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Resistance changes of Pb0.8Sn0.2Te under dynamic loading in the 0-100 kbar range

Resistance changes of thin Pb0.8Sn0.2Te films under dynamic pressures were measured using the planar impact configuration. The resulting resistance versus pressure curve, in the 0-100 kbar range, resembles similar static curves which were obtained for PbTe and Pb1-xSnxTe alloys. The pressure at the jump in resistance (48 kbar) which the authors obtained is very close to the phase transition pressure this compound is thought to have. Data from the release branch of the stress pulse are used, from which one can estimate the pressure hysteresis in the jump of the resistance curve.