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Life estimation of high power LED using distribution based reliability analysis

Light Emitting Diodes (LEDs) are highly preferred light sources due to their high luminous efficacy, energy efficiency, physical robustness and life. Technological developments in the recent years have almost replaced conventional light sources with light emitting diodes in many applications such as hospital lighting, street lighting, theater lighting and other general illumination purpose. The reliability and performance of the LEDs are affected by the junction temperature, as it reduces the lumen output over time. This paper uses the lumen maintenance data provided by a high power LED to analyze the degradation path and determination of life time using pseudo failure time and random effect parameter. With the help of statistical models (Normal, Lognormal and Weibull) the reliability and lifetime of the LED based on lumen degradation are predicted. And using a method called Akaike Information Criterion (AIC), the best model is chosen. Validation of the model is carried out using regression analysis. Reliability modeling using these methods result in high correlative coefficient and less error.