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Characterization of the reflectivity of various white materials

We present total reflectance measurements and Lambertian characterization of various materials that are commonly (and uncommonly) used as a screen for imaging system calibration (such as flat fielding). We measure the total reflectance of the samples over a broad wavelength range (250 nm < λ < 2500 nm) that is of interest to astronomical instruments in the ultraviolet, visible, and near-infrared regimes. A Helium-Neon laser was used to determine how closely the various materials' diffuse reflectance characteristics match that of a Lambertian surface.