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Exploring the Relationship bewtween Ambient Temperature and Internal DUT Temperature

This paper will explore issues regarding the relationship between a Device Under Test (DUT)’s internal temperature and the ambient temperature that is generally reported on a calibration report. What exactly is this ambient temperature representing, and how does this temperature relate to the temperature of the DUT? Is it the temperature of a single probe on the far corner of the lab? Is it the average of several probes throughout the lab? For DUTs that are enclosed in a force-air cooled chassis, the ambient temperature should probably represent the temperature at the intake fan for the chassis. However, the internal temperature of the device could be higher, but by how much? And, how much will the internal temperature vary over the course of a calibration, especially if the calibration takes multiple hours? How will an operator know if the internal temperature is too high, possibly due to clogged fan filters or other issues with air-flow? What about the effect of adjacent high-power instruments, causing the local temperature around the DUT to warm-up above the ambient level? If the DUT includes its own internal temperature sensor, how should this be used during calibration, and are there any situations where this temperature should be reported along with the ambient temperature?