen Pharmaceutica of Titusville, N.J., as an amalgam of the real experiences of several schizophrenics. Janssen makes an antipsychotic medication used by schizophrenics.
Angry voices, white noise and disturbing visions haunt many of the nation's two million schizophrenics. It is a hell on earth, says Ken Steele, a schizophrenic who spent 32 years under the yoke of a constant auditory tongue-lashing and the occasional sighting of the Virgin Mary. Mr. Steele, who says he now has his illness under control with medication, says he believed that radio and television personalities were speaking directly to him, telling him he was a loser. This was layered over a background of static and suicidal thoughts.
''You can imagine what that's like when you're on the streets of New York," Mr. Steele says, recalling that he spent many years wandering homeless through Manhattan. Mr. Steele's nightmare was used as raw material, along with the experiences of other schizophrenics, to create the animated video.
Of course, schizophrenics, unlike psychiatrists, can't walk away. ''I can turn down the volume of a radio, I can shut off the TV, or close the door to my office when I want to concentrate,'' said Mary Rappaport, a spokeswoman at the National Alliance for the Mentally Ill. ''But when people with schizophrenia experience this, there is no button they can push to shut it off.''
Several psychiatrists at the meeting said they found the experience useful. Zenadia Mangonon, a staff psychiatrist at the Ancora Psychiatric Hospital, a state institution in New Jersey, said, ''It's really something to experience, yourself, what your patients feel.'' Another, Jim Jacobs of Mercy Hospital in Pittsburgh, said that until he saw the video, he did not interpret a patient's distraction as a sign of hallucinations.
Janssen first showed the system to psychiatrists, but when it can be scaled down -- each headset at the exhibit was linked by 50 feet of cable to its own 400-megahertz Apple G3 -- it may be offered more widely. Janssen is considering bringing it to physician's offices, community support group meetings, and medical schools, so families, social workers, and psychiatrists-in-training can get a glimpse of the reality of schizophrenia.

subset: commoncrawl


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The other day someone asked me who my favorite racer was. Instinctively, I answered Ryan Maifield but on my way back home, I rethought about my answer and I realized that my preferred racer was in fact, a mix between three racers, Maifield, Tessman and Drake. Why these three guys?
Ryan Maifield: I like Maifield because first, he drives for Team Associated and second because he always drives on the edge. It is impossible for me to stay calm and relax when I watch him driving. I wish I have 10% of his talent! His driving has smoothed out since he runs the upgraded RC8B but no matter what he drives, I can't stop thinking that he will crash so much he pushes his buggy or truck to the limit. It is also very interesting to listen to him in interviews, he always has something interesting to say.
Ty Tessman: Even if I'm still not sure if I should put one "N" or two at the end of his last name, he is one of my favourite racers. He is the best Canadian offroad racer, he is young and he keeps on getting better and better at every race. He is very consistent at each races and since he did the A Main at the 2008 IFMAR Worlds, he seems to have learned a lot and he is now regularly in the A-mains. Ty uses Pro-Line tires and bodies, like I do. I predict a great future for him!
Adam Drake: In terms of R/C, I have absolutely nothing in common with The Drake. He runs Losi cars, I prefer AE. He runs Novarossi engines, I don't. He uses Losi tires and I prefer Pro-Line. He has a Spektrum radio, I prefer Futaba. His fuel? Nitrotane… Guess what? I prefer SideWinder or Byron. It seems that his sponsors can't influence me LOL. I don't care regarding what he or I like or what we have in common in term of R/C because even his wife Ronda (which is a pro RC racer too) have nothing in common with him (in term of R/C brands of course). Drake is one of my favourite racers because he did a lot for R/C and he represents what a R/C racer should be. He races for many years, he has a lot of R/C experience. He always has something interesting to say in interviews.
Ryan Cavalieri and Dakotah Phend are also among my favourite racers.
Use the comment box below and tell me who is your favourite racer and why?


