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Low Dose Rate Effects and Ionization Radiation Tolerance of the ATLAS Tracker Front-End Electronics

Ionization damage has been investigated in the IC designed for the readout of the detectors in the Semiconductor Tracker (SCT) of the ATLAS experiment at the LHC, the ABCD chip. The technology used in the fabrication has been found to be free from Low Dose Rate Effects which facilitates the studies of the radiation hardness of the chips. Other experiments have been done on individual transistors in order to study the effects of temperature and annealing, and to get quantitative information and a better understanding of these mechanisms. With this information, suitable irradiation experiments have been designed for the chips to obtain a better answer about the survivability of these chips in the real conditions of the ATLAS detector.