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X-ray Microanalysis Phase Map on Rare Earth Minerals with a Conventional and an Annular Silicon Drift Detector

Rare earth elements (REEs) have become important components in over 200 products across an extensive range of applications, causing the demand for these elements keeping rising and the rare earth industry keeping flourishing [1]. The Nechalacho rare earth deposit, located in the Northwest Territories in Canada, is one of the most important REE sources in the world [2]. The aim of this work is to use one high spatial resolution and high count rate scanning electron microscope/x-ray energy dispersive spectrometry (SEM/EDS) system to characterize rare earth minerals (REMs) in this deposit using phase maps. The Xray microanalysis was achieved by a conventional silicon drift detector (SDD) with 60 mm collecting area located on the side of specimen and an annular SDD with a same collecting area inserted below the objective lens. The position of the annular detector provides the shortest working distance and the largest solid angle, allowing the X-ray microanalysis with a count rate as high as 2,000,000 cps and short acquisition time. Because of the high count rate, the relatively low accelerating voltage can be used, providing a high spatial resolution, making the characterisation of small features in micron-scale possible. The traditional EDS elemental map shows distribution of elements, but it cannot provide enough information for phase identification. The problem is more obvious in geological materials, where the samples have numerous micro phases with unknown composition. In order to overcome that, we develop a phase map method using the traditional EDS map and the f-ratio method [3]. The method was applied to acquire the compositional information of REM and to show their distribution.