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Using Multi-Element Reference Materials for Approximating Concentrations in Soils and Sediments from Micro XRF Spectra

This paper reports a rapid and intuitive treatment process for X ray fluorescence (XRF) data to determine elemental concentrations in low Z siliceous materials. To estimate the concentration of an element in an unknown material, a reference material is required with a matrix whose composition is similar to that of the unknown. NIST SRM 610, a siliceous glass matrix containing as many as 60 elements with certified concentrations in the 300-/500 mg/kg range [1], has been widely used as a primary standard in geochemistry and environmental research. Importantly for microanalysis, the composition is homogeneous for the majority of elements [2]. We have developed a protocol using an intuitive XRF analysis software, Peakaboo [3] for the rapid but exacting computational fitting of a very complex XRF spectrum to provide a rapid multi-element quantitative assay. To test the accuracy, we determined the elemental concentration ratios in NIST SRM 2711a (Montana Soil) [4] using NIST SRM 610 as a primary reference.