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Calibration of instrument and sample parameters for small angle X-ray scattering

ABSTRACT A method for calibrating the parameters of a small angle X-ray scattering instrument using the diffraction ring of a standard sample is presented. A generalized geometric model for small angle X-ray scattering was constructed and detailed mathematical derivations presented to solve for the relevant instrument parameters, which were then used to convert two-dimensional small angle X-ray scattering data to standard curves. The method is valid regardless whether the detector photosensitive plane is perpendicular or tilted with respect to the beam. Small angle X-ray scattering was performed using standard calibration samples to validate the methodology.