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Study of graphene device electronic properties with horizontal and vertical double vacancy defects

Abstract Graphene device electronic properties with double vacancy (DV) defects for two cases, along the direction and perpendicular to the current pathways graphene device, were investigated by using the first principles calculations in combination with density functional theory. The bond lengths, density of states, transmission probability, and current-voltage curves are computed. For relaxed pristine graphene the bond length is around 1.43 Å. However, the bond lengths near the defects for relaxed graphene for DV case are modified to 1.40-1.49 Å. It is also observed that I − V graph is nonlinear based on the current-voltage curve of graphene device which contain DV defects. Furthermore, it has been shown that having the DV defects lead to reduce the current relative to the case of perfect graphene device. Moreover, we noted that when the voltage is increased from zero to one volt new peaks are created near Fermi level in the transmission spectrum graphs. In addition, we noted that the current for the vertical DV defect is smaller than the pristine and horizontal DV device because the number of blocked electrons current pathways in vertical DV defect is larger than the two other cases, namely the pristine and horizontal DV defect cases The obtained results can be useful for the construction of new nanoelectronic devices and may have practical applications.