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Characterization of Durable Nanostructured Thin Film Catalysts Tested under Transient Conditions Using Analytical Aberration-Corrected Electron Microscopy

The stability of Ru0.1Ir0.9 oxidation evolution reaction (OER) catalysts deposited on Pt-coated nanostructured thin films (NSTFs) has been investigated by aberration-corrected electron microscopy. Accelerated stress tests showed that the OER catalysts significantly improved the durability of the Pt under cell reversal conditions. High-resolution images of the end-of-life NSTFs showed significant Ir loss from the whisker surfaces, while no Pt loss was observed, indicating that the OER catalysts had protected the catalyst coated whisker surfaces from degradation.