text:
G.I.L.I. Petite Bootcut Jean
or 4 Easy Pays of $19.00
+ S&H and tax
In Stock
Sold Out
We're sorry. This item is not available at this time.
Pre Order Possible .
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- Fabrication: denim
- Hardware: zip fly and novelty button closure
- Features: belt loops, two front faux pockets, two back pockets
- Rise: below the waist
- Fit: fitted; cut to follow the lines of the body
- Leg shape: flared; flares from knee to leg opening
- Inseam: petite missy/plus inseam 29"
- Content: 98% cotton/2% spandex
- Care: machine wash, tumble dry
- Imported
To see the specific garment measurements for this item, click here.


text:
After you've stuffed yourself with great food this Thanksgiving and watched a lot of football, you'll probably need something to wind down and relax to you.
Well, if you're a Taylor Swift fan, then you're in luck! On November 25, you'll get access to Taylor Swift like never before with an all-new musical special "Taylor Swift: Speak Now" (8- 9 p.m. ET).
"Taylor Swift: Speak Now" will bring fans on a whirlwind trip from New York City to Los Angeles with concerts in unique locations, including Central Park and on top of a tour bus on Hollywood Boulevard in downtown Hollywood.
The fast-paced hour features nine one-of-a-kind performances, including intimate takes on Swift's songs "Mine," "Sparks Fly," "Story of Us," "Long Live," "Haunted," "Mean," "Back to December," "Enchanted," and the title track of her new album "Speak Now."
The special also features behind-the-scenes footage of all of the mayhem surrounding the popular Swift, who takes viewers along for the exhilarating ride of making and releasing her blockbuster Speak Now CD. From the recording studio to her publicity tour for Speak Now, fans get an all-access pass.
Lisa had the chance to attend the tapings in New York City, and Katie attended one in LA, and let us tell you, it was awesome. You'll definitely want to check it out. Maybe you'll even spot us!
Check out a few previews below. If you missed Taylor on Jay Leno, you can watch that here. For even MORE preview clips from the Thanksgiving special, go here.
(Photos: F. Scott Schafer/Taylor Swift Productions/NBC)
More Thanksgiving preview clips here.

subset: commoncrawl


text:
First Tutors enables you to find a local music teacher in Rugeley and anywhere in the UK. Home music tuition is an excellent way to improve confidence while increasing grades and doesn't have to be boring! Please use our service to search for Rugeley music tutors and select the one who best meets your requirements.
First Tutors is the best place to find the top Rugeley music tutors for your needs, helping you find a home Rugeley music teacher for any subject, for example, GCSE English, A-Level Maths or even university Chemistry. We also help with language tuition, so if you want to learn French, take a Arabic course or prepare yourself for French life, we can help - and all in Rugeley! We order music Rugeley tutors in your area by music lesson costs and proximity to you.
If you are a Rugeley music teacher wishing to offer your home music tuition services in Rugeley or the UK, please register with First Tutors or find out more about what we offer here. Private music tuition is a fantastic way to re-affirm your own music knowledge while helping someone else, all in your local Rugeley area!


text:
What's with the new screen name?
Welcome Back
Welcome back Moe!
My friend!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!!
Who do you think my comments will irritate?
MO Knows
I laughed typing it. The song even came to my head..
Wasn't being nasty sorry if I came off that way. I like you and find your posts hilarious Ostrich man.
I have two bengal's boards; www.bengalsworld.com (my name on there is MAUALUGA!!!!!) and the bengals.com board (I'm Shut it Down, don't call me king on there because they banned me one time for basically telling a mod he's dumb for saying CJ was better than Michael Irvin).
Welcome back my friend!
Send an Instant Message to MOtorboat Using...
Pinch & Roll
I love my wife.
Bring Back McDaniels!
Bring Back Hot Carl!!!!
Using powers for awesome
friendly 'hood colt


text:
Nightcrawler is a mystery when it first starts out. You have no idea what you're getting into with this suspenseful crime thriller set in the backdrop of L.A. Crime Journalism finally sees a voice in the most eerie way possible with Jake Gyllenhaal staring in this eerie night-time thriller.
Dan Gilroy, who penned the screenplay for the Bourne Legacy, has done an exceptional job translating the concept for the movies. Lou Bloom (Jake Gyllenhaal) is shown as this awkward and timid guy at first, but slowly things become a little sociopathic when we see the lengths he goes to in order to get something as simple as a watch and a sale. He is seen as an almost creepy yet charming personality with a salesman attitude, and the acting here is exceptionally built by Gyllenhaal on his character. The backdrop of L.A. at the nighttime is exceptional, something we have not seen since Ryan Gosling's Drive – with Mulholland Drive in Hollywood Hills being covered all the way to the Ocean Front Walk right here in Venice Beach, California. The extreme tension is built as you see how much ambition is in Bloom as he tries to work his way up in the crime journalism industry not just as a significant first-reporter on the scene, but someone willing to go out of his way to make an interesting story for his lead newscaster editor who trusts him. Their relationship is complex, and by the end of it all – seems vividly real and insane.
Nightcrawler really and truly is an amazing film in terms of everything from its storyline to even the cinematography and location planning. The film has symbolism in the most unlikeliest of places, and there is something eerie that one cannot forget about Nightcrawler even after the credits roll.
Rating: 4.5/5 stars


text:
Question about Kenwood KM400 / KM410 Chef Classic Stand Mixer
K-beater attachement is stuck and we can't remove it. Pls help
Posted by dave936 on
My dough hook is stuck and will not turn to remove - it only seems to turn the motor
Thanks so much, saved us so much money! Our local Kenwood repair quoted us over $120 to fix what just needed spanners!
Thanks Chris - I had the same problem and your solution worked for me too. When I compare my silicone beater (the one that got stuck) and my stainless steel one (that can be easily removed) I notice that on the silicone beater the spindle with the the T- bar fixer sits lower into the beater, so when fitted into the mixer it's a very tight fit. I might try unscrewing the spindle from the beater a few turns so that it's not quite so snug.
I couldn't remove the K-Beater as when I tried to turn it the whole mechanism turned with it. I couldn't even remove the splashguard! I was going to take it to the Kenwood factory (a few miles from home) but then I thought I'd give it one more go and this is what I did...
Perhaps someone can suggest how to stop it happening again. I haven't attached anything since but will update this post if I have any other helpful tips.
Posted on Oct 31, 2011
Thanks! This worked for my Kenwood Major Titanium KM020. I think the gear cog needs to be replaced now, because none of the tools fit anymore. It looks like a ring of metal is smeared on the inside of the tool/gear shaft.
Kenwood Major Titanium KM030 There is an alternative solution to this problem, which would be worth trying first. I found that the nut on the shaft at the top of the beater had become loose and worked it's way up(!) the shaft so that it had effectively bolted itself on to the female end. In other words the gap was less than that required for the k beater to move up in order for it to slip out the slot in the female end. Put a spanner on the nut and (about 13mm) spin it so it moves towards the beater - away from the machine. Simpler than dismantling the whole thing. Cheers Mark
Thank you, Did the job for me.
SOURCE: I have freestanding Series 8 dishwasher. Lately during the filling cycle water hammer is occurring. How can this be resolved
a 6ya Repairman can help you resolve that issue over the phone in a minute or two.
Best thing about this new service is that you are never placed on hold and get to talk to real repair professionals here in the US.
click here to Talk to a Repairman (only for users in the US for now) and get all the help you need.
Posted on Jan 02, 2017
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text:
West central Minnesota back in drought conditions; heat taking toll on crops
WILLMAR — Drought conditions have officially returned to west central Minnesota, adding one more challenge to an already challenging year for the region's crop farmers.
There is no doubt that this week's hot weather, plus the persistent lack of rainfall, has had a negative impact the region's corn and soybean crops, especially for crops planted on lighter soils in the northern portion of the county, according to Wes Nelson, executive director of the Kandiyohi County Farm Service Agency office.
"We have gone backwards," Nelson said Friday. "Everyone is trying to figure how far we have gone backwards."
The biggest concern right now, Nelson says, is that the soybeans will not have enough moisture to fill the top pods on the plants. The corn crop for the southern portion of the county, with heavier soils, is expected to bring pretty good yields, but this will likely only be an average crop year, he said.
This Thursday's weekly update to the U.S. Drought Monitor puts the central, west central, southwest and south-central portions of Minnesota in the moderate drought category. Only 14 percent of the state, along the northern border, isn't experiencing drought or dry conditions.
Even before the hot, hot weather, the state's crops were short on moisture. The weekly crop report released Monday, reflecting last week's conditions, showed that 23 percent was very short, 43 percent was short and 34 percent of the state's soil's had adequate topsoil moisture.
Subsoil moisture was rated as 15 percent very short, 41 percent short and 44 percent adequate. None of the state had surplus moisture of any type.
The condition of the crops reflects the moisture levels, with only 10 percent of the corn crop rated as excellent and 46 and 32 percent rating as good or fair. The soybeans rated as 9 percent excellent, 45 percent good and 34 percent fair. Beets were rated as 8 percent excellent, 59 percent good and 27 percent fair.
Noah Hultgren, who farms with his family in the Willmar area, noted that the overall crop conditions were still okay, but that the crops on lighter ground were showing the stress.
"We are starting to see the dry conditions take their toll," he said. "The marginal areas could really use a drink."
It's been at least two weeks or more since a good rain has fallen, Hultgren noted, adding that there haven't even been thundershowers this summer.
It's been a year when crop farmers have been at a disadvantage from the start, with winter snows continuing into May, putting planting time two weeks after the normal timeframe and keeping crop development behind all season. Now, the concern is that the first killing frost may come too soon for the delayed plants.
"We really need a late September, almost October 1, frost date to see full maturity of the crops, especially the soybeans," Hultgren said.
As of Friday, Nelson hadn't received any reports of death loss by livestock producers to the hot and humid conditions, although he suspected that producers had lost animals.
The long stretch of hot days means the cattle, hogs and poultry don't put on the weight as expected and milk production drops in dairy animals. It's also tough on the people who work with the animals.
"We needed the heat, but this is too much," he said.


