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System for thin film deposition utilizing compensating forces
A process for depositing a thin film material on a substrate is disclosed, comprising simultaneously directing a series of gas flows from the output face of a delivery head of a thin film deposition system toward the surface of a substrate, and wherein the series of gas flows comprises at least a first reactive gaseous material, an inert purge gas, and a second reactive gaseous material, wherein the first reactive gaseous material is capable of reacting with a substrate surface treated with the second reactive gaseous material. A system capable of carrying out such a process is also disclosed.
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The present application is related to U.S. application Ser. No. 11/392,007, filed Mar. 29, 2006 by Levy and entitled, "PROCESS FOR ATOMIC LAYER DEPOSITION," U.S. application Ser. No. 11/392,006, filed Mar. 29, 2006 by Levy and entitled "APPARATUS FOR ATOMIC LAYER DEPOSITION," U.S. application Ser. No. 11/620,738, filed Jan. 8, 2007, by Levy and entitled "DELIVERY DEVICE FOR DEPOSITION," U.S. application Ser. No. 11/620,740, filed Jan. 8, 2007 by Nelson et al. and entitled "DELIVERY DEVICE COMPRISING GAS DIFFUSER FOR THIN FILM DEPOSITION," U.S. application Ser. No. 11/620,744, filed Jan. 8, 2007 by Levy and entitled, "DEPOSITION SYSTEM AND METHOD USING A DELIVERY HEAD SEPARATED FROM A SUBSTRATE BY GAS PRESSURE," U.S. application Ser. No. 11/861,420 filed Sep. 26, 2007 by Kerr et al. and entitled, "DEPOSITION SYSTEM FOR THIN FILM FORMATION," U.S. application Ser. No. 11/861,402 filed Sep. 26, 2007 by Kerr et al. and entitled "DELIVERY DEVICE COMPRISING FOR DEPOSITION," and U.S. application Ser. No. 11/861,359 filed Sep. 26, 2007 by Levy et al. and entitled, "DEPOSITION SYSTEM FOR THIN FILM FORMATION" all the above identified applications incorporated by reference in their entirety.FIELD OF THE INVENTION
This invention generally relates to the deposition of thin-film materials and, more particularly, to an apparatus and method for atomic layer deposition onto a substrate using a distribution head directing simultaneous gas flows onto a substrate.BACKGROUND OF THE INVENTION
Among the techniques widely used for thin-film deposition is Chemical Vapor Deposition (CVD) that uses chemically reactive molecules that react in a reaction chamber to deposit a desired film on a substrate. Molecular precursors useful for CVD applications comprise elemental (atomic) constituents of the film to be deposited and typically also include additional elements. CVD precursors are volatile molecules that are delivered, in a gaseous phase, to a chamber in order to react at the substrate, forming the thin film thereon. The chemical reaction deposits a thin film with a desired film thickness.
Common to most CVD techniques is the need for application of a well-controlled flux of one or more molecular precursors into the CVD reactor. A substrate is kept at a well-controlled temperature under controlled pressure conditions to promote chemical reaction between these molecular precursors, concurrent with efficient removal of byproducts. Obtaining optimum CVD performance requires the ability to achieve and sustain steady-state conditions of gas flow, temperature, and pressure throughout the process, and the ability to minimize or eliminate transients.
Especially in the field of semiconductor, integrated circuit, and other electronic devices, there is a demand for thin films, especially higher quality, denser films, with superior conformal coating properties, beyond the achievable limits of conventional CVD techniques, especially thin films that can be manufactured at lower temperatures.
Atomic layer deposition ("ALD") is an alternative film deposition technology that can provide improved thickness resolution and conformal capabilities, compared to its CVD predecessor. The ALD process segments the conventional thin-film deposition process of conventional CVD into single atomic-layer deposition steps. Advantageously, ALD steps are self-terminating and can deposit one atomic layer when conducted up to or beyond self-termination exposure times. An atomic layer typically ranges from about 0.1 to about 0.5 molecular monolayers, with typical dimensions on the order of no more than a few Angstroms. In ALD, deposition of an atomic layer is the outcome of a chemical reaction between a reactive molecular precursor and the substrate. In each separate ALD reaction-deposition step, the net reaction deposits the desired atomic layer and substantially eliminates "extra" atoms originally included in the molecular precursor. In its most pure form, ALD involves the adsorption and reaction of each of the precursors in the absence of the other precursor or precursors of the reaction. In practice, in any system it is difficult to avoid some direct reaction of the different precursors leading to a small amount of chemical vapor deposition reaction. The goal of any system claiming to perform ALD is to obtain device performance and attributes commensurate with an ALD system while recognizing that a small amount of CVD reaction can be tolerated.
In ALD applications, typically two molecular precursors are introduced into the ALD reactor in separate stages. For example, a metal precursor molecule, MLx, comprises a metal element, M that is bonded to an atomic or molecular ligand, L. For example, M could be, but would not be restricted to, Al, W, Ta, Si, Zn, etc. The metal precursor reacts with the substrate when the substrate surface is prepared to react directly with the molecular precursor. For example, the substrate surface typically is prepared to include hydrogen-containing ligands, AH or the like, that are reactive with the metal precursor. Sulfur (S), oxygen (O), and Nitrogen (N) are some typical A species. The gaseous metal precursor molecule effectively reacts with all of the ligands on the substrate surface, resulting in deposition of a single atomic layer of the metal:
substrate−AH+MLx→substrate−AMLx-1+HL (1)
where HL is a reaction by-product. During the reaction, the initial surface ligands, AH, are consumed, and the surface becomes covered with L ligands, which cannot further react with metal precursor MLx. Therefore, the reaction self-terminates when all of the initial AH ligands on the surface are replaced with AMLx-1 species. The reaction stage is typically followed by an inert-gas purge stage that eliminates the excess metal precursor from the chamber prior to the separate introduction of a second reactant gaseous precursor material.
The second molecular precursor then is used to restore the surface reactivity of the substrate towards the metal precursor. This is done, for example, by removing the L ligands and redepositing AH ligands. In this case, the second precursor typically comprises the desired (usually nonmetallic) element A (i.e., O, N, S), and hydrogen (i.e., H2O, NH3, H2S). The next reaction is as follows:
substrate−A−ML+AHY→substrate−A−M−AH+HL (2)
This converts the surface back to its AH-covered state. (Here, for the sake of simplicity, the chemical reactions are not balanced.) The desired additional element, A, is incorporated into the film and the undesired ligands, L, are eliminated as volatile by-products. Once again, the reaction consumes the reactive sites (this time, the L terminated sites) and self-terminates when the reactive sites on the substrate are entirely depleted. The second molecular precursor then is removed from the deposition chamber by flowing inert purge-gas in a second purge stage.
In summary, then, the basic ALD process requires alternating, in sequence, the flux of chemicals to the substrate. The representative ALD process, as discussed above, is a cycle having four different operational stages:
- 1. MLx reaction;
- 2. MLx purge;
- 3. AHy reaction; and
- 4. AHy purge, and then back to stage 1.
ALD has been typically utilized for the deposition of inorganic compounds where metal precursors have been halides, alkoxides, -diketonate chelates or organometallic compounds. The second precursor has been typically an oxygen, nitrogen or sulfur source, when oxides, nitrides, or sulfides are deposited, respectively. Although it has been less studied, the deposition of organic compounds or organic/inorganic hybrid layers by ALD is possible. In these cases, it is possible to still have an alternating sequence of self-limiting reactions, except that the limiting layer produced by such a process may be a layer of molecules as opposed to atoms. As such, such techniques may also be referred to as molecular layer deposition (MLD), although the basic concepts and deposition equipment are similar to ALD processes and equipment. An example of atomic layer or molecular layer deposition of organic films can be found in "Atomic layer deposition of polyimide thin films," by Matti Putkonen, et. al. in The Journal of Materials Chemistry, 2007, (7), 664-669.
This repeated sequence of alternating surface reactions and precursor-removal that restores the substrate surface to its initial reactive state, with intervening purge operations, is a typical ALD deposition cycle. A key feature of ALD operation is the restoration of the substrate to its initial surface chemistry condition. Using this repeated set of steps, a film can be layered onto the substrate in equal metered layers that are all alike in chemical kinetics, deposition per cycle, composition, and thickness.
ALD can be used as a fabrication step for forming a number of types of thin-film electronic devices, including semiconductor devices and supporting electronic components such as resistors and capacitors, insulators, bus lines, and other conductive structures. ALD is particularly suited for forming thin layers of metal oxides in the components of electronic devices. General classes of functional materials that can be deposited with ALD include conductors, dielectrics or insulators, and semiconductors.
Conductors can be any useful conductive material. For example, the conductors may comprise transparent materials such as indium-tin oxide (ITO), doped zinc oxide ZnO, SnO2, or In2O3. The thickness of the conductor may vary, and according to particular examples it can range from about 50 to about 1000 nm.
Examples of useful semiconducting materials are compound semiconductors such as gallium arsenide, gallium nitride, cadmium sulfide, intrinsic zinc oxide, and zinc sulfide.
A dielectric material electrically insulates various portions of a patterned circuit. A dielectric layer may also be referred to as an insulator or insulating layer. Specific examples of materials useful as dielectrics include strontiates, tantalates, titanates, zirconates, aluminum oxides, silicon oxides, tantalum oxides, hafnium oxides, titanium oxides, zinc selenide, and zinc sulfide. In addition, alloys, combinations, and multilayers of these examples can be used as dielectrics. Of these materials, aluminum oxides are preferred.
A dielectric structure layer may comprise two or more layers having different dielectric constants. Such insulators are discussed in U.S. Pat. No. 5,981,970 hereby incorporated by reference and copending US Publication No. 2006/0214154, hereby incorporated by reference. Dielectric materials typically exhibit a band-gap of greater than about 5 eV. The thickness of a useful dielectric layer may vary, and according to particular examples it can range from about 10 to about 300 nm.
