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Characterization of dynamic nonlinearity in ADCs using wavelet networks

Dynamic nonlinear effects in the Track-and- Hold circuit contribute significantly to distortion in Analog-to-Digital Converters (ADCs). This paper proposes a model for the characterization of non-linear dynamic effects of a T/H-ADC device by employing a mathematical approach based on Wavelet Networks (WN). Method effectiveness is demonstrated by validating the model on ADS5483, a 16-bit, 135 MSPS ADC from Texas Instruments. The proposed model is able to predict the harmonic distortion of the ADC in the first three Nyquist zones, at all amplitudes ranging from −1dbFS to −45 dBFS.