{'fraction_non_alphanumeric': 0.021021021021021023, 'fraction_numerical': 0.0, 'mean_word_length': 5.475728155339806, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
An Accumulator—Based Test-Per-Clock Scheme

We propose a new scheme for reducing the test application time in accumulator-based test-pattern generation. Within this framework, we reduce the problem of efficiently generating test-patterns to that of finding the shortest Hamiltonian path in an associated directed graph. The resulting scheme exhibits extremely low demand for hardware based on a combination of decoders whose inputs are driven by a very slow external tester. Experimental results on ISCAS benchmarks substantiate the superiority of the proposed scheme over the previously-published test-set embedding approaches for accumulator-based test generation.