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X-ray diffraction study of lattice parameters for layered compounds MxTaS2 (M=Tl or In)

The composition dependence of lattice parameters for layered compounds MxTaS2 (M=Tl or In, 0<x<0.6) has been determined by an X-ray diffraction method, in order to discuss the structural characteristics. Stage-2 and stage-1 phases for both compounds exist. A drastic change in the c-axis layer spacing was found for stage-1. Tl0.465TaS2, although there was no such anomaly in the composition dependence of the c-axis lattice parameter for In4TaS2.