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IN THIS ISSUE Microstructure Analysis on Nanocrystalline Materials

Partial coherence of crystallites is often observed in supra-hard nanocomposites having a strong texture as an effect causing the diffraction line “narrowing”. The degree of the partial coherence depends on the crystallite size, on the local preferred orientation of crystallites and on the size of the diffraction vector. Consequently, the microstructure parameters influencing the partial coherence of crystallites can be determined from the dependence of the diffraction line broadening on the size of the diffraction vector. In some thermodynamically unstable systems, like in Ti-Al-Si-N and CrAl-Si-N thin films, the strongly correlated orientation of adjacent crystallites that is a necessary condition for their partial coherence can be understood as an indicator of the spinodal decomposition. INTRODUCTION Nanocrystalline materials are employed in many industrial applications, e.g. in materials for catalytic converters, in production of self cleaning surfaces, in magnetic nanostructures or in supra-hard nanocomposites. Nano-sized structures combine advantages of excellent chemical and physical properties that are tailored by modification of the material’s microstructure. For these reasons, the microstructure analysis on nanocrystalline materials and nanocomposites is a very important issue for materials science. Obligatory methods for the microstructure analysis on nano-sized structures are the transmission electron microscopy (TEM) and the highresolution transmission electron microscopy (HRTEM). The X-ray diffraction (XRD) offers still some benefits, the non-destructivity, a fast and easy sample preparation, and excellent statistics being few of them. Thus, XRD is still regarded as a very important experimental method for the microstructure analysis on nanocrystalline materials and nanocomposites [1 – 9]. X-RAY SCATTERING ON NANOCRYSTALS Within the kinematical diffraction theory, the diffracting volume of a material under study is assumed to consist of individual coherently diffracting domains called crystallites. The X-ray scattering on atomic structures is usually described by the amplitude of the scattered wave, E, which is equal to the Fourier transformation (FT) of the electron density ( ) r ρ : ( ) ( ) ( ) ( ) [ r r d r q i r q E V ] r r r r r r ρ ρ FT exp ∫ = ⋅ = , (1) where q r is the diffraction vector and r r the positions of the scattering centres. Electron density of an infinite crystal can be described as a convolution of the electron density of the unit cell ( ) r cell ρ with the lattice function ( ) r L r , see, e.g. [10]: ( ) ( ) r L r ( r r r r ) ∗ = ∞ cell ρ ρ , (2)