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MINNEAPOLIS, MN — Paul Maccabee, president of Maccabee Public Relations, was awarded the Donald G. Padilla "Distinguished Practitioner Award" as part of the annual Minnesota PRSA Classics event in Minneapolis.
The award recognized that during his 30 years in the public relations industry, Maccabee has served organizations whose focus is to create a more inclusive and tolerant community. Supporting clients who fight drug addiction, lymphedema, eye diseases, orthopedic conditions and eating disorders has been central to Maccabee's public relations career, in addition to his being a champion for LGBT rights.
Before co-founding his Minneapolis agency in 1996, Maccabee, Maccabee began his career as PR director for the federal anti-poverty agency Community Action of New Haven. Since that time Maccacbee has helped Carlson Companies publicize their efforts to fight global sex trafficking, dedicated time to helping agency Padilla and Minnesotans Against Terrorism fight anti-Semitism, coordinated campaigns for Hazelden against drug addiction and Rosewood Centers to combat eating disorders, and helped organize opposition to Minnesota's proposed same-sex marriage ban and staff cuts at the Minnesota Pollution Control Agency.
"Throughout the Classics Banquet, speakers referred to our PRSA Minnesota 'community' – and it's really true," said Maccabee. "My biggest mentors have been the men and women who run the PR agencies that compete with mine. I've been referred clients and employees by other PR agencies. Even when we 'pitch' against each other for a potential client, when the battle is over – we often gather together to solidify professional friendships. Winning the Padilla award? I accept it as a symbol of this entire community of Minnesota PR pros, who are so supportive of the growth of everyone involved in PRSA."
As part of the award, the winner has the chance to name a charity for which a donation would be made in honor of the winner. Maccabee chose the non-profit Protect Minnesota. "With the mass shootings of students at Marjory Stonemason Douglas High School in Parkland so fresh in our minds, it felt right to honor their courage with a donation to one of Minnesota's brave non-profits fighting gun violence," Maccabee said. "I love the fact that the techniques of public relations can be used for social justice. The 'Parkland Generation' of students have demonstrated how publicity for the public good, social media and public advocacy can be used to further the improvement of our society."


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Footage of a 15-year-old Syrian boy being grabbed by the throat, shoved to the ground and waterboarded by a group of his classmates in a school in the United Kingdom has been widely shared on social media. The same boy, whose wrist had been also broken by the same group before, just walks away in a very downtrodden and weary mood after being beaten, the video shows.
Almost all British media released the shocking footage after blurring the faces of the teens. I doubt whether the reason for such censorship is to preserve the privacy of the Syrian boy or to conceal the behavior of the other "British" students.
However, there is a bigger problem with the leaked video: While the Syrian boy is attacked, all of his classmates just laughed. There might be some willing to explain the incident with as ordinary incident of peer bullying, but the situation seems deeper, as the chuckles of the students prove.
What's worse, other footage showing the Syrian boy's sister being physically attacked at the same school has since gone viral, too. The British media, particularly the mainstream outlets such as BBC, once again used the blurring technique when releasing her video. They may be right according to the principles of journalism, but describing the incident as an "alleged attack" shows their true intentions. A good reminder: It may be necessary to avoid blurring such videos for it can sometimes lead to confusion among members of the media and pave the way for them to use the word "allegedly" in an explicitly racist attack.
Let's guess what will happen now. Since the video has gone viral and was widely shared on social media, there has been intense sensitivity and a lot of offers of help. Most probably and hopefully, the offers are likely to reach the right person. The boy and his family may be moved from the town, and the siblings may be registered in another school in order to partially help them forget their trauma, just like what happened after other violent incidents against Syrians in the past.
In September 2015, the dead body of a 3-year-old Syrian toddler, Aylan Kurdi, washed up on a Turkish beach and deeply affected the whole world. It was the fourth year of the Syrian civil war when this heart-wrenching incident happened. Some 5 million people were displaced and 300,000 others lost their lives. Two million displaced people migrated to Turkey within two years.
Kurdi's story became a milestone that inspired worldwide awareness for the first time since the suffering of Syrians began. Nongovernmental organizations around various parts of the world, which had so far failed to push their governments to generate effective mechanisms to solve the Syrian crisis, somehow started to produce related projects and even arrogantly advised Turkey about how to psychologically approach the refugees, although Turkey has been the most welcoming country in the region.
In the same year, a refugee deal to be signed was also suspended thanks to the European Union's "concerns about Turkish democracy." Likewise, there are still problems in the payments of EU aid money to be used for the refugees. Aylan Kurdi's family later settled in Canada as refugees, and their lives were thus saved; however, the memory of that sweet baby will always remain in our hearts and minds.
Another reminder: On Sept. 8, 2015, Hungarian camerawoman Petra Laszlo kicked and tripped a refugee man with a child in his arms while they were fleeing from a clash with police. The unfortunate incident took place near the town of Roszke, close to the border with Serbia, and sparked global outrage. Later, the Syrian refugee father, Osama Abdul Mohsen, was offered a position as a football coach in Spain. In other words, another Syrian family's life was therefore saved. What about the camerawoman?
She was first fired from her job and then sentenced to three years in prison, but it was reprieved. The Supreme Court later deemed Laszlo's act not a crime but "morally incorrect," and she was finally acquitted.
It is "blurry" as to what kind of a penalty will be imposed in the Huddersfield incident. However, it is impossible not to worry about the Syrians living in the U.K. Aylan Kurdi and Osama Abdul Mohsen are just symbolic names since there are thousands of others that remain publicly unknown. Particularly, Syrian women and little girls who are still largely vulnerable to assaults worldwide. The footage of the beaten Syrian boy may be just one of thousands. Europe as a whole is facing growing anti-immigrant and anti-refugee sentiment, and its reflections in the streets are obviously being felt. Therefore, the attack against the Syrian boy is not independent from it. Sadly, since adults have jumped on the bandwagon of hate speech and racist discourse, it is unfair to expect moderate behavior from their children.


