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Dielectric Properties of Irradiated Ferroelectric and Antiferroelectric Thin Films

Irradiation effects on highly oriented antiferroelectric (AFE) PbZrO 3 (PZ) and on ferroelectric (FE) Pb 0.92 La 0.08 (Zr 0.65 Ti 0.35 ) O 3 (PLZT-8) films are investigated. The dielectric properties were measured in the frequency range from 20 Hz (hysteresis measurements) to 250 kHz, at temperatures from 400 C to room temperature, as well as before and after irradiation to fast neutron fluences of 1 2 10 22 m m 2 and 2 2 10 22 m m 2 . After each irradiation, the films were annealed in several steps up to ∼400 C to remove the radiation induced defects. The results are discussed in terms of radiation-induced structural defects and radiation-induced charges. We find that the AFE films show a significantly different behaviour from the FE films.