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Characterization of epitaxial SrTiO3/YBa2Cu3O7 layers deposited on (001) MgO by laser ablation

We discuss the results obtained for SrTiO 3 /YBa 2 Cu 3 O 7 layers deposited on (001) MgO substrates by UV pulsed laser ablation. Different samples were prepared to study both the growth of a thin (55 nm) layer of SrTiO 3 on MgO and the successive epitaxy of a 220 nm YBa 2 Cu 3 O 7 (YBCO) film on the SrTiO 3 layer. An x-ray diffraction (XRD) texture analysis is reported for the bilayers together with resistivity versus temperature and critical current density ( J c ) measurements of the superconducting films. The results show that YBCO grains grow with c -axis normal to the surface; the main in-plane orientations are [100] MgO // [100] SrTiO 3 // [100] YBCO ([010] YBCO). The XRD line broadening analysis suggests that YBCO columnar grains grow along the whole thickness of the film, also evidencing dislocations and/or faulting separated by a mean distance of 80 nm. The values obtained for the critical current of the superconductor demonstrate the effectiveness of the SrTiO 3 intermediate layer in improving the structural quality of the YBCO film.