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Phase transition lowering and melting in dynamically compressed silicon and germanium at the LCLS

Despite being the subject of numerous shock compression studies, the behavior of silicon under dynamic loading is vigorously debated [1-4]. The few studies that combine shock compression and X-ray diffraction have exclusively focused on "normal" X-ray geometry whereby X-rays are collected along the shock propagation direction, consequently sampling numerous strain states at once, and hence greatly complicating both phase identification and studies of phase transition kinetics.[5] Here, we present a novel setup to perform in situ X-ray diffraction studies perpendicular to the shock propagation direction at the Matter in Extreme Conditions end station at Linac Coherent Light Source, SLAC. Combining the extremely bright, micro-focused X-ray beam available at the LCLS with a nanosecond laser driver, we unambiguously characterize of the complex multi-wave shock response in silicon for the first time. We further combine this platform for performing simultaneous imaging with X-ray diffraction from shock compressed germanium, revealing its behaviour following shock compression. We note the transverse geometry is significantly more sensitive to the onset of both solid-solid and solid-liquid phase transformations in materials which exhibit complex multi-wave behaviour, and compare and constrast the behaviour of Si and Ge.