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Nanocrystalline diamond thin film characterization using soft-X-ray absorption spectroscopy

Soft-x-ray absorption spectroscopy using synchrotron radiation has been used to characterize diamond thin films grown using fullerene precursors. Our data clearly show a C(1s) core excitonic feature in the absorption spectrum from these thin films which previously has only been observed clearly in pure diamond. The extended x-ray fine structure from these films is also essentially equivalent to that detected from pure diamond as well. These results mean that the local tetragonal (sp{sup 3}) ordering of the carbon atoms in the films extends out to at least 3 nearest neighbors, and that, in so far as the local order is concerned, these films are pure diamond with little oxygen or hydrogen contamination.