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Atomic-resolution electric field measurements with a universal detector

Differential phase contrast (DPC) imaging is a technique that has yielded significant results in optical, X-ray, and electron microscopy and has demonstrated the ability to image and measure the innate electric field within materials [1]. However, up until recently the maximum spatial resolution achievable by DPC (even in electron microscopy) has been limited to tens of nanometers or more. The incorporation of modern high-speed segmented or pixelated detectors has enhanced the sensitivity of DPC to a level where atomic-resolution is now possible [2,3].