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Viscoelastic maps obtained by nanorheological atomic force microscopy with two different driving systems

We previously developed nanorheological atomic force microscopy (AFM) that enables dynamic nanorheological mapping in a wide frequency range. We have used it for investigating the reinforcing mechanism of various filled rubber materials in more detail. However, in this type of nanorheological AFM, temperature control is difficult. In order to solve this serious problem, we changed the driving system of the instrument from a stage-driving system to a probe-driving system. In this study, we compare these two driving systems by measuring the viscoelastic properties of styrene-butadiene rubber (SBR) vulcanizate as a model rubber sample and also show the result obtained by the new type of nanorheological AFM with the probe-driving system with temperature control capability.