text:
Duke and Duchess of Cambridge welcomes ban on 'topless' images
Prince William and Kate Middleton were overjoyed to win the legal case against the French publication to ban any further publication of intimate topless photographs.
The Royal couple enjoyed themselves in South Pacific, while a judge in Paris granted them an order blocking the French magazine, Closer, from republishing or selling the images.
"They always believed the law was broken and that they were entitled to their privacy," the Daily Express quoted a source as saying.
The court explained the images as a "brutal display" of William and Kate's personal lives, while St James's Palace welcomed the court's order.
According to the reports, the court ordered the magazine's publisher, Mondatori Magazines France, to hand over all files within 24 hours, with an 8,000 pounds penalty for every day's delay.
It was also asked to pay 1,600 pounds in costs. It prevents Closer, which published the pictures in its latest edition, from reusing them in print or online.
It further prevented from selling them to countries where they have not been published, and the fine for sale of the photos was set at 80,000 pounds.
Another good news for the royal couple was the hope that a criminal inquiry will lead to the unmasking of the paparazzo who clicked the pictures.


text:
CVS Caremark Says Rival SXC Lured Away Workers
CVS Caremark and Caremark LLC's complaint in Illinois federal court says SXC luring over CVS employees — despite knowing that they are bound by employment agreements with noncompetition and confidentiality provisions — and putting them in positions where it's inevitable they will use or...
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Click on the title to send us an inquiry by e-mail
Vols. 1-93. Milwaukee, 1920/21-2012. Partly reprint. Partly bound. $ 3,850
Single volumes may be available. Please inquire.
- Formerly published as SOCIAL CASEWORK
- Published for the Alliance for Children and Families, the oldest social work journal in North America, FAMILIES IN SOCIETY is a standard title in any library's socialwork collection. Articles are written for social work professionals, covering theory, practice, and public policy issues relating to the field of family counseling and treatment (Katz).
Title available from
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text:
Today is a very special day. Eric and I are celebrating our first wedding anniversary!
Exactly one year ago, we did our "first look" at Capitol Park, I walked down the aisle to Pachelbel's Cannon in D at the beautiful Cathedral, and then we had a farmer's market feast at The Old Sugar Mill with our family and friends.
I thought it'd be a good day to share some of our wedding photos with you, since it's a special day and all.
And just for the record (if some of you don't already know this), I used to have blond hair. Obviously. Just didn't want you to be confused 😉
Beautiful bridesmaids
Handsome groomsmen
First look at Capitol Park
The Cathedral
Just married! Biggest smiles.
And the festivities at the Old Sugar Mill begin!!!
Eric and I love food. Farmer's Markets are our thing, so it didn't take too long to figure out that we will have a Farmer's Market inspired celebration.
Farmer's market stations, watering cans as centerpieces, handmade crates, with produce everywhere. We had a blast designing and sharing our love for food with friends and family.
We left many of the traditional details out to make more time for mingling and dancing (of course!), so we left out the cake and the cake cutting. Eric and I are not cake fans, but love pie! And because we didn't want everyone to fight over slices, we had 5 summer varieties.
Danced the night away. As usual.
Snuck away for a few photos outside.
Cheers to a sweet year!
It was really late before we said goodbye.
This year passed by faster than any other year of my life and it was full of changes for both of us. I am so thankful to have such a wonderful husband, who loves me just the way I am.
Happy One Year!
We are heading to the Russian River this weekend to celebrate!


text:
CLINTON, N.C. (WNCN) — Fourteen people were injured and homes and buildings have been destroyed following a severe thunderstorm in Sampson County Monday night, county officials said.
A severe thunderstorm tore though Sampson County around 11:30 p.m. Monday and left a trail of damage in its wake.
Officials said fourteen people were injured in the storm. Two people were transported to the hospital for treatment by EMS and a third person was transported to the hospital by a sheriff's deputy, officials said. Several others took themselves to the hospital.
Sampson Regional Medical Center's nursing supervisor Deborah Philyah said that they had nine people come to the ER for weather-related injuries. Most injuries were minor such as bruises and cuts. The first person came into the hospital around 11:30 p.m. There's currently no one in the ER with weather-related injuries, Philyah said.
In addition to the 14 people injured, there were also at least 12 reports of "structures damaged," which can mean anything from a tree falling on a house to a mobile home being destroyed.
One woman, Brenda Smith, of Hobbton, told CBS North Carolina that she was in her mobile home with her dog when the storms came through around 11 p.m.
"It hit. It sounded light a train coming through, and it hit. When it did I grabbed the kitchen sink, because I am standing there at the sink and grab it and I tell Lacy 'stay.'"
Smith was tossed out of her trailer during the storm.
"The next thing I know, I am tumbling, and then I am sitting on the ground behind the trailer – up under it. Right there under the middle of the debris," she said.
Smith said she feared Lacy had died, but the dog found her as she was on the ground outside the trailer. Lacy sat on her lap and she found a board to hold over their heads as the rain poured down.
A few minutes later, two men yelled out asking if anyone was inside the home. Smith said the men took her and Lacy to their house where they were able to dry off and she was given a change of clothes.
"It's by the grace of the Lord that I am here," she said. "It didn't really hit me last night, but this morning when I came over and looked, I am amazed I am even alive. It's just that bad."
Smith suffered a few cuts and bruises and said she's sore, but overall she's OK. Lacy was uninjured as well.
A number of hog and poultry farm houses were destroyed in the storm and residents in the county experienced power outages. Around 1,300 people were at one point without power. Several of the roads in Sampson County are blocked by downed trees or power lines.
Officials said the damage followed an east-west path from north of Salemburg to north of Clinton.
Sampson County schools announced Tuesday morning that schools will begin two hours late due to the damage left behind by the storm.
The Sampson County Emergency Operations Center is operational and volunteer fire departments are driving around looking for any other areas blocked by downed trees or power lines.
The National Weather Service will be sending a crew to Sampson County to survey the damage today. The NWS will be looking to see if the damage was caused by straight-line winds or if a tornado touched down. The focus of the survey will be in the north and northeastern part of the county – just south of Hobbton near the Keener area.
RELATED: Tornado with 110 mph winds rips through Autryville, cleanup now underway
Monday night's storm came just a week after a EF-1 tornado packing 110 mph winds ripped through Autryville, a small town located in Sampson County.
The May 24 tornado knocked down or damaged a number of buildings, including the fire department. Three fire department vehicles, each valued at $420,000 were destroyed in the storm. No one was seriously injured.


text: My A4Q does the same thing...the small high pitch noise. When I go to freeway, I will turn my radio loudly. Next time I will turn it off and listen carefully the noise problem. BUT, when I just start or stop my car, I can definitely hear the high pitch noise. not loud, but enough to make me crazy. I found out that the noise getting louder when I step on the brake. Any A4Q owners have the same problem? Kawo On Wed, 17 Jul 1996, McIntyre, Richard wrote: > My A6Q does something similar, but it's more subtle. The > local Audi mechanic couldn't hear it, but most passengers > can after you mention it to them. In my case the sound > is very sensitive to accelerator position (which I think means > vacuum), and secondarily speed (74 mph is the sweet spot, > but I've heard it at 49mph). I've just about given up on it. > > Richard > > > >From: email@example.com > >Date: Tue, 16 Jul 1996 18:17:02 -0400 > >Subject: Dash Noise ?? > > > >I've just got back from a 440 mile drive along the beautiful interstates of > >the south east in my 1990 V8...along the way, I tried to figure out the noise > >from under my dash....it doesn't matter what the climate control settings > >are, cruise on or off, what the radio is doing or anything else expect the > >speed and throttle position. The noise is rather high pitched, (almost > >electronic sounding), always stops when I declerate, it is worse when > >cruising at a constant speed. If I accelerate from the constant speed, it > >change pitch. The nosie seems worse at 65-70 versus slower or faster. > > > >Anybody got any ideas?? Could it be vacuum? the in dash temperature sensor? > > I'm going nuts, maybe! > > > >thanks Hank >


