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In situ characterization of the field-emission behaviour of individual carbon nanotubes

The current–voltage (I–V) characteristics of carbon nanotubes (CNTs) during field emission were investigated by in situ imaging and field-emission (FE) measurement inside a field-emission scanning electron microscope (FE-SEM). A primary electron of the FE-SEM could induce and enhance a large stimulated electron emission from a CNT which might be due to the strong local field on the tip of the CNT in the presence of an applied voltage. FE of bent nanotubes (BNTs) can initially occur after they are fully straightened or it can start in the bent state (during geometrical straightening) as the applied field increases. The FE from a single CNT follows FN (Fowler–Nordheim) behaviour with a single linear slope in the FN plot. The FE from two nanotubes with a geometrical change during FE showed transition of the FN slope from the low voltage to the high voltage region, which could be due to interactions between two dynamic neighbouring BNTs.