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Mapping optical process in semiconductor nanowires using dynamic optical tweezers

We present a novel method for spatial mapping of the luminescent properties of single optically trapped semiconductor nanowires by combing dynamic optical tweezers with micro-photoluminescence. The technique involves the use of a spatial light modulator (SLM) to control the axial position of the trapping focus relative to the excitation source and collection optics. When a nanowire is held in this arrangement, scanning the axial position of the trapping beam enables different sections of the nanowire axis to be probed. In this context we consider the axial resolution of the luminescence mapping and optimization of the nanowire trapping by spherical aberration correction.