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Using images in social media campaigns has proven to be one of the best ways to increase user engagement, but it can be tricky to know what kinds of images you should use. Here are 6 of the best kinds of images, and when to use them:
Photos are the most popular, and easiest, type of image. Using apps like Instagram, you can take photos, edit, and add them to a post without much trouble. The best time to use a photo is when the image you're sharing is powerful and different enough that it will stand out among all the others and grab your audience's attention. Accompanying text shouldn't be lengthy; keep it short and to the point, let the photo tell the story
Using collages is a great way to do a number of things: you can set up a timeline to show the progression of a product, service, or something else; you can give different perspectives on an idea or practice; and you can highlight different aspects of a product or service you offer
Text Over Plain Background
The purpose of using text is to get a message to your audience quickly and without losing their interest. Be careful how you set up your message; it should be simple but strong enough to captivate readers. Plain text images are great for inspiring quotes, quality headlines, and interesting book or blog excerpts
Text With a Photo
Using photos with text is a compelling way to communicate a message with visuals and text combined. This can be a great type of image to use with stock photography to make a photo others may have used, unique for your purposes
Icons and Illustrations
Icons and illustrations are a great alternative to using photos, and their simple, appealing look draws in more people. With these, you want to keep it uncomplicated; it's not meant to be a decoration. Additionally, adding a simple icon to a photo can help make the image stand out
Screenshots are one of the easiest types of images to put together. They take almost no time and it's best to use screenshots to highlight specific excerpts of text or images


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This morning we started the day at Garden of the Gods. First we took a gorgeous hike among the rock formations. Then we spent some time in the visitor center looking at exhibits, buying souvenirs, and celebrating Luke's 15th birthday.
After all that fun, we hit the road. It's been smooth sailing most of the day. We're now past Topeka, but have slowed down some because of the storms rolling through the area. Will be home soon and (at the very least) Rev. Lara will see you all in worship tomorrow morning!


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Edrin the Entertainer and His Fabulous Fourteen arrives at night, unloading and setting up shop before any authorities can think to stop them. Come morning, dozens of tents both big and small stand ready to entice visitors with all manner of entertainments. The circus is raucous and wild, with performers including an enslaved orc and goblin duo forced to be slapstick clowns, a falsely accused fire-eater on the run from the law, three acrobatic womanising con-artists and a blind juggler with a taste for blood. Due to some of the performers' unusual proclivities, the circus tends leaves in quite a hurry. Understandably, Edrin tries not to visit the same place twice. Not, at least, until the rumours die down.
This eventure is suitable for any level PCs and can be used with any size group. It has also been designed to be easily adapted to virtually any GM's campaign.
A Day Out at the Circus is set in the City of Languard but is easily adaptable to almost any fantasy city.
What's an Eventure?
An eventure is akin to a normal adventure, but does not (normally) feature violence or physical challenges. Instead, an eventure focuses on the use of social skills and role-play to resolve the challenges, or events, therein. Most eventures take places in a settlement or on the road. Few occur in traditional adventure locales such as dungeons, ruined castles and so on.
Eventures are an excellent change of pace and can be used as filler between adventures or as situations in which PCs who have invested in social skills can shine. They are also perfect for players who enjoy role-playing.
Get the PDF
Sign up for Raging Swan's Patreon campaign by 11 April and get all three versions of A Day Out at the Circus for only $2!
A Pathfinder Roleplaying Game Compatible Eventure by Jeff Gomez
Released 15 April 2019; Pages 13
PDF ($3.45) d20pfsrd, DriveThruRPG, Paizo, Warehouse 23
A 5e Compatible Eventure by Jeff Gomez
Released 15 April 2019; Pages 13
PDF ($3.45) DriveThruRPG
A System Neutral Eventure by Jeff Gomez
Released 15 April 2019; Pages 13
PDF ($3.45) DriveThruRPG


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"Whatever is true, whatever is honorable, whatever is just, whatever is pure, whatever is lovely, whatever is commendable, if there is any excellence, if there is anything worthy of praise, think about these things." (Philippians 4:8 )
Praying that this may just be it: the blog that's here to stay (I'm so hopeful that I've plastered my name on it!).
I intend to populate these pages with things to celebrate, to inspire…
And then some 😉
Here is my back story.
Feel free to check out my other blogs:
(location: Manila, Philippines)
Psalm 34:8 "Oh, taste and see that the Lord is good!"


