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Design and implementation of a gated-laser entrance hole imaging diagnostic (G-LEH-1) at NIF

Gated x-ray images through the laser entrance hole (LEH) of a hohlraum can provide critical information for ICF experiments at the National Ignition Facility (NIF), such as the size of the LEH vs time, the growth of the gold bubble1, and the change in the brightness of inner beam spots due to time-varying cross beam energy transfer2. Incorporating a high-speed multi-frame CMOS x-ray imager developed by Sandia National Laboratories3,4 into the existing Static X-ray Imager (SXI) diagnostic5 at NIF, the new Gated LEH Imager #1 (G-LEH-1) diagnostic is capable of capturing two to four LEH images per shot on its 1024x448 pixel photo detector array, with integration times as low as 2 ns per frame. The design of this diagnostic and its implementation on NIF will be presented.