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Metallic nanoshell for three-dimensional chemical mapping of low conductive materials with pulsed-voltage atom probe tomography

Although pulsed-laser atom probe tomography (APT) has been successfully applied to 3D imaging of insulated samples in recent years [1], it has been hypothesized that sufficient field evaporation can be achieved in pulsed-voltage APT given the presence of a thin, conductive layer on the specimen [2]. The aim of this study is to explore a new route of applying nanoscale metallic coating to facilitate pulsedvoltage APT imaging of insulated samples, which can then be applied to applications in various fields including biomaterials and cell biology.