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Plasma layers of fast focus discharges-schlieren pictures experimentally taken and computer simulated

An schlieren method with sub-millimeter and sub-nanosecond resolution was used to investigate profile variations of a fast collapsing focus plasma. Computer simulations allowed the authors to trace rays through the plasma and the schlieren system to the film plane where they produce intensity distributions which depend on density profiles of the plasma. In matching simulated intensity distributions to experimentally produced schlieren pictures, parameter ranges for density, density gradients and sheath thickness have been determined.