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Security Considerations for Conducted and Radiated Emissions

Useful information may be leaked by digital electronic circuits in their conducted and radiated electromagnetic emissions. The leakage signals can be captured and analysed using side-channel analysis techniques. This paper describes a current research project to explore the application of statistical analysis to measured electromagnetic emissions from a smart card system. Experimental results showed that logic state switching transient currents contain information related to the hamming weights of processed data. A differential side channel analysis (DSCA) technique was applied and it demonstrated that good correlation could be obtained when a correct sub-key was encountered.