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Nanoscale imaging of oxidized copper foil covered with chemical vapor deposition‐grown graphene layers

Characterization of the geometrical and structural characteristics of oxidized Cu area in high resolution is crucial for tracking the change in morphology, exploring interactions between graphene layers and Cu substrates and revealing the mechanism for the orientation‐dependent oxidation of Cu. Here, we reported experimental results on nanoscale imaging of natural oxidation of the polycrystalline Cu substrate coated by partial‐coverage chemical vapor deposition (CVD)‐grown graphene stored in dryer under ambient conditions for up to 10 months. Scanning electron microscope (SEM), together with atomic force microscope (AFM), Raman, and X‐ray photoelectron spectroscopy (XPS), was used for systematically studying the morphological and compositional changes at nanoscale during oxidation. The appearance of oxidized Cu substrates could be unambiguously distinguished from the unoxidized regions based on their distinctly different morphologies in SEM images, and the underlying mechanism was discussed in detail. By analyzing a millimeter‐seized polycrystalline Cu substrate, we found that the oxidation of polycrystalline Cu substrate depends sensitively on both orientation of graphene layers and Cu substrates. Furthermore, the time‐dependent oxidation evolution of Cu substrate was also established, and the oxidation rate was readily determined. The findings reported here will have important implications for developing protection coatings for Cu.