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Predicting visual fatigue in integrated circuit packaging plants

In the reworking department of integrated circuit (IC) production, both inspection and repair are visual tasks, and reworking operators frequently complain about eyestrain problems that lead to human error and a low yield rate. In this study, we evaluate the relationship between the operators' visual fatigue and actual defect data gathered from May to June 2008 and find a positive relationship between visual fatigue and the number of defects. To prevent eyestrain overload, we develop a visual fatigue prediction model using as significant predictors working time, rest time, number of inspections, number of repairs, and task difficulty. After the model was implemented in a real workplace, both visual comfort and yield rate improved. © 2010 Wiley Periodicals, Inc.