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Validation of the Concise Chinese Level of Expressed Emotion Scale

Expressed emotion (EE), a strong predictor of relapse of schizophrenia, has significant clinical implications. The study aims to validate a concise Chinese version of the 60-item Level of Expressed Emotion Scale (LEE). A questionnaire survey was conducted with 188 schizophrenic patients. The battery of validation scales included Hospital Anxiety and Depression Scale (HADS) and 12-item Short Form Health Survey (SF-12). Exploratory factor analysis revealed a 3-factor, 12-item solution. Factor explication named the three factors Criticism, Over-Involvement, and Hostility. Cronbach's alpha of the whole scale was .84 and the three sub-scales were .75 to .77. Regarding convergence and divergence construct validity, the Concise Chinese LEE Scale has significant positive correlations with the anxiety and depression scores of HADS (r = .37 and .21, respectively; p < .01); significant negative correlation with the mental component score of SF-12 (r = −0.27; p < .01); and insignificant correlation with the physical component score of SF-12 (r = −0.02). The Concise Chinese LEE Scale showed good psychometric properties in internal consistence and convergence/divergence construct validity. The three-factor structure is coherent with the original conceptualization of high EE. Further validation of the scale is worth pursuing, especially on predictive validity.