{'fraction_non_alphanumeric': 0.015280135823429542, 'fraction_numerical': 0.0, 'mean_word_length': 5.413043478260869, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Spatial filtering microscope for linewidth measurements.

High pass filtering has been relatively little used in microscopy, yet it may have application to linewidth measurement and visualization of phase objects. I have designed and built a spatial filtering microscope entirely of conventional microscope objectives. For linewidth measurement, the spatial filter has an optimum width that allows linewidths to be measured within a few percent. Phase lines can also be examined, but phase contrast microscopy may be more suited to weak phase objects such as integrated-optical waveguides.