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Sample size effects on the large strain bursts in submicron aluminum pillars

In situ transmission electron microscope compression testing of submicron Al pillars shows two sample size regimes with contrasting behavior underlying the large strain bursts. For small pillars, the bursts originate from explosive and highly correlated dislocation generation, characterized by very high collapse stresses and nearly dislocation-free post-collapse microstructure. For larger pillars, the bursts result from the reconstruction of jammed dislocation configurations, featuring relative low stress levels and retention of dislocation network after bursts.