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Electron traps in cadmium selenide

Thermally stimulated current measurements on crystals of cadmium selenide are described. As many as fourteen different trapping levels have been resolved. With so many traps the thermally stimulated current peaks overlap to such an extent that firm values of ionization energy have been obtained for six of the traps only. Estimates of the parameters of the remaining eight are given. The trap depths range from 0·15 to 0·63 ev. Photochemical effects such as the creation of fast recombination centres and of some of the electron traps are responsible for a situation in which the thermally stimulated current curve obtained is dependent on the illumination and cooling schedule used prior to measurement.