{'fraction_non_alphanumeric': 0.018867924528301886, 'fraction_numerical': 0.0031446540880503146, 'mean_word_length': 5.245098039215686, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Limits of SEM Resolution

Over the past decade the achievable resolution of the scanning electron microscope (SEM) in secondary electron (SE) imaging mode has improved by about one order of magnitude. In fact, instruments capable of demonstrating a resolution of one nanometer and exhibiting a probe size of less than 0.6 nm are not available. Continued improvements in electronoptics, electron sources, and in electronic and mechanical stability promise even smaller probe sizes that still contain adequate current for imaging, it is therefore relevant to consider what resolution might ultimately be achievable with an SEM in SE mode.