{'fraction_non_alphanumeric': 0.03777777777777778, 'fraction_numerical': 0.035555555555555556, 'mean_word_length': 4.567901234567901, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
A Delay Circuit for Build-Out-Self-Test in 0.18-μm CMOS

This paper describes a digital controlled delay circuit for BOST(build-out-self-test) with picosecond resolution. The proposed circuit operates at 250MHz under 1.8V supply according to Hspice simulation on the extracted layout. The complete design was fabricated in a standard TSMC 0.18μm CMOS process technology. The proposed circuit draws 7mw of static power and occupies an area of 0.09mm2.