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Surface morphological characterization of yeast cells by scanning force microscopy

A scanning probe microscope was used to analyse surface morphological characteristics and adhesion forces of the yeast cell Candida parapsilosis 294 incubated at two temperatures (22 and 37 °C). The simultaneous use of contact atomic force microscopy and lateral force microscopy allows two regions to be distinguished on the surface of the microbial cell with different friction characteristics. In addition, measurements of force curves over each zone revealed very distinct values of the adhesion force. Both the adhesion force average on each zone and the one between them depend on incubation temperature. Jointly, these results suggest some differences in the surface composition of the cell wall between these regions. Copyright © 2001 John Wiley & Sons, Ltd.