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A 12-b 10-GS/s Interleaved Pipeline ADC in 28-nm CMOS Technology

A 12-bit 10-GS/s interleaved (IL) pipeline analog-to-digital converter (ADC) is described in this paper. The ADC achieves a signal to noise and distortion ratio (SNDR) of 55 dB and a spurious free dynamic range (SFDR) of 66 dB with a 4-GHz input signal, is fabricated in the 28-nm CMOS technology, and dissipates 2.9 W. Eight pipeline sub-ADCs are interleaved to achieve 10-GS/s sample rate, and mismatches between sub-ADCs are calibrated in the background. The pipeline sub-ADCs employ a variety of techniques to lower power, like avoiding a dedicated sample-and-hold amplifier (SHA-less), residue scaling, flash background calibration, dithering and inter-stage gain error background calibration. A push–pull input buffer optimized for high-frequency linearity drives the interleaved sub-ADCs to enable >7-GHz bandwidth. A fast turn-ON bootstrapped switch enables 100-ps sampling. The ADC also includes the ability to randomize the sub-ADC selection pattern to further reduce residual interleaving spurs.