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An Electron Microscopy Collaboratory for Correlative Imaging Sciences

Transmission and scanning transmission electron microscopes, (S)TEMs are enabling groundbreaking discoveries in fields ranging from materials science to medicine. Scanning electron microscopes (SEMs) and dual-beam focused-ion-beam (FIB) instruments are multi-technique platforms that are being used for research ranging from in situ studies of mechanical properties to 3D reconstruction of biomaterials. Multimodal and multiscale correlative approaches are combining imaging and analytical modalities such as optical microscopy, scanning electron microscopy (SEM), and (S)TEM, and FIB with X-ray diffraction (XRD), X-ray absorption spectroscopy (XAS), and X-ray micro-tomography (XMT), to yield complementary and unique insights beyond that achievable with a single method.