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Improvment of Measurement Systems for Relative Quality Indicator by Immitance Parameters

The structure of the measuring system for precise determination of the relative quality indicator of non-conductive objects is improved. This indicator is determined relative to the parameters of the code controlled measures. To increase the accuracy of the value of the relative quality index, which is determined by the separation of the two results of the transformation, which is proportional to the control and sample components of the admittance. These components are obtained with a time division of channels. The metrological properties of the proposed structure will be practically determined only by the parameters of the code-controlled measure.