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Tasks and organization problems of the optoelectronic metrology laboratory

The thirty year period of formation of laser technology has resulted in the production of many devices including lasers of various power and energy of cw or pulsed operation, working from the ultraviolet to the far infrared range of the spectrum. Such a rapid development of laser technology forces the necessity of creation of the basis of metrological protection for this technology. Considering a peculiarity of measurements, the parameters and characteristics of laser radiation can be divided into two groups: (1) energy characteristics; (2) spectral/frequency characteristics. The main interest is directed to energy characteristics and that's why a necessity of metrological protection of measurements of laser energy appears.