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How to write a compact reliability model with the Open Model Interface (OMI)

As device structures and process technologies become more complex, they become more expensive to implement. It is therefore essential for profitability to have good yield. Part of achieving this yield is testing for reliability, which is further complicated by new materials being used [1] , [2] . Some EDA vendors have incorporated this need in specific areas but each has a separate solution and nothing in common, leaving the designer with a bewildering choice of different coding-styles to use when testing the reliability on his or her circuit. Semiconductor foundries became aware of this need, and one of them (TSMC [3] ) came up with an approach to modify model parameters through an interface to the simulator called the TSMC Model Interface (TMI). This interface was licensed to the Compact Model Coalition (CMC) [4] , which expanded and extended it, releasing it as Open Model Interface (OMI) to be used as a common platform for all foundries and model developers.