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Transient Port Parameter Extraction for Analysis of Coupled Linear EM and Nonlinear Devices

The ability to extract temporal port parameters from the interface between a coupled EM-device system is highly desirable for a number of applications, particularly in high-frequency systems involving strongly nonlinear devices. Among the manifold advantages are computational benefits, reuse of port parameters to incorporate any device, and potential integration with other physical models. While port extraction methods are commonplace in Fourier methods, constructing them in time domain was, until recently, untenable. The objective of this paper is to construct and validate a general transient port extraction method that is flexible to device models and can stably evaluate complex nonlinear systems. We present a number of numerical results that validate the method and demonstrate the proposed benefits.