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Estimation of ADC Nonlinearities from the Measurement in Input Voltage Intervals

This paper present proposal for fast testing method of AD converters aimed for estimation of INL as the error function and superimposed uncertainty based on two dimensional ADC error model. INL function is being determined by curve fitting of approximation function from the measurement of INL(k) in chosen code bins of the full scale range of ADC under test. Proposed testing method is suitable for approval of final accuracy of assembled data acquisition system.