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Prioritizing the Application of DFM Guidelines Based on the Detectability of Systematic Defects

A methodology using design-for-manufacturability (DFM) layout guidelines as a basis for modeling and detecting systematic defects was proposed earlier. In this paper, we show that this methodology can be extended to prioritize layout locations according to the importance of applying DFM guidelines to them. Prioritization is done based on test considerations including coverage and test set size. In particular, this methodology can identify layout locations where failure to follow a DFM guideline may result in test holes due to hard-to-detect defects. The prioritized list can be used by layout tools to create circuits that are easier to test.