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A Novel BIST Approach for Testing DLLs of SoC

A novel Built-In-Self-Test (BIST) approach is present in this paper to test the clock manager DLL of system-on-chip (SoC). The whole approach is divided into two steps. Firstly, test a single DLL which will be used as the benchmark in step two by introducing a test clock which is the jitter embodiment of the reference clock. The proposed method with a view to test the reference clock jitter tolerance. In the second step, the purpose is testing all the DLLs of SoC by traditional BIST approach based on comparison. And use the output response analyzer (ORA) to judge the comparison result. The proposed approach is widely suitable for test DLL of SoC rapidly and simply without complex test equipments.