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Determination of energy spectrum of laser-created heavy ions from their implantation depth profile in a metallic substrate

The energy spectrum of heavy ions emitted from laser- produced plasmas was determined by the use of a technique relying on the implantation of plasma ions into a substrate located close to the plasma. Ion energy spectra were reconstructed from depth profiles of the implanted ions measured by standard Rutherford back-scattering technique employing 2 MeV alpha particles scattered at 170 degrees laboratory angle. The energy spectra of Ag, Au, and Pb ions, implanted into aluminium or steel foils, are presented. A review of another techniques for ion energy spectrum measurement is presented and their limitations are compared.