{'fraction_non_alphanumeric': 0.022321428571428572, 'fraction_numerical': 0.008035714285714285, 'mean_word_length': 5.297752808988764, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Introduction: A Special Issue on Nanoscale Characterization Using Atom Probe Field Ion Microscopy

While searching the internet for “nanotechnology,” I was not surprised to find many definitions. Two of these are as follows: (1) nanotechnology is the development and use of devices that have a size of only a few nanometers; and (2) nanotechnology can best be considered as a “catch-all” description of activities at the level of atoms and molecules that have applications in the real world. While nanotechnology is usually focused on the building of structures at the atomic scale, the characterization of such structures should also be considered as nanotechnology. At the Microscopy and Microanalysis 2002 Meeting in Quebec City, together with Tom Kelly and Mike Thompson, I organized a symposium entitled “Advances in Nanoscale Technology.” The response to this symposium was impressive, with 32 contributed and 7 invited presentations. Some of these presentations concentrated on atom probe field ion microscopy and form the basis for the invited contributions in this special issue of Microscopy and Microanalysis.