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Crop growth monitoring using multi-temporal TerraSAR-X dual-polarimetric data

: Crop growth monitoring techniques using remotely sensed data have been required for precise management of crop production.In this study, multi-temporal TerraSAR-X (including TanDEM-X)dual-polar-imetric data were used for monitoring the growth of beans and beetroot. In addition to gamma naught values, polarimetric parameters were calculated using m-chi decomposition and dual polarization entropy/alpha decompo-sition.The results showed that the gamma naught of VV polarization and two polarimetric parameters of the m -chi decomposition (single-or odd-bounce(Odd)and randomly oriented (Rnd)scattering)from X-band SAR data possess potential for monitoring crop growth.