{'fraction_non_alphanumeric': 0.022900763358778626, 'fraction_numerical': 0.005089058524173028, 'mean_word_length': 4.628571428571429, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Integrating an Electron-Beam System into VLSI Fault Diagnosis

Using design data, the system can prepare a logic-state map for the device under test. The map draws top-layer connections in different colors according to their expected logic states so the map may be compared to the DUT image observed by the electron-beam tester. The system has successfully tested a 75K-transistor VLSI device.