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Modeling, evaluation and mitigation of SEU error in three-dimensional FPGAs

SEU error which is made by various radiations affects the signal integrity of nano-scale circuits, especially for future ultra-large and complex circuits. In this paper, we proposed a SEU error model for three-dimensional FPGAs and evaluate the SEU error of 3D-FPGAs based on the proposed model and then compare the SEU error rate of 3D-FPGAs with 2D-FPGAs. Moreover, we proposed a 3D layer assignment for improving SEU error possibility on three-dimensional FPGAs. The experimental results show that SEU error rate and critical delay decreases about 67% and 13.1% on 4 layers 3D-FPGA compared with 2D-FPGAs, respectively. In addition, the proposed layer assignment improves the possibility of SEU error of 3D-FPGAs up to 6.5% for large FPGA circuits.