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A transient monitor to reflect the quality of synchrophasors

The evolving synchrophasor standards under transient condition may stipulate the phasor measurements to carry information regarding the quality of measurements in addition to the time stamp. This paper proposes an index, named as the Synchrophasor Transient Monitor (STM), for indicating the quality of the phasors. A Teager energy concept has been utilized to estimate the time of occurrence of the event. STM is defined as the moving sum of squared deviation in the Teager energy of the signal from its steady state value. To demonstrate the performance of the proposed STM, several test cases have been carried out. The simulation results show that the proposed method is simple, fast and accurate, and it can be easily implemented for assessing the quality of the phasor measurement data.