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Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers

An on-chip analog waveform sampling system was demonstrated in a 65nm process focusing on extreme temperature step response measurements. Amplifier output waveforms were measured under different temperatures ranging from -40 degrees Celsius ambient temperature to 300 degrees Celsius heater temperature. For reliability testing, the amplifiers were stressed at a 1.6x supply voltage and a 350 degrees Celsius stress temperature for 100 hours.