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Memory effect from a one-dimensional rough dielectric film on a glass substrate

We present the experimental results of the angular correlation function of far field speckle patterns scattered by a one- dimensionally random rough surface of a thin dielectric film on a glass substrate when a polarized beam of light is incident on the rough surface from vacuum. This surface, which separates the vacuum and the dielectric, is rough enough that only diffused speckles are observed. The experiment for the correlation measurement was set up to use a CCD camera to obtain the image of the speckle pattern in the specular direction for each given angle of incidence; the cross- correlation function is then calculated from the digitized images. It is found that the intensity correlation functions exhibit two distinct maxima, one arises from the auto- correlation and the other from the reciprocity condition. It is also found that different scattering processes give rise to quite different correlation functions, where multiple- scattering processes produce narrow peaks with secondary maxima, while single-scattering processes produce relatively broad peaks. The error analysis is also presented.