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LEPTOS: a universal software for x-ray reflectivity and diffraction

LEPTOS is a software package for analytical interpretation of data obtained in glancing-incidence X-ray reflectivity and high-resolution X-ray diffraction experiments on thin film structures. The software is designed for comprehensive analysis of physical and crystallographic parameters of modern nanoscale layered structures. The interpretation is based on up-to-date dynamical diffraction approaches and most recent theories of interaction of X-rays with matter. The graphical user interface (GUI) is designed to conveniently work with experimental data, simulate X-ray scattering processes and automatically fit simulations to the measurements using a sample models.