{'fraction_non_alphanumeric': 0.027303754266211604, 'fraction_numerical': 0.0, 'mean_word_length': 4.430555555555555, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Analysis of Color Images

The major objective of the color image analysis is to identify surface stains and other small defects such as small worm holes or small pin knots that are hard to detect in either the laser image or the X-ray image. However, the analysis of the color image is fully capable of detecting and identifying any of the visible defects that have been mentioned throughout the course of the discussion in the last two chapters. That is to say the system is capable of identifying all these defects in the form that they would present themselves at this stage of the processing, i.e., after the analysis of the laser image, L(i, j), and the analysis of the X-ray image, X(i, j), have both been completed. The complete list of defects that the analysis of the color image must be able to handle include surface stain, small or shallow mineral streak, small or shallow knots, small holes, wane containing bark, and small splits, i.e., special versions of all the defects that system is supposed to be able to identify. Note that all of these defects manifest themselves as a discoloration of the board’s surface and hence are detectable in the color image.