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The recollision model applied to strong-field double ionization of C+

We have developed a recollision model approach, dedicated to the investigation of C+ subject to high-intensity laser fields. Double photoionization is investigated for 780 nm light at intensities between 1014 and 1016 W cm−2. Using the recollision model we obtain a ratio between double and single ionization of 0.13% when only a single recollision takes place. Through a careful analysis of the approach, we investigate what approximations are needed in order to apply the recollision model to strong-field double ionization of a more complex atom.