{'fraction_non_alphanumeric': 0.027603513174404015, 'fraction_numerical': 0.011292346298619825, 'mean_word_length': 5.234375, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Transmission Electron Microscopy Study on Microstructure of Tungsten/Carbon Multilayer Films

Microstructure changes of tungsten/carbon (W/C) multilayer films with heat treatments were investigated by high-resolution transmission electron microscopy (HRTEM) and X-ray diffraction. When the W/C amorphous multilayer films were annealed in vacuum at 800 or 900°C, the X-ray reflectivity became 30% higher than that of as-prepared ones in association with a slight increase of the periodic spacing of the multilayers. HRTEM images of the annealed specimens revealed the existence of randomly distributed microcrystallites of W2C in the W layers. The increase of X-ray reflectivity was interpreted well with a simple structural model assuming the decrease of the C-atom-number density in the C layers.