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Imaging the microstructure of duplex stainless steel samples with TOF‐SIMS

Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) mappings provide a visualization of the distribution of chemical elements and phases on polished duplex steel surfaces as element and fragment secondary ion signals. The advantage of TOF‐SIMS, compared to optical microscopy, is its potential to analyze the chemical composition with a lateral resolution at a submicrometer scale. TOF‐SIMS mappings allow distinguishing between ferritic and austenitic phases because of the phase selective detection method without any requirement of etching or other processing. Copyright © 2010 John Wiley & Sons, Ltd.