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Thickness measurement and optical properties of very thin ZnxCd(1−x)Te layers

A theoretical procedure based on the model dielectric function is used to fit the room temperature reflectivity spectra of ZnxCd1−xTe alloys in the range 1.5–4.5 eV. This procedure allows calculation of the thickness of very thin films as well as determination of the composition dependence of the critical points. A parabolic dependence on Zn molar fraction is reported. Calculated optical data, such as refractive index and extinction coefficient, are also presented.