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TVNZ Highlights: 24-30 March
Answer the call of the Siren, this week with TVNZ.
Premieres Friday 30 March at 8pm on TVNZ OnDemand
This thrilling new fantasy drama takes us inside Bristol Cove - a coastal town known for its mermaid legends.
The arrival of a mysterious girl proves that the folklore is all too true, and the battle between man and sea takes a vicious turn.
Starring Kiwi legend Rena Owen (Once Were Warriors, Star Wars Episode II and III).
The Adventures of Suzy Boon
New season available Friday 30 March on TVNZ OnDemand
This local web series follows the (mis)adventures of Suzy, who is trying to find her place in the world.
In the new season, Suzy must survive a prison sentence.
She wonders if she'll ever return to Aotearoa and eat Marmite again.
Unfinished Business
Sunday 25 March, 8.40pm on TVNZ 2
Comedy premiere movie starring Vince Vaughan and Dave Franco.
A business trip goes off the rails in every possible way for three colleagues.
Can these hardworking businessmen save their company from ruin?
Instant Hotel
Tuesday 27 March, 8.45pm on TVNZ 2
In the double episode season finale, the race is on the impress the judges and the jury.
Will Babe and Bondi's standout beachside location be enough?
Or will the size and comfort of Terry and Anita's Brisbane home take out the competition?
A User's Guide to Cheating Death
Available Friday 30 March, 12pm on TVNZ OnDemand
The anti-aging industry is worth almost $10 billion a year.
People want to live forever, and they want to look good while doing it.
But how much of it actually works?
Timothy Caulfield investigates.
Genius Factory
Available Friday 30 March, 12pm on TVNZ OnDemand
In the 1980s, an eccentric billionaire funded a controversial genetic experiment - to create the world's smartest kids.
Thirty years later, meet the products of this experiment and the people who worked on it.
How has it affected their lives and relationships?
NBA Live
Saturday 24 - Sunday 25 March on DUKE
Catch three LIVE matches on DUKE this weekend, starting 12.30pm Saturday.
The playoffs loom closer, with the Cleveland Cavaliers hosting the Phoenix Suns. Then the Atlanta Hawks travel to Oakland to take on the current NBA champions.
Sunday sees the Philadelphia 76ers with a homecourt advantage, against the Minnesota Timberwolves.
Splitting Up Together
Premieres Wednesday 28 March, 8pm on TVNZ OnDemand
While some divorces force families apart, Lena and Martin are splitting up together.
Jenna Fischer and Oliver Hudson star as a newly divorced couple, who explore what it means to live separately, under the same roof.
From the creator of Suburgatory and executive producer Ellen DeGeneres.


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George Clooney honours woman who saved 30,000 children in Burundi civil war
A woman who acted as a "mother to all children" during the Burundi civil war has been recognised for her actions by George Clooney with a million dollar (£700,000) humanitarian prize.
Marguerite Barankitse, who saved the lives of 30,000 children during the country's civil war, was handed the inaugural Aurora Prize by the Hollywood actor at a ceremony in Yerevan, Armenia.
She was personally awarded 100,000 US dollars (£70,000) as well as a million dollar grant to nominate to a charity or organisation that has inspired her.
Ms Barankitse, known as Maggie was heralded by Clooney as "extraordinary". He said all the finalists were people who "make the world a better place".
Clooney, who is visiting Armenia for the first time, earlier joined the president of Armenia Serzh Sargsyan in a solemn memorial service remembering the events of 1915 - when Armenians say the Ottoman Empire killed 1.5 million of its people.
Modern-day Turkey strongly disputes claims that the events were a genocide, and the figures stated.
During the prize ceremony Clooney called for the world to recognise the "Armenian genocide". Amongst the finalists for the Aurora Prize were American doctor Tom Catena, the only permanent surgeon responsible for more than half a million people in Sudan's conflicted border area with South Sudan.
Also nominated was Syeda Ghulam Fatima, a Pakistani activist who survived attempts on her life during her campaign to liberate bonded labourers, and Father Bernard Kinvi, a Togolese priest providing refuge to both sides of a civil war in the Central African Republic.


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Posts Tagged 'occupancy censors for lights'
Top 5 tips for smart home upgrades
Making Your Home a Smart Home
In today's world, mostly everything is digitized … even our homes. If you have upgraded from a flip phone, now it is time for your family to enjoy some smart home upgrades.
Are you worried about high electricity bills? … Read More


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I was just curious if they make any parts that can go onto your wheels that would make your manual chair into a power chair that has a remote you can control the chair with.
For me the power chair is big and bulky, and it's very hard to get into restaurants and fit under tables.
Just wondering if there was anything available


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Guide and Virtual Tour of Blackpool: The Pleasure Beach.
Panorama | Review | Map
Blackpool's Famous Pleasure Beach offers more than just thrills, spills and fairground rides. Aswell as the Pepsi Max Big One and the many adrenaline-inducing roller coasters, there are gentler rides for younger children.
Did you know that the Pleasure Beach is also home to Blackpool's own Ice Rink? The Hot Ice Show takes place here at the Ice Arena, but you can also come here to ice skate yourself at public skating sessions, at one of the two ice rinks.
Ice Arena Opening Times: open every day but restricted public skating times.
Blackpool Pleasure Beach Opening Times: daily from 10:30 til 18:00 or even 20:00 in high summer.
Join us on the next part of our virtual tour of Blackpool...
You are viewing panorama No.20 (The Pleasure Beach), one of 27 Virtual Reality 360 degree views of Blackpool.
Map of Blackpool showing the location of The Pleasure Beach at Latitude 53.79342 / Longitude -3.05642.
We visited Blackpool in the summer time, this page was created on Wed, 19 Oct 2011 16:15:19 +0100.
5 Day, 10 Day, 15 Day long range weather forecast and current conditions for The Pleasure Beach, Blackpool


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I'm so excited to be offering sponsorships on Littlest Sweet Pea again! One of the main reasons I stopped it was because it took so much extra work and time (that I didn't have) plus some of the blogger apps are no longer available. But I found out about Passion Fruit ads and knew it would be a good fit for me. You can see more info here on how to become a sponsor!
Here's a screen shot of the Sponsorship section!


