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Non‐Exotic Theory Of 1/f Noise As A Trace Of Infralow‐Frequency Fluctuations

This report is aimed at reviving the explanation of flicker‐noise observations as the result of spectral measurement of very low‐frequency but stationary narrow‐band fluctuations named as infralow‐frequency noise (ILF noise). Such a kind of the spectrum analyzer output takes place when the ILF‐noise correlation time is much longer than the analyzer reciprocal bandwidth. This result is valid for both analog and digital spectral measurements. The measured signal is proportional in this case to the mean square and not to the spectral density of the noise. The equilibrium temperature fluctuations and the defect‐motion as mechanisms of 1/f noise in metal films are reconsidered from this point of view. It is shown that the ILF‐noise approach allows to remove the main objection against temperature fluctuation model and difficulties within the defect‐motion model widely discussed in literature.