{'fraction_non_alphanumeric': 0.015594541910331383, 'fraction_numerical': 0.0, 'mean_word_length': 5.339506172839506, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Correction of port reflection effect for integrating sphere-based reflection measurements

We investigate the effect of port reflection in reflection measurements. Due to a high reflection coating of a sphere, the sphere's ports have thick edges, which cause reflection and contribute to the reflectance of the sphere. When the sphere is used in reflection measurements, the measured result may show a discrepancy with the theoretical prediction dealing with an ideal sphere with non-reflecting ports. To correct the reflection effects occurring at the port edges, we analytically calculate the contribution of the port edge reflection to the sphere reflectance and obtain a new correction factor for the absolute reflection measurement of Sharp and Little. Through a numerical calculation, we investigate the dependence of the new correction factor on the thickness of the port edges. For an experimental example, we perform a Sharp–Little measurement to determine the reflectance of a sample using the new correction factor.