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Logical diagnosis solutions must drive yield improvement

The author discusses automated production-worthy solutions for high-volume manufacturing. He suggests that Design for Test (DFT) techniques such as scan (particularly full scan) provide design hooks that enable more effective solutions, while advances in realistic defect behavior modeling and simulation are improving both the accuracy and the ability to localize more difficult defect types. Given a real commitment and a significant investment in research and development, the logic diagnosis problem is promising.