{'fraction_non_alphanumeric': 0.018722466960352423, 'fraction_numerical': 0.0, 'mean_word_length': 6.214285714285714, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Sensitivity analysis of dye absorption-spectrum transferability relative to substrates

This study describes a sensitivity analysis of absorption-spectrum transferability with respect to substrates for optimizing NIR-SWIR reflectance of dyed materials with respect to specified target spectra. Inverse modeling is applied to reflectance spectra of prototypical IR absorbing dyes, which have been deposited upon different substrates, with different deposit-layer thicknesses. IR absorption features of any given IR absorbing dye will be a function of deposit-layer microstructure and dielectric response of substrate material. This study examines the feasibility of parametrically modeling absorption-spectrum dependence on dye-deposit microstructure and dye-deposit-substrate interaction, which will depend on the sensitivity of absorption-spectrum transferability with respect to different types substrates.