{'fraction_non_alphanumeric': 0.022641509433962263, 'fraction_numerical': 0.007547169811320755, 'mean_word_length': 5.555555555555555, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Internal optical loss measurements in InGaAs-InAlGaAs quantum-well lasers operating around 1550 nm

A multisection device technique is employed to carry out internal optical loss measurements in two types of InGaAs-InAlGaAs quantum-well structures. One structure consists of conventional identical-width quantum wells and the other, a broader spectral-width material, consists of multiple-width quantum wells in the active region. The temperature dependence of the internal optical losses is also investigated for both structures.