{'fraction_non_alphanumeric': 0.026359143327841845, 'fraction_numerical': 0.008237232289950576, 'mean_word_length': 5.295336787564767, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Evolution of Atom Probe Data Collection Toward Optimized and Fully Automated Acquisition

Atom Probe Tomography (APT) has come a long way since the invention of the atom probe by Müller, Panitz and McLane in 1967 [1]. The state of the art then was to collect some tens of atoms per hour and record oscilloscope traces on film to measure time-of-flight (Figure 1). Today, modern electronics easily allow for collection rates of greater than 100 million ions per hour (limited primarily by specimen survivability rather than instrumentation) with software capable of parallel conversion from time-offlight to mass-to-charge with self-consistent estimates for corrections due to variations in voltage and detector impact position [2]. As application of APT continues to evolve and grow to take on new material characterization challenges, time-to-knowledge becomes more critical, especially to meet the requirements for users like those in the semiconductor industry. Improvements such as automated sample positioning and start-up, coupled with smarter acquisition algorithms and recipes, are necessary to provide full tool utilization, along with optimized yield and data quality to achieve minimum time-toknowledge.