{'fraction_non_alphanumeric': 0.023474178403755867, 'fraction_numerical': 0.0, 'mean_word_length': 4.882758620689655, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Quantitative Characterization of the Liquid Crystal Doped With Nanoscaled Tin-Doped Indium Oxide Under High Electric Fields

In this paper, a pulse circuit was designed to simulate the source of an electrostatic discharge (ESD). This high-voltage source was successfully used in ESD tests to precisely control the voltage exerted on the liquid crystal (LC) cells. In addition, the characteristics of the samples under ESD were measured by a more precise pulse source. According to the measurement of the relaxation of the sticking images, the behavior of the tin-doped indium oxide (ITO) nanoparticles in the LC was investigated in detail. It was confirmed that the amount of ITO may affect the speed of releasing high-voltage charges after the attack of ESD. In addition, we tried to estimate the resistivity and density of the conductive ITO bridges.