A number of device structures can be made with the functional layers described above. A resistor can be fabricated by selecting a conducting material with moderate to poor conductivity. A capacitor can be made by placing a dielectric between two conductors. A diode can be made by placing two semiconductors of complementary carrier type between two conducting electrodes. There may also be disposed between the semiconductors of complementary carrier type a semiconductor region that is intrinsic, indicating that that region has low numbers of free charge carriers. A diode may also be constructed by placing a single semiconductor between two conductors, where one of the conductor/semiconductors interfaces produces a Schottky barrier that impedes current flow strongly in one direction. A transistor may be made by placing upon a conductor (the gate) an insulating layer followed by a semiconducting layer. If two or more additional conductor electrodes (source and drain) are placed spaced apart in contact with the top semiconductor layer, a transistor can be formed. Any of the above devices can be created in various configurations as long as the necessary interfaces are created.
In typical applications of a thin film transistor, the need is for a switch that can control the flow of current through the device. As such, it is desired that when the switch is turned on, a high current can flow through the device. The extent of current flow is related to the semiconductor charge carrier mobility. When the device is turned off, it is desirable that the current flow be very small. This is related to the charge carrier concentration. Furthermore, it is generally preferable that visible light have little or no influence on thin-film transistor response. In order for this to be true, the semiconductor band gap must be sufficiently large (>3 eV) so that exposure to visible light does not cause an inter-band transition. A material that is capable of yielding a high mobility, low carrier concentration, and high band gap is ZnO. Furthermore, for high-volume manufacture onto a moving web, it is highly desirable that chemistries used in the process be both inexpensive and of low toxicity, which can be satisfied by the use of ZnO and the majority of its precursors.
Self-saturating surface reactions make ALD relatively insensitive to transport non-uniformities, which might otherwise impair surface uniformity, due to engineering tolerances and the limitations of the flow system or related to surface topography (that is, deposition into three dimensional, high aspect ratio structures). As a general rule, a non-uniform flux of chemicals in a reactive process generally results in different completion times over different portions of the surface area. However, with ALD, each of the reactions is allowed to complete on the entire substrate surface. Thus, differences in completion kinetics impose no penalty on uniformity. This is because the areas that are first to complete the reaction self-terminate the reaction; other areas are able to continue until the full treated surface undergoes the intended reaction.
Typically, an ALD process deposits about 0.1-0.2 nm of a film in a single ALD cycle (with one cycle having numbered steps 1 through 4 as listed earlier). A useful and economically feasible cycle time must be achieved in order to provide a uniform film thickness in a range of from about 3 nm to 30 nm for many or most semiconductor applications, and even thicker films for other applications. According to industry throughput standards, substrates are preferably processed within 2 minutes to 3 minutes, which means that ALD cycle times must be in a range from about 0.6 seconds to about 6 seconds.
ALD offers considerable promise for providing a controlled level of highly uniform thin film deposition. However, in spite of its inherent technical capabilities and advantages, a number of technical hurdles still remain. One important consideration relates to the number of cycles needed. Because of its repeated reactant and purge cycles, effective use of ALD has required an apparatus that is capable of abruptly changing the flux of chemicals from MLx to AHy, along with quickly performing purge cycles. Conventional ALD systems are designed to rapidly cycle the different gaseous substances onto the substrate in the needed sequence. However, it is difficult to obtain a reliable scheme for introducing the needed series of gaseous formulations into a chamber at the needed speeds and without some unwanted mixing. Furthermore, an ALD apparatus must be able to execute this rapid sequencing efficiently and reliably for many cycles in order to allow cost-effective coating of many substrates.
In an effort to minimize the time that an ALD reaction needs to reach self-termination, at any given reaction temperature, one approach has been to maximize the flux of chemicals flowing into the ALD reactor, using so-called "pulsing" systems. In order to maximize the flux of chemicals into the ALD reactor, it is advantageous to introduce the molecular precursors into the ALD reactor with minimum dilution of inert gas and at high pressures. However, these measures work against the need to achieve short cycle times and the rapid removal of these molecular precursors from the ALD reactor. Rapid removal in turn dictates that gas residence time in the ALD reactor be minimized. Gas residence times, τ, are proportional to the volume of the reactor, V, the pressure, P, in the ALD reactor, and the inverse of the flow, Q, that is:
τ=VP/Q (3)
In a typical ALD chamber, the volume (V) and pressure (P) are dictated independently by the mechanical and pumping constraints, leading to difficulty in precisely controlling the residence time to low values. Accordingly, lowering pressure (P) in the ALD reactor facilitates low gas residence times and increases the speed of removal (purge) of chemical precursor from the ALD reactor. In contrast, minimizing the ALD reaction time requires maximizing the flux of chemical precursors into the ALD reactor through the use of a high pressure within the ALD reactor. In addition, both gas residence time and chemical usage efficiency are inversely proportional to the flow. Thus, while lowering flow can increase efficiency, it also increases gas residence time.
Existing ALD approaches have been compromised with the trade-off between the need to shorten reaction times with improved chemical utilization efficiency, and, on the other hand, the need to minimize purge-gas residence and chemical removal times. One approach to overcome the inherent limitations of "pulsed" delivery of gaseous material is to provide each reactant gas continuously and to move the substrate through a region containing each gas in succession. In these systems, some mechanism must be employed to confine a particular gas to a spatial region in order that the substrate can sample all of the gases during its movement, but the individual mutually reactive gases cannot mix causing undesirable CVD deposition. Such systems can be referred to as spatially confined ALD systems. For example, U.S. Pat. No. 6,821,563 entitled "GAS DISTRIBUTION SYSTEM FOR CYCLICAL LAYER DEPOSITION" to Yudovsky, describes a processing chamber, under vacuum, having separate gas ports for precursor and purge gases, alternating with vacuum pump ports between each gas port. Each gas port directs its stream of gas vertically downward toward a substrate. The separate gas flows are separated by walls or partitions, with vacuum pumps for evacuating gas on both sides of each gas stream. A lower portion of each partition extends close to the substrate, for example, about 0.5 mm or greater from the substrate surface. In this manner, the lower portions of the partitions are separated from the substrate surface by a distance sufficient to allow the gas streams to flow around the lower portions toward the vacuum ports after the gas streams react with the substrate surface.
A rotary turntable or other transport device is provided for holding one or more substrate wafers. With this arrangement, the substrate is shuttled beneath the different gas streams, effecting ALD deposition thereby. In one embodiment, the substrate is moved in a linear path through a chamber, in which the substrate is passed back and forth a number of times.
Another approach using continuous gas flow is shown in U.S. Pat. No. 4,413,022 entitled "METHOD FOR PERFORMING GROWTH OF COMPOUND THIN FILMS" to Suntola et al. A gas flow array is provided with alternating source gas openings, carrier gas openings, and vacuum exhaust openings. Reciprocating motion of the substrate over the array effects ALD deposition, again, without the need for pulsed operation. In the embodiment of
While systems such as those described in the '563 Yudovsky and '022 Suntola et al. patents may avoid some of the difficulties inherent to pulsed gas approaches, these systems have other drawbacks. Neither the gas flow delivery unit of the '563 Yudovsky patent nor the gas flow array of the '022 Suntola et al. patent can be used in closer proximity to the substrate than about 0.5 mm. Neither of the gas flow delivery apparatus disclosed in the '563 Yudovsky and '022 Suntola et al. patents are arranged for possible use with a moving web surface, such as could be used as a flexible substrate for forming electronic circuits, light sensors, or displays, for example. The complex arrangements of both the gas flow delivery unit of the '563 Yudovsky patent and the gas flow array of the '022 Suntola et al. patent, each providing both gas flow and vacuum, make these solutions difficult to implement, costly to scale, and limit their potential usability to deposition applications onto a moving substrate of limited dimensions. Moreover, it would be very difficult to maintain a uniform vacuum at different points in an array and to maintain synchronous gas flow and vacuum at complementary pressures, thus compromising the uniformity of gas flux that is provided to the substrate surface.
US Patent Publication No. 2005/0084610 to Selitser discloses an atmospheric pressure atomic layer chemical vapor deposition process. Selitser states that extraordinary increases in reaction rates are obtained by changing the operating pressure to atmospheric pressure, which will involve orders of magnitude increase in the concentration of reactants, with consequent enhancement of surface reactant rates. The embodiments of Selitser involve separate chambers for each stage of the process, although FIG. 10 in 2005/0084610 shows an embodiment in which chamber walls are removed. A series of separated injectors are spaced around a rotating circular substrate holder track. Each injector incorporates independently operated reactant, purging, and exhaust gas manifolds and controls and acts as one complete mono-layer deposition and reactant purge cycle for each substrate as is passes there under in the process. Little or no specific details of the gas injectors or manifolds are described by Selitser, although it is stated that spacing of the injectors is selected so that cross-contamination from adjacent injectors is prevented by purging gas flows and exhaust manifolds incorporated in each injector.
Another approach for spatially confining gases in an ALD processing device is described in the above-cited U.S. patent application Ser. No. 11/392,006 which discloses a transverse flow ALD device. In such a device, various gases are directed parallel to each other and thus limit any gas intermixing by limiting the degree of countercurrent flow.
One of the most efficient methods for allowing for gas isolation is the floating-head ALD device of the above-cited U.S. patent application Ser. No. 11/620,744. In this device, the pressure of flowing reactive and purge gases is used as a means to separate the delivery head from the substrate. Due to the relatively large pressures that can be generated in such a system, gases are forced to travel in well defined paths and thus eliminate undesired gas intermixing.
