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THE INFLUENCE OF SURFACE ROUGHNESS ON THE REFRACTION OF X-RAYS AND ITS EFFECT ON BRAGG PEAK POSITIONS

The influence of surface roughness on the refraction effect for X-rays at gracing incidence was investigated. A set of brass samples with different surface roughnesses was used to measure the Bragg peak positions of {111} lattice plane in asymmetric Ω-mode with a constant incidence angle α. In a set of measurements with different incidence angles α the shift in Bragg peak positions was measured. The observed peak shift is due to the refraction effect at the sample surface and also due to residual stresses. Additional measurements in symmetrical θ/2θ-mode (Ψ-geometry) made it possible to separate both effects. The refraction effect at the sample surface was calculated and compared with theoretical values derived from Snell’s law of refraction. For a smooth surface theoretical and measured data are in very good agreement. But with increasing surface roughness the refraction effect decreases.