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Low energy electron microscopy of quantum well resonances in Ag films on W(110)

Laterally resolved measurements of the quantum size effect in electron reflectivity are made with low energy electron microscopy on Ag films on a W(110) surface. Intensity peaks are observed that are associated with quantum well (QW) resonances above the vacuum level. The unoccupied band structure in the ΓL direction is determined from a phase accumulation model analysis of experimental data. This analysis also identifies a substantial influence of the reflection phase at the W(110) interface on the QW resonance intensity peak positions observed in experiment.