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Preparation of cross‐section specimens for transmission electron microscopy from α‐Al2O3/Ni solid state bonded bicrystal interfaces

The technique which is described combines the advantages of the techniques formerly proposed in the literature in each stage of the preparation of transmission electron microscopy (TEM) specimens including a single metal‐ceramic interface. It allows easy handling of the thin foils in spite of their brittleness. Preferential thinning of the softer material in the two‐phase foil is prevented, and both sides of the interface are thinned down to comparable thicknesses. The nickel‐alumina bicrystal interface observed in TEM is neat and free from any reaction layer. This method is easily adaptable to other metal‐ceramic systems. © 1992 Wiley‐Liss, Inc.