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XAFS Applied to Trace Element Analysis

The sensitivity of X-ray Absorption Edge Spectrometry has been improved by using synchrotron radiation as the light source and analytical method developed for EXAFS. Qualitative as well as quantitative information is obtained free from any interferences which are experienced in many physicochemical methods. This method does not need any empirical information except the thickness of sample cell and is nondestructive. Excellent linearity is shown on Ag-Cd (200 to 1 ppm Cd in 1000 ppm Ag). Minimum detection limit is 0.5 ppm for cadmium and no limitation for maximum concentration. This report also stress the importance of careful inspection of χ(k) data when analyzing EXAFS.