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Gage capability control for electronic measurement instruments with time-dependent degeneration

Abstract Measurement variability occurs in almost all measurements of product quality. Industrial applications frequently require assessment of the impact of measurement variability. To quantify measurement errors for electronic measurement instruments, Liao and Wang (2009) presented an index, P/T*, for measuring overall gage capability. However, P/T* cannot clarify whether precision or accuracy degeneration is the main cause of measurement instrument failure. This study divides P/T* into two parts, P/T and A/T. P/T measures the relative variability while A/T measures the departure. Moreover, estimators of P/T and A/T are presented, and a control chart called the P/T* process performance analysis chart (P/T* MPPAC) is introduced for displaying the gage capability of measurement instruments. Using the P/T* MPPAC, it is possible to integrate the information of the three estimations of P/T, A/T and P/T* into a single point representation, obtain the main factor which causes measurement instrument failure, and track to degeneration of precision, accuracy, and overall gage capability, respectively.