{'fraction_non_alphanumeric': 0.023090586145648313, 'fraction_numerical': 0.0017761989342806395, 'mean_word_length': 4.814432989690721, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Site-specific TEM Specimen Preparation of Grain Boundary Corrosion in Nickel- Based Alloys Using the FIB “Plan-View Lift-Out” Technique

Use of the focused ion beam (FIB) microscope allows site-specific specimen preparation for TEM analyses in a routine manner not realizable with any other technique. The ability of FIB to image in secondary electron mode with a high degree of orientation contrast and in secondary ion mode with a high sensitivity to the presence of elements such as oxygen makes FIB an ideal tool for the analysis of metallurgical systems [1].