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Investigation Of Superpolished Surfaces By X-Ray Scattering

We are studying the diffuse scattering occuring when the X-ray beam is reflected by real surface. This diffuse scattering is produced by microroughnesses and other irregularities of a dielectric constant which retain after any method of surface finishing. The fundamental goal of this work is the physics of diffraction at irregular surfaces and interfaces. The results can be applied to the investigation and control of superpolished surfaces which is of interest both for research snd technology.