{'fraction_non_alphanumeric': 0.024208566108007448, 'fraction_numerical': 0.00186219739292365, 'mean_word_length': 5.897435897435898, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Application of Variable CS HRTEM to the Study of Nanoscale Structures

As nanoscale systems are increasingly incorporated into industrial products, an understanding of defect behavior and interfaces in these materials is critical. Because of the inherently small dimensions of the “nano” regime, characterization of nanoparticle-based systems demands high resolution. The transmission electron microscope (TEM) is uniquely suited for this task, although its resolution is limited by the aberrations present in electromagnetic lenses [1].