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Discrimination of wheat crop stage using CHRIS/PROBA multi-angle narrowband data

Multi-angular narrowband compact high-resolution imaging spectrometer (CHRIS) on-board the project for on-board autonomy (PROBA) data of 18 March 2008 were used in this study to discriminate three different growth stages of wheat crop grown in the Central State Farm of Suratgarh, Rajasthan, India. Results showed that the off-nadir view angles performed better than nadir viewing for crop stage discrimination. Among all the off-nadir viewing angles, −55.37° view angle (in the backward-scattering direction) had the highest normalized distance between the crop stage classes. Based on the analysis, the five best bands were identified as 630, 660, 674, 705 and 712 nm for separating wheat at different stages.