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Examination of Graphene in a Scanning Low Energy Electron Microscope

Although graphene has been available [1-2] and intensively studied [3-5] for a full decade, new methods are still required for its examination and diagnostics. Even checking the continuity of layers and the reliable counting of layers of graphene and other 2D crystals should be easier to perform. Scanning low energy electron microscope (SLEEM) equipped with a cathode lens [6] offers an innovative tool enabling one to see graphene samples at nanometer lateral resolution in both transmitted and reflected electrons and to count the number of layers. This diagnostics can be performed on freestanding graphene samples as well as on graphene grown on the surfaces of bulk substrates.