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Fault Coverage Measurement For Analog Circuits

This paper describes an effort to develop a technique for measuring the amount of fault detection coverage that an analog test pattern has for a particular analog device. The technique is based on a software tool which statistically analyzes data from a circuit simulator. One example of a fault simulation experiment is presented, and some of the results are discussed. Finally, a look at the future of Rome Laboratory (RL) work in this area is given.