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Test Cost-Test Quality Modeling For Adaptive Test

The ever increasing complexity of chips continuously challenges the goal of delivering a target test quality at a feasible cost. Adaptive testing has emerged as a method to explore test quality and test cost tradeoff. The modeling of the relation between test quality and test cost can enable the identification of optimal test cost and test quality points in this tradeoff space. In this work, we look at the test cost-test quality modeling problem and propose a validation framework for comparative evaluation of various models.