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Preface for Proceedings of SIMS XVII, Toronto, 2009

We are very pleased to present the Proceedings of the Seventeenth International Conference on Secondary Ion Mass Spectrometry (SIMS XVII), held in Toronto, Ontario, in September, 2009. We are very grateful for the opportunity to publish these proceedings as a special volume in Surface and Interface Analysis. The Proceedings open with a special invited review perspective from Professor Alfred Benninghoven, recognizing his extraordinary contributions to the development of this international conference and the proceedings series itself. Professor Benninghoven’s personal views on the development of SIMS and this conference are a fitting recognition of his leadership and effort to develop a truly international conference. The Proceedings include 165 manuscripts, organized as usual by their topical area, with invited talks given attention in the Table of