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X-ray spectroscopy with photon counting imaging detectors such as Timepix

The energy response spectrum of highly pixelated photon-counting detectors with a semiconductor sensor layer (e.g. silicon) differs significantly from the impinging X-ray spectrum due to charge sharing and Compton scattering. Therefore determining the impinging X-ray spectrum from the measured energy deposition spectrum is a non-trivial task. A detailed model of all relevant physical processes in the sensor layer is necessary to simulate monoenergetic response functions, which can be used to deconvolve the measured spectrum of energy depositions to reconstruct the impinging X-ray spectrum.