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SA(2,R) Multi-scale contour registration based on EM Algorithm

Here we propose a novel affine registration method for planar curves. It is based on a pseudo-inverse algorithm applied to the source and target curves in their multi-scale version. The proposed registration system selects the relevant scales in the optimized L2 distances. The retrieved smoothing parameters are realized with the Gaussian Expectation-Maximization (EM) algorithm. We resolve the global system, formed by equations corresponding to EM selected scales.