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Manipulation of one-dimensional nanomaterials using a high-speed atomic force microscope in tapping mode

Atomic Force Microscope (AFM) can be used not only for imaging of nano surface topography but also for manipulation of nanoscale objects. In this research, we developed a nanomanipulation method of nanometer scale objects using a high-speed tapping mode AFM. As for manipulation nanoobjects, one-dimensional materials such as carbon nanotubes were used. Tapping mode was employed to image the objects without dragging them on the surface. In the manipulation mode, the feedback point of the amplitude of the cantilever oscillation was much reduced, which allowed us to push and move the objects on the surface as if it was operated like a contact mode. By adding circular or linear oscillations in the horizontal plane to the cantilever tip, the object was effectively moved or cut on the substrate.