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Cost-effective accurate DAC-ADC co-testing and DAC linearization

There are many cases when both Digital-to-Analog Converter (DAC) and Analog-to-Digital Converter (ADC) are present in the integrated systems, which could be of great advantage to use both together to test the characteristics of the ADC and DAC without any extra test stimulus or instruments. Conventional test method either requires a precision DAC to accurately characterize the ADC, or requires a precision ADC to accurately characterize the DAC, which cannot be done simultaneously. This paper presents a novel method that can achieve accurate DAC-ADC co-testing linearity results with simple test setup and much lower test cost. Moreover, with the DAC linearity information available, the DAC's linearity performance can be significantly improved using pre-distortion codes, which linearizes the DAC output, and can produce high purity ramp or sine wave signal for high precision applications. Extensive simulation results have validated the functionality and robustness of the proposed method, with different performances, structures or resolutions of the DACs and ADCs. The proposed method can be implemented on board or on chip, with much lower design requirement and cost. In addition, the test system can serve as the high purity signal generator, which can be used for various high precision applications.