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Pulsed X-Ray Induced Partial Discharge Measurements (PXIPD)

It is difficult to detect small voids in solid insulators due to the large statistical time lag. The use of pulsed x-ray irradiation is a practical method to detect small defects at lower electrical stress so that potentially harmful effects of high voltage testing can be minimized. It is a method to artificially trigger partial discharges in an insulation void that is similar to the natural triggering. The statistical time lag disappears when pulsed x-rays are used and even voids as small as a few 100 μm can be detected. The PD inception levels and PRPD pattern of samples after conventional and PXIPD measurement are compared. It is shown that not all of the samples that had voids could be detected after the conventional PD measurement, and the detection of the voids with a diameter less than 0.5 mm was successful only with the PXIPD measurements. Further, attenuation measurements were done to find the minimum required x-ray dose for PXIPD.