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Submillimeter Wavelength Modeling of Dielectric Materials in Polarimetric Radar Approaches

Abstract : Development of two measurement techniques has made polarimetric study of dielectric materials at submillimeter wavelengths possible. The first technique, a linearly polarized(LP) transmit/receive measurement system probes polarimetric behavior of a dielectric material through observation of the material's Brewster angle. The second technique, utilizes the recently developed submillimeter quarter wave plate(QWP) to perform ellipsometric determination of the dielectric material's complex refractive index. In this paper submillimeter wavelength measurement techniques are used to polarimetrically characterize a variety of dielectric materials and demonstrate the feasibility of modeling clutter at microwave and millimeter wavelengths.