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Direct assessment of crystalline order and stacking faults in layered hybrid perovskite films from x-ray scattering measurements

Ruddlesden-Popper layered perovskites have emerged as a promising solution for overcoming the moisture instability of three-dimensional hybrid perovskite materials. Given that the optoelectronic properties of these layered perovskites strongly depend on the dimensionality (n) of the phases present, understanding of the microstructure and order in such materials is important. Typically, the dimensionality of phases present is inferred from optical measurements rather than diffraction measurements which are a more direct probe of structural order. Here we use a combination of grazing-incidence transmission wide-angle X-ray scattering and transmission wide-angle X-ray scattering techniques to probe the in-plane microstructure of highly textured Ruddlesden-Popper films. Our analysis reveals that only diffraction peaks corresponding to n = 1, 2, 3 and ∞ phases are observed due to increasing disorder with increasing n. Evidence for stacking faults from X-ray measurements is also shown.