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|Method and system for failure signal detection analysis
|Burch et al.
|Kulkarni et al.
|Automated sourcing of substrate microfabrication defects using defects signatures
|Luu et al.
|Defect analysis using a yield vehicle
|Fure et al.
|Method for automatically searching for and sorting failure signatures of wafers
|Method of and system for analyzing cells of a memory device
|Wohlfahrt et al.
|Method and system for analyzing bitmap test data
|Song et al.
|Diagnosis of combinational logic circuit failures
|Bartenstein et al.
|Method for diagnosing failures using invariant analysis
|Bartenstein et al.
|Advanced bit fail map compression with fail signature analysis
|Vollrath et al.
|Method and apparatus for yield and failure analysis in the manufacturing of semiconductors
|Defect reference system automatic pattern classification
|Harvey et al.
|Automated diagnostic system
|Steinmetz et al.
|Method for automating the development and execution of diagnostic reasoning software in products and processes
|Giordano et al.
|August, 1995
|August, 1995
The present invention relates to testing of semiconductor circuits. More particularly, the present invention relates to a method and system of determining the root causes of fail patterns by utilizing the spatial correlation information of fail patterns and the layout information of the circuits.
One of the main methods of improving circuit yield during the development or manufacturing of integrated circuits is to study the fail patterns uncovered by a tester used to test a given integrated circuit. If fail patterns could be used to disclose important information about their root causes or the nature of the defects, corrective actions could then be taken to improve the yield, based on the knowledge of such defects gained from such analysis, either from the process side or the design side.
Existing methods for analyzing semiconductor fail patterns are developed from the memory bit fail maps. Unlike logic circuits, memory chips can easily provide the exact X, Y coordinates of each memory cell. Therefore, memory chips have been used more extensively in fail pattern analysis than logic circuits. One example of a yield analysis tool is disclosed in U.S. Pat. No. 6,564,346. Although fail patterns from the tester data of memory circuits are searched, classified and analyzed, each fail pattern is classified individually without regard to the local correlation among the fail patterns.
The present invention is directed to a method for determining the root causes of fail patterns in integrated circuit chips. Initially for a given integrated circuit chip layout, a plurality of potential defects are identified in the given integrated circuit chip layout, and a plurality of potential fail patterns are identified in the given integrated circuit chip layout. Identification of the plurality of potential defects includes using layout connectivity information from the integrated circuit chip layout to identify the potential defects. Correlations between the identified potential defects and identified potential fail patterns are identified, and these correlations are used to identify groupings of potential fail patterns and potential defects. Each grouping includes one potential defect and one or more potential fail patterns. For an actual integrated circuit chip that is to be tested, actual fail patterns are identified in the integrated circuit chip. These actual fail patterns are compared to the identified groupings of potential fail patterns and potential defects to identify actual defects in the integrated circuit chip.
In one embodiment, identification of the plurality of potential fail patterns includes determining fail patterns that can be caused by the identified plurality of potential defects. Identification of the correlations between potential defects and potential fail patterns includes associating each potential fail pattern with all potential defects that are potential root causes of that potential fail pattern. Use of the correlations to identify groupings of potential fail patterns includes identifying potential fail patterns that can result from the same defect. Identification of actual fail patterns includes searching bit fail maps associated with the integrated circuit chip.
In one embodiment, use of the groupings of potential fail patterns and potential defects to identify actual defects includes grouping the actual fail patterns according to spatial correlations across the integrated circuit chip, matching the groupings of actual fail patterns to the groupings of fail patterns and potential defects and identifying potential defects associated with the groupings of potential fail patterns and potential defects to which the groupings of actual defects are matched. In one embodiment, the spatial correlations include areas of the integrated circuit chip. In one embodiment, the spatial correlations correspond to the entire integrated circuit chip.
In one embodiment, the method also includes determining a total number of each potential defect that can occur in the integrated circuit chip arrangement, and using the total numbers to calculate a probability of occurrence of each potential failure pattern. In one embodiment, the potential defects include breaks or short circuits within the circuitry of the integrated circuit chip arrangement.
FIG. 1 is a schematic representation of an embodiment of a method to identify the root causes of failure patterns by using spatial correlation of tester data in accordance with the present invention;
FIG. 2 is a table summarizing an embodiment of the layout analysis of a SRAM showing the correspondence between defects and fail patterns;
FIG. 3 is an illustration of an embodiment of a layout analysis of SRAM cells showing that contact open defects can cause both single cell failure (SCF) and vertical pair failure (VP);
FIG. 4 is an illustration of an embodiment of the local correlation between SCF and VP failures clustered in some regions; and
FIG. 5 is a graph showing an embodiment of the total numbers of vertical pair failures and single cell failures on an integrated circuit chip.
