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An application of phase retrieval x-ray diffractometry to refraction/small-angle scattering data

A recently developed experimental-analytical x-ray diffraction method for the direct, comprehensive, non-destructive characterization of crystalline materials is applied to analyse x-ray scattering data from amorphous materials. High-resolution refraction/small-angle scattering intensity profiles from a homogeneous, non-crystalline sample were collected at the 1 km long beamline, SPring-8, Japan. A logarithmic dispersion relation is used to determine the x-ray phase. A priori knowledge of the sample structure is utilised to reconstruct the physical characteristics of the sample with a resolution of 0.25 µm. These studies have demonstrated the viability of the technique as a new characterization method for amorphous materials.