{'fraction_non_alphanumeric': 0.03656307129798903, 'fraction_numerical': 0.004570383912248629, 'mean_word_length': 5.636363636363637, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Solving the Structural Mysteries of Magnetic Materials in TEM

We are entering the era of optimum nanostructure design of magnetic materials for applications such as recording media, magnetic memory, magnetic sensors, exchange-coupled permanent magnets and spin electronics etc. Transmission electron microscopy (TEM) is the single powerful tool that can provide all the necessary information. This paper will review my recent experience in TEM of various magnetic materials. The first step is to use proper preparation method for different samples. Methods for bulk sample, thin films, self-assembled nanowires [1], and mechanically milled powders will be reviewed. The next step is to choose a proper technique to answer a particular question. Examples using selected area electron diffraction, convergent beam electron diffraction, nanodiffraction, high resolution TEM [2], super-resolution TEM, selected reflection imaging (SRI) [3], compositional mapping by electron energy loss spectroscopy (EELS) [4] and by energy dispersive X-ray spectroscopy, and Lorentz microscopy will be shown [5].