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A New Method for Elemental Analysis of Concealed Materials

A new nondestructive method for the elemental analysis of concealed materials is proposed. This method utilizes the effect of electron binding on the energy spectrum of Compton-scattered X-rays. As a demonstration, we have measured the energy spectra of Cu-metal and stainless-steel rods, both of which are concealed by a Pb sheet with a thickness of 0.1 mm. We have observed steep edges in the energy spectra, the positions of which correspond to Cu 1s, Fe 1s and Cr 1s binding energies. This shows that the proposed method can be used for identifying the constituent element of concealed materials.