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Dielectric properties of (Ba,Sr)TiO3 thin films in MHz and THz frequency regions: Quantitative evaluation of the orientational polarization

We have deposited 1.0-µm-thick BaTiO3 (BTO), SrTiO3 (STO), Ba0.5Sr0.5TiO3 (BST) thin films on MgO substrates by pulsed laser deposition technique and measured their dielectric properties by terahertz-time domain spectroscopy (THz-TDS) and an impedance analyzer with interdigital surface electrodes in the temperature range from 20 to 290 K. By comparing the real part of the dielectric constant at 1 MHz and 1 THz, we have estimated the temperature dependence of the orientational polarization. The results suggest that the orientational polarization emerges in the ferroelectric phase of (Ba,Sr)TiO3, and the concentration of orientational polarization components of BST exceeds 90% of the total below 150 K, while it is about 30% at room temperature.