{'fraction_non_alphanumeric': 0.0111731843575419, 'fraction_numerical': 0.0, 'mean_word_length': 6.685714285714286, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Nondestructive investigations of multilayer dielectrical coatings

The paper presents an approach to the nondestructive ellipsometric investigation and computer simulation of dielectric structures with known thicknesses. Three-dimensional profile studies of surface microrelief using an atomic force microscope are also considered. The proposed approach enables the examination of an optical waveguide''s sections and permits investigations of interferometric coatings and the numerical analysis of various multilayer dielectric systems.