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Analysis of Polymorphs Using Simultaneous X-ray Fluorescence and Diffraction with an Imaging Spectrometer

X-ray fluorescence (XRF) is a widely used method for materials characterization. However, for polymorphs such as Rutile and Anatase, both of which are TiO2, the fluorescence spectra will be nearly identical. Differentiating between these polymorphs requires a second measurement with an X-ray diffractometer. Using two instruments increases the cost of the measurement, and it introduces issues with image registration and sample preparation. Previously, simultaneous XRD-XRF has been done by attaching a silicon drift detector (SDD) to an X-ray diffraction (XRD) system. However, due to the typical geometry and source monochromation of an XRD system, the count rate in the SDD is typically low, making the measurement process slow [1]. Overcoming these limitations requires a detector that is both position sensitive and energy dispersive.