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An analysis of preferred orientation in YBa2Cu3O7–x superconducting films deposited by CVD on single-crystal and polycrystalline substrates

YBa2Cu3O7–x films were deposited by chemical vapor deposition (CVD) onto single-crystal MgO, single-crystal Al2O3, and polycrystalline Al2O3 substrates, characterized before and after annealing, and tested for their superconducting properties. The preferred orientation in the films was analyzed (i) with pole figures and (ii) by comparison of experimental x-ray powder diffraction patterns with those calculated for the material using the March–Dollase function to model the degree of preferred orientation. Preferred orientation was significant in as-deposited films, with March coefficients ranging from 0.1–0.5 (random orientation would have a coefficient of 1.0). The (006) pole figures of the films on single crystal substrates exhibited uniquely symmetric patterns. On single-crystal MgO before annealing, a minor secondary orientation of (006) poles in the film was observed in a pattern consistent with the symmetry of major crystallographic directions of MgO. On single-crystal Al2O3 after annealing, a “dual orientation” phenomenon was observed. The high-temperature anneal destroyed the orientation and superconducting properties of the CVD films deposited at high temperatures.