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A True Random Number Generator Robust Against PVT Variation

This paper presents a true random number generator (TRNG). Pseudo-NMOS circuits are used in cells of the ring oscillator. Two methods are used simultaneously to extract random bits. True random number generator provides robustness across a wide range of temperature (0 to 85 °C), voltage (1 to 1.8 v) and process attack. In this work, a differential ring oscillator is used to generate random numbers. The phenomena of thermal noise and flicker noise are used to render the jitter produced in the oscillator. When the supply voltage is 1v, the bit rate is 30Mb/s and efficiency is 42.1Mb/mJ. This work has been implemented in the. 18um process. The simulation results are presented in HSPICE software. Images of output bits are displayed in MATLAB software.