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XPS analysis of small particles by proximal X‐ray generation

In this work, the feasibility of XPS analysis using locally generated Al Kα radiation has been demonstrated. Both photo and Auger‐electron signals can be obtained from a single, sub‐micrometre, particle, achieving the aim of chemical state identification by means of the Auger parameter. The results, demonstrated in this work using copper particles on an aluminium substrate, suggest that the technique, with further development, will be valuable for those concerned with the health hazards of nano‐particles in general. Copyright © 2014 John Wiley & Sons, Ltd.