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Developments In Image Processing For Industrial Inspection

The suitability of a number of systems architectures for use in industrial inspection machines is briefly reviewed. Two different pipe-line processors, a (linear) array processor, an array of transputers, a concurrent array of (non-interconnected) von Neumann machines are all discussed. Where possible, measured execution speeds are given. The article concludes that no one system yet available is able to fulfil anything approaching a significant proportion of all inspection requirements. However, a clear view of the short-term future emerges, in which a combination of certain current ideas is perceived as providing a basis for a far more cost-effective 'general purpose' image processing system for industrial inspection than we have yet enjoyed.