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Time Effect of Sulfurization on the Characterization of Copper Indium Diselenide

Polycrystalline CuIn(Se,S)2 (CISS) thin films with chalcopyrite structure were synthesized by sol-gel spin-coating method. Sequential reduction, selenization and sulfurization treatments were performed with hydrogen, Se and H2S vapor, respectively. The effects of different sulfurization times on the films were also studyed. X-ray diffraction (XRD), and SEM analysis have been employed to examine the structural properties and surface morphology of polycrystalline CISS thin films. The experimental results demonstrated that the obtained CISS had good crystallinity and uniformity.