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New Technology and Approaches for the Acceleration and Enhancement of Microstructural Characterization using Electron Backscatter Diffraction

Electron Backscatter Diffraction (EBSD) has developed into a well-established microstructural characterization technique that provides quantifiable information on the grain size and shape, grain boundary character, preferred orientation, and local strain state of crystalline materials. Recent developments in pattern detection technology have enabled EBSD data acquisitions speeds to increase to rates greater than 1,400 analysed EBSD pattern per second.