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Real-time reconstruction of arbitrary slices for quantitative and in-situ three-dimensional characterization of nanoparticles

Nanoparticles are important for a wide range of applications because of their unique properties, which are in general strongly connected to their 3D structure. To understand the connection between structure/composition and properties, nanoparticles are often investigated by transmission electron microscopy (TEM). Although TEM has become an indispensable tool to study nanomaterials, it remains difficult to perform a 3D characterization. Indeed, conventional TEM provides 2D projection images of 3D objects, therefore missing a wealth of information. Electron tomography was developed to overcome this issue.