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Fully integrated microwave reflectometers in multi-layer microstrip-slot technology for ultra wideband applications

This paper presents the design of compact fully integrated six-port reflectometers, which, from scalar power measurements, are capable to determine the complex reflection coefficient over an ultra wide frequency band of 3.1 to 10.6 GHz. These devices are formed by multi-layer microstrip/slot couplers and power dividers that are assembled without vias or wire cross-overs. An ultra wideband operation of these devices is confirmed by simulations in CST Microwave Studio and Agilent ADS.