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A uniaxial tension system and its applications in testing of thin films and small components.

The aim of this investigation is to develop a uniaxial tension system for testing very small samples that allows observation of the gauge section by optical or atomic force microscopy. Major parts of the system consist of a pair of identical piezoelectric actuators, two symmetrical double-cantilevered force sensors, and two symmetrical universal coupling joints. It can accomplish both-end loaded uniaxial tension to produce centrosymmetric deformations of the tested objects in the field of view and can apply tensile loads in the range from 7.8 microN to 15 N to the samples. Sample extensions from submicrometers to 100 microm can be measured with displacement resolution of several tens of nanometers. The system's performance is demonstrated by tests of a polycrystalline aluminum alloy thin sheet, a mica thin sheet, and a fibril of bamboo.