{'fraction_non_alphanumeric': 0.036410923276983094, 'fraction_numerical': 0.006501950585175552, 'mean_word_length': 4.7894736842105265, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Local Structural Analysis for Mn-Doped ZnO Dilute Magnetic Semiconductors

The local structure around Mn atoms in 5 wt % Mn-doped ZnO thin films was investigated using extended X-ray absorption fine structure (EXAFS) and X-ray absorption near edge structure (XANES). Mn-doped ZnO exhibits strong magnetization (SM), weak magnetization (WM) and non magnetization (NM) depending on the bond angles between two Mn and one O, bond distances between Mn and O, and the degree of order of Mn atoms. We found in the EXAFS results that the bond angle formed in a Mn–O–Mn configuration to lead to ferromagnetism is 107.7° for Mn-doped ZnO thin films. Our results indicate that local structural variations have an influence on the determination of magnetic or nonmagnetic samples.