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Thermal imaging with high spatial and temperature resolution

Based on a highly sensitive dierential spectroscopy technique, we present a non-contact method of optical- scanning thermal imaging with a possibility of sub-thermal-wavelength spatial resolution. This technique is general and can also be applied to imaging of strain or impurity distributions at the surfaces of semiconductors. This procedure is particularly well suited for near-eld imaging and investigation of thermal transport on the nanoscale. Applications to optical refrigeration in semiconductors are discussed.