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A method for evaluating the frequency characteristics of ac thin film electroluminescent devices

Although there are some obvious variances in both electrical and optical characteristics describing the frequency dependence in ACTFEL devices, a method for the quantitative analysis of frequency characteristics is still lacking. This paper presents a method for including the frequency dependence. We assume that there is a phase shift between the applied voltage and the equivalent current emitted from the phosphor-insulator interface. Combining the continuity equations and the tunnel current formula, we have obtained the voltage in the phosphor layer, the phase shift between the applied voltage and the tunnel current, the average current and the total amount of space charge in the phosphor layer at varying applied voltages and at different frequencies. Some physical parameters of the phosphor layer can be obtained by fitting the theoretical model proposed to the experimental results in the range of 500 Hz to 2000 Hz. The results are satisfactory.