{'fraction_non_alphanumeric': 0.033576642335766425, 'fraction_numerical': 0.00291970802919708, 'mean_word_length': 4.764705882352941, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
A DFT methodology for detecting bridging faults in reversible logic circuits

Toffoli gate is a universal reversible logic gate by which any classical or quantum circuit can be synthesized. In this paper, we propose a design-for-test (DFT) method to make an arbitrary reversible logic circuit composed of n-bit Toffoli gates fully testable for single intra-level bridging faults and single stuck-at faults. We have considered testing of circuits composed of n-bit Toffoli gates. The proposed method requires exactly ([log2N] +3) test vectors, for 'N' input wires, which is independent of the number of gates in the circuit. We also give a universal test set for detecting these faults.