{'fraction_non_alphanumeric': 0.02975609756097561, 'fraction_numerical': 0.0014634146341463415, 'mean_word_length': 5.310769230769231, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Augmenting spectroscopic imaging for analyses of samples with complex surface topographies.

Spectroscopic imaging has become a widely used tool for analyses of heterogeneous samples. Focal plane array detectors are incorporated into spectrometers that acquire a large number of spectra from different sample locations in parallel. This sensing technique facilitates analyses of spatial distributions of chemical information in an X-Y plane at high time resolution. In many cases, chemical reactions proceed in three spatial dimensions (X-Y-Z) and require the acquisition of spectroscopic information in an X-Y plane plus topographic (Z-dimension) information. However, capturing two-dimensional (2D, i.e., X-Y) images from three-dimensional (3D, i.e., X-Y-Z) samples inherently loses Z-dimension information. This technical note describes an augmented spectroscopic imager that gains both types of data, i.e., spatially resolved spectroscopic information and topography. For the latter purpose, a regular light pattern is generated and projected onto a sample. Due to its 3D topography, this light pattern is distorted. After extracting these distortions, the topography can be determined since the height structure is encoded in the light pattern. Because topographic probing must not affect infrared measurements, different wavelength ranges are used. Here spectroscopic information is acquired in the mid-IR while the light pattern probing the topography is generated in the visible. For relating distortions to physical height structures, the setup needs to be calibrated. For this purpose, calibration objects of known dimensions have been manufactured onto which the light pattern is projected. Determining distortions introduced by objects of known height derives a transform from distortions to topographies. Due to mechanical restrictions, the light pattern can only achieve a certain spatial resolution. In order to enhance the spatial resolution the topography is probed with, scanning the light pattern in X- and Y-direction is proposed.