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Temperature Dependent Magnetic and Structural Properties of Co2(Fe, Ti)Ga Thin Films

We report on the first study of magnetic and structural properties of Co2Fe1-xTixGa thin films prepared by a magnetron sputtering technique. The presence of well-defined (220) and (422) peaks corresponding to the principal reflection of the Heusler structure were revealed by XRD analysis. Results of magnetic properties measurements of the thin films showed that annealed samples have uniaxial in-plane anisotropy but magnetic properties of as-prepared samples exhibit anisotropy within the plane. The annealed thin films demonstrate complex magnetization process which can be attributed to the difference in the magnetic properties of two coexisting phases with B2 and L21 structural ordering.