text:
Which one do you ladies like? And does anyone have a picture comparing both of them side by side?
I'm sorry I do not have pictures of them... also if I'd love to have a sandstone.
So i vote for it: sandstone!!
aghhh! i am so confused! i wish someone would get one! then i will vote! great question! i want to know too!
There're comparison pics HGbags listed in "I'm unerwhelmed" thread. According to the pics and what some said, Mastic is yellowish beige whereas Sandstone is more taupe.
I personally adore Sandstone(I love gray-taupe-beige shades), so I voted for Sandstone. Mastic seems very similar(in the pics)to my 03 Mastic, which I also like.
Sandstone. I like taupey colors if they are more brown than gray, and Sandstone was the rare color to fit that category. For me, Mastic had an uphill climb in comparison. I haven't seen it in person, though, and if it is sort of golden, and the leather is really nice, then I could like it as a totally different thing.
Just going from pictures, I have not seen either in real life, I like both colors equally. They are too similar to get both but I can't decide which one I want.
I own a Sandstone Twiggy, and really love the color, so I voted for Sandstone. I've seen the comparison pics that hgbags posted and there is definitely a difference between Sandstone and Mastic. I might change my mind, however, when I see Mastic IRL...
I prefer sandstone as a color on its own. However, because of the golden tones in mastic, I think it would make a more versatile neutral for a wardrobe with lots of color. Sandstone looks great against neutrals, but I find my 05 caramel to be better suited for colors, the greyness in the sandstone makes it seem drab when paired against a coral or turwuoise shirt.
I like the pinkish undertones of SS more than the yellow undertones of mastic. However, I think they both have similar qualities, so chose the one that suites your wardrobe and skin color the best.
I have YET to see sandstone (or mastic) in real life, but from the comparison shots (thanks for pointing those out, chuggie), I think I prefer sandstone.
I prefer Sandstone - Mastic is a bit too golden for my liking.
i voted sandstone... i have a twiggy in SS and the reason i love it is how multi-dimensional the colour is, which brings out the beauty of the chevre leather. mastic looks a little flat from the pics but i haven't seen it IRL.
I love sansdstone! I got one from hgbags in giant hobo and its beautiful!!i am going to post pics soon. this color is amazing, so i vote sandstone.
Sandstone for me too!! Has a little pink in it!!!!
i'm swimming against the tide - i am loving the mastic! i think it is so gorgeous and the leathers i've seen so far remind me of the 05 bags.


text:
+myConnections: Engage your community - connect to news, events and information you care about. View more information...
View your community's facilities and features online with the new Facilities Module.
Personalize your online experience to stay up-to-date on news, events and other information.
View All Calendars is the default. Choose Select a Calendar to view a specific calendar. Subscribe to calendar notifications by clicking on the Notify Me button, and you will automatically be alerted about the latest events in our community. When searching the calendar, enter a Start Date in the area next to the search box to receive the most recent events.
July 5, 10:00 AM - 12:00 PM @ Atkins Study Room
July 5, 10:00 AM - 10:45 AM @ Broadmoor Meeting Room
For ages Birth - 3 years
July 5, 10:00 AM - 12:00 PM @ Broadmoor Tech Center
Limited Space; Registration Required
Class times subject to change.
July 5, 11:00 AM - 11:45 AM @ Broadmoor Meeting Room
July 5, 3:00 PM - 5:00 PM @ Broadmoor Youth Services Area
Builders and future builders of the world, join us for LEGO Club and let your imagination soar with this open-build program, All ages.
July 5, 4:30 PM - 6:30 PM @ Broadmoor Meeting Room
Join us for an acoustic jam! Everyone is welcome!
July 5, 10:00 AM - 11:00 AM @ Cedar Grove / Line Avenue Meeting Room
Are you looking for a fun way to relax? Coloring is a great way to relax. Join us for our weekly coloring club and create a beautiful piece of art. For more information call 868-3890.
July 5, 11:00 AM - 11:45 AM @ Cedar Grove/Line Avenue Youth Services Area
Are you interested in learning how to use the computer? If so join us for a Basic Computer Skills. Registration is required. For more information call 868-3890.
July 5, 2:00 PM - 2:30 PM @ Cedar Grove / Line Avenue Meeting Room
Fun storytime for kids.
Large groups/daycares, please call ahead.
July 5, 4:00 PM - 6:00 PM @ Cedar Grove/Line Avenue Youth Services Area
Looking for a fun activity after school. Join us for Family Coloring Club. Families will enjoy coloring while watching a movie. Light refreshments served. For more information call 868-3890.
July 5, 10:00 AM - 10:45 AM
July 5, 11:00 AM - 1:00 PM @ David Raines Meeting Room
A program of the U.S. Department of Agriculture (USDA), the Summer Food Service Program was established to ensure that children continue to receive nutritious meals when school is not in session. The program is sponsored by the State of Louisiana and the Food Bank of Northwest Louisiana. Meals will be provided free of charge by the Food Bank of Northwest Louisiana Monday through Friday through July 31.
July 5, 10:00 AM - 11:00 AM @ Hamilton / South Caddo Small Meeting Room
Ages 0-36 months are welcome to join the Summer Reading Program with Mother Goose rhymes, stories, crafts, and movement activities in a fun environment.
July 5, 10:00 AM - 11:00 AM @ Higginbotham Library on Hwy 80 across from Greenwood Park
The Greenwood Police Department will present a program on gun safety for youths.
July 5, 10:00 AM - 11:00 AM @ Hollywood / Union Avenue Meeting Room
You are Invited !!!
Please join us for our preschool story time.
Come Read, Sing and Dance with Ms. Tenisha
For more info call 318-636-5520
July 5, 1:00 PM - 2:00 PM @ Hollywood/Union Avenue Tech Center
You are invited to attend our computer classes at Hollywood Union Ave Branch
Basic Computer Class (intro to Computers)
For More Info contact 318-636-5520
July 5, 3:00 PM - 4:00 PM @ Hosston
We will build ab better world by building a habitat for an animal.
July 5, 11:00 AM - 12:00 PM @ Main Library Tech Center: Classroom
No registration required, but there will be no entrance allowed after the class has begun.
July 5, 3:00 PM - 4:45 PM @ Main Library Youth Services Area
Tweens and teens are invited to join us for a weekly game time in the Youth Services area in June and July. The days play may feature card games, table top games, or video games.
July 5, 10:00 AM - 12:00 PM @ Mooretown Tech Center
Registration is Required.
July 5, 10:00 AM - 10:30 AM @ Mooretown Meeting Room
July 5, 11:00 AM - 1:00 PM @ Mooretown Meeting Room
Northwest Louisiana Food Bank is sponsoring a "Free Feed" Program to children 0-18 years of age daily at the Mooretown Branch Library.
July 5, 10:00 AM - 10:45 AM @ North Caddo Meeting Room
Peapods Storytime will be for ages 0-4 on Wednesdays at 10:00 AM. It will be a fun storytime with stories, songs, and fun with learning.
July 5, 2:00 PM - 3:00 PM @ North Shreveport Meeting Room
Tips and tricks on organizing your home.
July 5, 2:00 PM - 3:00 PM @ Rodessa
July 5, 11:00 AM - 1:00 PM @ Wallette Meeting Room
July 5, 4:00 PM - 5:00 PM @ West Shreveport Meeting Room
Walk 3 miles in air conditioned comfort, while getting healthier in the company of others in the community.
July 5, 7:00 PM - 9:00 PM @ West Shreveport


text:
"There are a thousand hacking at the
Site Section Links
Introduction Material
Christianity Material
Jesus Material
Philosophy Material
Cosmology, Creation,
Reconstruction &
Miscellaneous Material
What can be said
about almost all human beings is that they
1. Neither the material nor ideas promulgated on this site has been delivered or revealed by any supernatural agency or supra-normal process or experience such as visitations, voices, dreams or visions.
2. The site is not being promoted in any systematic way, but only by word-of-mouth networking, and the material is for those that have been led to it in this way.
3. Every single idea, concept or facet proposed on the site, outside of articles authored by others, has been vetted by extensive discussion with at least one other intellectually responsible person who understands it and agrees with it.
4. ALL of the material and conceptual content judged worthy for inclusion is deemed to be understandable, sensible, compatible and coherent with ALL of the other aspects of the paradigm, and seems GOOD to and GOOD for the author.
5. In order to appreciate the material on this site, a person must have already internalized authority, must have taken total personal responsibility for their own belief system, must have a thriving hunger for the truth, and must have made an unequivocal commitment to being intellectually responsible, i.e., rational, logical and reasonable.
6. The site is not promoting, nor is it associated with any
grand theory of intrinsically evil, world dominating conspiracy, such as by
Satanists, Zionists, Bilderbergers, Khazairian Mafia, Rothschilds, Masons,
Federal or national banks, etc.
The pen is mightier than the sword. - Bulwer-Lytton
But the question to be asked, is it mighty enough?
The site attempts to deal with most of the important information and issues that confront us as human beings. Consequently, there is a lot of material on this site, all of which except for a few fun items is adjudged to be important and worthwhile. Naturally some of the material is of greater importance than some other, and of course this evaluation of importance would vary from person to person according to where they are and what their current needs may be. Here are the salient points to help keep things in perspective:
Suggested Article Reading Sequence
To access a list of all the articles, use the Site Section links in the left column, the article synopsis list in the header, or the Site Article Map in the footer below. *-*-*
Home Site Sections Complete Article Map Contact Store Contributions


text:
I Wonder Until When,does One Notice
Personal Stories, Advice, and Support
When Does One Notice When Its Really Overi oftenly ask my self when will i notice. we fell in love, got married and got a baby all of a sudden things changed. i now annoy him when i talk to him as he would just scream at me for no reason. we fight for minor issues, there's is no romance any more ( cant remeber te last...
verypositive 26-30 1 Nov 29, 2009


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Calcutta, Oct. 13: Finolex Industries Ltd (FIL), flagship company of the Rs 2,500-crore Finolex group, is going ahead with a plan to double its production capacity from the existing 130,000 tonnes to 260,000 tonnes.
The company, which is one of the largest manufacturers of PVC (polyvinyl chloride) and related products, will make an investment of Rs 350 crore to expand capacity.
Sources said the investment would be made to match the expected growth in demand for PVC products, especially pipes and fittings, which are fast replacing metallic pipes.
PVC products are given priority by the construction industry since they have several benefits like longevity, apart from the price of the pipes and fittings which are much cheaper than iron or ductile pipes. Demand for these products is expected to be more than double in the next three-four years time and we want to be ready to meet that demand, they said.
They have, however, not divulged how the company will garner funds for the investment.
FIL as well as the entire group is tremendously cash rich with a very strong reserve base. The debt-equity ratio is so low that borrowing funds will not be a problem. But most of the investment is likely to come from internal accruals, sources said.
FIL has plants in Pune and Ratnagiri. The brownfield project, however, will be implemented at Ratnagiri, which is close to the sea. Proximity to the sea provides us strong benefits in terms of transport costs both for raw materials and finished products, they said.


