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Magnetic Line Source Diffraction by an Impedance Step

Diffraction of a magnetic line source by an impedance step joined by two half planes is studied in the case where the half planes and step are characterized by different surface impedances. The problem is solved using Wiener Hopf technique and Fourier transform. The scattered field in the far zone is determined by the method of steepest descent. Graphical results for the solution has also been presented. It is observed that if the source is shifted to a large distance these results differ from those of by a multiplicative factor to the part of the scattered field containing the effects of incident and reflected waves.