{'fraction_non_alphanumeric': 0.017543859649122806, 'fraction_numerical': 0.0, 'mean_word_length': 5.194285714285714, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Laser microprobe and resonance ionization mass spectrometry for the analysis of trace elements in solids

A laser microprobe and resonance ionization mass spectrometer (LAM/RIMS) has been designed and constructed by combining a newly designed simple laser microprobe (LAM) with a continuous‐wave (cw) resonance ionization mass spectrometer, for the direct analysis of trace elements in solids. The LAM/RIMS has achieved a simultaneous record of the complete mass spectrum of a solid sample, and a three orders of magnitude enhancement in the detection signal of the selected trace elements in the solid, with precise spatial information, and without the need of sample preparation. A n‐type silicon wafer containing an impurity of sodium in parts per billion order has been easily detected by applying a single shot of an ablation laser pulse and a cw resonance ionization laser. The result has also shown that the sensitivity of the LAM/RIMS for the analysis of selected trace elements is better than the Auger electron spectroscopy and is comparable to neutron activation analysis.