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Electronic Speckle‐Pattern Interferometry Measurements of Structural Ratcheting Strain

Abstract:  Several tensile specimens with a central hole were subjected to a cyclic loading for which the Von Mises stress was beyond the initial yield stress in the vicinity of the hole. The tensile machine was fixed together with a phase‐shifting electronic speckle‐pattern interferometry measurement bench that makes it possible to perform strain measurement along the tensile axis. The plastic strain map corresponding to the 30th cycle was obtained. For the considered measurement field, the resolution of the strain measurement is close to 10−5. By varying the loading, it was possible to detect and observe the deformation corresponding to an early stage of the ratcheting phenomenon. The non‐ratcheting cyclic plasticity behaviour was not observed during the 30th cycle. In the Discussion section, the experimental results were interpreted using Melans’s theorem, which allowed us to determine an upper bound for the yield stress. Eventually, it is shown that the procedure followed in this work could be a way to obtain some interesting data related to the material behaviour laws.