{'fraction_non_alphanumeric': 0.014539579967689823, 'fraction_numerical': 0.0, 'mean_word_length': 5.391752577319588, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
A High-Frequency Extension of a Surface-PotentialBased Substrate Model for Noise Coupling Analysis

In this paper we present a high-frequency extension of our surface-potential-based substrate model for predicting substrate noise coupling in integrated circuits. The model handles an arbitrary number of aggressor and victim devices on a multi-layered substrate with either biased or floating backside. We show that the dielectric properties of the substrate are easily included in this model for providing a more accurate description above GHz frequencies. Finite element calculations are used for validating the model