In the operation of a floating style ALD deposition head as proposed above, it is very important to provide a method to allow robust deposition of high quality thin films. In particular, it is important that the separation of the substrate from the deposition head be maintained in such a way that potential mechanical and other disturbances do not lead to variations in coating quality.OBJECT OF THE INVENTION
An object of the present invention is, when placing reactive gases in close proximity in an ALD coating process, to deliver gases in a relatively precise way, with good uniformity over the dimensions of a delivery head.
Another object is to provide a means to maintain the substrate at a fixed gap with respect to the delivery head, and to maintain this gap effectively even in the presence of external disturbances.
Another object is to provide a means to use a floating style deposition head in which the substrate can hang from the deposition head, with its position maintained by forces generated by flows and pressures set by the delivery head and its operating regime.
Another object is to provide an ALD deposition method and apparatus that can be used with a continuous process and that can provide improved gas flow separation over earlier solutions.
Another object is to provide an ALD deposition method and apparatus that is more robust to potential disturbances or irregularities in process conditions or circumstances during operation.
Another object is to provide, in embodiments that use a floating delivery head, an ALD deposition method and apparatus that advantageously provides improved mobility.SUMMARY OF THE INVENTION
The present invention provides an apparatus and process for depositing a thin film material on a substrate, comprising simultaneously directing a series of gas flows from the output face of a delivery head of a thin film deposition system toward the surface of a substrate, wherein the series of gas flows comprises at least a first reactive gaseous material, an inert purge gas, and a second reactive gaseous material. The first reactive gaseous material is capable of reacting with a substrate surface treated with the second reactive gaseous material. In particular, the present invention relates to a delivery device for thin-film material deposition onto a substrate comprising:
- (A) at least a first, a second, and a third source for at least a first, a second, and a third gaseous materials;
- (B) a substrate having a substrate surface and an average weight per unit area;
- (C) a deposition head for delivering the gaseous materials to the substrate surface for thin film deposition comprising:
- i) at least a first, a second, and a third inlet port for receiving the first, the second, and the third gaseous materials, respectively;
- ii) at least one exhaust port for exhausting waste gases;
- iii) an output face in proximity to the substrate surface comprising a plurality of elongated openings, wherein
- (a) each of the inlet ports is independently connected to at least one (preferably a plurality of) first, second, and third elongated output openings (each associated or connected with an elongated emissive channel) in the face of the deposition head for supplying the respective gaseous materials to the substrate; and
- (b) the at least one exhaust port is connected to at least two (preferably a plurality of) elongated exhaust openings each having an associated pressure, wherein the elongated exhaust openings (each associated or connected with a corresponding elongated emissive channel) are disposed such that at least a first, second, or third elongated output opening is located between the at least two (preferably each of the plurality of) exhaust openings in the output face; and
- wherein a substantially uniform distance between the output face and the substrate surface is maintained at least in part by pressure generated due to flows of one or more of the gaseous materials from the elongated output openings to the substrate's surface and wherein the difference between atmospheric pressure and the average pressure of the elongated exhaust openings measured in Pascals is at least two times the average weight per unit area of the substrate, also measured in Pascals.
Preferably, the delivery head comprises a plurality of first elongated emissive channels and/or a plurality of second elongated emissive channels for various applications. However, as a minimum, a one-stage delivery head can have, for example, only one metal and or one oxidizer channel in combination with at least two purge channels. A plurality of individual "delivery-head sub-units" that are connected together, or that treat the same substrate during a common period of time are considered a "delivery head" for the purpose of the present invention, even though separately constructed or separable after deposition.
In a preferred embodiment, the first and second gaseous materials can be mutually reactive gases, and the third gaseous material can be a purge gas such as nitrogen.
Another aspect of the present invention relates to a process for depositing a thin film material on a substrate, comprising simultaneously directing a series of gas flows from the output face of a delivery head of a thin film deposition system toward the surface of a substrate, and wherein the series of gas flows comprises at least a first reactive gaseous material, an inert purge gas, and a second reactive gaseous material, wherein the first reactive gaseous material is capable of reacting with a substrate surface treated with the second reactive gaseous material, wherein the delivery head comprises:
- (a) at least a first, a second, and a third inlet port for receiving the first reactive gaseous material, the second reactive gaseous material, and the inert purge gas, respectively;
- (b) at least one exhaust port for exhausting waste gases;
- (c) an output face in proximity to the substrate surface comprising a plurality of elongated openings, wherein
- (i) each of the inlet ports is independently connected, respectively, to at least one first, second, and third elongated output openings, each associated with an elongated emissive channel, for supplying the respective gaseous materials to the substrate; and
- (ii) the at least one exhaust port is connected to at least two elongated exhaust openings, each connected to or associated with a corresponding elongated exhaust channel, each elongated exhaust opening having an associated pressure, wherein the elongated exhaust openings are disposed such that at least a first, second, or third elongated output opening is located between the at least two elongated exhaust openings in the output face; and
- wherein a substantially uniform distance between the output face and the substrate's surface is maintained at least in part by pressure generated due to flows of one or more of the gaseous materials from the elongated output openings to the substrate's surface and wherein the difference between atmospheric pressure and the average pressure of the elongated exhaust openings measured in Pascals is at least two times the average weight per unit area of the substrate, also measured in Pascals.
In one preferred embodiment, all of the emissive gas flows in the output face provide a pressure that substantially contributes to the separation of the surface of the substrate from the face of the delivery head, while a series of exhaust channels provide a suction force that prevents the substrate from moving too far from the surface of the deposition head.
In another preferred embodiment, the force of the exhaust channel suction at the output face (i.e., at the exhaust openings) is large enough to allow the substrate to be located below the deposition head, and that the suction provides the majority of the force required to counteract gravity and prevent the substrate from falling.
In another embodiment, the system provides a relative oscillating motion between the distribution head and the substrate. In a preferred embodiment, the system can be operated with continuous movement of a substrate being subjected to thin film deposition, wherein the system is capable of conveying the support on or as a web past the distribution head, preferably in an unsealed environment to ambient at substantially atmospheric pressure.
It is an advantage of the present invention that it can provide a compact apparatus for atomic layer deposition onto a substrate that is well suited to a number of different types of substrates and deposition environments.
It is a further advantage of the present invention that it allows operation, in preferred embodiments, under atmospheric pressure conditions.
It is yet a further advantage of the present invention that it is adaptable for deposition on a web or other moving substrate, including deposition onto a large area substrate.
It is still a further advantage of the present invention that it can be employed in low temperature processes at atmospheric pressures, which may be practiced in an unsealed environment, open to ambient atmosphere. The method of the present invention allows control of the gas residence time τ in the relationship shown earlier in equation (3), allowing residence time τ to be reduced, with system pressure and volume controlled by a single variable, the gas flow.
As used herein, the terms "vertical," "horizontal," "top," "bottom," "front," "back," or "parallel," and the like, unless otherwise indicated, are with reference to a front/bottom horizontal face of the delivery device or a top horizontal parallel surface of the substrate being treated, in an theoretical configuration in which the delivery head is vertically over the substrate, although that configuration is optional, for example, the substrate can be positioned over the face of the delivery head or otherwise positioned.
These and other objects, features, and advantages of the present invention will become apparent to those skilled in the art upon a reading of the following detailed description when taken in conjunction with the drawings wherein there is shown and described an illustrative embodiment of the invention.
While the specification concludes with claims particularly pointing out and distinctly claiming the subject matter of the present invention, it is believed that the invention will be better understood from the following description when taken in conjunction with the accompanying drawings, wherein:
The present description is directed in particular to elements forming part of, or cooperating more directly with, apparatus in accordance with the invention. It is to be understood that elements not specifically shown or described may take various forms well known to those skilled in the art.
For the description that follows, the term "gas" or "gaseous material" is used in a broad sense to encompass any of a range of vaporized or gaseous elements, compounds, or materials. Other terms used herein, such as: "reactant," "precursor," "vacuum," and "inert gas," for example, all have their conventional meanings as would be well understood by those skilled in the materials deposition art. The figures provided are not drawn to scale but are intended to show overall function and the structural arrangement of some embodiments of the present invention. Terms "upstream" and "downstream" have their conventional meanings as relates to the direction of gas flow.
The apparatus of the present invention offers a significant departure from conventional approaches to ALD, employing an improved distribution device for delivery of gaseous materials to a substrate surface, adaptable to deposition on larger and web-based or web-supported substrates and capable of achieving a highly uniform thin-film deposition at improved throughput speeds. The apparatus and method of the present invention employs a continuous (as opposed to pulsed) gaseous material distribution. The apparatus of the present invention allows operation at atmospheric or near-atmospheric pressures as well as under vacuum and is capable of operating in an unsealed or open-air environment.
Referring to
In one embodiment, gas inlet conduits 14 and 16 are adapted to accept first and second gases that react sequentially on the substrate surface to effect ALD deposition, and gas inlet conduit 18 receives a purge gas that is inert with respect to the first and second gases. Delivery head 10 is spaced a distance D from substrate 20, which may be provided on a substrate support, as described in more detail subsequently. Reciprocating motion can be provided between substrate 20 and delivery head 10, either by movement of substrate 20, by movement of delivery head 10, or by movement of both substrate 20 and delivery head 10. In the particular embodiment shown in
The cross-sectional view of
The cross-sectional views of
In one embodiment, as described in more detail in copending, commonly assigned U.S. patent application Ser. No. 11/620,744, hereby incorporated by reference in its entirety, gas pressure is provided against substrate 20, such that separation distance D is maintained, at least in part, by the force of pressure that is exerted. By maintaining some amount of gas pressure between output face 36 and the surface of substrate 20, the apparatus of the present invention provides at least some portion of an air bearing, or more properly a gas fluid bearing, for delivery head 10 itself or, alternately, for substrate 20. This arrangement helps to simplify the transport requirements for delivery head 10, as described subsequently. The effect of allowing the delivery head to approach the substrate such that it is supported by gas pressure, helps to provide isolation between the gas streams. By allowing the head to float on these streams, pressure fields are set up in the reactive and purge flow areas that cause the gases to be directed from inlet to exhaust with little or no intermixing of other gas streams. In such a device, the close proximity of the delivery head to the substrate leads to relatively high pressure and high variations of pressure under the head. The absence of a gas diffuser system or an inadequate gas diffusion system within the head would indicate that there is little pressure drop for gases flowing within the head. In such a case, if random forces cause a small increase on the gap on one side of the head, the pressure in that area may be lowered and gas may flow into that area in too high a proportion. Thus, a gas diffuser is required so that gas flow out of the head is maintained relatively uniformly despite potential variations under the delivery head.
