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New Implicit ESD Test Methodology and Simple Simulation Method for ESD Risk Evaluation

ESD test [1] is essential for IT product certification. While, usual test methodology requires complex system setup and have device damage risk. And, it is time consuming to evaluate ESD risk by current simulation method. Hence, this paper introduces new implicit ESD test methodology by using thermocouple to visualize discharging path and avoid complex process for system setup and device damage risk. Then, a simple simulation method to use s-parameter to check ESD risk by energy leakage examination are introduced as well to shorten simulation time required for ESD risk evaluation of board design.