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Test Station for the CARIOCA FE-chip of the LHCb Muon Detector

This document describes the hardware and the software of a Front-End Electronics Test Station developed to test and characterize the Front-End ASIC for the LHCb Muon chambers. This ASIC, an 8-channel amplifier, shaper and discriminator with baseline restoration, processes read-out signals generated by Multi-Wire Proportional and GEM chambers located in a high radiation environment. It is almost entirely analog. In total, an amount of about 25000 chips will be produced in both the engineering and production runs. They will require individual testing, before final assembly on printed circuit boards. The test system we present has the following features: variable and bipolar charge injection, custom read-out, rate and time measuring circuitry, power consumption control, data analysis and statistical tools. The system is controlled by a LabVIEW based program. We present the results of about 3000 tests of ASIC produced in the engineering run.