{'fraction_non_alphanumeric': 0.006837606837606838, 'fraction_numerical': 0.0, 'mean_word_length': 5.168421052631579, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Charge neutralisation of insulating surfaces in the SEM by gas ionisation

A theory is presented in which the elimination of charging artefacts on uncoated insulating surfaces in the scanning electron microscope by a low-pressure ambient gas is taken to be due to ionisation of the gas. Curves of ion current against ionising field calculated from a model of gas neutralisation give good agreement with the variation of measured ion currents passing through metal specimens. This result permits a precise interpretation of the behavior occurring at the surface of insulating specimens.