{'fraction_non_alphanumeric': 0.009523809523809525, 'fraction_numerical': 0.030476190476190476, 'mean_word_length': 5.658227848101266, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Characterization of 1122nm Laser for Laser Based Fault Isolation Applications

As the technology node shrinks, the choice of laser for performing fault isolation becomes critical. The conventionally used 1319nm laser has spatial resolution constraint at smaller geometries. The 1064nm laser provides resolution improvement at the cost of reduced signal strength especially for thicker or heavily doped substrates. This paper explores the possibilities of using a low noise 1122nm laser in Electrical Fault isolation analyses.