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Structural characterization of sol-gel ZnO thin films on different substrates for memristive application

Sol-gel derived multilayer ZnO thin films were successfully prepared by spin coating technique on glass, Si wafer and platinum substrates. Structural and morphological features of the samples were investigated by field emission scanning electron microscopy (FE-SEM) and X-ray diffraction (XRD) analysis. The combined techniques assess that uniform flawless films with preferable c-axis orientation of the ZnO crystallites could be obtained. The preliminary electrical measurements on sol-gel derived SiO2/Ti/Pt/ZnO/Ag systems showed memristive behavior, and the detailed studies of switching response are in progress.