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Scanning tunneling microscopy-based in situ measurement of fast tool servo-assisted diamond turning micro-structures

We propose a new in situ measurement system based on scanning tunneling microscopy (STM) to realize spiral scanning of a micro-structure without removing it after fast tool servo (FTS) cutting. To avoid distortion of the machined and measured surface, the center alignment of the FTS tool and the STM tip was first implemented by an STM in situ raster scan of two circular grooves cut by the machine tool. To originally observe the machined surface, the trace of the STM tip is put in accord with that of the FTS by setting the same start and end points of cutting and scanning and the same feed rate, and both are triggered by the subdivided rotary encoder of the spindle of the diamond turning machine. The profile data of the in situ spiral scanning of the machined micro-lens array can be fed back to compensate the depth of the cut to guarantee sub-micron form accuracy after second machining. The efficient spiral scanning, proper matching and accurate evaluation results demonstrate that the proposed STM in situ measurement approach is of great significance to the fabrication process.