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Extended field-of-view adaptive optics in microscopy via numerical field segmentation.

Sample-induced optical aberrations in microscopy are, in general, field dependent, limiting their correction via pupil adaptive optics (AO) to the center of the available field-of-view (FoV). This is a major hindrance, particularly for deep tissue imaging, where AO has a significant impact. We present a new wide-field AO microscopy scheme, in which the deformable element is located at the pupil plane of the objective. To maintain high-quality correction across its entirety, the FoV is partitioned into small segments, and a separate aberration estimation is performed for each via a modal-decomposition-based indirect wavefront sensing algorithm. A final full-field image is synthesized by stitching of the partitions corrected consecutively and independently via their respective measured aberrations. The performance and limitations of the method are experimentally explored on synthetic samples imaged via a custom-developed AO fluorescence microscope featuring an optofluidic refractive wavefront modulator.