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Investigation of transmittance spectra in Si-based one-dimensional photonic crystals with defect

By using the transfer matrix method (TMM), we analyzed the properties of the transmittance spectra and photonic band of light in the 1D (one-dimensional) photonic structure with defect, which was fictionalized with two different dielectric layers. The device is designed as multilayer Si/SiO2 structure with defect in the middle of the periodic photonic crystal system. The change of defect mode and the band gap in A0=1550 nm central wavelength in optical communication region is investigated for the different angles of incidence of light and two different dielectric defect layers.