{'fraction_non_alphanumeric': 0.03754266211604096, 'fraction_numerical': 0.007963594994311717, 'mean_word_length': 5.197183098591549, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Comparison of ELNES and NEXAFS of vanadium oxide V2O5 with different spectral resolution

Electron energy-loss spectrometer (EELS) on a transmission electron microscope (TEM) exhibit the advantages of high lateral resolution and on-line structure determination by the facilities of electron diffraction and high-resolution imaging. However, EELS usually suffers under the bad energy-resolution (ca.1 eV on TEM with field emission gun). Recently, many efforts have been made to increase the energy resolution; the most promising way is the development of a monochromator selecting electrons with monoenergy. In the present work, we give a comparison of ELNES (energy-loss near edge structure) , measured with an energy resolution of 1 eV, with NEXAFS (near edge X-ray absorption fine structure), extracted from X-ray absorption spectrum (XAS) with an energy-resolution of 0.08 eV.