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Research and analysis on defect detection of semi-conductive layer of high voltage cable

As a component of the Internet of things, high-voltage cables are the power supply infrastructure for the modern development of cities. The operation experience shows that the high-voltage cable has been broken down many times due to the defective operation. At present, due to the limitation of detection technology, the research on detection and identification of defects in high-voltage cables is progressing slowly. Therefore, a new DR technology based on X-ray digital imaging is proposed in this paper to realize real-time detection of defects in the semi-conductive buffer layer of high-voltage cables, and intelligent detection of DR images of high-voltage cables by using image depth processing technology to realize intelligent identification of defects in the buffer layer of power cables. The results show that using the new DR technique proposed in this paper, the accurate and intuitive DR image of high-voltage cable can be obtained quickly, and the intelligent identification of defects can be realized.