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Dynamic Scanning Force Microscopy at Low Temperatures

In this paper, we review the design and various applications of a low temperature scanning force microscope for ultrahigh vacuum. It has been adopted for dynamic mode measurements, a powerful method to image surfaces with a resolution similar to scanning tunneling microscopy, but without the limitation to conducting materials. With this instrument, we have studied semiconducting (InAs), conducting (HOPG) and insulating samples (xenon thin film). Finally, we discuss a new experimental method to determine the tip-sample interaction with high accuracy.