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Polarized light-scattering matrix elements for select perfect and perturbed optical surfaces.

The angular distribution of scattered light depends on the electromagnetic properties (refractive index, absorptivity), the geometrical properties (size, shape, and distribution) of the scatterer(s), as well as the polarization and illumination angle of the incident light. To study the total information content, we measured the entire experimental sixteen-element Mueller scattering matrix for a smooth reflecting aluminum surface illuminated with lambda = 4416-A light at various angles of incidence alpha. In comparison, we also measured the scattering matrix for a degraded surface of identical material. This paper discusses the experimental procedure and compares the scattering results obtained from these two types of surface.