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Measuring Antiferromagnetism at the Angstrom Scale using 4D-STEM

Antiferromagnets are a category of magnetic materials with near-zero net magnetization. New magnetic devices involving antiferromagnets may rely on manipulating patterns of magnetic moments such as domain walls or skyrmions, which have been imaged using techniques such as x-ray photoemission electron microscopy or differential phase contrast scanning transmission electron microscopy (DPC STEM) [1, 2]. DPC STEM with an atomically sharp probe and unit-cell averaging has been used to map the magnetic structure of an antiferromagnet in real space [3]. However, electron microscopy studies of antiferromagnets need to isolate and detect the relatively weak signal due to scattering from the magnetic structure and remain limited in signal-to-noise ratio. Here, we propose using antiferromagnetic reflections to perform phase-contrast imaging of magnetic structure at few-angstrom resolution. Such reflections are commonly measured in neutron scattering [4] and, more recently, have been detected in transmission electron diffraction, where they are around 10 4 times less intense than structural reflections [5]. In the regions of convergent beam electron diffraction (CBED) patterns where two disks overlap, interference between the two beams causes the intensity to vary sinusoidally with probe position [6]. Thus, a periodic magnetic structure can be visualized as lattice fringes.