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On precise phase difference measurement approach using border stability of detection resolution.

For the precise phase difference measurement, this paper develops an improved dual phase coincidence detection method. The measurement resolution of the digital phase coincidence detection circuits is always limited, for example, only at the nanosecond level. This paper reveals a new way to improve the phase difference measurement precision by using the border stability of the circuit detection fuzzy areas. When a common oscillator signal is used to detect the phase coincidence with the two comparison signals, there will be two detection fuzzy areas for the reason of finite detection resolution surrounding the strict phase coincidence. Border stability of fuzzy areas and the fluctuation difference of the two fuzzy areas can be even finer than the picoseconds level. It is shown that the system resolution obtained only depends on the stability of the circuit measurement resolution which is much better than the measurement device resolution itself.