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Fabrication and reliability testing of Ti/TiN heaters

We present a new material for highly resistive heaters: thin Ti/TiN layers. Their resistivity is indeed comparable to the resistivity of NiCr, i.e. 50-100 micro-Ohn-cm. However, as opposed to the latter material, Ti/TiN is CMOS compatible and thus easier to incorporate in CMOS integrated MEMS processing. To test the reliability of thin Ti/TiN resistive heaters, both 5 nm Ti/30 nm TiN and 5 nm Ti/60 nm TiN heaters were fabricated. A thermal analysis shows a small temperature coefficient of resistivity. To test the reliability of such heaters at temperatures up to 300 degrees C, 1 micron wide Ti/TiN lines were biased using high currents. Both DC and pulsed DC current stressing resulted in very small deviations from the initial resistance for sintered and passivated heaters. The temperature uniformity over the heater line is investigated using Emission Microscopy.