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The performance degradation of folded-cascode CMOS op-amp due to hot-carrier effects

This study presents the first experimental data for the impact of CMOS hot-carrier degradation on the performance of folded-cascode op-amps. Two types of folded-cascode op-amps have been designed and fabricated using a 0.8 /spl mu/m double-metal CMOS process. After high voltage stress, the degradation of performance parameters such as open-loop voltage gain, offset voltage, unity-gain frequency and phase margin has been analyzed and physically explained in terms of hot-carrier degradation.