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Hybrid spectral domain ray tracing algorithm for fast analysis of on-chip terahertz integrated antenna

We present a computationally efficient general Hybrid Spectral Ray Tracing (HSRT) method that requires one spectral domain integration step for each observation point. The HSRT method is capable of modeling arbitrary three-dimensional dielectric and metallic structures. As an example, the HSRT method is applied to on-chip dipole antenna backed by Silicon lens and integrated with a 180-GHz VCO in SiGe:C BiCMOS technology. We compare and validate the HSRT method for different reflection orders with measurements.