{'fraction_non_alphanumeric': 0.046052631578947366, 'fraction_numerical': 0.0, 'mean_word_length': 4.935064935064935, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
A DFT and test pattern generation methodology for an ARM powered® SoC design

This article describes the design-for-testability (DFT) methodology for an ARM powered SoC (system-on-a-chip) design which is named by Garfield and used for hand-held computing. Various test methods, including scan insertion, memory BIST (built-in self-test), boundary scan and functional test, and the strategies merging the above methods in SoC design are discussed in detail.