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Theoretical study of resonant-light-induced force microscopy

We propose a new type of scanning probe microscope using the resonant-light-induced force based on the theoretical study of the force between optically excited nanostructures. In order to clarify the fundamental mechanism of this microscope, we have investigated the photon energy spectra and spatial mapping of interparticle radiation force (IRF) between a probe tip and a nanoscale sample under electronic resonance conditions by using the theoretical framework based on the Lorentz force equation and the nonlocal theory. As a result of algebraic calculations with this framework, a concise analytical expression of the IRF has been obtained. By a semi-analytical approach based on this expression, we have clearly shown that IRF is attributable to the coherent electromagnetic coupling of polaritons in spatially separated nanostructures, and how IRF reflects excited states in the probe–sample system comprising semiconductor quantum dots. This mechanism can be used to obtain the multidirectional information of quantum properties in an optically excited nanoscale sample through the resonant IRF.