{'fraction_non_alphanumeric': 0.02644003777148253, 'fraction_numerical': 0.01794145420207743, 'mean_word_length': 5.838709677419355, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 1, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Ferroelectric and ferroelastic domain wall motion in unconstrained Pb(Zr,Ti)O3 microtubes and thin films

Ferroelectric polarization switching of high aspect ratio (>80:1) PbZr0.52Ti0.48O3 (PZT) microtubes with a wall thickness of ~200 nm was investigated. A charge-based technique was used to assess the dielectric and ferroelectric properties of individual mechanically-unconstrained PZT microtubes with interdigitated electrodes. An enhancement in the degree of ferroelastic (non-180°) domain wall motion was observed in the tubes relative to films of similar thickness on rigid substrates. The dielectric response of the tubes showed a Rayleigh-like ac field dependence over a wide temperature range; the extent of the extrinsic contribution to the dielectric response dropped as the temperature approached 10K, but remained finite. This work demonstrates a general methodology for directly electrically addressing small, unconstrained ferroelectric devices, extending the range of driving fields and temperatures over which these materials can be probed.