{'fraction_non_alphanumeric': 0.010396975425330813, 'fraction_numerical': 0.0, 'mean_word_length': 4.949438202247191, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Extended and Point Defects in Diamond Studied With the Aid of Various Forms of Microscopy

Introduction There is considerable interest in CVD diamond layers for a wide variety of applications. Growth of high quality and phase pure material is now achieved in a number of laboratories but it remains to optimize the growth process for particular applications so that physical properties approaching or even exceeding those of the best natural diamond can be achieved. We have found that the combined use of a wide range of different microscopies is effective in the process of refinement. Diamond quality and phase purity Raman spectroscopy is widely used to investigate the phase purity of diamond layers. Infra-red Raman is particularly sensitive to the presence of traces of non-diamond carbon in diamond while ultra-violet Raman reveals the presence of traces of diamond carbon in layers that largely are not sp bonded. For thick rather perfect layers confocal micro-Raman mapping is a convenient method for revealing the locations of non-diamond regions.