In one embodiment, a delivery device having an output face for providing gaseous materials for thin-film material deposition onto a substrate comprises:
(a) a plurality of inlet ports comprising at least a first inlet port, a second inlet port, and a third inlet port capable of receiving a common supply for a first gaseous material, a second gaseous material, and a third gaseous material, respectively; and
(b) at least three groups of elongated emissive channels, a first group comprising one or more first elongated emissive channels, a second group comprising one or more second elongated emissive channels, and a third group comprising at least two third elongated emissive channels, each of the first, second, and third elongated emissive channels allowing gaseous fluid communication with one of corresponding first inlet port, second inlet port, and third inlet port;
wherein each first elongated emissive channel is separated on at least one elongated side thereof from the nearest second elongated emissive channel by a third elongated emissive channel;
wherein each first elongated emissive channel and each second elongated emissive channel is situated between third elongated emissive channels,
wherein each of the first, second, and third elongated emissive channels extend in a length direction and are substantially in parallel;
wherein each of the elongated emissive channels in at least one group of elongated emissive channels, of the three groups of elongated emissive channels, is capable of directing a flow, respectively, of at least one of the first gaseous material, second gaseous material, and the third gaseous material substantially orthogonally with respect to the output face of the delivery device, which flow of gaseous material is capable of being provided, either directly or indirectly from each of the elongated emissive channels in the at least one group, substantially orthogonally to the surface of the substrate.
In one embodiment, at least a portion of the delivery device is formed as a plurality of apertured plates, superposed to define a network of interconnecting supply chambers and directing channels for routing each of the first, second, and third gaseous materials from its corresponding inlet port to its corresponding elongated emissive channels.
For example, the first and second gaseous materials can be mutually reactive gases, and the third gaseous material can be a purge gas.
The exploded view of
As shown in the example of
As indicated above, the delivery device for thin-film material deposition onto a substrate can preferably comprise a gas diffuser, wherein the gaseous material from at least one (preferably all three) of a plurality of elongated channels of said first, second, and third elongated emissive channels is capable of passing through the gas diffuser prior to delivery from the delivery device to the substrate, including deposition onto the substrate, wherein the delivery device allows the passage of each gaseous material in order through the respective inlet port, elongated emissive channels, and (with respect to said at least one plurality of emissive channels) gas diffuser. The gas diffuser can be either in said at least one plurality of emissive elongated channels and/or upstream of the emissive elongated channel.
In an advantageous embodiment, the gas diffuser is capable of providing a friction factor, to be described subsequently, that is greater than 1×102, preferably 1×104 to 1×108, more preferably 1×105 to 5×106. This provides back pressure and promotes the equalization of pressure where the flow of the at least one first, second and third gaseous material exits the delivery device.
This friction factor assumes that the characteristic area in the equation below is equal to the entire area between exhaust elongated channels on either side of each emissive elongated channel of said at least one plurality of emissive elongated channels. In other words, the area is defined by a straight line connecting the two ends of the respective exhaust elongated channels. For the purpose of the apparatus claims, this also assumes a representative gas that is nitrogen at 25° C. and an average velocity of between 0.01 and 0.5 m/sec, for the purpose of calculating the friction factor for the apparatus apart from a method of use. The average velocity is calculated based on the flow rate divided by the characteristic area A defined below. (These representative values are for characterizing the delivery device apart from its method of use and do not apply to the process according to the invention, in which actual values during the process apply.)
The term "friction factor" can be explained as follows. When a flow of gas is passed through the channel, there will exist a higher pressure on the upstream side of the diffuser than exists on the downstream side due to the resistive nature of the diffuser. The difference in pressure is the known as the pressure drop across the diffuser.
A gas diffuser or other means for providing back pressure in the delivery head (which diffuser can be an apparatus, material, or combination thereof) provides a resistance to flow in a channel, while still allowing fluid to pass uniformly. A gas diffuser means may be placed at the end of a flow channel of some shape. In the absence of the gas diffuser, fluid may tend to leave the channel at any spot and may not be constrained to leave as uniformly. With a gas diffuser present, fluid traveling up to the gas diffuser will find a strong resistance there, and will travel by path of least resistance along all areas of the diffuser to exit more uniformly, which is desired for smoother, more robust operation.
Since a desired property of the gas diffuser is its resistance to flow, it is convenient to characterize this resistance by accepted means in the field of fluid dynamics (Transport Phenomena, R. B. Bird, W. E. Stewart, E. N Lightfoot, John Wiley & Sons, 1960, hereby incorporated by reference). Pressure drops across a diffuser can be characterized by the friction factor, f, presented by the gas diffuser:
where Fk is the force exerted due to the fluid flow, ultimately related to the pressure drop, A is a characteristic area, and K represents the kinetic energy of the fluid flow. Diffusers can take many shapes. For a typical system, as described for the present invention, A is disposed perpendicular to the output flow and Fk is disposed parallel to the output flow. Thus, the term Fk/A can be taken as the pressure drop ΔP caused by the gas diffuser.
The kinetic energy term of the flow is:
where ρ is the gas density and <v> is the average velocity, equal to the flow rate of the gaseous material divided by the characteristic area A. (The density of nitrogen can be used for a first approximation for the gases actually used in the process, or as a representative gas for characterizing the delivery head apparatus.) Thus, the pressure drop due to a gas diffuser can be reduced to:
Equation (6) can be used to calculate the friction factor f, a dimensionless number, since the other factors can be experimental determined or measured, as shown in the examples below.
Materials or devices exhibiting higher friction factors present a higher resistance to gas flow. The friction factor for a given diffuser means can be measured by disposing the diffuser in some channel, and simultaneously recording the pressure drop as well as the flow rate of gas presented to the diffuser. From the flow rate of gas and knowledge of the shape of the channel, the velocity <v> can be calculated, thus allowing calculation of the friction factor from the above equation. The friction factor for a given system is not perfectly constant, but has some relatively weak dependence upon the flow rate. For practical purposes, it is only important that the friction factor be known at flow rates typical of use in a given system or method. With respect to a delivery head apparatus, apart from the method, the average velocity <v> can be taken as 0.01 to 0.5 m/sec as a representative number. (The claimed friction factor in the case of the apparatus should be met for all average velocities <v> in this representative range.)
In one embodiment, a suitable gas diffuser is capable of providing a friction factor for gas flow through the gas diffuser that is greater than 1×102, preferably 1×104 to 1×108, more preferably 1×105 to 5×106. This provides the desired back pressure and promotes the equalization of pressure where the gas flow of the at least one first, second and third gaseous material (preferably all three gaseous materials) exits the delivery device through the gas diffuser.
As indicated above, the characteristic area A for determining the average velocity <v> for Equation (6) is equal to the entire area between exhaust elongated channels on either side of each individual emissive elongated channel among the emissive elongated channels in flow communication with the gas diffuser. In other words, the area is defined by a straight line connected the two ends of the respective exhaust elongated channels. For the purpose of the apparatus claims, this also assumes a representative gas that is nitrogen at 25° C.
The skilled artisan can appreciate that typical random materials by itself will not provide the necessary friction factor. For example, a stainless steel perforated screen even though representing fairly small features for typical machined or mechanically fabricated elements, may offer a friction factor that is too low to be adequate by itself for the present gas diffuser.
For the purpose of determining the friction factor, in most cases, a good approximation can be made by using the pressure into the delivery head, since the effect of the flow path leading to the gas diffuser will be relatively small.
A gas diffuser means can be a mechanically formed apparatus that provides the necessary friction factor, for example, wherein the emissive elongated channels are designed to provide the first, second, and third gaseous material indirectly to the substrate after passing through a gas diffuser element comprising openings in a solid material. For example, the solid material can be steel and the openings formed by molding, machining, the application of laser or lithography, or the like.
Alternatively, a gas diffuser means can comprise a porous material. Instead of machining holes in a solid material, a porous material having tiny pores can be used to create the desired backpressure. The resulting uniform distribution of inlet gas allows improved uniformity of deposition growth as well as, for certain embodiments, better floatation of a floating head. Porous materials are advantageous for providing a relatively simple unit that avoids difficulty machining of steel and the like.
In the literature, porous materials have been used to create back pressure for air bearings, but such applications are not concerned about cross-flow (i.e., gas moving laterally). Thus, sintered alumina particles might be used to form a membrane for an air bearing. In the preferred embodiment of the ALD system of the present invention, however, gases preferably flow substantially vertically from the outlet, with minimal or no inadvertent sideways motion that could allow gas mixing. Therefore porous materials with substantially vertical tubular openings or pores to direct the gas flow are especially desirable and advantageous.
