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Effect of evacuating a chamber on the degradation rate of solar cells in a cell-level potential-induced degradation test

In this work, we investigated the effect of evacuating a chamber on the degradation rate of solar cells in a cell-level potential-induced degradation (PID) test by which photovoltaic-module-like stacks are stressed. The degradation rate of a solar cell tested in an evacuated chamber was higher than that in air. The higher degradation rate may be due to the improvement of contacts between the stack components. From this result, evacuating the chamber was confirmed to be effective for obtaining a high acceleration factor in cell-level PID tests.