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Total dose effect on the propagation of single event transients in a CMOS inverter string

Recently, there has been considerable interest in the propagation of Single Event Transients (SETs) in both linear bipolar and digital CMOS circuits. [1,2,3,4,5] SETs appear at the outputs of these circuits as momentary glitches that, if sufficiently large and of sufficient duration, can be latched into follow-on circuitry and lead to system errors that are potentially catastrophic if not properly mitigated.