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Extended x-ray K-absorption spectral studies of some copper (II) Schiff base complexes

Abstract. Extended X-ray absorption fine structure (EXAFS) spectra have been recorded at the K-edge of Cu (II) using the energy dispersive EXAFS beam line at 2.5GeV Indus -2 synchrotron source at RRCAT, Indore, India. These data have been calibrated by derivative method and also used to determine the bond lengths with the help of three different methods, namely, Levy’s, Lytle’s and Lytle, Sayers and Stern’s (LSS) methods and bond lengths have also been obtained from Fourier transformation method and the results have been compared with the each other. The EXAFS data have been analyzed using the computer software Athena.