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An Independent Component Analysis Based Defect Detection for the OLED Display

Organic Light Emitting Displays (OLED) is a new type of display device which has become increasingly attractive and popular. Due to the complex manufacturing process, various defects may exist on the OLED panel. These defects have the characteristics of fuzzy boundaries, irregular in shape, low contrast with background and they are mixed with the texture background increasing the difficulty of a rapid identification. In this paper, we proposed an approach to detect these defects based on the model of independent component analysis (ICA). The ICA model is applied to a perfect OLED image to determine the de-mixing matrix and its corresponding independent components (ICs). Through the choice of a proper ICi row vector, the new de-mixing matrix is generated which contains only uniform information and is used to reconstruct the OLED background image. The defect result can be obtained by the subtracting operation between the reconstructed background and the source images. The detection system is implemented in the Labview and the testing results show that the ICA based OLED defect detection method is feasible and effective.