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CMOS Active Pixel Sensors for soft X-rays detection applications

In this work we present the characterization of CMOS Active Pixel Sensors (APS) manufactured in a standard twin-tub 0.18μm technology conceived for direct soft X-rays and MIP detection applications, i.e. without the adoption of scintillating and/or photomultiplier layers coupled to the chip. To this purpose, different pixel options have been exploited, looking for the best trade-off between full-well capacity and noise degradation effects. For test purposes, different X-rays radiation sources have been used, allowing for the sensor calibration with respect to radiation of different energies. X-rays imaging capabilities and spatial resolution analyses have been carried out, along with energy resolution analyses, looking for potential applications of such a class of sensors in material analyses and/or medical imaging.