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TEM Specimen Preparation for the Physical Sciences

There are many different methods of specimen preparation suitable for analysis via transmission electron microscopy (TEM) and related techniques (i.e., STEM, HRTEM, electron holography, etc.). Ideally, the specimen preparation technique that one chooses should be dictated by the specimen requirements. However, the technique chosen may often depend on the expertise and availability of equipment to the user and the speed in which a final specimen may be produced. In their careers, the authors have employed a variety of methods spanning a large range of materials systems and are comfortable addressing the questions in the “Ask the Experts” session on sample preparation for the physical sciences. In this paper, we present three different specimen preparation techniques that are commonly used for the physical sciences, each of which have advantages and disadvantages.