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Minimizing concurrent test time in SoC's by balancing resource usage

We present a novel test scheduling algorithm for embedded core-based SoC's. Given a system integrated with a set of cores and a set of test resources, we select a test for each core from a set of alternative test sets, and schedule it in a way that evenly balances the resource usage, and ultimately reduce the test application time. Furthermore, we propose a novel approach that groups the cores and assigns higher priority to those with smaller number of alternate test sets. In addition, we also extend the algorithm to allow multiple test sets selection from a set of alternatives to facilitate testing for various fault models.