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Design of Aging Detection Sensor Based on Voltage Comparison

With the shrink of integrated chip process size, the circuit aging has become a major challenge for integrated chip designs. Based on the research of aging detection and voltage comparison, we proposed an aging detection circuit scheme based on voltage comparison. This scheme firstly obtains the deviation signal of aging module. Then, the quantization module uses its sampling characteristics to acquire the aging signal and quantize it by the counter unit. Finally, the aging decision module converts the quantized data into a voltage signal and determine whether the circuit is aging by the comparison result between the voltage signal and the reference voltage. Achieving the design of aging detection sensor in the TSMC 65nm CMOS process, the experimental result suggests that the logic function of design is correct. In the meanwhile, margin can be adjusted dynamically and it has a certain flexibility compared to other detection circuits.