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Dielectric Characteristics of Pb(Zr, Ti)O3 Films on MgO Single Crystal Substrate by Terahertz Time Domain Spectroscopy

Lead zirconium titanate (PbZr0.52Ti0.48 O3 and PbZr0.30Ti0.70O3) films were prepared on MgO (100) substrate by the sol-gel method. Film Thickness, microstructure and crystalline structure of the films were investigated by scanning electron microscope (SEM) and X-ray diffraction analysis, respectively. Terahertz time-domain spectroscopy has been used to investigate the dielectric properties of ferroelectric Pb(Zr, Ti)O3 thin films in the frequency range of 0.2 to 2.0 THz.