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Spectrum photoluminescence measuring system of porous silicon samples

The porous silicon is a material made by monocrystalline silicon wafers which has a structure and properties that depends on the wafers characteristics and its obtaining process. The material has a use potential in different fields of knowledge and technological application such as solar cells, humidity or gases sensors. The photoluminescence, obtained by the incidence of ultraviolet radiation over the material, has been the most studied property, noting especially the understanding of chemical and physical phenomena present in this material that can even explain its formation process. This study aimed to build a spectrum measuring system of porous silicon photoluminescence to determine the profile of the porous silicon photoemission curve for comparison between the morphology of the porous silicon and its photoluminescence.