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Dynamic scaling study of nanostructured silver films

Silver thin films were electrodeposited at various thicknesses and current densities, and their surface morphology was studied with scaling analysis based on atomic force microscopy. The Ag thin films show intrinsic anomalous dynamic scaling that was evaluated with a set of local exponents αloc=0.88 and βloc= 0.61, and global ones, α= 1.75 and β= 1.21. Local slope scales with time as ρ=t0.58. High-order local roughness exponents decrease with q indicating the existence of multi-scaling of the system (and hence anomalous scaling). All the experimental data collapse into one curve of the anomalous dynamic scaling. The results demonstrate that the film deposited with higher current density has higher surface roughness and grain size. Calculation of αloc values indicates that they are not dependent on the current density.