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Segmented electrodes electrodynamic destruction in metallized film capacitors

This paper presents the results of the experimental investigation and numerical simulation of electrodynamic destruction of metallized film capacitors electrodes during self-healing process. The degradation of intersegment gates of Al metallized patterned electrodes under high current load was studied. The numerical simulation was conducted by means of COMSOL Multiphysics software. The model takes into account the heat flow from metal layer to polymer film since it has significant influence on destruction process dynamics. The simulation results are in good agreement with the experimental data.