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Microwave Imaging of Dielectric Targets by Means of a Variable-Exponent Finite-Elements Approach

In this paper, a microwave inverse-scattering technique based on the inversion of S-parameter measurements by means of a nonlinear method in variable exponent Lebesgue spaces is presented. A two-dimensional finite-element formulation is adopted to model the measurement setup accurately. The approach has been preliminarily validated using numerically simulated data, showing promising outcomes.