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355 W Putnam Ave
Greenwich, CT 06830-5218
Sales: (203) 413-1900
MSRP $64,245...NOW $53,950 (PRICE INCLUDES APR CREDIT. MUST FINANCE THRU' BMW FS).**LUXURY LINE**, NAVIGATION GPS NAV, PREMIUM PKG, COLD WEATHER PKG, Heated Front Seats, Heated Steering Wheel, Luxury Package, SiriusXM Satellite Radio.Clean CARFAX. CARFAX One-Owner. Air Conditioning, Climate Control, Dual Zone Climate Control, Cruise Control, Tinted Windows, Power Steering, Power Windows, Power Mirrors, Leather Steering Wheel, Power Passenger Seat, Memory Seat Position, Roof Rack, Wood Trim, Clock, Tachometer, Digital Info Center, Tilt Steering Wheel, Telescoping Steering Wheel, Steering Wheel Radio Controls, Sunroof, Moonroof, Driver Airbag, Passenger Airbag, Side Airbags, Keyless Entry, Security System, ABS Brakes, Traction Control, Dynamic Stability, Rear Defogger, Fog Lights, Intermittent Wipers, AM/FM, CD Player, Anti-Theft, Alloy Wheels, Sport Package, 3.154 Axle Ratio, Front Bucket Seats, SensaTec Upholstery, Power Front Seats, Lumbar Support, Heated Front Seats, Hi-Fi Sound System, Enhanced USB & Bluetooth, Standard Suspension, 4-Wheel Disc Brakes, Front Center Armrest, Navigation System, Spoiler, Anti-whiplash front head restraints, Auto-dimming door mirrors, Automatic temperature control, Brake assist, Bumpers: body-color, Delay-off headlights, Driver door bin, Driver vanity mirror, Dual front impact airbags, Dual front side impact airbags, Emergency communication system, Four wheel independent suspension, Front anti-roll bar, Front reading lights, Fully automatic headlights, Genuine wood console insert, Genuine wood dashboard insert, Genuine wood door panel insert, Head restraints memory, Heated door mirrors, Heated front seats, Illuminated entry, Low tire pressure warning, MP3 decoder, Occupant sensing airbag, Outside temperature display, Overhead airbag, Overhead console, Passenger door bin, Passenger vanity mirror, Power adjustable front head restraints, Power door mirrors, Power driver seat, Radio data system, Rain sensing wipers, Rear anti-roll bar, Rear reading lights, Rear seat center armrest, Rear window wiper, Split folding rear seat, Sport steering wheel, Steering wheel memory, Telescoping steering wheel, Turn signal indicator mirrors, Weather band radio, Auto-dimming Rear-View mirror, 10 Speakers, Trunk/hatch auto-latch, High intensity discharge headlights: Bi-xenon Adaptive headlights, Bluetooth, Carpeted Floor Mats, Center Arm Rest, Child Proof Door Locks, Daytime Running Lights, Heated Mirrors, HID Headlamps, Navigation System, Overhead Console, Parking Sensors, Power Lift Gate, Premium Sound, Rear Spoiler, Rear Spoiler, Rear Wipers, Remote Trunk Lid, Roll Stability Control, Side Curtain Airbags, Tire Pressure Monitor, Vanity Mirrors -
355 W Putnam Ave
Greenwich, CT 06830-5218
(0 Miles)
Sales: (203) 413-1900
Year: 2017
Make: BMW
Model: X5 xDrive35i
Price: $53,950
Mileage: 6,445
Engine: 3.0L DOHC I-6 24V TWINPOWER TURBO
Transmission: AUTOMATIC
Exterior Color: Black Sapphire Metallic
Interior Color: Terra Dakota Leather
Fuel Type: Gasoline
Stock #: 0X80930GSO
City MPG: 18
Hwy MPG: 24
Featured Options
Cold Weather Package
Luxury Package
Premium Package
19" Light alloy wheels
Running boards
Luxury Line
Poplar Wood Trim
Navigation system
Included Packages
Cold Weather Package
Luxury Package
Premium Package
Additional Options
19" Light alloy wheels
Running boards
Luxury Line
Poplar Wood Trim
Navigation system
CO2 relevant vehicles
Power adj. steering column
Sport leather steering wheel
Tire pressure monitor
Universal garage-door opener
Roof rails in Satin Aluminum
Privacy glass
Floor mats
Auto-dimming driver mirror
Smoker's package
Lumbar support
Storage package
Heated front seats
Blow-by heater
Park Distance Control
Ambient Lighting
Additional 12-V power sockets
LED Fog Lights
Hi-fi sound system
BMW Assist eCall
BMW TeleServices
BMW Online and BMW Apps
Advanced RTTI
Remote Services
Anthracite headliner
Oil Chg 10,000 mls/12 months
Variable Light Decoding
Daytime driving lights
Transport protection
Tier 2


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Contact Us
Sign up to My Account
My Account is the easy way to check your rent balance and report repairs direct to us. You can do it any time. Sign up or log in to My Account here.
Give us a call
For repairs and general enquiries you can call us on:
01633 620 111
Our Customer Services team can be contacted between 8am – 5pm (Mon – Fri).
If you have an emergency you can use the above numbers to contact our out of hours emergency service.
Send us an email
For general enquiries you can email email@example.com
If your query is for a specific member of staff add their name to the subject line and we will make sure your email reaches them.
Talk to us on social media
You can use any of the links below to ask a question or leave a comment. These accounts are only monitored between 9am and 5pm on weekdays so if your query is urgent during the evening or weekend please call us on the numbers above.
Visit our head office
Bron Afon Community Housing
Tŷ Bron Afon
William Brown Close
Llantarnam Industrial Park
How to get here
If you are coming by car just click on the map above for a link to our location on Google Maps. The car park is free but can be very busy so please allow extra time to find a space. The Bron Afon office is located approximately five minutes from M4 junction 26.
You could also think about car sharing to reduce your carbon footprint. You can use Liftshare Wales or Share Cymru to find someone who might want to share the journey.
If you are using public transport you can plan your journey by bus or train using Traveline Cymru
We have a place to lock your bicycle and showers for walkers and cyclists. Cwmbran train station is approximately two miles away and is also close to the National Cycle Network. Sustrans has lots more information on cycle routes.


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This Zippered Custom Toiletry bag w/ Leather Accents is a great a great accessory for your traveling adventures. This bag has the perfect capacity for all your travel toiletry needs.
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It's extremely likely that driverless cars shall be operating on our roads within the next decade. Technology is developing quickly and various areas of the UK have already legislated that testing of these vehicles will be permitted. Once driverless cars become more commonplace on our roads, it is possible that insurance providers will have to re-evaluate the traditional motor insurance model.
Many consumers will be concerned with how driverless cars might affect their insurance premiums. This topic continues to be debated, because no real precedent has yet been set.
Ultimately, the advent of driverless vehicles is expected to lead to lower insurance premiums for those who own these models. It is estimated that around three quarters of all road traffic accidents are caused by driver error, as opposed to mechanical defects or faults with the road itself. The technology which will operate within these vehicles should remove the possibility for human error from within that particular vehicle. Theoretically, this should help to reduce the number of accidents that occur on the roads.
Recent research has shown that the use of autonomous parking technology in driver-operated vehicles has already helped to reduce parking accidents by 15% in some places. As technology continues to improve, accident figures are expected to continue to drop. Some accidents will still happen however, as technology is not infallible.
Of course, during the period where driverless cars and driven vehicles are sharing the road, there will still be a high number of accidents caused by human error. Although driverless cars are being designed to react to the actions of other vehicles on the road and adapt to changing situations, other road users could force situations that it would be impossible for the driverless car to escape from without an accident. It is hoped however that the improved reaction times from the vehicles, compared to the reaction times of human drivers, could mean that these accidents are less serious.
It therefore follows that reductions in the number of payouts and the cost of each payout should lead to lower insurance premiums across the board. In order to remain competitive, insurers have to stay relatively close to their bottom line. If the bottom line is reduced because of reduced payouts, the rates that are offered to the consumers should also be reduced. These reductions should ultimately be offered to drivers across the board. Insurance providers may also appear which are entirely dedicated to covering driverless vehicles.
Nonetheless, in the early years, driverless car owners should expect high premiums. Until insurance providers can get a full understanding of how these cars work and what type of accidents they are likely to be involved in, the premiums will stay high. The costs involved with the purchase and maintenance of driverless vehicles will also be highest during the first few years of public sales, so insurers will need to make higher payouts to anyone whose vehicle is damaged. Theft and Fire cover may end up adding a huge amount to insurance premiums for these vehicle owners.
It is likely that some additional liability will be taken on by the manufacturers of driverless vehicles, and this may help to keep costs down for trailblazing buyers. If a car crashes whilst it is supposed to be operating in driverless mode, the manufacturer may be considered to be liable, because the product has failed to meet its primary function. Of course, this liability will be dependent on certain circumstances. For example, the buyer may need to take out extended warranties to get continued manufacturer's liability insurance once the standard liability period has elapsed. The owner may also need to take certain steps to prove that they have done everything that is necessary to keep the system in working condition. For example, unauthorised hacks and failing to meet upgrade schedules could absolve the manufacturer of liability.
Once driverless cars have really started to take off in the United Kingdom, owners of user driven vehicles may find that their premium start to become higher than those of people with driverless cars. This is because of the expectation that they will be responsible for a greater number of road traffic accidents. Even careful drivers with no previous record of accident liability may find that their premiums will rise because they are part of a group which is perceived to hold higher risk.
Of course, these predictions may not prove to be accurate. The insurance industry will have to adapt to all new vehicles that start to appear on British roads. It is expected to be a time of uncertainty for the British insurance industry, as the traditional insurance model may no longer meet the needs of road users. If driverless cars start to become more popular in the United Kingdom, vehicle owners should expect a period of fluctuating premiums and uncertainty.


