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Periodic comparison method for defects inspection of TFT-LCD panel

In this paper, we propose a novel defects inspection algorithm for TFT-LCD panels. We first compensate the distorted image caused by poor illumination circumstances, and compare it with the reference pattern to inspect the arrangement of the pattern on the panel. Based on the reference frame, an error value image map that shows the distribution of defects is finally obtained. The simulation example shows that our algorithm not only inspects the LCD defects well, but also is robust to the 1-pixel error.