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Epileptic Seizure Classification based on the Combined Features

Electroencephalography (EEG) can provide a wealth of valuable information to help understand the mechanism of seizures. The automatic classification of EEG signals can help clinicians make effective judgments on whether seizures occur. In this work, a method based on combined features is proposed to classify epilepsy seizures. Firstly, discrete wavelet transform is applied to the signal, and the line length features, energy distribution proportion and approximate entropy of each sub-band signal are extracted. Then the statistical features of the raw signal are extracted, including mean, standard deviation, coefficient of variation, median absolute deviation (MAD) and interquartile range (IQR). All the features are combined and the dimension of the combined feature vector is reduced by the principal component analysis (PCA). Finally, the support vector machine (SVM) is used to classify the epileptic seizure. The dataset is from the epilepsy laboratory of the University of Bonn, Germany. The accuracy of 98.40% proves the validity of this method.