{'fraction_non_alphanumeric': 0.020588235294117647, 'fraction_numerical': 0.0, 'mean_word_length': 5.364485981308412, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Analytical Techniques in Near Eastern Archaeology: Materials and the Scanning Electron Microscope

same way as ordinary microscopes use light, bombarding the sample with the sub-atomic particles and then collecting the reflected electrons (secondary electrons) or the electrons emitted by the bombarded sample (backscattered electrons) to develop an image. As electrons are very much finer than the wavelength of light, an SEM can produce images of much higher resolution than light microscopes. Secondary electrons can be used to develop an image of the topography of the sample, for instance, an image of wear patterns on lithics, or to enable identification of organic remains.