{'fraction_non_alphanumeric': 0.043852106620808254, 'fraction_numerical': 0.018056749785038694, 'mean_word_length': 4.82, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Hybrid Scanning Near-Field Optical/Tunneling Microscopy with Indium-Tin-Oxide/Au Coated Optical Fiber Probe

As widely known, the spatial resolution of a scanning near-field optical microscope (SNOM) is strongly limited by its aperture size (50–200 nm). However, as reported by the authors [Jpn. J. Appl. Phys. 38 (1999) 3949], a hybrid system of a SNOM with a scanning tunneling microscope (STM) using a “doubly metal-coated optical fiber probe” could be used to overcome this limitation, resulting in a high-resolution feature (λ/ 50 ≃10 nm). However, the throughput of such a probe was extremely low because of the metal coating on the aperture. In this study, we developed a novel probe to overcome this disadvantage, where the metal coating on the aperture was replaced with an indium-tin-oxide (ITO) coating. The performance of this probe was evaluated by examining isolated CdSe nanoparticles on an ITO substrate. The fluorescence from each nanoparticle was observed as a bright spot with the full-width at half-maximum of about 20 nm, indicating high spatial resolution beyond the aperture size without sacrificing single-molecular-level high sensitivity.