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Statistical inference on progressive‐stress accelerated life testing for the logistic exponential distribution under progressive type‐II censoring

The accelerated life testing (ALT) is an efficient approach and has been used in several fields to obtain failure time data of test units in a much shorter time than testing at normal operating conditions. In this article, a progressive‐stress ALT under progressive type‐II censoring is considered when the lifetime of test units follows logistic exponential distribution. We assume that the scale parameter of the distribution satisfying the inverse power law. First, the maximum likelihood estimates of the model parameters and their approximate confidence intervals are obtained. Next, we obtain Bayes estimators under squared error loss function with the help of Metropolis‐Hasting (MH) algorithm. We also derive highest posterior density (HPD) credible intervals of the model parameters. Monte Carlo simulations are performed to compare the performances of the proposed methods of estimation. Finally, one data set has been analyzed for illustrative purposes.