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On-chip crosstalk evaluation between adjacent interconnections

With the reduction of distances between wires in deep sub-micron technologies, coupling capacitances become significant. This increase of capacitance causes noise capable of propagating a logical fault. Poor evaluation of the crosstalk could be at the origin of a circuit malfunction. In this paper, we propose a new closed form expression for the crosstalk between two, three and five lines. Results given by our expression are compared with SPICE simulations for 0.25 /spl mu/m technology.