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Reducing Electron Beam Damage with Multipass Transmission Electron Microscopy

With the introduction of hardware aberration correction, direct electron detectors, ultra-bright electron sources and highly precise spectrometers, it seems like we are approaching the pinnacle of transmission electron microscopy (TEM) imaging and spectroscopy. However, the field of electron microscopy is still far from the ultimate signal-to-noise and efficiency limits imposed by electron scattering physics. images are with high quantum efficiency electron