{'fraction_non_alphanumeric': 0.02619589977220957, 'fraction_numerical': 0.002277904328018223, 'mean_word_length': 5.190140845070423, 'pattern_counts': {'":': 0, '<': 0, '<?xml version=': 0, '>': 0, 'https://': 0, 'lorem ipsum': 0, 'www.': 0, 'xml': 0}, 'pii_count': 0, 'substrings_counts': 0, 'word_list_counts': {'cursed_substrings.json': 0, 'profanity_word_list.json': 0, 'sexual_word_list.json': 0, 'zh_pornsignals.json': 0}}
MULTIPLE-FAULT SIMULATION AND COVERAGE OF DETERMINISTIC SINGLE-FAULT TEST SETS

In this paper, we present the results of multiple-fault fault simulation experiments which have been performed on ISCAS combinational [I] and sequential [2] benchmarks. Using test sets generated by a single stuck-at fault test generator [3], we performed symbolic fault simulation to determine multiple stuck-at fault coverage. Injecting all faults simultaneously, our fault simulation algorithm uses N-ary decision diagrams (NDDs) to determine the effects of the faults on the behavior of the circuit. A testing function is generated by comparing the outputs computed by the faultfree circuit and the circuit with faults activated. The coverage is then determined by computing the ratio of the size of the satisfying set of the testing function and the number of possible multiple-fault scenarios.