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Dielectric Constants of Modified C60 Extracted from Reflection‐Electron‐Energy‐Loss Spectroscopy Data

A new calculation technique providing correct conversion of experimental data obtained by reflection‐electron‐energy loss spectroscopy (REELS) into respective dielectric functions has been developed. The technique was successfully applied to processing a series of REELS spectra taken from C60 film in the course of its irradiation with the flux of 1.5 keV electrons. As a result, a number of complex dielectric functions ε = ε1+iε2 corresponding to the different stages of fullerite C60 electron induced modification was obtained for the first time. These data provide an exhaustive characterization of electronic and optical properties of arbitrary modified C60, thereby give a serious impetus to the search for the new technological applications of this material.