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Statistical Analysis of Random Telegraph Signal Maximum Transition Amplitudes in an Irradiated CMOS Image Sensor

This paper aims to propose a new approach to model the Dark Current Random Telegraph Signal (DC-RTS) maximum transition distribution in irradiated CMOS Image Sensors (CIS). Based on some outcomes of the Extreme Value Theory (EVT), it can be used to predict this distribution at the end of a given space mission. An example of application of this methodology is presented in detail.