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Predicting properties of ferroelectric relaxors based on stochastic models

Abstract The stochastic models of temperature diffusing of the phase transition are presented, taking into account the structural disorder of the material by introducing a random function, i.e., the temperature of the phase transition as a function of coordinates. The structural disorders in the plane and across the thickness of the ferroelectric film are considered. The temperature of the phase transition and the width of the region of its diffusing are determined depending on the probabilistic characteristics of the random function, the film thickness, and the type of the film surface. It is established that the phase transition temperature at the structural disordered in the plane of the ferroelectric film is significantly higher than in the case of disordered over the film thickness with the same other material parameters.