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Sample and length-dependent variability of 77 and 4.2 K properties in nominally identical RE123 coated conductors

We present a broad study by multiple techniques of the critical current and critical current density of a small but representative set of nominally identical commercial RE123 (REBa2Cu3O7−δ, RE = rare Earth, here Y and Gd) coated conductors (CC) recently fabricated by SuperPower Inc. to the same nominal high pinning specification with BaZrO3 and RE2O3 nanoprecipitate pinning centers. With high-field low-temperature applications to magnet technology in mind, we address the nature of their tape-to-tape variations and length-wise Ic inhomogeneities by measurements on a scale of about 2 cm rather than the 5 m scale normally supplied by the vendor and address the question of whether these variations have their origin in cross-sectional or in vortex pinning variations. Our principal method has been a continuous measurement transport critical current tool (YateStar) that applies about 0.5 T perpendicular and parallel to the tape at 77 K, thus allowing variations of c-axis and ab-plane properties to be clearly distinguished in the temperature and field regime where strong pinning defects are obvious. We also find such in-field measurements at 77 K to be more valuable in predicting 4.2 K, high-field properties than self-field, 77 K properties because the pinning centers controlling 77 K performance play a decisive role in introducing point defects that also add strongly to Jc at 4.2 K. We find that the dominant source of Ic variation is due to pinning center fluctuations that control Jc, rather than to production defects that locally reduce the active cross-section. Given the 5–10 nm scale of these pinning centers, it appears that the route to greater Ic homogeneity is through more stringent control of the REBCO growth conditions in these Zr-doped coated conductors.