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Imaging Structural Damage of Bacteria on Antibacterial Copper – a Scanning Electron Microscopy Study Using FIB Cross-Sectioning

Abstract The combination Scanning Electron Microscopy/Focused Ion Beam sectioning represents an established method for the three-dimensional characterization of material microstructures. This work examines whether this method of analysis is also applicable in case of a high resolution structure elucidation of bacterial cells in interaction with material surfaces. Here, the focus is on imaging the mechanism of bacteria cell damage induced by antibacterial copper materials.