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Relationship between exo‐electron currents from MgO thin film and statistical delay time in ACPDPs

Abstract— The exo‐electron currents from a ACPDP test panel with or without MgO crystals sprayed on MgO film were measured directly after eliminating of the wall‐voltage effect. An inverse relationship was established between the statistical delay time and exo‐electron currentfrom the MgO cathode film. The spraying of MgO crystals on MgO thin film was observed to reduce the statistical delay time dramatically even for the same exo‐electron currents measured. The shift of the inverse curve may be attributed to an increased discharge success probability by the MgO crystals sprayed.