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Dual-channel CMOS co-integration with Si NFET and strained-SiGe PFET in nanowire device architecture featuring sub-15nm gate length

We have fabricated hybrid channel Ω-gate CMOS nanowires (NWs) with strained SiGe-channel (cSiGe) p-FETs and Si-channel n-FETs. An optimized process flow based on the Ge enrichment technique results in a +135% hole mobility enhancement at long gate lengths compared to Si. Effectiveness of cSiGe channel is also evidenced for ultra-scaled p-FET NWs (gate length LG=15 nm) with +90% ION current improvement.