{'fraction_non_alphanumeric': 0.013029315960912053, 'fraction_numerical': 0.0, 'mean_word_length': 5.758241758241758, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Single-shot multilayer measurement by chromatic confocal coherence tomography

We propose Chromatic Confocal Coherence Tomography as a new system able to achieve corrected topography measurements of multi-layered specimens by measuring position, thickness and refractive index of each layer simultaneously at each measurement point. This feature is achieved by a combination of a chromatic confocal scheme and an interferometric one. The numerical aperture of the used microscope objective has a significant effect on the measurement uncertainty. Hence, its contribution to uncertainty is discussed in more detail.