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English country cottage in quiet off-road setting, and a neutral modern interior.
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Download Author Steven Nedelton apk 2.0.2 free for Android smartphone
Posted by Appy Our Publishing in Books & Reference | June 11, 2014 | 1 Comments
Apk file size: 1.9 MB
Steven Nedelton writes suspenseful novels in crime, mystery, paranormal & noir thriller sub genres. His first two novels, 'Crossroads' (new edition 'Dangerous Trade' and 'The Raven Affair' were published traditionally in 2009/2010.
Steven Nedelton (pseudonym Ned Stevens) other titles are 'Fear!,' 'A Suitcase Mystery,' 'Coma Sins/The Madness of Ben Bluman' and 'Nemesis,' the sequel to 'A Suitcase Mystery.' Steven's novels were evaluated by the Midwest Book Review, The US Review of Books, Book Pleasures and Apex Reviews and were rate '5 Stars.' Recently, three of his novels were accepted by the Awesome Indies group. 'Fear!' received a special recognition from the MBR Journal. Steven was accepted to 'Awesome Indies' group with the books - 'The Raven Affair,' 'Dangerous Trade' and 'Fear!'
This author received top grades in English literature and Advanced Creative Writing (graduate course at SUNY). The author comes a well educated family - from a criminal lawyer and a judge, medical doctor and his mother held degrees in English/German literature and a MA in French literature.
Steven holds a BSME (SUNY) and a MSME from NYU - Polytechnic (PIB). He is a Professional Engineer for Pennsylvania, New Jersey & Ohio.
Appy Our Publishing part of our Books & Reference and have average installs from 50 to 100. Last Update June 11, 2014. Google play rating is 80.0. Current verison is 2.0.2. Actual size 1.9 MB.
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CHICAGO, IL --A Lamborghini crashed into a light pole and burst into flames on Saturday in Chicago, witnesses and fire officials said.
At about 3pm, the Lamborghini and Lincoln crash and then the Lamborghini struck a light pole near South Columbus Drive and East Balbo Avenue, according to a witness. The Lamborghini split in half, the witness said.
A man was pulled from the Lamborghini before it burst into flames, witnesses said.
The Chicago Fire Department confirmed that one person was transported to Northwestern Hospital. Their condition was not immediately known.
Just left corner of Balbo and Columbus in Chicago Guy pulled from this car before explosion! #Chitown pic.twitter.com/cVDxxFNLcd— Stephen Bardo (@stephenbardo) August 13, 2016


text: SHAFAQNA – According to Western Journalism The University of Maryland announced Thursday that it has cancelled a scheduled screening of American Sniper after protests from the Muslim students on campus. The Academy Award-winning film is the top grossing war picture of all time, taking in over $500 million at the box office worldwide. American Sniper depicts the true-life experiences of Navy Seal Chris Kyle, who deployed four times overseas, serving in the Iraq War. He is credited with being America's deadliest sniper.


