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Investigation on Structural, Optical and Morphological Properties of the SnSe Films with Function of Annealing Temperatures

The work, studies on the impact of annealing on Tin Selenide thin films prepared by thermal evaporation technique. The films were annealed at different temperatures (150 °C–350 °C) inside the vacuum chamber under the pressure of 10−5 to 10−6
 torr. The effects of annealing on the SnSe films were studied by various characterization techniques. The X-ray diffraction study reveals the as prepared SnSe films have orthorhombic crystal structure and annealing enhance the crystalline nature. The grain size is found to be 29 nm to 35 nm.
 The FE-SEM images observed that both uniform shaped grains of the annealing. The Selenium (Se) content has reduced after annealing due to re-evaporation of Se at higher annealing temperatures. The optical band gap values are found to be varying between 1.1 eV and 2.79 eV.