Systems and methods in accordance with the present invention correlate fail patterns in an integrated circuit chip or wafer with defect locations in that chip or wafer to identify the root cause of such fail patterns and to improve integrated circuit manufacturing yield. Referring initially to FIG. 1, an exemplary embodiment of a system 100 for the identification of defects that are the root cause of fail patterns in an integrated circuit chip in accordance with the present invention is illustrated. As illustrated, a known layout for each integrated circuit chip that is to be manufactured is identified 102. This layout is derived, for example, from a schematic used in the manufacture of the integrated circuit chip. The known layout for each integrated circuit chip is analyzed, and potential defects that can occur in the layout are identified 104. These manufacturing defects could cause open circuits and short circuits on the device and interconnect layers, for example on the silicon layer RX, polysilicon layer PC, contact layer CA, metal layers M1, M2, M3 and via layers V1, V2. In addition to defects, potential fail patterns in the integrated circuit chip layout are identified 106. Common fail patterns on memory chips may involve single cell (SCF), quadruple cells (QUAD), horizontal pair (HP), vertical pair (VP), bit line (BL), word line (WL) and one bit line crosses one word line (Cross) failures.
The identified defects are the roots causes of the fail patterns. Stated another way, the fail patterns are the functional manifestations of the underlying defects in the integrated circuit chip. Therefore, identification of fail patterns is used to identify actual defects in the integrated circuit chip. In order to use the fail patterns to derive the defects, correspondences between fail patterns and defects are required. In one embodiment, the desired correspondences are obtained by identifying correspondences between the identified potential defects and the identified potential fail patterns in the integrated circuit chip layout 108. A given fail pattern can result from different defects. In addition, a given defect in an integrated circuit chip can manifest as one or more fail patterns. In one embodiment, potential defects are grouped by the common failure patterns associated with the defects. Preferably, the potential fail patterns are grouped according to a common defect 110.
A given grouping of potential fail patterns and the associated common potential defect that is the root cause of the all of the fail patterns in the group is associated with the integrated circuit chip layout from which the potential fail patterns and potential defect were derived. Each integrated circuit chip layout can have a plurality of associated groupings of potential fail patterns. Therefore, all potential fail patterns that can result from a given defect are grouped together. In one embodiment, these groups are saved to a persistent storage location to be used any time that an integrated circuit chip is created in accordance with the integrated circuit chip layout. The groupings are used to determine the likely root causes, i.e., the defects, associated with observed fail patterns in actual integrated circuit chip wafers that are tested. Fail patterns with common potential root causes will show local correlation if their common root causes are the dominant failure mechanisms in a related technology or product.
Having established groupings of potential fail patterns and common potential defects for an integrated circuit chip layout, these groupings are used in the testing and analysis of actual integrated circuit chips manufactured in accordance with the layout. A production integrated circuit chip 112 is placed in a suitable tester 114 that analyzes the wafer and produces fail data 116. Suitable testers and resulting fail data are known and available in the art. For example, a programmable tester can be used to perform the functional and parametric testing of dynamic random access memory (DRAM), static random access memory (SRAM), video random access memory (VRAM) and single in-line memory module (SIMM) devices. Memory cells that failed a specific test are shown as black squares on a bit fail map, while memory cells that passed the test are shown as white squares (402 in FIG. 4). The fail data generated by the tester are used to identify actual fail patterns in the integrated circuit chip wafer 118. In one embodiment, a plurality of actual fail patterns are recognized from the fail data. In order to utilize the groupings of potential fail patterns to identify defects, the actual fail patterns are grouped 120. In one embodiment, the actual fail patterns are grouped in accordance with spatial correlations in the tested integrated circuit chip wafer. The size of the spatial correlation can be varied from groupings that cover the entire wafer to local correlations of groupings that cover single circuits, components, i.e., transistor, or connectors in the integrated circuit. In one embodiment, the spatial correlations cover a prescribed area of the tested wafer.
The groupings of the actual fail patterns are compared to the potential fail pattern groupings 122, and matches are identified. From the potential fail pattern groupings that match the actual fail pattern groupings, defects, i.e., underlying root causes, for the actual fail patterns are obtained 124. In particular, the identified defects are the potential defects associated with the potential fail pattern groupings with which the actual fail patterns are matched. Therefore, systems and methods in accordance with the present invention provide for a more accurate identification of defects in integrated circuit chips than existing systems that do not consider the correlation of fail patterns. In one embodiment, the steps of actual fail pattern recognition, actual fail pattern grouping, comparison of actual groupings to potential groupings and the identification of defects are performed by the tester. Alternatively, a separate dedicated or general purpose computing system is used to handle the analysis.
