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Theoretical Study of Ferroelectric Properties Degradation in Perovskite Ferroelectrics and Antiferroelectrics under Neutron Irradiation

In present study the influence of neutron irradiation on different types of ferroelectric perovskite structures is theoretically investigated. The changes of polarization of PLZT ceramics after irradiation are caused by oxygen vacancies with special reordering of the crystal lattice around a vacancy. This reordering leads to about zero value of local polarization which results in zero polarization of the whole sample when a sufficient number of such vacancies are created. Oxygen vacancies formed by irradiation may also serve as a source of charge carriers in the ferroelectric perovskite materials. In the case of antiferroelectric lead-zirconate thin films the influence of oxygen vacancies on polarization is suppressed and it is possible to clarify the influence of radiation charged defects on the material properties. We associate the decrease of the Curie-Weiss temperature in lead-zirconate thin films under neutron irradiation with the charges located near film surfaces where Schottky junction on the contact between antiferroelectric and metal is formed. In this case the relative decrease of the Curie-Weiss temperature is proportional to the neutron fluence. However the charges possibly remaining in the bulk of the film may change this proportionality to the quadratic law.