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Fractions of excited ions in O+ ion beam generated by electron impact

High-resolution (0.1 eV FWHM) translational energy spectroscopy is used to determine the fractional abundances of O+(4S32/,2D,2P) as a function of the ionising electron energy. Over the energy range 20-110 eV the fractions of O+(4S32/) ground state and the two low-lying excited states O+(2D) and O+(2P) are found to be (0.88-0.55), (0.1-0.25) and (0.02-0.25) respectively. It is clearly demonstrated that each of the three states can be selectively generated. Present and reported data on the lifetime tau of the O+(2P) state suggest a value of 20>or= tau >or=2 mu s.