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Wheat traits and the associated loci conferring radiation use efficiency.

Wheat radiation use efficiency (RUE) must be raised through crop breeding to further increase the yield potential, as the harvest index is now close to its theoretical limit. Field experiments, including 209 wheat cultivars which have been widely cultivated in China since the 1940s, were grown in two growing seasons (2018-2019 and 2019-2020) to evaluate the variations of phenological, physiological, plant architectural and yield-related traits and their contribution to RUE, and to identify limiting factors for wheat yield potential. The average annual genetic gain in grain yield was 0.60% (or 45.32 kg ha-1 yr-1 ; R2 =0.44, P<0.01), mainly attributed to the gain in RUE (r=0.85, P<0.01). The net photosynthetic rates were positively and closely correlated with grain RUE and grain yield, suggesting source as a limiting factor to future yield gains. Thirty-four cultivars were identified, encompassing high RUE and traits contributing to high RUE, and 11 other critical traits -of known genetic basis-, as potential parents for breeding to improve yield and RUE. Our findings reveal wheat traits and the associated loci conferring RUE, which are valuable for facilitating marker-assisted breeding to improve wheat RUE and yield potential.