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Adsorbed layer structure of cationic surfactants on quartz.

Recent atomic force microscopy (AFM) surface images of surfactant adsorbed at solid and solution interfaces have shown apparent micellar aggregates familiar from bulk self-assembly. This contradicts the classical picture of laterally unstructured bilayers within which neutron reflectometry (NR) measurements have previously been analyzed. Applying both techniques to surfactant adsorption on quartz, we show that film thickness and coverage parameters derived from NR results are generally consistent with those from AFM and bulk self-assembly. NR by itself allows us to distinguish between actual bilayer and probable aggregate adsorption, which will be of particular importance when a solution's rheology makes AFM imaging impractical.