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Dynamic characterization of passive microstructures (SiO2-Au microcantilevers) under controlled environment

There currently exists many optoelectronic methods of characterization of microstructures. We present here a dynamic method which uses the principle of the optical vibrometer in order to determine the oscillatory modes of microstructures. This measurement makes it possible to go up with the mechanical properties. It is a method without contact, based on the lighting of a microstructure using a laser beam guided by a lensed tapered optical fiber which will be used. Principal evolution of this technique is its miniaturization. It allows to integrate the device within a cryostat, where we will be able to carry out measurements with a control of temperature, pressure and composition of the atmosphere.