Porous materials have also been for filters, where the object is to keep one component of a flow on one side, while allowing another component to pass through. In contrast, in the present invention, moderate resistance to the flow of the entire gaseous material is the objective. For this purpose, two preferred classes of porous materials are as follows:
A first preferred class of porous materials comprises porous materials with uniform, controlled diameter, columnar-type pore structure. In a membrane (or layer) made of such material, flow through the membrane is substantially uni-directional, essentially without any cross-flow between pore channels. Alumina formed by anodization of highly pure aluminum is well-known in the literature for its uniformity of pore diameter (though the cross-sectional shape of the pores is not necessarily round or regular), and such materials are commercially available at diameters of 0.02, 0.1, and 0.2 microns. The pores in ANOPORE alumina, a commercially available alumina, are fairly dense, 1.23×109 pores/cm2 (J Chem Phys, V. 96, p. 7789, 1992). However, a wide variety of pore diameters and interpore distance can be fabricated. Porous materials can also be formed of titanium oxides, zirconium oxides, and tin oxides (Adv. Materials, V. 13, p. 180, 2001). Another commercially available material with columnar pores is a Polycarbonate Track Etch (PCTE) membrane, made from a thin, microporous polycarbonate film material, known as NUCLEOPORE. Block copolymers can form similar configurations, with a wide range of tunability.
Thus, in a preferred embodiment, the gas diffuser comprises porous material comprises an isolating, non-connecting pores structure in which pores are substantially vertical to the surface, for example, anodic alumina.
In all these materials, the precise range of pore diameter and density of pores (or pore volume) must be adjusted to achieve the appropriate friction factor for the flow required. It is desirable to avoid reactivity of the diffusing membrane with the flowing gases. This is likely to be less of a potential issue, for example, for inorganic oxides than for organic-based materials.
Furthermore, the membrane must have some mechanical toughness. The flowing gases will exert pressure on the membranes. The toughness could be achieved by a support membrane, so that the friction factor is generated by a layer with smaller pores coupled with a more robust layer with larger pores.
In a second preferred class of porous materials, porous materials are fabricated such that the flow can be isotropic, i.e. moving sideways inside the membrane, as well as through the membrane. However, for present purposes, such an isotropically-flowing material is preferably separated by walls on non-porous material (for example, ribs) that isolate gaseous material in each output channel from gaseous material in other output channels and prevent gaseous materials from intermingling in the gas diffuser or when leaving the gas diffuser or delivery head. For example, such porous materials can be sintered from small particles, either organic or inorganic. Sintering typically involves applying heat and/or pressure, preferably both, sufficient to bond the particles. A wide variety of such porous materials are available commercially, such as porous glass (VYCOR has, for example, having a void volume of 28%) and porous ceramics. Alternatively, fibrous materials can be compressed to create a tight network to limit or resist the flow of gas. Alternatively, porous stainless steel can be formed by plasma coating onto a subsequently removed substrate.
In one embodiment, for producing suitable backpressure while still providing relative isolation between gas channels, polymeric materials treated in a way to generate useful pores can be employed, for example, TEFLON material that is treated to produce porosity (GoreTex, Inc.; Newark, Del.). In this case, the pores may not be interconnected. Also, the natural chemical inertness of such materials is advantageous.
Porous materials can comprise pores formed from the interstitial space between particles, pores that are interconnected voids in a solid material formed by a voiding agent or other means, or pores that are formed from micro-scale or nano-scale fibers. For example, the porous material can be formed from the interstitial space between inorganic or organic particles which is held together by sintering, either by pressure and/or heat, adhesive material, or other bonding means. Alternatively, the porous material can result from the processing of a polymer film to generate porosity.
In one embodiment, a gas diffuser means comprises a porous material that comprise pores that are less than 10,000 nm in average diameter, preferably 10 to 5000 nm, more preferably 50 to 5000 nm in average diameter, as determined by mercury intrusion porosity measurement.
Various configurations of the porous material in a gas diffuser means are possible. For example, the porous material can comprise one or more layers of different porous materials or a layer of porous material supported by a porous or perforated sheet, which layers are optionally separated by spacer elements. Preferably, the porous material comprises a layer that is 5 to 1000 micrometers thick, preferably 5 to 100 micrometers thick, for example, about 60 μm. In one embodiment, the porous material can be in the form of at least one horizontally disposed layer that covers the face of the delivery assembly and comprises the part of the delivery device from which the gaseous materials exit the output face.
The porous material can form a continuous layer, optionally with passages mechanically formed therein. For example, the porous layer of the gas diffuser can comprise mechanically formed openings or elongated channels for the relatively unimpeded flow of exhaust gaseous material back through the delivery device. Alternatively, the layer of porous material can be in the form of a substantially completely continuous plate in a stack of plates.
In still another embodiment, the porous material can be introduced or formed inside elongated emissive channels or other walled channels in the flow path from the elongated emissive channels, for example by the bonding or sintering of particles introduced into the channels. Channels can be at least partially filled by porous material. For example, a diffuser element or portion thereof can be formed from elongated channels in a steel plate in which particles are introduced and then sintered.
Thus, a gas diffuser means can be an assembly of elements in which porous material is held in separate confined areas. For example, porous alumina material can be grown onto a previously machined piece of aluminum so that the resulting porous structure has big openings for purge channels and sheets of vertical pores for the supply gases.
The exploded view of
A gas diffuser plate 146, shown in
A face plate 148, as shown in
In the particular case of the arrangement of
The nozzle holes in the nozzle plate 142 can be of any size suitable for back-pressure generation. These holes are preferably less than 200 microns, more preferably less than 100 microns in diameter on average. Furthermore, the use of holes in the back-pressure generator is convenient but not necessary. The back pressure can also be generated by other geometries such as a slit, as long as the size is chosen to provide the desired back pressure.
Thus, in the embodiment of
In this embodiment, also, the gas diffuser unit 140 is a unit is designed to be separable from the rest of the delivery head 10, the delivery assembly 150, and substantially covers the final openings or flow passages for the first, second, and third gaseous material in the delivery device prior to the gas diffuser element. Thus, the gas diffuser unit 140 provides essentially the final flow path for the first, second and third gaseous material prior to delivery from the output face of the delivery device to the substrate. However, the gas diffuser element can also be designed as an inseparable part of delivery head 10.
In particular, the gas diffuser unit 140 in the embodiment of
Thus, a gas diffuser unit in accordance with the present invention can be a multilevel system comprising a series of at least two substantially horizontally extending diffuser components with parallel surfaces facing each other in an orthogonal direction with respect to the face of the delivery device (for example, stacked plates). In general, in association with each elongated emissive channel of the first, second, and third emissive channels, the gas diffuser comprises vertically overlying or superposed passages, respectively, in the at least two vertically arranged gas-diffuser plates, in combination providing a flow path for gaseous material that comprises two substantially vertical flow paths separated by a substantially horizontal flow path, wherein each substantially vertical flow path is provided by one or more passages, or passage components, extending in an elongated direction and wherein each substantially horizontal flow path is provided by a thin space between parallel surface areas in parallel plates, wherein vertical refers to the orthogonal direction with respect to the output face of the delivery device. The phrase "component passages" refers to a component of a passage in an element that does not pass all the way through the element, for example, the two component passages formed by combining second and third diffuser passages 147 and 149 of
In the particular embodiment of
Furthermore, a sequentially second gas diffuser component positioned between the first and third diffuser component comprises passages 147 each in the form of an elongated center opening that is relatively broader than the width of the passages in each of the first and third second diffuser component, such that the center opening is defined by two elongated sides and contains the interconnected passages of the first diffuser component and the third diffuser component, respectively, within its borders when viewed from above the gas diffuser looking down. Consequently, the gas diffuser unit 140 is capable of substantially deflecting the flow of the gaseous material passing there through. Preferably, the deflection is at an angle of 45 to 135 degrees, preferably about 90 degrees, such that orthogonal gas flow is changed to parallel gas flow with respect to the surface of the output face and/or substrate. Thus, the flow of the gaseous material can be substantially vertical through the passages in the first and third gas diffuser components and substantially horizontal in the second gas diffuser component.
In the embodiment of
Alternatively, as indicated above, a gas diffuser can comprise a porous material, wherein the delivery device is designed such that each of the individual emissive elongated channels provide gaseous material indirectly to the substrate after passing through the porous material either within each individual emissive elongated channel and/or upstream of each of the emissive elongated channel. Porous materials typically comprise pores that are formed by a chemical transformation or present in a naturally occurring porous material.
Referring back to
Apertured plates used for delivery head 10 could be formed and coupled together in a number of ways. Advantageously, apertured plates can be separately fabricated, using known methods such as progressive die, molding, machining, or stamping. Combinations of apertured plates can vary widely from those shown in the embodiments of FIGS. 4 and 9A-9B, forming delivery head 10 with any number of plates, such as from 5 to 100 plates. Stainless steel is used in one embodiment and is advantageous for its resistance to chemicals and corrosion. Generally, apertured plates are metallic, although ceramic, glass, or other durable materials may also be suitable for forming some or all of the apertured plates, depending on the application and on the reactant gaseous materials that are used in the deposition process.
For assembly, apertured plates can be glued or coupled together using mechanical fasteners, such as bolts, clamps, or screws. For sealing, apertured plates can be skin-coated with suitable adhesive or sealant materials, such as vacuum grease. Epoxy, such as a high-temperature epoxy, can be used as an adhesive. Adhesive properties of melted polymer materials such as polytetrafluoroethylene (PTFE) or TEFLON have also been used to bond together superposed apertured plates for delivery head 10. In one embodiment, a coating of PTFE is formed on each of the apertured plates used in delivery head 10. The plates are stacked (superposed) and compressed together while heat is applied near the melting point of the PTFE material (nominally 327° C.). The combination of heat and pressure then forms delivery head 10 from the coated apertured plates. The coating material acts both as an adhesive and as a sealant. KAPTON and other polymer materials could alternately be used as interstitial coating materials for adhesion.
As shown in
Referring to
The exploded view of
From left to right in
Returning to
(With the last separator plate in this sequence not shown in
where R1 and R2 represent reactant plates 166 in different orientations, for the two different reactant gases used, and E1 and E2 correspondingly represent exhaust plates 164 in different orientations.