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|Publication number
|Publication type
|Application number
|Publication date
|Sep 9, 2003
|Filing date
|Feb 27, 2002
|Priority date
|Feb 27, 2002
|Fee status
|Publication number
|Victoria J. Bruce
|Original Assignee
|Advanced Micro Devices, Inc.
|Export Citation
|BiBTeX, EndNote, RefMan
|Patent Citations (8), Referenced by (50), Classifications (7), Legal Events (7)
|External Links: USPTO, USPTO Assignment, Espacenet
1. Field of the Invention
The present invention relates generally to failure analysis and device qualification in integrated circuits, as well as design debugging. More particularly, the present invention relates to an improved method of locating specific integrated circuit current paths that are related to defects, mis-processing or poor circuit design.
2. Description of Related Art
In integrated circuit ("IC") manufacturing, parts are tested throughout various stages of fabrication and packaging. Some parts may not pass the required tests or may otherwise be deemed defective. For example, if an input/output pin on the IC has a current leakage path it may be deemed defective. Many times in developing and manufacturing ICs it is difficult to determine exactly what causes the defective part to fail the required tests. IC technology trends only exacerbate this problem as more routing layers are required to connect tightly packed circuit elements. In addition, the number of transistors in each successive generation of ICs are doubling approximately every eighteen months, which results in a continual increase in total current demand with each new generation of ICs. Methods for determining the root cause of the defective ICs are a vital part of developing and manufacturing integrated circuits.
Fortunately, IC analysis apparatuses and methods exist which provide useful insight into design, manufacturing, and processing defects, as well as other failure modes. IC analysis includes the location, identification, and mapping of an IC to reveal defects. For example, different methods for IC analysis are described in, "Novel Failure Analysis Techniques Using Photon Probing With a Scanning Optical Microscope," by E. I. Cole Jr. et al. Of particular interest is the Light-Induced Voltage Alteration ("LIVA") method.
In addition, U.S. Pat. Nos. 5,430,305 and 6,078,183 disclose LIVA and Thermally-Induced Voltage Alteration ("TIVA") techniques for ICs respectively. These techniques power the entire IC with a constant current source (the voltage supplied to the IC may vary) while scanning the surface of the IC with a light source of specific wavelengths that depend on whether LIVA or TIVA is used. Localized current changes are induced due to photon exposure (LIVA), or localized heating of the IC (TIVA). These local current changes alter the total power required, and these changes are more pronounced when the light source is exposed to a defect on the IC. Since the IC is powered by a power supply with constant current and variable voltage, any alteration in the total power requirement causes a voltage alteration on the power supply. Therefore a voltage alteration on the power supply caused by light exposure may indicate that a defect in the area of the IC that is being exposed to the light source.
However, these methods have weaknesses that cause defects to be overlooked. For example, in a typical setup, the IC is tested with various capacitors connected to the power supply to filter out noise injection from the power supply. Besides filtering noise, the capacitors attenuate the induced voltage alteration, thereby allowing defects to remain unnoticed. Another problem is that circuit elements that are only marginally defective may not produce enough of a current change when exposed to the light source to overcome the noise floor and be noticed. With millions of circuit elements (specifically transistors) in a typical IC, the overall noise floor can be quite high. This remains true despite the fact that each transistor may be in a quiescent state and will draw only a minute amount of current individually. In such circumstances, a marginally defective transistor that produces less of a current change than a fully defective transistor with respect to the overall quiescent current draw is more likely to remain unnoticed. In addition, because current demands (both quiescent and dynamic) in successive generations of ICs increase every eighteen months, the current risk becoming less and less capable of detecting defects. Accordingly, a solution to these problems is needed.
The present invention provides an improved defect detection technique and system. In a preferred embodiment, the defect detection system includes two separate power supplies: a global power supply and a dedicated power supply. The global power supply provides power to the IC and is preferably a constant voltage power supply. The dedicated power supply supplies power to specific points of interest on the IC, and may be a variable current and/or a variable voltage power supply. The dedicated power supply may be configured to supply a constant current approximately equal to a previously measured value while letting the voltage vary. Next the IC is scanned with the light source, and the defect causes a change in power demand on the dedicated power supply when exposed to the light source. This change in power demand is the result of photon exposure or localized heating of the IC, and is more of a drastic change when the light is exposed to a defect on the IC. The change in power demand causes a voltage alteration on the dedicated power supply, thereby allowing a defect to be spotted.
The present invention is expected to alleviate the problems described above because the global power supply provides the quiescent current to the IC. The separate dedicated power supply then has a lower noise floor and is more sensitive to voltage alterations, especially from marginally defective devices. Therefore, a voltage alteration on the dedicated power supply is measured independent of any background noise resulting from the quiescent state of the IC. Also, if the dedicated power supply supplies power only the suspect area of the IC, then a greater sensitivity is achieved when the laser is scanned over that area. This same premise is expected to provide promising results even as new generations of ICs are developed which require more current.
A better understanding of the present invention can be obtained when the following detailed description of the preferred embodiments is considered in conjunction with the following drawings, in which:
FIG. 1 is a block diagram of the IC analysis apparatus in accordance with a preferred embodiment of the present invention.
FIG. 2 is a schematic diagram of an IC being used in the apparatus of FIG. 1.
FIG. 3 is an image of a functional IC used as a control for an experiment and was obtained using the apparatus of FIG. 1, with a voltage alteration ("VA") image of the scanned area, and an overlaid image of the same scanned area.
FIG. 4 shows VA and overlaid images of a failing IC.
FIG. 5 is the overlaid image of FIG. 4 under a higher magnification.
While the invention is susceptible to various modifications and alternative forms, specific embodiments thereof are shown by way of example in the drawings and will herein be described in detail. It should be understood, however, that the drawings and detailed description thereto are not intended to limit the invention to the particular form disclosed, but on the contrary, the intention is to cover all modifications, equivalents and alternatives falling within the spirit and scope of the present invention as defined by the appended claims.
Certain terms are used throughout the following description and claims to refer to particular system components. As one skilled in the art will appreciate, functionally equivalent elements may be referred to by using different names and/or acronyms. This document does not intend to distinguish between components that differ in name but not function. In the following discussion and in the claims, the terms "including" and "comprising" are used in an open-ended fashion, and thus should be interpreted to mean "including, but not limited to . . . ". Also, the term "couple" or "couples" is intended to mean either an indirect or direct electrical connection. Thus, if a first device couples to a second device, that connection may be through a direct electrical connection, or through an indirect electrical connection via other devices and connections.
The term "defect" refers to a condition contained within an IC that causes the IC to fail a functional test. The causation of such a defect may result from a wide array of specific manufacturing, processing, and/or design errors (e.g. an Electro-Static-Discharge (ESD) causing irreparable damage to the IC may occur during manufacturing or a particle may cause a short circuit between different conductors during processing.)
The term "power supply" as used herein is understood to be a method of providing voltage and current to an electrical circuit. Power supplies which occupy the same physical piece of electrical equipment while still providing separate voltages and currents are considered separate power supplies.
The "frontside" of the die is a term referring to the side of the die that includes electrical devices that have been processed onto its surface through a series of lithography steps. The "backside" of the die is a term that refers to the side opposite to the frontside and generally does not contain electrical devices. Thus, a frontside analysis technique is an analysis performed using the side of the die that has been processed and now contains electrical devices, whereas a backside analysis technique uses the side of the die that has not been processed to contain devices (also known as substrate side).
The term "flip-chip" refers to a method of packaging die such that the frontside of the die faces downward and the backside faces upward when placed into the package.
The term "failure mode" refers to a mode that an IC may be placed in such that a defect (as described above) causes the IC to fail a certain functional test.
As explained below, the constant current power supply may be coupled to a point of interest on the IC via a digital IC tester, or by using a microprobe. In accordance with the preferred embodiment of the invention, a laser is scanned over the IC while monitoring a constant current power supply, which has been attached to a point of interest on the IC.
Referring to FIG. 1, an apparatus for detecting IC defects 10 is shown constructed in accordance with the preferred embodiment. Apparatus 10 preferably includes a scanning optical microscope 95, a display 45, a digital IC tester 90, a dedicated power supply 70, and a global power supply 80.
Scanning optical microscope 95 (e.g. a Carl Zeiss, Inc., Model LSM 310 scanning optical microscope) preferably includes a scanner 110, a photodetector 120, a stage 99, a lens 105, a beam splitter 125, and an optical filter 35. Also, an IC 100 is preferably placed within scanning optical microscope 95 and rests on stage 99. As shown in the embodiment of FIG. 1, laser 30 is coupled to scanning optical microscope 95 and may be either internal to scanning optical microscope 95 or externally connected. Laser 30 may be a neodymium:yttrium-vanadium-oxide (Nd:YVO4) laser, a neodymium:yttrium-aluminum-garnet (Nd:YAG) laser, or a solid state diode pump laser.
Laser 30 emits a laser beam that passes through filter 35. Filter 35 limits the intensity of the laser beam to a desired level. Filter 35 is preferably oriented such that incident laser beam 31 from laser 30 passes through it before arriving at light scanner 110. The laser beam 31 passes through a beam splitter 125 and into scanner 110. Scanner 110 directs the laser beam 31 through lens 105 and onto IC 100. Light reflecting from the IC 100 passes back through lens 105 to the scanner 110 as a reflection beam. The scanner 110 directs the reflection beam back to the beam splitter 125, which in turn directs the reflection beam to detector 120. Beam splitter 125 may include mirrors of varying transmission/reflection capabilities.
Lens 105 is preferably positioned so that incident beam 31 may be focussed onto IC 100, and the focussed spot size can be on the order of the width of a metal conductor (e.g. 0.8 μm). Scanning optical microscope 95 can further include an eyepiece or video camera (not shown) for visually inspecting and selecting a particular portion of IC 100 to be analyzed, or as an aid in centering IC 100 on stage 99.
Stage 99 supports IC 100 within scanning optical microscope 95 and further facilitates providing a plurality of electrical connections 94 from digital IC tester 90 to IC 100. Stage 99 generally includes a socket for making these electrical connections, and preferably can be configured to accommodate IC 100 regardless of its packaging. Stage 99 additionally is coupled to digital IC tester 90 by a plurality of electrical connections 94 (e.g. ribbon cables.)
Digital IC tester 90 may be an Integrated Measurement Systems. Inc., Model ATS FT or Model ATS Blazer! IC tester, and is preferably coupled to global power supply 80 and one or more dedicated power supplies 70. These power supplies (80, 70) may be the computer-controlled type manufactured by Keithly Instruments (e.g. model 238 source measurement unit.) Dedicated power supply 70 and global power supply 80 are shown sharing a common ground 75 in FIG. 1. However, dedicated power supply 70 and global power supply 80 may be grounded separately for a number of reasons including, to isolate noise from one power supply from leaking into the other.
The global supply line 85 is preferably coupled to the digital IC tester 90. The dedicated supply line 65, which connects dedicated power supply 70 and digital IC tester 90, is preferably coupled to display 45. An amplifier 60 may optionally be used to amplify the voltage on line 65 and to isolate line 65 from any loading effects of display 45. Whether amplifier 60 is present or not, the voltage alteration on supply line 65 is provided to display 45 as analytical output signal 35.
Display 45 includes an image processor 50 and a cathode ray tube (CRT) 40. Analytical output signal 35 is preferably coupled to image processor 50 within display 45 along with position signal 111 from light scanner 110, and photodetector output signal 130 from photodetector 120. The image processor would preferably process these three signals to produce a standard video signal (e.g. NTSC, PAL, etc.) for display on CRT 40, or any other display device accepting a standard video signal (i.e. flat panel display.)
Initially, IC 100 is placed onto stage 99. A plurality of electrical connections 94 from digital IC tester 90 is made to stage 99 coupling dedicated power supply 70 and global power supply 80 to IC 100. Global power supply 80 preferably supplies a constant voltage, and is coupled to the IC 100 for powering up and setting states within the IC 100. Dedicated power supply 70 may be configured to supply either constant current or constant voltage, and is preferably coupled to a point of interest on IC 100. Digital IC tester 90, or alternately, a computer-controlled switch matrix (not shown) facilitates the application of global power supply 80 and dedicated power supply 70, which may be in the form of input test vectors to the IC 100. Digital IC tester 90 also measures output states from IC 100 in response to the input test vectors. This measurement may occur in a serial or a parallel fashion. For example, if multiple dedicated power supplies are used at multiple points of interest, they may be measured simultaneously (i.e. parallel), or they may be measured successively one after the other (i.e. serially). A set of input test vectors is defined herein as a set of input voltages that are provided to input pins of IC 100 either all at once or in a predetermined sequence in order to produce a desired response from IC 100 in the form of one or more output states as defined by output voltages at output pins of IC 100. In some cases, this may include applying a set of input test vectors to configure the IC 100 into a known failing mode.
An example would be if an input/output pin of IC 100 has a current leakage path. The input/output pins on the IC 100 may be configured (using input test vectors) to a high impedance state while being interrogated with dedicated power supply 70 (configured to constant voltage and varying current.) It should be noted that configuring an input/output pin in a high impedance state implies that little or no current is drawn when a voltage supply is connected to the pin, and the pin appears to have infinite impedance. If the current drawn from dedicated power supply 70 is higher than an expectedly small amount, there is current leakage occurring somewhere. Current leakage while the pin is configured to a high impedance state signals a defect in a path that is connected to this pin, and the leakage current and voltage of the dedicated power supply are measured. Dedicated power supply 70 may then be configured to provide constant current and variable voltage, while scanned according to the procedure described below. Those skilled in the art will understand that the same pins of an IC can provide both inputs and outputs depending upon IC operation.
With IC 100 configured (using global power supply 80 and dedicated power supply 70), in a known state wherein IC 100 fails a functional test (preferably due to a defect), focussed laser beam 31 is preferably applied to reveal root causes of the failing functional test. Stage 99 may be moved in an X-Y direction to further center IC 100 under the scanning lens 105.
