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Photographic response to x-ray irradiation. II: Correlated models.

In this paper models from the first paper are generalized so that they include the correlation of attenuation coefficients and coverages with emulsion depth. They avoid further assumptions and can provide physically meaningful parameters (as opposed to earlier studies); thus closer agreement with experimental measurements is obtained. The difficulty in estimating correlated overlap functions is discussed. Error estimates resulting from grain statistics are generalized and computed in a selfconsistent manner. Contributions to granularity from densitometer and grain statistics have been shown to be significant or dominant in most emulsion types. The formulation derives reliable error estimates. Correlated models are important for thick emulsions such as DEF-392, whereas integral formalisms may be as useful for thin emulsions. In agreement with the first paper, reciprocity failure appears to be negligible for UV or x-ray energies above 9 eV.