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Characterization of Buffer Layers on Ni-based Substrates for YBCO Superconductors

Abstract Metal oxide buffer layers provide a continuous, smooth textured and chemically inert surface for growth of the YBCO (YBa2Cu307-x) film and prevent metal diffusion from the substrate into the superconductor. Ce02, Gd203 and EU203 buffer layers were grown on metallic Ni substrates using a sol-gel method by using metal 2,4-pentanedionate and acetate precursors. The films were annealed at 1150°C under 4%H2-Ar gas mixture. Textured, crack free and continuous buffer layers were obtained through the sol-gel technique. Prior to the coating process, solution characterization was performed by turbidimeter, pH meter, contact angle goniometer and rheometer. Heat treatment profiles were determined by using DTA-TG and FTIR. The coated layers were characterized by means of XRD, SEM-EDS, AFM and a scratch tester. As a result, textured growth of Ce02, EU203 and Gd203 thin films on textured Ni tapes by the sol-gel dip coating process were successfully performed.