{'fraction_non_alphanumeric': 0.01940755873340143, 'fraction_numerical': 0.0030643513789581204, 'mean_word_length': 5.24203821656051, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
Reliability of different levels of cascaded H-Bridge inverter: An investigation and comparison

This paper presents the comparative analysis of reliability of different levels of cascaded H-Bridge inverter topologies. Failure of single IGBT in a cell of H-Bridge can determine the reliability of the complete cell. Military Handbook-217F provides basis for computation of reliability of semiconductors. This method is not applicable for reliability evaluation of IGBT. To determine the temperature cycles of IGBT, thermal impedance model is developed and power cycles are obtained by using transfer function in MATLAB simulation. By Coffin-Manson fatigue life relationship, the number of temperature cycles is detected by MATLAB programming. An algorithm is used to correlate number of temperature cycles with failure rate. Mean time to failure (MTTF) of each model is compared. It was observed that reliability increases with increase in number of levels of multilevel inverter.