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Particle Based Image Segmentation with Simulated Annealing

The Charged Particle Model (CPM) is a physically motivated deformable model for shape recovery and segmentation. It simulates a system of charged particles moving in an electric field generated from the input image, whose positions in the equilibrium state are used for curve or surface reconstruction. As an alternative we propose to use simulated annealing to position these particles and present a fast and simple algorithm that is able to match CPM’s results on images with well defined contours.