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Mass-Thickness Measurements in the TEM via EDS: A New Approach to Quantitative Chemical Analysis of Planetary Materials?

The chemical origins of our solar system are stored within meteorites and other planetary materials, the solid relics leftover from its birth 4.5 billion years ago. Energy-dispersive X-ray spectroscopy (EDS) has been central to compositional analysis of such materials. Coupled to an electron microscope, EDS can provide both qualitative and quantitative information in the form of false-color maps and as (normalized) elemental abundances, respectively. Both kinds of information are critical in planetary science for identifying two-dimensional compositional variations, and ultimately, as an aid to phase identification. Quantitative analysis is particularly important for planetary materials because it allows for comparison to equilibrium thermodynamic predictions and therefore constraining fundamental parameters, e.g., pressure and temperature, that are central to chemical models of the early solar nebula. Quantitative EDS has and will continue to be important for analysis of planetary materials including those we currently have in our collections and those to be returned by sample-return missions, e.g., Hayabusa 2 [1], OSIRIS-REx [2], and CAESAR [3] over the coming two decades.