{'fraction_non_alphanumeric': 0.013806706114398421, 'fraction_numerical': 0.0, 'mean_word_length': 5.35, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Stress and microhardness in polycrystalline thin films from below-band-gap absorption studies

A comprehensive model has been developed for the determination of the strain, stress and microhardness of polycrystalline thin films from the below-band-gap optical absorption data which reflect the defect states at the grain boundary regions. The model has been applied to describe the absorption data of AlN and diamond films and consequent interpretation of the mechanical properties of the same is presented.