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Fourier Transform Infrared Ellipsometry Of Thin Polymer Films

Reflection spectra containing phase as well as intensity information were collected on a FT-IR spectrometer using two linear polarizers. The sample consisted of a poly(vinyl acetate) (PVAc) film on a copper substrate. Using well known principles of ellipsometry, the relative phase retardation (delta) and relative amplitude (psi) were calculated from these measurements.