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Lattice Orientation Imaging of C60-Fullerene Single Crystal with Microbeam-Scanning-Type X-ray Scattering Topography Using Charged-Coupled Device Detector

The technique of X-ray scattering topography (XST) is useful for imaging imperfect single crystals that cannot be properly observed by ordinary X-ray topography and has been successfully applied to the mapping of crystal-lattice orientation. Using scanning-type XST with a finely collimated X-ray beam and a pinhole slit and applying the technique of Laue orientation imaging using a charged-coupled device (CCD) camera, gnomonic projection, and Hough transform data processing, we have taken pictures of the scattering topographs of a C60-fullerene single crystal with a CCD camera that enable the relative angular difference of the zone axis to be observed. C60-fullerene fcc single crystal samples were grown from vapour employing a double temperature gradient. The results indicate that crystal growth began at the central region and proceeded to the periphery. These observations provide valuable information about crystal growth.