{'fraction_non_alphanumeric': 0.007772020725388601, 'fraction_numerical': 0.0, 'mean_word_length': 5.142857142857143, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Evaluating waveform generation capabilities of VLSI test systems

This paper presents a means of evaluating the waveform generation capabilities of VLSI test systems. It presents a series of equations that can be used to determine the maximum frequency at which a timing system can produce a specific set of waveforms as a function of that timing system's capabilities and restrictions.