{'fraction_non_alphanumeric': 0.015558698727015558, 'fraction_numerical': 0.0, 'mean_word_length': 5.4363636363636365, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Configuration-specific test pattern extraction for field programmable gate arrays

The aim of this paper is to present a methodology for extracting configuration-specific test patterns for FPGA cells, from the set of sequences that test all stuck-at-faults for the unconfigured cell. This is achieved through the construction of an automaton that recognises test sequences for all faults, followed by the extraction of a second automaton that recognises only the non-redundant faults with respect to a given configuration. Since structural information is not needed for sequence extraction, this methodology provides the user with a structural fault model while granting protection of Intellectual Property.