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Devising a test strategy to characterize system reliability of submicron interconnect wiring

Measuring the distribution of time to failure of faults in metal interconnects is highly analogous to the weakest link problem, i.e. one can measure the strength of the weakest link, but when a chain breaks the characteristic of any remaining weak links cannot be determined. This paper looks for a way to project the characteristics of all weak links given measurements of the weakest of those links. We show that when the form of the distribution is understood, a good estimate can be made, and that error tolerances are not restrictive. Monte Carlo simulation is used to establish these results.