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Photoelectron Diffraction: Present Applications And Future Prospects

The technique of photoelectron diffraction is reviewed with special emphasis on comparisons with LEED and SEXAFS in surface structural determinations. The review is intended to serve as a guide in choosing photoelectron diffraction over these other techniques. The application of the various data acquisition modes to well-defined systems as well as to more complex overlayer structures is demonstrated. In particular, the potential of photo-electron diffraction in structural determinations of molecular and multi-site overlayer systems is emphasized.