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Implementation of an analyser crystal method for x-ray diffraction tomography

In this paper we present an experimental method which is well suited to synchrotron x-ray diffraction tomography. The experimental technique utilizes an analyser crystal placed in the diffracted x-ray beam to selectively detect diffracted photons at the desired scattering angle. This arrangement selects the prominent diffraction feature of a specimen component, allowing the spatial distribution of that component to be specifically and quantitatively imaged. Images of the spatial variation of the differential x-ray scattering cross section (reflectivity) in a cross sectional plane of interest are reconstructed using an iterative algebraic technique and an error functional minimization. Reconstructed images of a well characterized phantom show that material features can be clearly delineated. Images based on the spatial variation of x-ray linear attenuation coefficients and differential coherent scattering cross sections have been reconstructed with approximately 125 µm spatial resolution in the imaging plane.