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Nanostructures Viewed through Low Voltage Electron Microscopy

Materials that present nanostructural features, either internally—as in nanoporous structures, or externally—as in nanoparticles with various shapes and aspect ratios, pose a challenge in visualizing their nanoscale features via low-voltage microscopy. The LV EM 5, the only benchtop TEM in the market, offers a variety of tools that overcome the typical low voltage drawbacks. These enhancements will be presented in the context of two projects. The first part of the presentation will discuss the use of LV EM 5 in SEM-mode in a project targeting the application of mesoporous silica nanomaterials in carbon capture, with emphasis on the particles analysis. In the second part, the TEM and SEM modes will be presented in the context of a solar research project, where the solar device is fabricated solely through solution processing and both nanoparticle precursors and films are subjected to microscopy investigation.