{'fraction_non_alphanumeric': 0.021037868162692847, 'fraction_numerical': 0.0, 'mean_word_length': 6.846153846153846, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Spectrum-feature extraction from diffuse reflectance using multiplicative-factor decomposition

This study describes a methodogy for spectrum-feature extraction from diffuse reflectance for distributions of materials on substrates, which is based on diffuse-reflectance theory and phenomenological multiplicative-factor decomposition of reflectance functions. Specifically, this methodology entails feature-extraction using reflectance-spectrum normalization with respect to phenomenological backgrounds. A mathematical analysis of the feature-extraction methodology with respect to its formulation is presented. In addition, results of inverse analyses demonstrating application of the methodology are described.