{'fraction_non_alphanumeric': 0.025714285714285714, 'fraction_numerical': 0.032857142857142856, 'mean_word_length': 4.793388429752066, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Preparation of thermally evaporated CdTe thin films

Thin films of cadmium telluride were prepared by evaporating cadmium telluride powder in a vacuum of less than 10-4 Torr. The substrate temperature was varied systematically from room temperature to 300° C. The results of optical and structural characterizations have revealed that the films posses a high value of absorption coefficient with a bandgap value in the range 1.475-1.769 eV, and that the films are of cubic structure with a preferred orientation along (111) plane. Four probe measurements have shown that resistivity of these films is affected by the change in substrate temperature, with the lowest value (12.6 Ω-cm) being at 200° C.