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Analysis of MCCT's turn-on and short circuit operation

The turn-on characteristic and oscillation waveform in the short circuit test of a 1200 V MOS controlled cascode thyristor (MCCT) are described for the first time. A smaller turn-on loss can be successfully achieved in the MCCT than that of an IGBT which was fabricated using the same epitaxial wafer with the MCCT. In the MCCT, the oscillation waveform in the short circuit test takes place for the whole duration. However, a smaller optimized gate capacitance successfully achieves elimination of the oscillation without degradation of the electrical characteristics.