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IN SITU INVESTIGATION OF RETENTION PROPERTIES OF POLYDOMAIN FERROELECTRIC THIN FILMS BY MULTIMODE SCANNING FORCE MICROSCOPY

ABSTRACT The domain structures and retention properties of the sandwich structure PT/PZT/PT thin films with pure perovskite structure, strong (111)-preferred orientation and excellent ferroelectric properties were investigated in situ by piezoresponse force microscope (PFM) and electrostatic force microscope (EFM) synchronously. The piezoresponse domain images and the profiles of piezoresponse with various times exhibit that the forward backswitching and the sidewise motion of the domain walls occurred synchronously in the backswitching of the written domain. The time-dependent surface potential images and line potential profiles show that the potential decay with time. The tendency of decay becomes slower as time goes on, and the highest decay rate is within the first 15 min.