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GENERALIZED DE-EMBEDDING TECHNIQUES

This paper discusses techniques for embedding and de-embedding the characteristics of two-port devices described by scattering parameters at microwave frequencies. Such techniques have wide applications in areas such as the measurement of the parameters of a semiconductor device mounted in a fixture, removal of the effects of cables, adapters, etc. and network analyzer calibration using variant error models. The uses of the techniques are demonstrated with examples including the characterization of the HP85041A transistor test fixture.