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In situ observations and measurements of plastic deformation, phase transformations and fracture with 4D-STEM

In situ TEM experiments are typically recorded either in real space or diffraction space. However, it would be ideal to have information from both for when transient events occur that cannot be repeated exactly (ie-defect generation or irreversible phase transformations). 4D-STEM can come close to providing simultaneous real-space imaging and diffraction analysis during in situ testing, making it possible to perform strain mapping via diffraction pattern analysis during in-situ deformation in a TEM. This talk will highlight recent in situ 4DSTEM nanomechanical deformation experiments that explore transient events where both information from diffraction space and real space are used. The diffraction patterns are used to identify different phases, defects, orientations and relative strain, while the images formed by using virtual apertures provide microstructural context for the analysis. Example experiments include defect generation and fracture in multi-principal element alloys [1] and phase transformations in functional oxides [2].