Elongated exhaust channel 154 need not be a vacuum port, in the conventional sense, but may simply be provided to draw off the flow in its corresponding output channel 12, thus facilitating a uniform flow pattern within the channel. A negative draw, just slightly less than the opposite of the gas pressure at neighboring elongated emissive channels 152, can help to facilitate an orderly flow. The negative draw can, for example, operate with draw pressure at the source (for example, a vacuum pump) of between 0.2 and 1.0 atmosphere, whereas a typical vacuum is, for example, below 0.1 atmosphere.
Use of the flow pattern provided by delivery head 10 provides a number of advantages over conventional approaches, such as those noted earlier in the background section, that pulse gases individually to a deposition chamber. Mobility of the deposition apparatus improves, and the device of the present invention is suited to high-volume deposition applications in which the substrate dimensions exceed the size of the deposition head. Flow dynamics are also improved over earlier approaches.
The flow arrangement used in the present invention allows a very small distance D between delivery head 10 and substrate 20, as was shown in
It is desirable that when a large number of plates are assembled in a stacked-plate embodiment, the gas flow delivered to the substrate is uniform across all of the channels delivering a gas flow (I, M, or O materials). This can be accomplished by proper design of the apertured plates, such as having restrictions in some part of the flow pattern for each plate which are accurately machined to provide a reproducible pressure drop for each emissive elongated output or exhaust channel. In one embodiment, output openings or channels 12 exhibit substantially equivalent pressure along the length of the openings, to within no more than about 10% deviation. Even higher tolerances could be provided, such as allowing no more than about 5% or even as little as 2% deviation.
Although the method using stacked apertured plates is a particularly useful way of constructing a delivery head, there are a number of other methods for building such structures that may be useful in alternate embodiments. For example, the apparatus may be constructed by direct machining of a metal block, or of several metal blocks adhered together. Furthermore, molding techniques involving internal mold features can be employed, as will be understood by the skilled artisan. The apparatus can also be constructed using any of a number of stereolithography techniques.
It can be appreciated that there would be advantages to providing a fluid gas bearing, so that delivery head 10 is substantially maintained at a distance D above substrate 20. This would allow essentially frictionless motion of delivery head 10 using any suitable type of transport mechanism. Delivery head 10 could then be caused to "hover" above the surface of substrate 20 as it is channeled back and forth, sweeping across the surface of substrate 20 during materials deposition.
In one such embodiment, since the separation distance D is relatively small, even a small change in distance D (for example, even 100 micrometers) would require a significant change in flow rates and consequently gas pressure providing the separation distance D. For example, in one embodiment, doubling the separation distance D, involving a change less than 1 mm, would necessitate more than doubling, preferably more than quadrupling, the flow rate of the gases providing the separation distance D. As a general principle, it is considered more advantageous in practice to minimize separation distance D and, consequently, to operate at reduced flow rates.
The first force results from the pressure of the coating gases, which tends to push the substrate away for the head. This pressure is continuously varying along the length L, with a maximum pressure of Pin caused by the supply gases and a minimum pressure Pout caused by draw, or suction, from the exhaust port. The resulting force on the substrate from this pressure is the average pressure (properly integrated) multiplied by the active area A of the segment defined by lines x10, which is L times the width W.
The second force results from the effect of atmospheric pressure, Patm, acting on the surface of the substrate that is not in contact with the deposition head. This force is simply the atmospheric pressure times the area A. This force is always positive.
The third force Fm contains any additional mechanical forces that exist in the system. These forces may result from gravity, or the application of any other mechanical, magnetic, or electrical forces causing the substrate to change position relative to the deposition head. The force in this case must be considered as the proportional force applied to the area segment A of the coating.
Under conditions where there is suction on the exhaust port, the value of the exhaust area pressure Pout is set by experimental equipment. For the following calculations, the value of Pout is the value at the output face of the pressure in the immediate vicinity of the exhaust channel. In most practical implementations of a delivery head of this invention, the exhaust pressure cannot be measured at the output face but is instead measured by a pressure measuring means at a location at the head exhaust port. Because the restriction of gas flow in a well designed delivery head occurs at the point of close contact of the output face with the substrate, there should be very low pressure drop due to gas flow in the interior of the delivery head and therefore the pressure measured at the exhaust port should be very close to that at the output face, and it is acceptable to consider that Pout is represented by the pressure measured at the exhaust port of the delivery head.
In a typical delivery head configuration there are many elongated exhaust channels leading to fewer exhaust ports. There may be slight variations in the actual pressures at the elongated exhaust channels on the output face. It is sufficient for the purposes of this invention to assume that the Pout value can be represented by the average pressure taken over all of the exhaust ports, which are connected to all of the elongated exhaust channels.
In order to approximate the pressures caused by the flow of coating gases in the between the head and the substrate, the geometry can be considered as flow of gas through a narrow slit. The length of the slit is L, the thickness of the slit is 2 h, and the width of the slit is W. The volumetric flow Q through such a slit is defined as (Transport phenomena. Bird R B, Stewart W E & Lightfoot E N. New York: John Wiley and Sons, 1960. p. 62):
where μ is the viscosity of the gas.
The balance of forces described above would indicate that the stable gap between the substrate and delivery head is achieved when:
PatmA+Fm−PhA=0 (8)
Equation (7) predicts that if the pressure were to be sampled along the length L, it would have a linear profile. Therefore, the average pressure produced by the coating gases, Ph, is simply:
Equations (8) and (9) can be substituted in equation (7) and rearranged to yield a solution for half the slit (gap) thickness h as a function of known variables and parameters:
To maintain the substrate at a fixed distance from the delivery head, and to control this distance robustly, it is desired that the floating head operate in a vacuum preload mode. In the vacuum preload mode, the absolute pressure Pout is less than atmospheric pressure. In such a case, as long as the mechanical contribution Fm/A is small with respect to the different between Patm and Pout, the substrate will be forced into proximity with the delivery head in a way that it is still levitated by gas pressure, but requires a forced to remove it from this position.
The critical point at which the substrate will no longer remain in close proximity to the delivery head occurs when the term in the denominator of Equation (10) reaches 0. The condition is met when:
A significant contribution to Fm is from the weight of the substrate itself. The term Fm/A is:
where t is the substrate thickness, ρsub is the substrate density, and g is acceleration due to gravity. Assuming that thickness of typical substrates can range from 100 microns to 2000 microns, and densities can range from 1 to 10 kg/m3, the value of Fm/A will typically be in the range of 1 to 200 Pa.
In order for the system to be insensitive to mechanical perturbations, which will often relate to the weight of the substrate, it is desirable that Patm-Pout exceed Fm/A by a factor of 2 and preferably by a factor of 10.
A further benefit of operating in such a regime is that the substrate can hang from the delivery head.
Delivery head 10 may be positioned in some other orientation with respect to substrate 20. For example, substrate 20 could be supported by the fluid gas bearing effect, opposing gravity, so that substrate 20 can be moved along delivery head 10 during deposition. One embodiment using the fluid gas bearing effect for deposition onto substrate 20, with substrate 20 cushioned above delivery head 10 is shown in
The alternate embodiment of
As was particularly described with reference to
Typically, ALD requires multiple deposition cycles, building up a controlled film depth with each cycle. Using the nomenclature for types of gaseous materials given earlier, a single cycle can, for example in a simple design, provide one application of first reactant gaseous material O and one application of second reactant gaseous material M.
The distance between output channels for O and M reactant gaseous materials determines the needed distance for reciprocating movement to complete each cycle. For the example delivery head 10 of
A delivery head 10 may have only enough output channels 12 to provide a single cycle. Alternately, delivery head 10 may have an arrangement of multiple cycles, enabling it to cover a larger deposition area or enabling its reciprocating motion over a distance that allows two or more deposition cycles in one traversal of the reciprocating motion distance.
For example, in one particular application, it was found that each O-M cycle formed a layer of one atomic diameter over about ¼ of the treated surface. Thus, four cycles, in this case, are needed to form a uniform layer of 1 atomic diameter over the treated surface. Similarly, to form a uniform layer of 10 atomic diameters in this case, then, 40 cycles would be required.
An advantage of the reciprocating motion used for a delivery head 10 of the present invention is that it allows deposition onto a substrate 20 whose area exceeds the area of output face 36.
Advantageously, delivery head 10 can be fabricated at a smaller size than is possible for many types of deposition heads. For example, in one embodiment, output channel 12 has width w1 of about 0.005 inches (0.127 mm) and is extended in length to about 3 inches (75 mm).
In a preferred embodiment, ALD can be performed at or near atmospheric pressure and over a broad range of ambient and substrate temperatures, preferably at a temperature of under 300° C. Preferably, a relatively clean environment is needed to minimize the likelihood of contamination; however, full "clean room" conditions or an inert gas-filled enclosure would not be required for obtaining good performance when using preferred embodiments of the apparatus of the present invention.
In another embodiment that can be particularly useful for web fabrication, ALD system 70 can have multiple delivery heads 10, or dual delivery heads 10, with one disposed on each side of web substrate 66. A flexible delivery head 10 could alternately be provided. This would provide a deposition apparatus that exhibits at least some conformance to the deposition surface.
For the purposes of coating a flat substrate, it is generally assumed that the output face of the deposition apparatus will also be flat. However, there are advantages to having an output face with a degree of curvature.
The curvature of a surface can generally be defined by a radius of curvature. The radius of curvature is the radius of a circle where a section of that circle matches the curvature of the output face. In the case where the curvature of the surface varies and cannot be described by a single radius, then the maximum curvature and the minimum radius of curvature may be used to define the characteristic radius of curvature of the system.
For certain substrates it may be useful to have some curvature of the deposition head in the direction of movement of the substrate. This can have the beneficial effect of allowing the leading edge of the substrate to have lower downward force than the remaining portion of the substrate since curvature of the head will tend to pull the leading edge of the substrate away from the deposition output face.
For certain substrates it may be useful to have curvature in a direction that is perpendicular to the direction of substrate motion. This degree of curvature will have the effect of corrugation which is to increase the rigidity of the substrate and perform a more robust coating.
