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Porous surface statistical characterization via fluorescence correlation spectroscopy

The characterization of the porosity or of the pore density is a very important issue for porous materials. We report on a new technique allowing a direct measure of the surface pore density. The number of pores on porous silicon substrates has been measured using fluorescence correlation spectroscopy, a technique that is generally applied in solution to study molecules diffusing through a small observation volume. This technique is used to measure the surface density of luminescent pores in a mesoscopic porous silicon layer. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)