{'fraction_non_alphanumeric': 0.024390243902439025, 'fraction_numerical': 0.001876172607879925, 'mean_word_length': 4.868131868131868, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Compact Modeling of Single-Event Latchup of Integrated CMOS Circuit

This paper presents a compact model of latchup considering design and process dependence. The new approach is more realistic and inspirited from the classical model. This model was used to confirm the single-event latchup (SEL) robustness of D-flip-flops (DFFs) used in Readout Circuit of Infrared-sensors developed by Sofradir. SEL cross sections are presented by the mean of the Monte Carlo tool MUSCA SEP3 in order to validate the new latchup modeling approach.