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Analysis of partial discharge patterns from a rod to plane arrangement

Partial discharges (PDs) in high-voltage insulating systems may originate from various defects. It is important to identify the type of these insulation defects for instance internal discharges, surface discharges, corona, etc. In the past decade, PD identification research work has been carried out in a way of extracting fingerprints mainly from Phase Resolved and/or PD Magnitude Resolved distribution patterns. Generally, a PD process can be treated as a stochastic process consisting of short duration discharges and charge carrier drift/recombination intervals between these discharges. However, the complexity of PD process makes it difficult to link the PD stochastic process and the measured distribution pattern. The proposed approach yields possibilities for the interpretation of PD physical process using Voltage Resolved PD distribution (VRPD) patterns. Features of VRPD can be computed from the measurable quantities and the information about the discharge physics can be analytically obtained from calculated parameters.