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Substrate Defect Detection Using Nematic LCs

The thin layers of homogeneously oriented nematic LCs applied on the surface under investigation as a free film can visualise through a polarising microscope cleaning defects, traces of physicochemical modifications, structural inhomogeneities and microrelief defects. The basic theory was developed to describe the defect's image formation process and its relation to nematic LC film parameters. On this basis a new non‐destructive method to study FPD substrates quality has been developed.