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Characterization of small specimens using an integrated computational/measurement technique

Traditional electromagnetic material property extraction techniques rely on the use of carefully chosen specimen and measurement geometries that have analytical solutions which relate material properties to scattering parameters. Specimens must be carefully formed into precise shapes to meet the geometrical requirements of the analytical solutions, which can sometimes be either difficult or impossible depending on the material. Here we present an extraction method based on the use of a computational, as opposed to analytical, solution which can be used with nearly any specimen geometry.