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XAFS study on silica glasses irradiated by high-energy particles

X-ray absorption technique was applied to analyze the local structures of fused and synthesized silica glasses before and after irradiation in a nuclear reactor. Si K-edge EXAFS revealed changes in the SiO4 tetrahedron structure by the irradiation, i.e. a distorted tetrahedron in the silica glass returned to more regular one but the connection between neighboring tetrahedrons became looser. In addition, the detailed analysis of EXAFS spectra gave evidence for the formation of direct Si-Si bonding after prolonged irradiation, suggesting the appearance of Si precipitates in silica glass.