{'fraction_non_alphanumeric': 0.03418054338299737, 'fraction_numerical': 0.007011393514460999, 'mean_word_length': 4.979057591623037, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
In-situ Elastic Strain Mapping via EBSD of Micro-Sized Specimens

In-situ observation of a wide range of small-scale mechanical tests has become commonplace recently, in large part due to the insights that can be gained by observing the tests. However, direct strain measurement during the test is more valuable than simple observation. A variety of techniques have been developed to measure strains, but none offer the strain and spatial resolution of electron backscatter diffraction (EBSD) [1]. EBSD has been used in a variety of strain measurement applications, including strained epilayer films on substrates (typically Si1-xGex/Si) [2,3] and ex-situ measurements near micro-hardness indents in silicon [4,5]. Only a few have measured elastic strains in-situ while applying a mechanical load to the sample [3,6], and most of these studies have used larger-scale specimens and only measured the strain in a small area. In this work, in-situ strain mapping was performed using a micro-scale test specimen with a complex geometry in order to fully illustrate the richness of deformation information and spatial resolution of the technique.