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An efficient optimization algorithm in integrated circuit reliability design

In this paper, we present a new optimization algorithm in integrated circuit reliability design. The new algorithm uses the number–theoretic method to choose the initial population and uses a three-point quadratic approximation to improve the local search ability. It can be implemented readily in the existing circuit optimization environments. The improved algorithm has been applied to a two-stage sense amplifier to minimize hot-carrier-induced device degradation, and a comparison is made with the reference. The results show that the proposed approach can yield a more accurate optimization value. It can significantly increase circuit reliability and improve circuit performance.