Yield analysis and physical failure analysis (PFA) in a 45 nm-technology silicon on insulator static random access memory (SOI SRAM) was performed using methods for the determination of root causes of fail patterns in accordance with the present invention. Initially, an extensive SRAM layout analysis was performed to determine the potential defect-related failure mechanisms, i.e., defects, on all active and metal interconnect layers and to determine potential SRAM fail patterns that might be induced by the potential failure mechanisms. Referring to FIG. 2, a table 200 illustrates the relationship among the potential fail patterns 202 in the SRAM and the potential defects 204. As illustrated, any given potential defect can be the root cause of one or more potential fail patterns. Therefore, a given fail pattern can be caused by one or more defects. All of the potential fail patterns caused by a given defect are a grouping of fail patterns caused by the associated defect. Therefore, even though a given fail pattern can be caused by more than one defect, when that fail pattern appears in combination with a given grouping, then the actual defect causing that fail pattern can be determined. For example, a contact open defect 206 is associated with the potential fail pattern grouping of single cell failure (SCF) 208, vertical pair of cells failure (VPC) 212 and a horizontal pair of cells failure (HPC) 210. In the actual SRAM being tested, these fail patterns would be spatially coordinated within the prescribed parameters.
Referring to FIG. 3, details of the SRAM layout 300 are illustrated. These details show how contact-open defects, i.e., CA open, cause the plurality of fails patterns in the groupings associated with the contact-open defect. Depending on the actual contact on which the defect is landing on, the defect can cause a single cell to fail (SCF) 302, a vertical pair of cells to fail (VP) 304 or a horizontal pair of cells to fail (HP) 306. Although different fail patterns may not occur simultaneously in the same cell, the CA open defect could cause all three types of failures in an expanded region that includes multiple cells. In general, in only one fail pattern were present in a specific chip area, it would be difficult to identify the root cause as there could be multiple potential defects that might cause the same fail pattern. However, if a plurality of fail patterns were present in a specific chip area, then the number of potential defects that could cause such combination of failures would be greatly reduced.
By counting the number of contacts corresponding to the occurrence of each one of the fail patterns in the entire SRAM design, the failing probability of each fail pattern is calculated. In addition, ratios of probabilities of occurrence of each one of the failing patterns associated with a given defect are calculated. As illustrated, the fail probability ratio of an SCF failure pattern occurrence to a VP failure pattern occurrence is 2:3 for the SRAM layout illustrated. In one embodiment, this ratio of SCF failure pattern occurrence to a VP failure pattern occurrence is used to identify the root cause of such failures when the chip-level correlation of SCF to VP in the actual chip also yields a 2:3 ratio (FIG. 5). In one embodiment, the layout analysis can be enumerated with layout connectivity information. After the layout connectivity information is extracted from the design layout, it can be used to simulate fail patterns by enumerating all possible breakages and shorts. This enumeration technique can be used to generate potentially correlated fail patterns. It can also be used to identify potential root causes after correlated fail patterns are observed in tester data. In contrast to a traditional manual layout analysis, the use of layout connectivity information to enumerate potential defects provides an automatic means and complete coverage to correlate to fail patterns with their potential root causes (FIG. 2).
Having established potential defects and groupings of potential fail patterns associated with these root causes as illustrated in FIG. 2, local spatial correlations of these groups of fail patterns, for example, SCF and VP, that have common root causes are identified in an actual SRAM that is tested. In this embodiment, only two of the three failure patterns in a given group are used, because the horizontal pair (HP) failures do not occur as frequently in certain chips, for example in certain SRAM technologies. Therefore, the exact arrangement and grouping of defects can be varied based upon the type of integrated circuit ship being tested. The local correlation of fail patterns can be identified by a comprehensive search in the SRAM bit fail maps. Referring to FIG. 4, the bit fail map 402 of an SRAM chip where SCF and VP failures are found to be locally correlated is illustrated. Since SCFs and VPs are locally clustered together, these fail patterns are likely to share the same root cause in the regions of the SRAM chip where these clusters occur. To confirm this hypothesis, these regions of the chip are polished and etched down to the poly/active/contact layers through the de-layering process. As shown in the scanning electron microscope image representation 404 of the tested SRAM chip, a contact 406 was found to be failing at the location of the single cell failure (SCF). In particular, the scanning electron microscope image shows that the failing contact is smaller than other contacts. Therefore, the voltage contrast of this contact differs from the voltage contrasts of all the other contacts. In the physical failure analysis of other vertical pair (VP) failures, similar contact open defects were found. The SCF and VP failures show strong local correlation, indicating a correspondence to the same contact open root cause.
In one embodiment, the local correlations of fail patterns are extended to the chip level for further yield analysis or confirmation of the results found in local regions. Referring to FIG. 5, the correlation between SCF and VP failures, where the x-axis is the number of VP patterns in each chip 502 and the y-axis is the number of SCF patterns in each chip 504, is illustrated for a variety of SRAM wafers. Some wafers show strong correlation between SCF and VP, with a ratio of 2:3 along the correlation line 500, which is consistent with the layout analysis. This finding strongly indicates that these wafers have been affected by the same contact open problems found in physical failure analysis.
