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A Generic Randomization Framework Architecture for Test Execution in Automated Testing Of SoC

Conventional directed tests lack the flexibility to cover different variations of test configurations. To overcome the problem and obtain better coverage, randomization is adopted. Generic randomization framework for test execution in automated testing of SoC is effective for generating real time stimulus that covers variations in test configurations such as different functional modes, register configurations, and network data packets. It provides a way to capture the state of the DUT (Device Under Test) at randomly generated parameter configurations. It prevents the selection bias and also accidental bias. It eradicates the origin of bias and provides better bug fixation in automated testing of SoC in post-silicon validation.