{'fraction_non_alphanumeric': 0.007947019867549669, 'fraction_numerical': 0.0, 'mean_word_length': 5.872727272727273, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Electrical Characterization of Thin Films Using Measurements of Electrical Resistivity

Some procedures carried out in the National University of Colombia physics laboratories involved in the electrical characterization of thin films are highly troublesome and comprise several inaccuracies in the measurements that expose the results to misunderstandings. The following electrical characterization system is a real-time software-controlled data acquisition environment specially designed for the measurement of voltage and current in thin films using the four-probe testing method. The system also allows the study of the thermal behavior of thin films using a heating source and provides measurements storage in a plain-text archive for further research