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Anisotropic enhancement of flux pinning in Y-Ba-Cu-O thin films by substrate mediated defect control

(YBCO) thin films have been grown on vicinal single crystals. The films show a pronounced anisotropic resistivity and flux pinning properties in the substrate plane. UHV scanning tunnelling microscopy and transmission electron microscopy have been used to investigate the substrate surface, film morphology and the growth induced defect structure. The anisotropy is caused by planar defects generated via self-organization of the YBCO which lead to an exceptionally large critical current density up to at 4.2 K. The results demonstrate the possibility of a controlled enhancement of the critical current by tailoring the growth induced defect structure.