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SENSITIVITY TO CONTACT GEOMETRY OF THE TRANSVERSE CURRENT DISTRIBUTION INTO A BSCCO TAPE : A COMPUTATIONAL STUDY

The four-probe technique is a standard way for measuring transport properties in samples with low output voltage. The use of this technique to study inhomogeneities of superconducting properties of ceramic superconductors [1– 6], coated superconductors [7,8], films [9,10] and tapes [11,12] has been well established. A less common practice in the study of these materials is to change the positions of the voltage probes in order to explore local properties. A study of the local transport properties in the transverse direction of Bi2Sr2Ca2Cu3O10+x tapes [13] and some studies related to the anisotropy in the dissipation associated to transport currents in the longitudinal and transverse directions on multi-filamentary Bi2Sr2Ca2Cu3O10+x tapes [14, 15] were accomplished by changing the position of the voltage probes in the four-probes set-up. However, very small attention has been put in studying the effects of the positions of the current leads on the transport measurements and sample performance. Particularly, it is interesting to know how the current injection geometry may influence the formation of hot spots [16] and the shape of the I V curves.