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DESIGN AND RELIABILITY ANALYSIS OF A 4:1 MUX USING SINGLE ELECTRON TUNNELING TECHNOLOGY BASED THRESHOLD LOGIC GATE

As single electron tunneling technology based threshold logic gate uses less no of tunnel junctions so it reduces the size of Boolean logic gate compare to single electron tunneling based logic gate and single electron transistor based logic gate. The design and simulation of a 4:1 multiplexer based on buffered threshold logic gate is presented in this paper. The logic operation is verified using Monte Carlo based simulation tool SIMON. The reliability of the designed circuit is analyzed using MATLAB and SIMON. A comparison of the reliability for normal and uniform distribution of background charges has been shown in the present work. The stability of the circuit is analyzed using free energy history diagram and stability plot. Also the stability analysis for different operating temperature has been shown in this paper.