IC 100 is then scanned using light scanner 110, which moves the focussed laser beam 31 across IC 100. As the focussed laser beam moves into the neighborhood of a defect on IC 100, the laser induces localized current changes. Suspect areas of IC 100 may then be tested by coupling dedicated power supply 70 to a point of interest while scanned laser beam 31 causes a localized current change in any path coupled to this point of interest, and this current change appears on dedicated supply line 65.
Preferably, dedicated power supply 70 of apparatus 10 is configured such that it provides a predetermined current to the point of interest that it is coupled to, while the voltage at the point of interest is varying. Therefore, when dedicated supply line 65 experiences a current change as described above, a voltage alteration will occur in response to accommodate the increased loading. This alteration in voltage that occurs on dedicated supply line 65 may then be amplified if necessary with an amplifier 60 that is coupled to the image processor 50 via the analytical output signal 35. Therefore, when incident laser beam 31 irradiates a defect on IC 100, a voltage alteration will occur on dedicated supply line 65 and not on global supply line 85.
In display 45, analytical output signal 35 is preferably used in combination with position signal 111 and photodetector signal 130 to form a map of IC 100 being scanned by focussed laser beam 31. Exceeding a predetermined threshold of voltage alteration on dedicated supply line 65 indicates a defective spot on IC 100 and the image processor makes note of this position using position information supplied via position signal 111. The map can then be used for locating defects in IC 100 that cause IC 100 to fail functional tests. Additionally, image processor 50 can provide capabilities for processing and storing the signals 35, 111, and 130 including averaging, contrast enhancing, and digitizing the signals in order to generate the maps or images with enhanced resolution for more precisely locating the defects in IC 100 that are responsible for failing functional tests. It should be noted that adjusting the contrast of the video signal might in some cases prove to be advantageous in the location of defects. Display 45 can be part of scanning optical microscope 95; or it can be in the form of a separate instrument (e.g. a computer).
Preferably global power supply 80 of apparatus 10 supplies a constant voltage to IC 100 powering up the electrical devices contained therein in a static state, concurrently, dedicated power supply 70 is coupled to a point of interest on IC 100. For example, an input output pin of IC 100 may be coupled to dedicated power supply 70 through digital IC tester 90, a plurality of connections 94, and stage 99; or alternatively, dedicated power supply 70 may be coupled directly to a device or conductor of interest on IC 100 with a microprobe. Therefore, if global power supply line 85 is filtered (e.g. with a filter capacitor), dedicated supply line 65 is isolated from this filtering and any voltage alteration induced thereon is not also attenuated with the filtering device. Hence, the voltage alteration signal will be a more pronounced signal, allowing more defects to be detected.
In addition, by coupling dedicated power supply 70 to a point of interest on IC 100 while global power supply 80 powers up IC 100, the amount of noise on the dedicated power supply 70 is reduced. This is because most of the noise is now contained on global power supply 80. Thus, if a moderately defective circuit element on IC 100 that is exposed to light beam 31 does not generate as large of voltage alteration as a completely defective circuit element, it is more likely to be noticed on dedicated power supply 70 than global power supply 80 because it has less noise to overcome to be recognized.
As an aid in locating defects within IC 100 that are responsible for producing functional failures, a reflected-light image or map of IC 100 is preferably produced in the display 45 either separately or superimposed with map of the defects mentioned above. Such a reflected-light image is preferably construed from the position signal 111 and from a detector output signal 130 from a photodetector 120 (e.g. a germanium photodetector), which measures a portion of the return portion of the focussed laser beam 31 that is reflected or scattered from IC 100. This can be accomplished, for example, by placing beam splitter 125 in the path of laser beam 31. The reflected-light image can also be used for precisely focussing laser beam 31 on the circuit elements in IC 100 by observing the sharpness of details in the reflected-light image. This can be done when focussing laser beam 31 for both backside and frontside analysis. In general, the resolution of the reflected-light image will depend upon the spot size of the focussed laser beam 31. Additionally, polishing and/or antireflection coating of the substrate during backside analysis can be advantageous for improving the quality of the reflected-light image when this mode of analysis is selected.
Trends in the IC industry (i.e. flip-chip packaging techniques, multiple metal layer designs, etc.) may make analysis from the frontside (as described above in the notation section) of the die very difficult. Accordingly, the preferred embodiment may be used in either the frontside or backside analysis, wherein incident laser beam 31 (because of the chosen wavelength) may be tuned to achieve the desired effect regardless of which analysis may be desired. When applied to the backside this technique may require thinning and/or polishing of the substrate in order to achieve the desired results.
In frontside and backside analysis, it may be preferable to use differing wavelengths of laser beam 31 in generating the localized currents. Localized current generation may result from electron-hole pairs being induced by laser beam 31 (with a wavelength of around 1 μm) or alternately by locally heating IC 100 with laser beam 31 (with a wavelength of around 1.3 μm), to name a few ways. For example, backside analysis may be performed by selecting a photon energy (which is inversely related to wavelength) of laser 30 that is less than the bandgap energy of the substrate (substrates may consist of Silicon, Silicon on Insulator (SOI), Germanium, and other III-V compounds.) In the case of a Silicon substrate, the bandgap energy can correspond to a lasing wavelength that is in the range of 1.2 to 2.5 μm, and preferably about 1.3 μm. Such a wavelength for laser 30 provides for local heating without generating electron-hole pairs (which may distort the analysis by producing spurious signals, and/or may distort the analysis by perturbing device operation.)
In general, any laser operating in the wavelength range of 1-2.5 μm, which emits sufficient laser power (e.g. 50-500 mW or more) may be used in the preferred embodiment of the present invention. Also, a laser may be selected that emits a plurality of wavelengths including undesirable wavelengths, and may additionally be filtered using filter 35 in the path of the light beam, or alternatively by selecting internal cavity mirrors that restrict operation to desired wavelengths. As mentioned above, ICs may be constructed onto various types of substrates that have different bandgap energy values. Accordingly, those skilled in the art will know depending on the type of substrate, type of analysis (frontside or backside), and/or method of generating local currents (i.e. electron hole-pair, thermal, etc.), which combination of laser wavelengths, laser types (semiconductor diode, solid-state, or gas), and/or filter configurations are desired for their particular analysis with the present technique or invention.
Light scanner 110 includes a pair of galvanometers that each support and control movement of a plane mirror (not shown), with the mirrors being in an x-y arrangement so that the laser beam 31 can be scanned in two dimensions. In other embodiments of the present invention, an acousto-optical modulator or an electro-optical modulator may be substituted for the galvanometer-driven mirrors to form the light scanner 110. Light scanner 110 is preferably controlled to step or raster scan the focussed laser beam 31 over a predetermined portion of IC 100, or over IC 100 in its entirety. Light scanner 110 further provides an output position signal 111 that can be used to determine the position of the focussed laser beam 31 on IC 100 at any instant in time. The position signal 111 can be derived, for example, from a voltage waveform used to drive the galvanometers. When the scan is stepped, the portion of IC 100 being scanned can be divided into a predetermined number of pixels, with light scanner 110 directing the focussed laser beam 31 from pixel to pixel, dwelling at each pixel for a predetermined time period to allow data to be accumulated and the signal to be averaged by image processor 50. Such signal averaging is preferably used to form an enhanced-resolution map for more precisely locating defects within IC 100 that produce the functional failures of IC 100. Additionally the operating temperature of IC 100 may be controlled by controlling the temperature of stage 99 (e.g. using a thermoelectric cooling/heating module). This may be advantageous in the case of thermally generating localized defect currents in that the amount of static background current may be reduced by reducing the temperature giving the current change (or voltage alteration) a more profound effect.
In addition, the complexity of IC 100 may be such that digital IC tester 90 may not be desired. Generally if IC 100 is less complex and contains fewer circuit elements (i.e. transistors, resistors, capacitors, etc.) it may not be desirable to utilize digital IC tester 90 to couple signals into IC 100. Referring now to FIG. 2, dedicated supply line 65, global power supply line 85 and common ground line 75 are all coupled to IC 100 for the analysis mentioned above. Although the above discussion disclosed using digital IC tester 90, in some cases it may not be desired and IC 100 may still be tested by coupling dedicated power supply 70 to a point of interest (e.g. direct wired to a pin or microprobed to a specific point) while global power supply 80 is also coupled directly to IC 100. For example, an IC may contain very few circuit elements (e.g. a linear or analog IC) when compared to a high-speed microprocessor containing millions of transistors, yet still the defect causing the IC to fail may elude the engineer trying to find its root cause. In this case using digital IC tester 90 may be too excessive for an IC of this nature and therefore directly wiring global power supply 80 and dedicated power supply 70 to IC 100 is desirable.
In another embodiment of the present invention, multiple dedicated power supplies in addition to global power supply 80 and dedicated power supply 70 are preferably coupled to separate points of interest on IC 100. This would allow the user to interrogate multiple paths and/or pins on IC 100 in any desired order (e.g. serially, parallel, or some random variation.)
In another embodiment of the present invention, stage 99 may be used to bring IC 100 to the edge of failure while scanning with laser beam 31 to further drive IC 100 into a failing mode.
In yet another embodiment of the present invention, the voltage of global power supply 80 is preferably reduced in a range from normal operating voltage (e.g. 1.3-5V) to zero. dedicated power supply 70 therefore may be coupled to a point of interest while laser beam 31 is scanned over IC 100.
An example illustrating operation of the apparatus and method of the present invention for locating a defect, which was producing functional test failures in IC 100 is provided hereinafter.
FIG. 3 shows a control image (i.e. map) obtained using apparatus 10 of the preferred embodiment to perform a backside analysis by thermally inducing the current with laser 30 (with a wavelength of approximately 1.3 μm) on a microprocessor 100. FIG. 3 has two parts, (1) a VA image and (2) an overlaid image, either of which may appear on display 45. The VA image represents a mapping of the area of interest with any voltage alterations in it. The overlaid image represents a picture of the microprocessor using the reflected light off microprocessor 100 superimposed with the VA image.
FIG. 4 shows an experimental image (i.e. map) similar to that shown in FIG. 3 (the same part type is used), except for that initial testing revealed a current leakage path from a point of interest to the power supply. Constant current was applied to the point of interest using a microprobe, while microprocessor 100 was scanned with a laser (with a wavelength of approximately 1.3 μm). A defect appears on the VA image as shown in FIG. 4. Microprocessor 100 was de-processed and a cross section of it was taken with a focussed ion beam (FIB), which proved that the inner layer dielectric was voided in this region causing a metal 1 to metal 1 short. FIG. 4 also contains the overlaid image that consists of a VA image superimposed with light reflected from microprocessor 100. Referring now to FIG. 5, the overlaid image of FIG. 4 is shown at a higher magnification.
It should be noted that the VA image of FIG. 3 (control) may appear to contain defects (dark spots), while the VA image of FIG. 4 (experiment) does not. However, these dark spots are not defects, they are normal paths for current dissipation. The reason the dark spots do not appear in the FIG. 4 VA image is that a majority of the current flows to the defect, and not the normal current paths.
Numerous variations and modifications will become apparent to those skilled in the art once the above disclosure is fully appreciated. It is intended that the present invention be interpreted to embrace all such variations and modifications.
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|Kabushiki Kaisha Toshiba
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|Colvin James B
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|Renesas Electronics Corporation
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|James B. Colvin
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|Street Alan G
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|Xerox Corporation
|Artifact removal and quality assurance system and method for scanned images
|Jul 14, 2006
|Jun 14, 2007
|Young-Seok Kim
|Apparatus, unit and method for testing image sensor packages
|Jan 14, 2008
|May 15, 2008
|Colvin James B
|System and Method for Use in Functional Failure Analysis by Induced Stimulus
|May 27, 2008
|Sep 18, 2008
|Optopac Co., Ltd.
|Apparatus, unit and method for testing image sensor packages
|Jun 30, 2008
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|Method and apparatus for inspection and fault analysis
|Jan 18, 2011
|May 19, 2011
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|System and Method for Use in Functional Failure Analysis by Induced Stimulus
|Aug 23, 2010
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|Hitachi High-Technologies Corporation
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|U.S. Classification
|324/754.23, 324/762.02
|International Classification
|Cooperative Classification
|European Classification
|Feb 27, 2002
Owner name: ADVANCED MICRO DEVICES, INC., CALIFORNIA
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|Fee payment
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Owner name: GLOBALFOUNDRIES INC., CAYMAN ISLANDS
Free format text: AFFIRMATION OF PATENT ASSIGNMENT;ASSIGNOR:ADVANCED MICRO DEVICES, INC.;REEL/FRAME:023119/0083
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|Fee payment
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|Apr 17, 2015
|Maintenance fee reminder mailed
|Sep 9, 2015
|Lapse for failure to pay maintenance fees
|Oct 27, 2015
|Expired due to failure to pay maintenance fee
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text:
The Georgia-Florida game on Oct. 27 will be at its traditional time slot -- 3:30 p.m. It will be televised by CBS.
That leaves only two games this season without announced start times -- the No. 10 Auburn game and the Nov. 17 Ole Miss game. The Auburn game, which will be played at Sanford Stadium, won't start later than 6 p.m. Georgia's athletic board by-laws stipulate the school can only play two home night games per season and those were used up by the 7:45 p.m. South Carolina game and the 6:30 p.m. Arkansas game.
The Nov. 24 Georgia Tech game will be played at 8 p.m. and shown on ABC, and the Dec. 1 make-up against Houston will be a 1 p.m. game.
-- Josh Kendall
This article published in the Athens Banner-Herald on Tuesday, October 16, 2001.
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Xzibit ft. Wiz Khalifa - Forever a G
Xzibit's been a gangster since his formative years in the Motown streets, and he will continue to be such till the day that he dies. On Forever a G, a freshly-released standout off his soon-to-be-released seventh album, the rap vet shares a few pearls of wisdom gained over the course of his hustle. Backed by the slow-rolling boardwork of ID Labs' E. Dan, X counsels hip-hop hopefuls to "do you," rather than trying to conform to the game's exaggerated ideals, and to keep a constant focus on self-improvement: "The greatest trick the devil put together / was that self-destruction is better than striving for perfection." Pittsburgh heavyweight Wiz Khalifa (whose sophomore set, O.N.I.F.C, drops in December) contributes a hazy hook. In addition to copping Napalm when it drops tomorrow, October 9, fans should be sure to check out The DJBooth and Rdio's Best of Xzibit playlist, running through to the end of the month across the entire site.


