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Individual Hysteresis Loops of sub-μm Particles Recorded with Fully Automated Differential Phase Contrast Microscopy

The recent development of information storage systems includes also magnetic storage techniques, i.e. magnetic RAM [1] devices or patterned magnetic thin films for ultra high density hard discs [2]. For these applications a very detailed knowledge of the magnetic properties of structures in the microand nanometer scale is necessary. To gain this information various techniques of magnetometry are used to measure the magnetic parameters of particles as their coercivity, their saturation magnetisation or to record their hysteresis loop. Here an array of very many, ideally identical particles is necessary to get a useful signal to noise ratio. On the other hand some microscopic methods with high spatial resolution allow a detailed insight in the domain configuration of a single particle during remagnetisation. We present the development of a technique which provides both the magnetometric data and microscopic images of a single particle by use of Differential Phase Contrast (DPC) microscopy [3] in combination with a computer-controlled TECNAI F30 microscope. For Differential Phase Contrast microscopy the electron microscope is operated in the low mag scanning mode (LSTEM).