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A Preliminary Experimental Study on Dielectric Properties of Metal/ (Pb, La)(Ti, Zr)O3/Semiconductive Perovskite Heterostructures

(Pb, La)(Ti, Zr)O3 films were epitaxially grown on various semiconductive perovskites including (La, Sr)2CuO4, (La, Sr)MnO3, (La, Sr)FeO3, (La, Sr)CoO3, LaNiO3, (Nd, Ce)2CuO4 films, and Sr(Ti, Nb)O3. Excellent alignments of the materials in the heterostructures were confirmed by X-ray diffractometry. Using the heterostructures, effects of the carrier type, the carrier concentration, and the mobility on the ferroelectric and dielectric properties were examined. In these heterostructures, the depolarization instability was so weak that it could not be detected in their polarization hysteresis loops.