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Electron-impact-induced emission cross sections of neon in the extreme ultraviolet

We have measured the extreme ultraviolet (EUV) spectrum of neon produced by electron impact excitation. The measurements were obtained under optically thin conditions, and at a spectral resolution of 0.5 nm full width at half maximum (FWHM). The most prominent features of the EUV spectrum between 45 - 80 nm are the resonance lines of Ne I at 73.6 and 74.4 nm and a multiplet of Ne II at 46.14 nm (the average value for the line centre of the two closely spaced ion lines at 46.07 and 46.22 nm). Absolute emission cross sections of these lines at 300 eV were measured and compared to other previous measurements. The measured emission cross section values at 300 eV for the Ne I lines at 73.6 and 74.4 nm are found to be and respectively, and for the Ne II multiplet at 46.14 nm is found to be (sum of the 46.07 and 46.22 nm line cross sections) with an uncertainty of 41%. In addition, excitation functions were measured for the Ne I resonance lines (0 - 400 eV) and Ne II ion line (0 - 1 keV). The excitation functions for the Ne I resonance lines were corrected for polarization because these are strongly polarized.