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Analysis of Measurement Uncertainty for 5G OTA Measurement Grid Above 3 GHz

OTA testing is mandatory for 5G wireless devices. Protocols with frequency above 3 GHz, such as high-band WiFi and V2X, tend to have longer testing times for TIS. Due to the proliferation of such devices and bands, testing time reduction is of great significance. Among all potential methods, measurement grid reduction is a more effective one. This paper evaluates the effect of different measurement grid distribution on OT A performance of 5G wireless devices operating above 3 GHz. The determination of associated measurement uncertainty (MU) term is proposed and characterized based on statistical analysis. The reasonable MU limit for grid distribution is also proposed. Based on this work, it can be found that reduction of TIS measurement grid resolution from currently required 30/30 (AO/<j)i) to 45/45 (AO/<j)i) could achieve a roughly 60% grid point reduction, while still maintaining an uncertainty level of less than 0.25 dB, which is considered to be acceptable for OTA testing of 5G wireless devices above 3 GHz.