{'fraction_non_alphanumeric': 0.018475750577367205, 'fraction_numerical': 0.013856812933025405, 'mean_word_length': 5.2898550724637685, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 1, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
A Newly Developed 300 kV Field-Emission Analytical Transmission Electron Microscope

In order to carry out high-spatial-resolution analysis at the nanometer level, a 300 kV analytical transmission electron microscope with a field-emission gun has been developed. Some characteristic features of the new microscope are described and the results of the nanometer-level analysis are shown for silicon nitride and indium iron zinc oxide.