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THz characterization of high dielectric‐constant materials using double‐layer sample

A method of measurement of the real and imaginary parts of high dielectric constant materials at THz frequencies is described. The method is based on application of double‐layer sample with variable distance between slabs. The recorded power transmittance inerferogram is employed for reconstructing complex permittivity of a material under test. Reconstructing algorithm and its realization are presented. Example of measurements of the alumina sample in 0.8–1.1 THz has demonstrated a good agreement with independent data obtained from the time‐domain terahertz spectroscopy method. © 2007 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 1388–1391, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI.10.1002/mop.22442