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Tomographic microscopy using a plenoptic sensor

Plenoptic sensors have been developed as passive method for 3D scanning of a scene by the intensity of the light. In this work a new method to measure 3D, not by its intensity but its wavefront phase, is presented. Microscopy on translucent or fluorescent samples, can take advantage of this technique. Preliminary studies and simulations are presented to show the feasibility of the technique.