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Chemically stimulated current and ESR studies of charge storage

During the last few years, many powerful methods for studying the storage and polarization processes in dielectrics have been developed. They are essentially based on the analysis of the time or temperature dependence of the charge or polarization stored in the material. This has led to the knowledge of phenomenological parameters (trap depths, activation energies, carrier lifetimes, etc.) which are of great practical value but which only give informations on a macroscopic scale (except in some ideal crystalline structures).