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A model-adaptable MOSFET parameter extraction system

A model-adaptable parameter extraction system is developed to catch up with rapid development of new advanced MOSFET models. The model-adaptability relies on two techniques; a model-adaptable initial value estimation method and a design environment that stores and reuses extraction procedures. The system makes it easy to develop an extraction procedure for a new MOSFET model through the reuse of an existing procedure for a previous model. We have verified that the system can accommodate major SPICE models including Level2-3 and BSIM1-3.