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Microwave Loss Measurements of Copper-Clad Superconducting Niobium Microstrip Resonators on Flexible Polyimide Substrates

In this work, we investigated how different under- and capping layers on patterned Nb films impacted the RF losses of flexible thin-film superconducting microstrip transmission line resonators measured in a frequency range from 2 to 20 GHz. We studied how different thicknesses of Ti(10 and 50 nm) under-layer, used for adhesion, impacts conductor losses. We also studied Cu(20, 50, 100, and 200 nm) capping layers and how they affect conductor loss. These studies were carried out on 20-μm-thick spin-on polyimide (PI-2611) thin films and characterized at various cryogenic temperatures between 1.2 and 4.2 K. The results indicate normal-superconductor (Ti/Nb) and superconductor-normal (Nb/Cu) bilayer structures have increased surface resistance, which leads to an increase in microwave loss when compared to Nb-only signal traces. We quantified this additional loss by extracting resonator quality factors for weakly coupled resonators with various conductor stack-ups. Our experimental results can help inform decisions regarding material stack-ups when designing multiconductor multilayer superconducting flexible cables intended for use with ultralow-temperature electronic systems.