{'fraction_non_alphanumeric': 0.011968085106382979, 'fraction_numerical': 0.0, 'mean_word_length': 4.8828125, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Experimental measurement of the variation in sensitivity within a single pixel of a CCD

The sensitivity of a solid state detector array varies as a result of changes in transmission, diffusion effects and scattering. This variation will occur on a scale length less than that of a single pixel and its knowledge is of importance for improved device design and in applications such as event centroiding in photon counting systems. This paper reports on a measurement of sensitivity variation on a sub-pixel scale for a two-phase front-illuminated CCD. The measurement was made using a scanning reflection microscope. Variation in sensitivity between the phases within a pixel and on much smaller spatial scale are clearly observed as well as crosstalk.