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Time-resolved structure analysis of piezoelectric crystals by X-ray diffraction under alternating electric field

Rare-earth substitution effects on atomic motions in resonantly vibrating piezoelectric oscillators of langasite-type crystals, namely, La3Ga5SiO14 (LGS) and Nd3Ga5SiO14 (NGS), are revealed by time-resolved X-ray crystal structure analysis under alternating electric fields. Deformations of Ga–O–Ga and Ga–O–Ga/Si bond angles accompanying deformations of RE–O (RE: La or Nd) bond lengths found in LGS are suppressed in NGS. Alternatively, rigid GaO6 octahedra are deformed in NGS. The decreases in RE–O bond lengths and Ga–O–Ga and Ga–O–Ga/Si bond angles caused by the substitution of La by Nd would make the bond lengths and angles more difficult to deform under electric fields; hence, the piezoelectric constants of NGS are smaller than those of LGS.