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Information extraction from laser speckle patterns using wavelet entropy techniques

A novel speckle patterns processing method is presented using multi-scale wavelet techniques. Laser speckle patterns generated from the sample contained abundant information. In this paper, we propose a method using wavelet entropy techniques to analyze the speckle patterns and exact the information on the sample surface. In our case, we used this approach to test the solar silicon cell surface profiles based on the sym8 orthogonal wavelet family. According different wavelet entropy values, the micro-structure of different solar silicon cell surfaces were comparative analyzed. Furthermore, we studied the AFM and reflective spectra of the wafer. Results show that the wavelet entropy speckle processing method is effective and accurate. And the experiment proved that this method is a useful tool to investigate the surface profile quality.