{'fraction_non_alphanumeric': 0.025925925925925925, 'fraction_numerical': 0.0, 'mean_word_length': 5.647540983606557, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Higher-order aberration analysis in symmetry-free optical systems

Compared to the rotationally symmetric systems, the surface-decomposed aberrations of the symmetry-free system is harder for analysis, due to the invalidity of the conventional paraxial reference. To solve this problem, a novel higher-order aberration calculation method for symmetry-free systems is proposed based on the mixed ray-tracing method, which is proved as a good approximation of the full-order transverse aberration for generalized systems. Furthermore, the method is also applicable for intrinsic/induced aberration calculation, as well as the surface additive Zernike coefficient fitting. With various potential implementations, the method is considered a convenient and powerful tool for aberration analysis of off-axis systems.