{'fraction_non_alphanumeric': 0.024709302325581394, 'fraction_numerical': 0.0029069767441860465, 'mean_word_length': 4.694214876033058, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
A Universal Charge Injection Model and Its Applications

In this paper we propose a new analytical charge injection model. This model is completely general (i.e., it can be applied to any load condition) and models all regions of operation. The validity of the model has been verified via measurements from a fabricated design in a 0.5 CMOS process. Measurement results match extremely well with our model. The model is completely analytical and can be adapted to any application scenario. In particular, we have applied our model to a high-speed sample-and-hold circuit. Our model accurately predicts nonlinearity that has been measured but not completely modeled in previous literature.