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Fractal Characterization of SERS-Active Electrodes Using Extended Focus Reflectance Microscopy

The fractal characteristics of roughened silver electrode surfaces are used for a light microscopy diagnostic for the surface-enhanced Raman activity of the surfaces. It is shown that the fractal dimension of an electrode as measured from scanning electron microscope images (resolution 0.08 μm) is the same as measured from extended focus (EF) light microscopy images (resolution <0.4 μm). There is a threshold fractal dimension for SERS activity. The threshold is independent of the adsorbed molecule.