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Measuring efficiency of semiconductor manufacturing operations using data envelopment analysis (DEA)

All manufacturing requires metrics of inputs and outputs of a process. Many companies use reports of metrics to quantify and score particular areas of the manufacturing process. The goal of such activity is to define who is efficient, find out why and then apply this across the organization. Organizing the obtained data is always a complicated task A method of metric analysis is needed that deals with multiple inputs and multiple outputs. The only method available to deal with multiple inputs and outputs is Data Envelopment Analysis (DEA). The paper explains how DEA can be used in a semiconductor manufacturing environment to identify areas of best practice within a fabricator.