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Electron Energy-Loss Spectroscopy and Energy-Filtered Imaging of C60 Thin Films

Electron energy-loss spectra and energy filtered images have been obtained from C60 film deposited on Si(100) substrate using a serial electron energy loss spectrometer equipped on a scanning transmission electron microscope. The electron energy loss spectra of the specimen in the low loss region reveals the plasmon energies of C60 to be 6.6 eV and 25.3 eV. Energy-filtered images obtained at energy-losses corresponding to zero-loss, plasmon energies of Si and C60, and core loss energies of Si and C60 clearly demonstrate the elemental mapping capabilities of the energy-filtered imaging technique. Energy-filtered selected area diffraction pattern indicates that the film is amorphous, i.e., the C60 molecules are randomly arranged on the Si substrate, with a mean intermolecular spacing of 9.9±0.2 Å.