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Progression of rapid potential-induced degradation of n-type single-crystalline silicon photovoltaic modules

This study addresses progression of potential-induced degradation (PID) of photovoltaic modules using n-type single-crystalline silicon cells. In a PID test in which a voltage of −1000 V was applied to the cells, the modules started to degrade within 10 s and the degradation saturated within 120 s, suggesting that PID is caused by positive charge accumulation in the front passivation films. We propose that these positive charges originate from positively charged K centers formed by extracting electrons from the K centers, which explains the rapid degradation and its saturation behavior. We obtain simulated and experimental results supporting this hypothesis.