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Automated ADC characterization using the histogram test stimulated by Gaussian noise

A broadband variant of the histogram test where Gaussian noise is used as a stimulus signal is presented. A methodology allowing for an automated and extensive characterization of analog-to-digital converters (ADCs) is given. Tolerance and confidence intervals are determined both for the integral nonlinearity (INL) and differential nonlinearity (DNL) vectors, related to the number of samples acquired. Experimental results of the characterization of a VXI waveform digitizer using this methodology are shown.