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New methods of near-field holography

Two optical interference methods of surfaces characterization with subwavelength resolution are presented. One of the methods is based on recording of the interferograms of the near-field, which contains information about subwavelength structure of the surface. The concept of the other method consists in transformation of the near-field evanescent waves to propagating waves and measuring of their parameters far from the surface. Proposed methods have been tested numerically.