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Impact of Electron Energy and Dose on Particle Dynamics Imaging in the Scanning Electron Microscope

Over past decades the majority of real-space nanoparticle (NP) dynamics measurements have been performed by Transmission Electron Microscopy (TEM) confining a liquid sample in various types of fluid cells, protecting the fluid from evaporation during imaging [1,2,3]. These TEM observations demonstrated that the electron interaction itself can extensively influence particle motion [4,5], but unfortunately one has limited control of beam energy, i.e. acceleration voltage, in TEM. In addition the interactions of the particles with the windows in these very thin cells can introduce artifact. Although Scanning Electron Microscopy (SEM) can be operated at much lower beam energies it has received little attention, since NP motion cannot be observed with a protective film that prevents evaporation of the vast majority of liquids under high vacuum conditions.