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Analysis of transient effects induced by neutrons on a CCD image sensor

This paper is focused on transient effects produced by neutrons and gamma on a CCD sensor. The main effect encountered, due to neutron interaction in the silicon is random excitation of individual pixel or pixel clusters. We have investigated the different image degradations with a 14 MeV pulsed neutron source as a function of angle of incidence and CCD camera parameters. A complete analysis has been achieved for all fluences between 104 and 107 c/cm2 including spectra of neutron induced noise. We have found a linear dependence of the number of bright and saturated pixels with fluence. The number and size of pixel clusters increase with fluence particularly for grazing angle. In a second time we have investigated gamma effects which increase the background noise of the CCD. We have compared their effects to the previous results obtained with 14 MeV neutrons to discuss on image processing algorithms to correct these phenomena.