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Dielectric spectroscopy for planar materials using guided and unguided electromagnetic waves

In this paper, we present several methods to extract the dielectric properties of a material using electromagnetic waves in guided and unguided media. These methods are used to measure the complex relative permittivity (ερ) and complex relative permeability (μ^) of a material under test (MUT). In these methods, post processing algorithms such as Thru-Reflect- Line (TRL) Calibration and Nicolson-Ross-Weir (NRW) are employed to provide the required calibration standards and conversion tools. They, along with the frequency domain scattering parameters, characterize the dielectric properties of the MUT. The proposed methods can be employed in different applications that range from electronics manufacturing, to biomedical implementation, and industrial food production. These methods are compared and analyzed in this paper. Several experiments are conducted to validate the proposed techniques. These techniques are adjusted to reduce the constraints on MUT while maintaining acceptable accuracy.