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Investigations Regarding the Influence of Surface Topography on Emissive Properties of Material

In the paper analysis of surface topography influence on emissivity of metals was shown. This was performed for infrared band comprising wavelength region of 7.5 13 micrometers. Appropriate characterization and description of object emissivity has a crucial influence on accuracy of IR system for remote temperature measurement, e.g. IR thermography or pyrometry. These properties depend on many factors, including surface topography of material, where especially cavities play a very important role. In references so far emissivity are discussed mainly as influence of type of material (metal, dielectric), its temperature, wavelength or direction of emission. In the paper characterizing emissivity of construction materials in connection with 3D surface topography.