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Special Issue on “Recent Emerging Technologies in Atomic Force Microscopy”

Nano-technology is an important research area in the 21st century. There are many relevant applications in various industries, such as for scientific measurement and for high tech. business areas. Atomic Force Microscopy (AFM) opens a new window to the nano-world. It features a high resolution for imaging and manipulating samples on a nanoscale in vacuum, gases, or liquid operational environments, and has now become a widely used tool in the sectors of, for example, biological sciences, industrial inspection, and medical testing, etc. As a result, AFM is becoming more and more important as one of the key approaches in next generation nano-technology. This special issue invites original articles that address both theoretical and application-oriented papers, including innovative mechanism design, control technological improvements, new scanning methods, and any related technologies in AFM.