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A device to demonstrate the Haynes-Shockley Experiment

The celebrated Haynes-Shockley Experiment was devised in 1951 by J. Haynes and W. Shockley to demonstrate basic carrier transport phenomena. This experiment allows diffusion, drift and recombination to be investigated in a simple yet deeply insightful manner. This paper describes an attempt to build and test a device that can be used to demonstrate the Haynes Shockley Experiment. Details of the process flow and test strategies utilized are provided. Problems encountered and solutions taken are reported.