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A New Threshold Display Technique for Josephson Interferometer Logic Gates and Its Application to Gate Parameter Estimation

A new sweep technique is described for displaying the switching threshold curves of Josephson interferometer gates. The technique is based on a CRT sweep in the form of a combined line and circular scan. It successfully displays the switching boundary even in the vortex-mode overlapping region. This new technique is also found to be quite effective for studying the relation between the gate threshold and the gate parameters in detail.