The apparatus of the present invention is advantaged in its capability to perform deposition onto a substrate over a broad range of temperatures, including room or near-room temperature in some embodiments. The apparatus of the present invention can operate in a vacuum environment, but is particularly well suited for operation at or near atmospheric pressure.
The invention has been described in detail with particular reference to certain preferred embodiments thereof, but it will be understood that variations and modifications can be effected within the scope of the invention as described above, and as noted in the appended claims, by a person of ordinary skill in the art without departing from the scope of the invention. For example, while air bearing effects may be used to at least partially separate delivery head 10 from the surface of substrate 20, the apparatus of the present invention may alternately be used to lift or levitate substrate 20 from output surface 36 of delivery head 10. Other types of substrate holder could alternately be used, including a platen for example.EXAMPLES
The theoretical deposition head used in all of the following theoretically calculated examples is composed of the following arrangement of elongated slots:
- P-Ex-O-Ex-P-Ex-M-Ex-P-Ex-O-Ex-P-Ex-M-Ex-P-Ex-O-Ex-P
Where P represents a purge channel, Ex represents an exhaust slot, O represents an oxidizer gas channel, and M represents a metal containing gas channel.
The elongated slots are separated on their long sides by 1.0 mm, and they are 50 mm in length. The substrate for the purposes of the Examples is chosen such that the substrate exactly covers the area generated by the above arrangement, thus the substrate is 50 mm wide by 20 mm long.Example 1 Comparative
This example quantifies the forces acting on a substrate when the average exhaust suction is ½ of the weight per unit area of the substrate.
In this example the substrate rests on top of the deposition head such that the force of gravity acts to pull the substrate toward the deposition head.
The substrate is a piece of conventional glass with a density of 2.2 g/cm3 and a thickness of 1 mm. Based upon its area the mass of the glass will be 2.2 grams and the substrate weight, thus the gravitational force acting on the substrate, will be 0.0216 N. The weight per unit area of the substrate is therefore 21.6 Pa.
If the exhaust channel pressure is set at 10.8 Pa (0.043 in H2O) then the exhaust pressure will be ½ of the weight per unit area of the substrate. According to equation (5) the critical force at which the substrate will separate from the head will be 0.0108 N. Since this force is substantially less than the weight of the substrate at 0.0216 N, small forces applied to the substrate are likely to significantly change the substrate to delivery head gap leading to non-robust operation.Example 2 Inventive
This example quantifies the forces acting on a substrate when the average exhaust suction is 5 times the weight per unit area of the substrate.
In this example the substrate rests on top of the deposition head such that the force of gravity acts to pull the substrate toward the deposition head.
The substrate is a piece of conventional glass with a density of 2.2 g/cm3 and a thickness of 1 mm. Based upon its area the mass of the glass will be 2.2 grams and the substrate weight, thus the gravitational force acting on the substrate, will be 0.0216 N. The weight per unit area of the substrate is therefore 21.6 Pa.
If the exhaust channel pressure is set at 108 Pa (0.43 in H2O) then the exhaust pressure will be 5 times the weight per unit area of the substrate. According to equation (5) the critical force at which the substrate will separate from the head will be 0.108 N. Since this force is substantially more than the weight of the substrate at 0.0216 N, small forces applied to the substrate are not likely to significantly change the substrate to delivery head gap.Example 3 Comparative
This example employs the same configuration as in Example 1 except that the deposition head is inverted with the substrate below the head. Therefore, the force of gravity acts to pull the substrate from the head.
This example quantifies the forces acting on a substrate when the average exhaust suction is ½ of the weight per unit area of the substrate.
The substrate is a piece of conventional glass with a density of 2.2 g/cm3 and a thickness of 1 mm. Based upon its area the mass of the glass will be 2.2 grams and the substrate weight, thus the gravitational force acting on the substrate, will be 0.0216 N. The weight per unit area of the substrate is therefore 21.6 Pa.
If the exhaust channel pressure is set at 10.8 Pa (0.043 in H2O) then the exhaust pressure will be ½ of the weight per unit area of the substrate. According to equation (5) the critical force at which the substrate will separate from the head will be 0.0108 N. Since the gravitational force on the substrate is 0.0216 N, the force applied by the deposition head will be insufficient to support the substrate and substrate will fall.Example 4 Inventive
This example employs the same configuration as in Example 1 except that the deposition head is inverted with the substrate below the head. Therefore the force of gravity acts to pull the substrate from the head.
This example quantifies the forces acting on a substrate when the average exhaust suction is 5 times the weight per unit area of the substrate.
The substrate is a piece of conventional glass with a density of 2.2 g/cm3 and a thickness of 1 mm. Based upon its area the mass of the glass will be 2.2 grams and the substrate weight, thus the gravitational force acting on the substrate, will be 0.0216 N. The weight per unit area of the substrate is therefore 21.6 Pa.
If the exhaust channel pressure is set at 108 Pa (0.043 in H2O) then the exhaust pressure will be 5 times of the weight per unit area of the substrate. According to equation (5) the critical force at which the substrate will separate from the head will be 0.108 N. Since the gravitational force on the substrate is 0.0216 N, the force applied by the deposition head will be sufficient to support the substrate and prevent it from falling.
The invention has been described in detail with particular reference to certain preferred embodiments thereof, but it will be understood that variations and modifications can be effected within the scope of the invention as described above, and as noted in the appended claims, by a person of ordinary skill in the art without departing from the scope of the invention.PARTS LIST
- 2h thickness of slit
- 10 delivery head
- 12 output channel
- 14, 16, 18 gas inlet conduit
- 20 substrate
- 22 exhaust channel
- 24 exhaust conduit
- 28a, 28b, 28c gas supply
- 30 actuator
- 32 supply line
- 36 output face
- 50 chamber
- 52 transport motor
- 54 transport subsystem
- 56 control logic processor
- 60 Atomic Layer Deposition (ALD) system
- 62 web conveyor
- 64 delivery head transport
- 66 web substrate
- 70 Atomic Layer Deposition (ALD) system
- 74 substrate support
- 90 directing channel for precursor material
- 91 exhaust directing channel
- 92 directing channel for purge gas
- 96 substrate support
- 98 gas fluid bearing
- 100 connection plate
- 102 directing chamber
- 104 input port
- 110 gas chamber plate
- 112, 113, 115, supply chamber
- 114, 116 exhaust chamber
- 120 gas direction plate
- 122 directing channel for precursor material
- 123 exhaust directing channel
- 130 base plate
- 132 elongated emissive channel
- 134 elongated exhaust channel
- 140 gas diffuser unit
- 142 nozzle plate
- 143, 147, 149 first, second, third diffuser passages
- 146 gas diffuser plate
- 148 face plate
- 150 delivery assembly
- 152 elongated emissive channel
- 154 elongated exhaust channel
- 160 separator plate
- 162 purge plate
- 164 exhaust plate
- 166, 166′ reactant plate
- 168 aperture
- 170 spring
- 180 sequential first exhaust slot
- 182 sequential second exhaust slot
- 184 sequential third exhaust slot
- A arrow
- D distance
- E Exhaust plate
- F1, F2, F3, F4 gas flow
- Fm mechanical force
- l third inert gaseous material
- L length
- K direction
- M second reactant gaseous material
- O first reactant gaseous material
- P purge plate
- Patm atmospheric pressure
- Pin maximum pressure
- Pout minimum pressure
- R reactant plate
- S separator plate
- w1, w2 channel width
- X arrow
- x10 central element of delivery head 10
1. A process for depositing a thin film material on a substrate, comprising simultaneously directing a series of gas flows from an output face of a delivery head of a thin film deposition system toward a substrate surface, and wherein the series of gas flows comprises at least a first reactive gaseous material, an inert purge gas, and a second reactive gaseous material, wherein the first reactive gaseous material is capable of reacting with the substrate surface treated with the second reactive gaseous material, wherein the delivery head comprises:
- (a) at least a first, a second, and a third inlet port for receiving the first reactive gaseous material, the second reactive gaseous material, and the inert purge gas, respectively;
- (b) at least one exhaust port for exhausting waste gases;
- (c) an output face in proximity to the substrate surface comprising a plurality of elongated openings; wherein: (i) each of the inlet ports is independently connected, respectively, to at least one first, second, and third elongated output opening for supplying the respective gaseous materials to the substrate; and (ii) the at least one exhaust port is connected to at least two elongated exhaust openings each having an associated pressure, wherein the elongated exhaust openings are disposed such that at least a first, a second, or a third elongated output opening is located between the at least two elongated exhaust openings; and
- wherein a substantially uniform distance between the output face and the substrate surface is maintained at least in part by pressure generated due to flows of one or more of the gaseous materials from the elongated output openings to the substrate surface and wherein the difference between atmospheric pressure and the average pressure of the elongated exhaust openings measured in Pascals is at least two times the average weight per unit area of the substrate, also measured in Pascals.
2. The process of claim 1 wherein flows of the first and second reactive gaseous materials are spatially separated substantially by at least the inert purge gas and an elongated exhaust opening.
3. The process of claim 1 wherein the gas flows of the first reactive gaseous material, the second reactive gaseous material, and the inert purge gas in combination provides a pressure that substantially contributes to separation of the surface of the substrate from the output face of the delivery head.
4. The process of claim 1 wherein gas flows are provided from a series of elongated output openings, substantially in parallel, positioned in close proximity to the substrate, with the output face of the delivery head spaced within 1 mm of the substrate surface subject to deposition.
5. The process of claim 1 wherein a given area of the substrate is exposed to gas flow of the first reactive gaseous material for less than about 500 milliseconds at a time.
