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A self‐checking technique for materials characterization using calibration‐independent measurements of reflecting lines

There is a need for a method for the performance evaluation of calibration‐independent measurements of dielectric materials located into a measurement cell (a coaxial or waveguide section) before starting the extraction of the complex permittivity of the sample. This is important since such a method can signal the accurateness of measurements and even may show any problem of numerical methods used for the permittivity extraction. In this article, we present a metric function derived for reflecting cells, in which the samples partially or completely fill. The function is validated by uncalibrated scattering parameter measurements. © 2008 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 129–132, 2009; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.23978