While the present invention has been particularly described in conjunction with a specific preferred embodiment, it is evident that many alternatives, modifications and variations will be apparent to those skilled in the art in light of the present description. It is therefore contemplated that the appended claims will embrace any such alternatives, modifications and variations as falling within the true scope and spirit of the present invention.
Methods and systems in accordance with exemplary embodiments of the present invention can take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment containing both hardware and software elements. In a preferred embodiment, the invention is implemented in software, which includes but is not limited to firmware, resident software and microcode. In addition, exemplary methods and systems can take the form of a computer program product accessible from a computer-usable or computer-readable medium providing program code for use by or in connection with a computer, logical processing unit or any instruction execution system. For the purposes of this description, a computer-usable or computer-readable medium can be any apparatus that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. Suitable computer-usable or computer readable mediums include, but are not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems (or apparatuses or devices) or propagation mediums. Examples of a computer-readable medium include a semiconductor or solid state memory, magnetic tape, a removable computer diskette, a random access memory (RAM), a read-only memory (ROM), a rigid magnetic disk and an optical disk. Current examples of optical disks include compact disk—read only memory (CD-ROM), compact disk—read/write (CD-R/W) and DVD.
Suitable data processing systems for storing and/or executing program code include, but are not limited to, at least one processor coupled directly or indirectly to memory elements through a system bus. The memory elements include local memory employed during actual execution of the program code, bulk storage, and cache memories, which provide temporary storage of at least some program code in order to reduce the number of times code must be retrieved from bulk storage during execution. Input/output or I/O devices, including but not limited to keyboards, displays and pointing devices, can be coupled to the system either directly or through intervening I/O controllers. Exemplary embodiments of the methods and systems in accordance with the present invention also include network adapters coupled to the system to enable the data processing system to become coupled to other data processing systems or remote printers or storage devices through intervening private or public networks. Suitable currently available types of network adapters include, but are not limited to, modems, cable modems, DSL modems, Ethernet cards and combinations thereof.
In one embodiment, the present invention is directed to a machine-readable or computer-readable medium containing a machine-executable or computer-executable code that when read by a machine or computer causes the machine or computer to perform a method for determining root causes of fail patterns in integrated circuit chips in accordance with exemplary embodiments of the present invention and to the computer-executable code itself. The machine-readable or computer-readable code can be any type of code or language capable of being read and executed by the machine or computer and can be expressed in any suitable language or syntax known and available in the art including machine languages, assembler languages, higher level languages, object oriented languages and scripting languages. The computer-executable code can be stored on any suitable storage medium or database, including databases disposed within, in communication with and accessible by computer networks utilized by systems in accordance with the present invention and can be executed on any suitable hardware platform as are known and available in the art including the control systems used to control the presentations of the present invention.
While it is apparent that the illustrative embodiments of the invention disclosed herein fulfill the objectives of the present invention, it is appreciated that numerous modifications and other embodiments may be devised by those skilled in the art. Additionally, feature(s) and/or element(s) from any embodiment may be used singly or in combination with other embodiment(s) and steps or elements from methods in accordance with the present invention can be executed or performed in any suitable order. Therefore, it will be understood that the appended claims are intended to cover all such modifications and embodiments, which would come within the spirit and scope of the present invention.


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Marionberry Scones
2016-01-05 17:26:09
Need a Monday morning/afternoon/evening pick-me-up? Try these deliciously simple Stahlbush Marion Blackberry Scones.
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- 1 bag Stahlbush Island Farms Marion Blackberries
- 2 cups all-purpose flour
- 1/4 cup sugar, plus 1 tablespoon for the topping
- 1 tablespoon baking powder
- 1/2 teaspoon salt
- 6 tablespoons cold unsalted butter, cut into 1/2-inch pieces
- 2 eggs
- 1/2 cup half & half
- 1 teaspoon almond extract
- Preheat oven to 425ºF.
- Sift flour, sugar, baking powder and salt.
- Cut in the butter, until the mixture looks like meal.
- Mix in the Marion blackberries.
- In a separate bowl, combine the eggs, half & half and almond extract.
- Stir into the flour mixture just until evenly moistened.
- Turn the dough out onto a lightly floured surface and gently form it into a ball.
- Pat the ball into a circle about 1/2 inch thick.
- Use a biscuit cutter and cut out scones.
- Place the wedges 1 inch apart on the baking pan, lined with parchment paper.
- Brush with a tablespoon of sugar on top.
- Bake until golden brown, about 15 minutes.
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