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Raman microscopy as a local probe of structural defects and oxygen content in HTS thin films

Three YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) thin films grown by c-beam evaporation have been studied using Raman microscopy. The films were grown at different temperatures and show different levels of cation disorder as determined from the 'c' axis lattice parameter and certain X-ray peak intensity ratios. We report on how the position of the 115 cm/sup -1/ and 500 cm/sup -1/ Raman peaks change as a function of oxygen, cation disorder and spatial position across the films and relate the results to structural changes which occur in the YBCO unit cell.