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Thickness and Aspect Ratio Dependences of Magnetic Domain Structures in Patterned CoFe Thin Films on GaAs (001) Substrates

We characterize magnetic domain structures in patterned CoFe thin films, which are deposited on GaAs (001) substrates, using magnetic force microscopy (MFM) at room temperature under zero-field condition. We observe that the domain structures depend on the crystallographic orientations of GaAs substrates in the case of 20-nm-thick CoFe thin films with a relatively high aspect ratio, e.g., 2 x 0.5  m 2 . The MFM observation results suggest that the magnetic domains can be tuned by controlling aspect ratio and thickness of CoFe thin films.