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Ballistic electron transport and two-level resistance fluctuations in noble-metal nanobridges.

The electrical properties of microfabricated nanobridges of copper, silver, and gold with contact diameters in the range 4-32 nm have been studied. High-quality point-contact spectra are evidence that electron transport is ballistic in these nanobridges. A comparison of our spectra with spectra from mechanical point contacts shows that microfabricated nanobridges are at least as good as mechanical point contacts for study of the electron-phonon interaction. Further, in Au nanobridges we have observed defect motion induced two-level resistance fluctuations (TLF's)