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Integrated injection logic for a linear/digital LSI environment

The dc and transient performance of Integrated Injection Logic (I2L) structures in a linear/digital LSI environment is analyzed and modeled. The analysis is based on a functional modeling approach and uses a one-dimensional regional computer device analysis program which includes heavy doping effects and doping level mobility dependence. The computed results are used to evaluate the performance of I2L structures in five bioplar technologies. Means of decreasing the effective epitaxial layer thickness and decreasing the effective epi-resistivities of the I2L part of the chip, without affecting the breakdown voltage of the linear part, are given and evaluated. The computed results are compared to experiments.