{'fraction_non_alphanumeric': 0.04004576659038902, 'fraction_numerical': 0.034324942791762014, 'mean_word_length': 4.50314465408805, 'pattern_counts': {'":': 0, '<': 3, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Fabrication of YBa 2Cu 3O 7 Step-Edge Junctions on Sapphire Substrates

YBa2Cu3O7 step-edge Josephson junctions have been fabricated on sapphire substrates with a CeO2 buffer layer. The steps were formed by the Ar-ion milling technique having step angles in a wide range (α= 20° to 70°). The current-voltage curves of the junctions formed on low-angle (<50°) steps exhibit RSJ-like behaviors at 77 K. The critical current (IC) decreased and normal resistance (RN) increased with increasing step angle (α) in the range 20° < α< 50°. A large ICRN value of 250 µV with junction resistance RN ≈5 Ω and critical current IC ≈50 µA at 77 K could be obtained reproducibly with 5 µm microbridges formed on 35° steps. The temperature dependence of the critical current and the normal resistance suggest the presence of a metallic barrier as the interface layer in a SNS-type junction.