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The design of an improved low-power voltage testing and protection circuit

This paper presents the design of an improved low-power and high-precision voltage testing and protection circuit, which is most suitable for the IC cards. The circuit consists of a temperature-insensitive low voltage testing part and high voltage protection part, which assures that the IC cards can work in a certain voltage range and avoid being destroyed by the high voltage. The simulation results of the circuit are correctly in consistence with the design objects.