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Intrinsic noise power spectrum for the electronic noise in radiography image detectors

In order to design low-dose imaging systems, the radiography detector should have a good noise performance especially at low incident exposures. The signal-to-noise ratio (SNR) performance at low incident exposures is influenced by the electronic noise of readout circuits as well as the quantum noise of x-rays. Hence, analyzing the electronic noise of a detector is of importance in developing good detectors. However, the SNR value for electronic noise is zero and does not provide any useful information. Observing the standard deviation of the acquired image without exposure may confuse the analysis due to the inconsistent electronic gains of the readout circuits. Hence, it is required to find an appropriate evaluation scheme for the electronic noise. A blind electronic noise evaluation approach, which uses a set of acquired images at various incident exposures, is considered in this paper. We calculate the electronic gain and then derive an intrinsic noise power spectrum (NPS), which is independent of the electronic gain. Furthermore, we can obtain the intrinsic NPS only for the electronic noise. The proposed evaluation schemes are experimentally tested for digital x-ray images, which are obtained from various development prototypes of direct and indirect detectors. It is shown that the proposed schemes can efficiently provide an evaluation for the electronic noise performance.