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Cross-coupled bit-line biasing for 22-nm SRAM

Sub-22nm processes necessitate the use of larger SRAM cells in order to counter the effects of increasing silicon variation. However, storage density is reduced when the SRAM cell grows in size. This paper proposes the use of a cross-coupled bit line (BL) biasing scheme that retains SRAM's fast access speed while reducing the read-access failures in the presence of V variation, without excessively increasing the SRAM cell size. We have shown, by extensive Monte-Carlo simulations using 22-nm predictive CMOS models, that the proposed scheme reduces the cell area by 6.5% compared to the conventional BL biasing schemes also analyzed in this paper.