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TEM Characterization of Nanostructured Materials - Opportunities and Challenges

There is considerable interest in the growth and characterization of nanostructured materials that take the form of nanometer-sized particles or ultrathin layers of semiconductors, metals, ceramics, polymers or biomaterials. In order to understand and control the fabrication and properties of such materials, which can also be consolidated to form bulk materials and coatings with novel properties, it is essential to characterize them at close to the atomic scale. This requirement necessitates the development of advanced transmission electron microscopy (TEM) techniques for characterizing their crystallography, composition, defect structure, strain, site occupancy and electronic structure.