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Sub-Terahertz Quasi-Optical Reflectometer for CFRP Surface Inspection

Quasioptical reflectometer based on hollow dielectric beamguide (HDB), terahertz beamguide components and elements has been developed. The reflectometer has been analyzed in terms of its application for nondestructive method for surface and subsurface contamination of carbon fiber reinforced plastic (CFRP). Sub-terahertz (0.1…0.2 THz) measurement results of CFRP samples with different surface contaminations are presented.