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Silicon Drift Detectors: Limitations for Throughput and Resolution

Silicon Drift Detector (SDD) based Energy Dispersive X-ray Spectroscopy (EDS) systems have undergone significant improvements since their inception [1] further improving the dramatic speed, resolution, and low energy sensitivity gains they offer over the older Si(Li) systems. To identify the limitations and bottlenecks of a given system, the three primary components of the system should be considered: The Si chip, the preamplifier, and the pulse processor.