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A Nonnegative Blind Source Separation Model for Binary Test Data

A novel method called binNMF is introduced which aimed to extract hidden information from multivariate binary data sets. The method treats the problem in the spirit of blind source separation: The data are assumed to be generated by a superposition of several simultaneously acting sources or elementary causes which are not observable directly. The superposition process is based on a minimum of assumptions and reversed to identify the underlying sources. The method is motivated, developed, and demonstrated in the context of binary wafer test data which evolve during microchip fabrication.