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A novel method for screening OCD using low-frequency noise measurement and parameters fitting

In this paper the theoretical analysis of low frequency noise sources in Optoelectronic Coupled Devices (OCDs) is given and the relation between typical defects and low frequency noise that consists of 1/f, generation-recombination (G-R) and burst noise is described. A novel measurement system for low frequency noise is introduced here, and nV-level measurement precision can be achieved with the typical low-frequency noise measuring system, which is based on virtual instrumentation. According to statistical and experimental results, a threshold to screen potential devices with excess noise is derived, which has been proved theoretically that the screening criterion is reasonable. Contrasting the former screening criterion, some familiar noise parameters of devices are adopted to establish a novel screening criterion in this paper. At last, the Levenberg-Marquardt regression algorithm is used for the low-frequency noise parameters fitting. The noise parameters are very useful for analyzing the defects.