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Consistent optical characterization on nano-layers

Before nano blocks or membranes are integrated into functional devices or systems, prospective performances depend on accurate structures with thickness. However, due to wave transparency on nano or micro thick materials, interface noise will result in serious optical characterization deviations and thus hide microscopic behaviors or misguide material processing. Fluorophore aided optical characterization aims to promise a consistent optical characterization by remitting interface noise. The deviation is 21.8 times smaller and the consistency at diverse λ is 2.14 times better. The article will widely benefit 2D or 3D material applications, nano assembly technologies or mass-fabrications on IC chips, MEMS or OLED etc.