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Incorporation of Secondary-Ion Information and TCAD Simulation for Atmospheric Neutron Soft-Error-Rate Prediction in SRAMs

Neutron-induced secondary ions and their contribution to a single-event upset (SEU) in SRAM are investigated by Geant4 and TCAD simulations. It proves that the maximum linear energy transfer (LET) values of secondary ions produced by neutron–nuclear reactions can be as high as 31.5MeV-cm2/mg, while the LET value of 99.8% secondary ion is <16 MeV-cm2/mg. Only the secondary ion with the LET of >2 MeV-cm2/mg could induce an SEU in this 65-nm SRAM. Then, these results are used to calculate the atmospheric neutron-induced soft-error rate (SER). The calculated SER is verified by field testing and 14-MeV neutron-accelerated testing.