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TOF-SIMS study on nano size conducting polymer prepared by simple atmospheric pressure plasma polymerization technique for display applications

ABSTRACT We had previously reported on a surface analysis investigation of newly atmospheric pressure plasma (APP) polymerized conducting polymers films, both plasma-polymerized polyaniline and polypyrrole (pPPy). In this study, time of flight secondary ion mass spectrometry (ToF-SIMS) has been used to characterize nano size conducting polypyrrole films between the conventional and novel APP source under room temperature. Specific negative and positive ions from pPPy were effective in monitoring the change in the pPPy content at the surface of the composites. This ToF-SIMS analysis clearly demonstrates that novel APP polymerization source is effective in increasing the surface polymer content and thus confirms previously published X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FT-IR), and gas chromatography-mass spectrometry (GC-MS) data based on some necessary assumptions. To check the suitability of the conductive layer for the display application, the resistance variations of the pPPy grown on the interdigitated electrode substrates are examined by doping with iodine.