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Atomic Number Determination of Energetic Heavy Ions by Energy Loss Measurements Using Planar Si Detectors

Energy loss measurements of a 33 MeV/¿, 40Ar beam using 300 ¿m thick surface barrier and implanted planar Si detectors are presented. The latter exhibit an energy resolution of about 2 %, that we suggest to be the ultimate resolution due to energy straggling in the bulk of the detector, and that will allow an accurate Z determination.