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Size effects on the thermal conductivity of polycrystalline platinum nanofilms

The surface and grain-boundary effects on the in-plane thermal conductivity of polycrystalline platinum nanofilms have been investigated. The thicknesses of the nanofilms range from 15.0 to 63.0 nm and the mean grain sizes measured by x-ray diffraction vary from 9.5 to 26.4 nm. The thermal conductivities of the nanofilms measured by a direct electrical heating method are greatly reduced from the bulk values. The measured results are compared with the values predicted by the Qiu and Tien model and the Kumar and Vradis theory. It is found that the reduction in the thermal conductivity is mainly caused by grain-boundary scattering and the reflection coefficient of electrons striking the grain boundaries is around 0.35. The relaxation time model is also applied to study the size effects to check whether the Matthiessen rule is still valid in predicting the in-plane thermal conductivity of polycrystalline metallic nanofilms. The results indicate that by considering only grain-boundary scattering and background scattering the Matthiessen rule is still valid. If surface scattering, however, is included, deviations of the Matthiessen rule from other theories mentioned above have been found.