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Statistical Strategies to Capture Correlation Between Overshooting Effect and Propagation Delay Time in Nano-CMOS Inverters

In this paper, we model statistical correlation between overshooting effect and propagation delay time in nano-CMOS technology considering the influence of intrinsic parameter fluctuations caused by discreteness of charge and granularity of matter. The impact of input slew rate, output capacitive load, and supply voltage on this statistical correlation is comprehensively studied. Moreover, we propose two alternative approaches which are capable of reproducing the statistical correlation as well as mean and standard deviation of both propagation delay time and overshoot voltage. We evaluate the accuracy of these alternative approaches against accurate Monte-Carlo simulations. It is shown that the statistical correlations are almost preserved using these alternative approaches.