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Projected fringe profilometry using a supercontinum light illumination for micro-scale measurements

In this paper, a projected fringe profilometry using a supercontinuum light source generated by launching femto second laser pulses into a highly nonlinear photonic crystal fiber is presented. The proposed profilometry for micro-scale measurements has the following major advantages: (1) large-depth-of-field in the projection system, (2) ease of calibration, and (3) little speckle noise.