{'fraction_non_alphanumeric': 0.01601423487544484, 'fraction_numerical': 0.0, 'mean_word_length': 5.2555555555555555, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Optical characterization of materials in sol-gel dip coatings

Optical properties of materials inside a multilayer stack may differ from those of single layers. This fact is specially noticeable in the case of sol-gel films obtained by dip coatings. We propose a method to determine the refractive index and thickness of materials inside a multilayer stack, based on the simultaneous characterization of several samples. The procedure increases the reliability of the results and helps in improving quality in optical coating production. (Summary only available)