text: Hello! First of all, apologies for such a late introduction. I registered in May and was going to post a photo guide how to replace all door speakers in 2008 estate but ended up going to Honda after they agreed to replace them under gesture of goodwill. I have always loved japanese cars and have been very happy owner of Blue GT EX 2.2 I-DTEC, half heated leather seats, Premium Audio and all goodies one can think of but (no ADAS though) since January 2013. Thanks


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text:
Among the stories early in the NFL period has actually had nothing to do with the real video games on the area.
Less individuals are enjoying the video games on tv this period, as confirmed by significantly reduced ratings. Although that the NFL has actually stated openly it isn't really stressed, felt confident its a resource of substantial hand-wringing for the organization, group proprietors as well as their tv companions.
The inquiry for those that wishes to see lawful sports betting in the United States: Could the ratings dip cause a change in exactly how the organization comes close to betting on its video games?
The ratings decline for the NFL
The ratings go down up until now this period has actually been greater than simply a spot on the radar. Numbers are down 15 percent year over year, consisting of for Sunday evening's video game in between the Seattle Seahawks as well as the Arizona Cardinals that in some way finished in a 6-6 connection.
TELEVISION ratings, certainly, are practically one of the most crucial point going with the NFL; the organization makes a substantial portion of cash from doing take care of networks to relay its video games.
Every person has warm tackles why the ratings decline is taking place, criticizing it on whatever from the political election cycle in the United States, to gamer demonstrations throughout the nationwide anthem, to the Chicago Cubs' go to the Globe Collection.
Is it an assemblage of all these variables, or something a lot easier?
The virtually widely ridiculed Sunday evening video game was subsequented by a Monday evening video game in between the Denver Broncos as well as Houston Texans that lots of located to be less-than brilliant also.
If occasions outside the NFL's control are truly creating the ratings decline, the organization certainly has absolutely nothing to fret about. Yet if the trouble is with the item itself, that's a trouble.
What if the NFL ratings dip persists?
Today, it does not show up that the NFL is mosting likely to do anything as well reactionary.
However if the ratings do not rebound in the 2nd fifty percent of the period– after the political election mores than– the NFL will likely believe it has a genuine issue on its hands.
The trouble with TELEVISION ratings is that it will certainly be challenging for the NFL to swing a magic stick and also repair them, if completing concepts are proven false. If the video games and also the interplay in them typically aren't as fascinating to followers as in previous years, a flip can not be changed to earn them much better.
Among minority points the NFL could do? Welcome legalized sports betting, or a minimum of stand aside to allow it occur.
There is no question that followers having a financial interest in a video game raises follower interaction and also contributes to TELEVISION viewership, somewhat. Besides, the American Pc gaming Organization approximates that $90 billion will certainly be bet on NFL as well as university football this period, the majority of it unlawfully.
Although that the organization has actually constantly been openly versus United States sports betting, a minimum of some proprietors obviously see the recklessness because. And also whatever the organization claims, it cannot perhaps have its head in the sand even to be not aware that banking on its video games assists to own passion agen bola.
It's not difficult to think of that a lawful sports betting atmosphere in the United States would promptly enhance TELEVISION ratings. And also if points remain to look grim for viewership numbers, one would certainly think the NFL will certainly check out all alternatives to stem the trend.
The case for and against the NFL changing on sports betting
The NFL does not do a lot of anything rapidly. To believe it is mosting likely to change years of stating lawful sports betting would certainly among the most awful points ever before– over night– is maybe reckless.
Simply recently, Commissioner Roger Goodell stated the organization's setting versus sports betting.
However the organization is horribly aware concerning its photo as well as just what the general public thinks about it. (See adjustments in exactly how it comes close to concussions/CTE and also residential physical violence problems, for instance.).
If the NFL detects that followers are just enjoying much less as a result of the item it places on area, as well as it assumes sports betting will certainly assist, one could certainly see the organization altering its tune.
No matter, a continual dip in ratings would certainly need to materialize prior to that result ends up being most likely.
Perhaps the video games will certainly simply begin boosting in high quality as well as marquee worth, and also individuals truly typically aren't seeing NFL ready a selection of factors. Because situation, all the problem over ratings will certainly be a temporary spot on the radar.
However otherwise, anticipate a bigger promote sports betting from the rate of interests inside the NFL that have no worry with it coming to be lawful in the United States.
It's not such as lawful sports betting is right around the bend, regardless of what– a Legislative initiative is simply getting under way. Yet that initiative would certainly obtain an excellent increase if the NFL remained in its edge.


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