{'fraction_non_alphanumeric': 0.027777777777777776, 'fraction_numerical': 0.003968253968253968, 'mean_word_length': 4.734848484848484, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Impact of NFSI on the clock circuit of a Gigabit Ethernet Switch

In this paper we study the susceptibility of an integrated circuit, a Gigabit Ethernet Switch (GES), under Near Field Scan Immunity (NFSI) injection. The NFSI measure highlighted the weakness of the clock circuit of the GSE. The goal of this work is to model, simulate and predict such phenomenon. First, the model of the NFSI probe, based on 3D construction using CST™ studio Electromagnetic Software, using a 50Ω strip-line, allows us to model and simulate the NFSI power injection. The model of the clock circuit is built according to Printed Circuit Board (PCB) characteristics and IBIS data of the GES. Both SPICE and CST simulations are validated by comparison with NFSI measurements.