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Microabsorption of X-ray Intensity in Fractal Microstructures

Analytical models for isotropic random surface fractals with tunable fractal dimension, d f , and variable microstructural parameters are used to investigate the microabsorption of X-rays scattered symmetrically from planar samples. The models characterize homogeneous materials the constituents of which differ by their linear absorption coefficients. The absorption contrast between the fractal scattering phase and the mean value of the material is assumed to be small. It is shown that the microabsorption is maximum if the fractality of the internal surface is low (d f →2) whereas it vanishes for d f →3 irrespective of other microstructural parameters and the absorption contrast. For one of the models, a simple analytical expression is presented describing the microabsorption effect of surface fractals with an accuracy of about 20% for arbitrary fractal dimension and volume fraction.