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Conductivity and temperature coefficient of resistance of multilayered polycrystalline films

We calculate the electric conductivity and the temperature coefficient of resistance (TCR) of a multilayered film consisting of the alternating polycrystalline metal layers of different thickness and purity within the relaxation time formalism. In the case of Cr, Cu and Co‐based multilayered films we perform verification of our analytical formulas and demonstrate a qualitative agreement between the theoretically calculated values of the TCR and experiment. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)