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Fine structure in electron channelling patterns

Electron channelling patterns contain information from high index planes lying in the first order Laue zone. These lines are prominent in the area immediately surrounding low index poles, and can be indexed using procedures similar to those used for convergent beam electron diffraction. They reflect the lattice symmetry more clearly than the overall channelling pattern, and their exact geometry is sensitive to both lattice parameter and accelerating potential. They should also be sensitive to elastic strain.