{'fraction_non_alphanumeric': 0.008561643835616438, 'fraction_numerical': 0.0017123287671232876, 'mean_word_length': 5.09375, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Temperature measurement of Al metallization and the study of Black's model in high current density

The temperature of 1 micrometer dia spot on a conductor was measured for the first time and compared with the predictions of the simulation model and with the data obtained by the line resistance method. Experiments were carried out to determine the dependence of electromigration lifetime on current density and temperature with an accurate measurement of temperature. These data support that the parameters of Black's model are constant at low as well as high current density range.