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Application of the Electron Probe Microanalyzer to the Analysis of Planetary and Geological Materials: a Historical Perspective.

Castaing first presented his idea to use secondary X-rays excited by a focused electron beam from a polished solid sample for microanalysis in 1949 at the First European Regional Conference on Electron Microscopy in Delft, Netherlands. As part of his dissertation, he then not only built the first electron probe microanalyzer (EPM), but also established many of the theoretical and analytical principles of the technique. This technique offered enormous analytical advantages to earth scientists over other analytical methods available at the time. For example, it allows qualitative and quantitative analysis of individual mineral grains a few microns in diameter; mineral grains can be viewed during analysis, thus ensuring accurate correlation between composition and grain morphology; for most purposes, the method is non-destructive; in situ analysis of minerals in polished thin sections results in retention of textural relationships among coexisting minerals; because of the small excitation volume, the technique is ideally suited for the study of zoned minerals, minute inclusions, exsolution lamellae, etc.; and once suitable standards are prepared and correction procedures are established, a large number of quantitative analyses can be obtained in a comparatively short time.