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Special Issue: Surface Analysis

Last November's Microscopy Today was our first special issue to focus on a single microscopy topic (scanning probe microscopy). The present issue on surface analysis is the first to have a guest editor, Vincent Smentkowski. Vincent brought me the idea of a special issue on surface analysis, and I was pleased to help him bring this topic to our readers. Many journals publish highly technical special issues, but that is not the goal here. These articles on surface analysis techniques are aimed at the general microscopist. Each article provides a brief introduction to a technique, discusses the method's capabilities, and gives a few applications.