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Dual Mach-Zehnder Based Integrated X-Type Ratiometric Wavelength Monitor on Glass

We design and fabricate an integrated ratiometric wavelength monitor based on ion-exchange waveguides on glass. The device consists of two unbalanced Mach-Zehnder interferometers acting as edge filters. They are designed to have X-type spectral response. Their output ratio is monotonic to the wavelength in the functional range of the wavelength monitor. The measured resolution is ~ 0.1 nm ranging from 1522 to 1576 nm, which can potentially be improved to 15 pm after packaged. The polarization dependency of the device is also discussed. Our work makes it possible to build a high performance integrated sensing and detecting optical system on one single chip.