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Characterization of bulk CdZnTe by IR transmission imaging

Performance and yield of CdZnTe (CZT) nuclear radiation detector arrays are sensitive to bulk defects introduced at all stages of material processing. Ingots of CZT grown by the high pressure Bridgman process contain several kinds of bulk material defects (BMDs) which can affect nuclear detector performance. In this study infrared transmission imaging was used to locate and identify certain BMDs in four-inch CZT wafers produced by Digirad. The correlation of performance of subsequently processed pixel arrays with IR image features demonstrates the predictive value of this method.