{'fraction_non_alphanumeric': 0.0385470719051149, 'fraction_numerical': 0.010378057820607857, 'mean_word_length': 6.0680628272251305, 'pattern_counts': {'":': 0, '<': 1, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Unraveling Depth-Specific Ionic Conduction and Stiffness Behavior across Ionomer Thin Films and Bulk Membranes.

Interfacial behavior of submicron thick polymer films critically controls the performance of electrochemical devices. We developed a robust, everyday-accessible, fluorescence confocal laser scanning microscopy (CLSM)-based strategy that can probe the distribution of mobility, ion conduction, and other properties across ionomer samples. When fluorescent photoacid probe 8-hydroxypyrene-1,3,6-trisulfonic acid trisodium salt (HPTS) was incorporated into <1 μm thick Nafion films on substrates, the depth-profile images showed thickness- and interface-dependent proton conduction behavior. In these films, proton conduction was weak over a region next to substrate interface, then gradually increased until air interface at 88% RH. Conversely, consistently high proton conduction with no interface dependence was observed across 35-50 μm thick bulk, free-standing Nafion membranes. A hump-like mobility/stiffness distribution was observed across Nafion films containing mobility-sensitive probe (9-(2-carboxy-2-cyanovinyl)julolidine) (CCVJ). The proton conduction and mobility distribution were rationalized as a combinatorial effect of interfacial interaction, ionomer chain orientation, chain density, and ionic domain characteristics.