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Terahertz Time Domain Spectroscopy for Plastic Films Using a Tapered Parallel Plate Waveguide

Measurement for thin films without modifications of the shape and properties is very important for industrial applications. A tapered parallel plate waveguide is proposed to measure such thin films. We demonstrated that the measurement using tapered parallel plate waveguide is very effective for the evaluation of the thin films and the results of the sample length dependence well agree with the Lambert-Beer's law.