{'fraction_non_alphanumeric': 0.028465346534653466, 'fraction_numerical': 0.0, 'mean_word_length': 5.8559322033898304, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
RFIP method: Towards a better characterization of integrated circuits immunity

This paper presents an evolution of a conducted immunity measurement technique for integrated circuits: the Resistive RF Injection Probe (RFIP) test method. This method complements the Direct Power Injection (DPI) method by giving different immunity parameters (voltage, current, impedance, power). After a brief description of the method, immunity parameters computation is detailed and both RFIP probe and test bench are characterized. Immunity parameters calculation model is then verified by implementing a virtual test bench using simulation. Finally, RFIP immunity measurements on a microcontroller's embedded analog to digital converter (ADC) are carried out and compared to DPI and Vector Network Analyzer (VNA) results.