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High impedance fault detection utilizing real-time complexity measurement

This paper presents a High Impedance Fault (HIF) Detection method based on the Real-time Complexity Measurement (RCM). The proposed method is a passive technique which does not need any additional equipment to perturb the system parameters, i. e, voltage or current. Thus, it can be easily implemented in an industrial processor. Additionally, in the proposed method because no signal is injected to the system, it does not affect the power quality. In this study, a Solid State Transformer (SST) in a microgrid is considered as the test system. The instantaneous RMS voltage at the load side of the SST is imported to a real-time processor where the complexity of the time-series data is measured. Results confirm the dependability of the proposed method in the HIF detection.