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A New Scheme for Imaging On-Chip Dry DNA Spots using Optical/Potential Dual-Image Complementary Metal Oxide Semiconductor Sensor

A new scheme to image on-chip DNA spots using an optical/potential dual-image complementary metal oxide semiconductor (CMOS) sensor was proposed and demonstrated. Dry DNA spots have been successfully imaged without using an off-chip reference electrode. The structure of our dual-image sensor plays an essential role in the measurement method. The sensor was revealed to be capable of sensing the dielectric properties of materials placed on the sensor surface. The present measurement scheme is expected to be a powerful method for sensing dry on-chip biomolecular spots, with better compatibility with conventional slide-glass-based microarray technologies.