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Reliability Analysis for MOSFET Based on Wiener Process

In this paper, we study a kind of accelerated degradation model, and put forward a statistic to test the homogeneous of the variance based on Wiener process. Firstly, Wiener process is applied to model the degradation process of the deteriorating system, and the analytical expressions of probability density function and reliability function for such system are derived. The MLE (Maximum Likelihood Estimation) algorithm is also presented to estimate the model parameters. Then, by means of homogeneity test of variance, we can judge whether the failure mechanism of the products is changed or not, which is the basis for the extrapolation of the characteristic quantity. A simulation study is given to illustrate the effectiveness of the proposed method. Finally, we use this method to analyze the degradation data of the MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) and get its reliability under normal working condition.