6. The process of claim 1 further comprising providing relative motion between the delivery head and the substrate.
7. The process of claim 1 wherein the temperature of the substrate during deposition is under 300° C.
8. The process of claim 1 wherein the first reactive gas is a metal-containing reactive gaseous material and the second reactive gas is a non-metallic reactive gaseous material which react to form an oxide or sulfide material selected from the group consisting of tantalum pentoxide, aluminum oxide, titanium oxide, niobium pentoxide, zirconium oxide, hafnium oxide, zinc oxide, lanthium oxide, yttrium oxide, cerium oxide, vanadium oxide, molybdenum oxide, manganese oxide, tin oxide, indium oxide, tungsten oxide, silicon dioxide, zinc sulfide, strontium sulfide, calcium sulfide, lead sulfide, and mixtures thereof.
9. The process of claim 1 wherein the process is used to make a semiconductor or dielectric thin film on a substrate, for use in a transistor, wherein the thin film comprises a metal-oxide-based material, the process comprising forming on a substrate, at a temperature of 300° C. or less, at least one layer of a metal-oxide-based material, wherein the metal-oxide-based material is the reaction product of at least two reactive gases, a first reactive gas comprising an organometallic precursor compound and a second reactive gas comprising a reactive oxygen-containing gaseous material.
10. The process of claim 1 wherein the average pressure of the exhaust channels measured in Pascals is at least ten times the average weight per unit area of the substrate, also measured in Pascals.
|November 1, 1983
|Suntola et al.
|January 18, 2000
|Suntola et al.
|January 21, 2003
|April 22, 2003
|November 23, 2004
|June 20, 2006
|Yamazaki et al.
|July 2008
|July 2008
|July 2008
- U.S. Appl. No. 11/392,006, filed Mar. 29, 2006, Levy.
- U.S. Appl. No. 11/392,007, filed Mar. 29, 2006, Levy.
- U.S. Appl. No. 11/620,738, filed Jan. 8, 2007, Levy.
- U.S. Appl. No. 11/620,740, filed Jan. 8, 2007, Nelson et al.
- U.S. Appl. No. 11/620,744, filed Jan. 8, 2007, Levy.
Type: Grant
Filed: Sep 26, 2007
Date of Patent: Aug 11, 2009
Patent Publication Number: 20090081886
Assignee: Eastman Kodak Company (Rochester, NY)
Inventors: David H. Levy (Rochester, NY), Roger S. Kerr (Brockport, NY), Jeffrey T. Carey (Victor, NY)
Primary Examiner: Walter L Lindsay, Jr.
Assistant Examiner: Mohsen Ahmadi
Attorney: J. Lanny Tucker
Application Number: 11/861,372
International Classification: H01L 21/84 (20060101); H01L 21/00 (20060101); H01L 21/461 (20060101); H01L 21/311 (20060101);


text: Sports Fields - Frequently Asked Questions Body Content How or where can I get my child registered in outdoor sports such as baseball, soccer, football etc.?You can find and register for all of the minor sport groups in the Program and Activities Guide, which is available at any of our Recreation Centres.How do I know if the field I'm playing on tonight will be playable after all of this rain?All of our soccer fields will be inspected the morning of or after a steady rainfall that may have saturated the fields. This is done to ensure that the field is in playable condition and player safety is not in doubt. This information can be obtained from the City of Brampton website here, or by calling 3-1-1 in the local area. All Baseball diamonds, (with the exception of Chris Gibson, David Dash and Flower City Community Campus) will be deemed "playable" at the discretion of the umpire. Where can I get information on renting a sports field and how much it will cost?All of our sports field's rentals are controlled by the Central Booking office. For more information, please call 905-874-BOOK. How often does Parks Maintenance & Operations cut the grass and line fields?Park Maintenance & Operations strives to maintain a mowing height of 3 inches, which will in turn contribute to a much healthier turf surface. Maintaining this height has proven to reduce weeds, endure heat stress and tolerate drought in the hot summer months. This practice is highly recommended on your own lawn to produce the same results. After we cut our fields, we will paint the markings on our fields that are used for "games only", and we strive to maintain these markings at least once per week (weather permitting).

subset: commoncrawl


text:
rcl4444, 05 Sep 2012That's a really interesting and, as you say, eerie comparison.
Run by the po... moreHow about this. Eerily familiar?
Crime infested slums:
Open to anyone to pass through (just don't blame anyone if you get robbed)
No rules, which suits criminals and rapists more than law abiding citizens
Pirate software and hardworking developers are all welcome on Android, no real distinction
No rules, hence 700% rise in malware in the last quarter
I was writing this as a joke in the beginning, and then it started to scare me... lol
Anyone can find analogies if you try hard enough hahahaha.
rcl4444, 05 Sep 2012Overall I agree with you, choice is good. And no one should be limiting that. However I ha... moreAgree with this and have been saying the same thing. Not everybody understands the distinction but you have summarized it nicely.
Article from Business Insider on why Android is in a lot of trouble.
Win 8 tablets will have an interesting effect on the smartphone field. Destroying Android in tablets, may create a halo effect for the WP8 phones. Will be interesting to see what happens.
Android with its current unsolvable problems remind me of Symbian, in that it is currently in the majority of smartphones, yet is already sinking and unable to pull itself out.
Samsung the largest mobile manufacturer in the world in terms of hardware, third party like OS Android and Windows 8. I believe that Samsung still continue to innovate high end mobile phone ever.
i'm so excited what will happen next; as i can see on the score results, android still at the top; and for all of the android users, they/we are enjoying it;
apple fanboys will become jealous; xD
Anonymous, 05 Sep 2012Providers still stock older versions of iphone for cheap or free on contract. Read any review ... moreExcept for the Motorola Atrix HD, HTC One X, and just the Galaxy S 2. But I do see what your saying, it's just not relevant anymore, those days are over.
I believe Apple Devices are designed for people who can afford it. And the main reason you buy an iDevice is to show you can in fact afford it. But that is not what Apple is all about. Apple is about quality, attention to details and lots of eye-candy. iPhones may not be the most powerfull devices out there, but this is not the point. Apple products will always be Apple products. Apple will always make high-quality software and hardware, quality which in my oppinion always overcomes Samsung's or LG's, to name a few.
Feel free to disagree, but this is my belief.
And to sum it up...
Android - Running.
iOS - Jogging.
RIM - Walking.
Others - Crawling.
rcl4444, 05 Sep 2012Overall I agree with you, choice is good. And no one should be limiting that. However I ha... moreI believe Samsung produce so many phones for many different regions/markets of the world. For example, I cannot find most of the Samsung models officially in Australia. Samsung lines of smartphones may be vast but it gives you the freedom of choice that we all strive for in this world.
rcl4444, 05 Sep 2012That's a really interesting and, as you say, eerie comparison.
Run by the po... moreWell well my friend.
My thinking was along your line of thinking (great minds think alike! lol) but I was too lazy to spell it all out.
May I just add one more thing: This is the very reason why Apple works so well with the Communist Chinese when it come to ripping of their own people, let it be hard labour or right in the hip pocket. Can you see the amazing coincidence; once again, eerily?
AnonD-53748, 05 Sep 2012What's wrong with having choices?
That's freedom to choose.
This isn't communism.Overall I agree with you, choice is good. And no one should be limiting that.
However I have to say that Samsung do produce far to many variants, often of the same phone. This is not only confusing for the buyer, but makes it harder for Samsung to be able to provide ongoing support for all of them.
They would be better off putting out half as many models, and ensuring each of those models is the best it can be in its category. It then becomes easier support them all with timely updates.
ad, 05 Sep 2012Thank you Sir Awesome. I take a bow to you. You spell it out exactly the way I would like to t... moreThat's a really interesting and, as you say, eerie comparison.
Run by the poeople, for the people (supposedly).
Limits change, ensuring the changes only support what they say is best.
The state decides and produces what products are available.
The state censors or does not allow non-state produced/suported products, particularly if it puts the state in a bad light.
They say you get the best, claiming all others are jealous, capitalist, create false propoganda and wish they had the same as what the state provides for you.
The state runs and owns everything.
You have freedom of choice, so long as that choice is something made, supported by or supports the state.
The state monitors everything you do.
Now does this sound familiar?:
We respond to our customers ensuring our products reflect the desires and features they want; so believe us when we say it is the best for you.
We release one product update a year, and ensure it is not very different from the previous because that already is the most ideal for you to use.
You don't need or want other prducts. Our products are designed to be the best and most practical for you.
We get others to make things for us, or incorporate existing tech and find ways to claim it as ours.
Other products are just cheap copies of ours. We seek to ban them so that the state can prosper more.
We buy patents and other companies with tech we can use so we can claim it as our innovation.
You can use our products in any way you like, except you must use them in conjunction with our services; and you can't go outside of the limitations we put on them.
Our services track everything you do for your own good - so that we can provide you with an experience more tailored to you.
The scary thing is I started writing this tongue in cheek, but halfway through I realised it wasn't funny anymore.
android's share will continue to go up....look at the interesting phones sony,htc,Motorola etc are producing,as this year will end these brands marketshare will improve tremendously.remember Motorola is now owned by Google and with JELLYBEAN the lag which android users experienced till date has vanished completely
[deleted post]I don't fully agree with you but I think the Americans have been brainwashed by Apple and they are too proud to look outside the square that they live in. I am not pointing my finger at all Americans as some are still sensible enough to look at the alternatives.
[deleted post]im not applefan!
MCRL, 05 Sep 2012Oh come on guys it's just a smartphones, do you really need to bash each other?thats why im still not buying android. coz, maybe im become basher!
iSJ5, 05 Sep 2012i will sell my iphone 3gs, 4s and my 5230 to buy iphone 5! i hope its help to increase a lot o... morenot a good move dude, not a good move, i boycott apple and i tell all my friends to do it too.
I would not usually post such a comment as this, but considering the headline, I can only say this:-
Closing in... LOL
[deleted post]but im still love my nokia 5230! so no worship at all!