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A new model for numerical analysis of simultaneously thermally stimulated luminescence and exoelectron emission phenomena of alpha-Al2O3 single crystals.

An efficient model to analyse numerically the simultaneously detected thermally stimulated luminescence (TL) and exoelectron emission (TSEE) dosimetric peak D' (450 K) of a-alumina is proposed. In this model, the TSEE obeys a thermionic mechanism. To take into account the fact that TL is a bulk phenomenon and that TSEE results from surface processes, a multilayer structure of the sample is adopted. In this work, two different approaches are discussed and compared. The first implies that the charge neutrality condition is applied to the sample alone, whereas in the second, the condition concerns the sample added to the detection equipment. The two models are applied to the dosimetric peak D' (at about 450 K) of alpha alumina and give very good results in both cases.