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Metrology for the Advancement of X-ray Optics at the ALS

When it comes to building short-wavelength optical systems to control light at the nano-scale, metrology is the foundation, and accuracy is the bedrock. An inescapable truth in our field is that the most highly specified optical elements are wildly aberrated when just slightly misaligned, whether that misalignment comes from surface-figure or mirror-placement errors, imperfect bending, thermal drift, vibration, or other various anomalies.